ASTM E2301-2012 Standard Test Method for Daytime Colorimetric Properties of Fluorescent Retroreflective Sheeting and Marking Materials for High Visibility Traffic Control and Perso.pdf

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1、Designation: E2301 12Standard Test Method forDaytime Colorimetric Properties of FluorescentRetroreflective Sheeting and Marking Materials for HighVisibility Traffic Control and Personal Safety ApplicationsUsing 45:Normal Geometry1This standard is issued under the fixed designation E2301; the number

2、immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1

3、This test method describes the instrumental measure-ment of the colorimetric properties (CIE tristimulus values,luminance factors, and chromaticity coordinates) offluorescent-retroreflective sheeting and marking materialswhen illuminated by daylight.1.2 This test method is generally applicable to an

4、y sheetingor marking material having combined fluorescent and retrore-flective properties used for daytime high visibility trafficcontrol and personal safety applications.1.3 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.4 T

5、his standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Docume

6、nts2.1 ASTM Standards:2D2244 Practice for Calculation of Color Tolerances andColor Differences from Instrumentally Measured ColorCoordinatesE179 Guide for Selection of Geometric Conditions forMeasurement of Reflection and Transmission Properties ofMaterialsE284 Terminology of AppearanceE308 Practice

7、 for Computing the Colors of Objects byUsing the CIE SystemE691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test MethodE1164 Practice for Obtaining Spectrometric Data forObject-Color EvaluationE1767 Practice for Specifying the Geometries of Observa-tion and Measur

8、ement to Characterize the Appearance ofMaterialsE2152 Practice for Computing the Colors of FluorescentObjects from Bispectral Photometric DataE2153 Practice for Obtaining Bispectral Photometric Datafor Evaluation of Fluorescent Color2.2 CIE Document:CIE 15:2004 Colorimetry33. Terminology3.1 Definiti

9、onsThe definitions contained in Guide E179,Terminology E284, and Practice E1164 are applicable to thistest method.4. Summary of Test Method4.1 This test method provides a procedure for measuring thecolorimetric properties of fluorescent-retroreflective sheetingand markings under simulated daylight i

10、llumination. Colori-metric properties are determined for CIE D65, which approxi-mates outdoor illumination at midday, and Daylight 15 000 K,which is an alternate D illuminant chosen to represent lowambient light/dawn/dusk daylight illumination conditions (seeCIE 15:2004).4.2 This test method require

11、s the use of a calibrated bispec-trometer (two-monochromator spectrometer) with either 45:0or 0:45 geometry that can measure the specimens Donaldsonmatrix (see Practice E2153).4.3 This test method provides for calculation and reportingof separated fluorescence, reflectance and total tristimulusvalue

12、s (XYZ) and luminance factors (Y, %), and total chroma-ticity coordinates (x,y) from the Donaldson matrix for the CIE1931 Standard Colorimetric Observer.1This test method is under the jurisdiction of ASTM Committee E12 on Colorand Appearance and is the direct responsibility of Subcommittee E12.05 on

13、Fluorescence.Current edition approved July 1, 2012. Published September 2012. Originallyapproved in 2003. Last previous edition approved in 2003 as E2301 03 which waswithdrawn April 2012 and reinstated in July 2012. DOI: 10.1520/E2301-12.2For referenced ASTM standards, visit the ASTM website, www.as

14、tm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from U.S. National Committee of the CIE (International Commissionon Illumination), C/o Thomas M. Lemons, TLA-Lig

15、hting Consultants, Inc., 7 PondSt., Salem, MA 01970, http:/www.cie-usnc.org.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.5. Significance and Use5.1 This test method provides procedures for obtainingtristimulus values, luminance fa

16、ctors and chromaticity coordi-nates of fluorescent-retroreflective materials by bispectral colo-rimetry using a 45:0 or 0:45 optical measuring system.5.2 The CIE 1931 (2) standard observer is used to calculatethe colorimetric properties of fluorescent-retroreflective sheet-ing and markings used in d

17、aytime high visibility traffic controland personal safety applications because in practice thesematerials are primarily viewed from a distance where theysubtend less than 4 of the visual field.5.3 This test method is applicable to object-color specimensof any gloss level.5.4 Due to the retroreflecti

18、ve properties of these materialsthe colorimetric data may not be suitable for use in computercolorant formulation.5.5 This test method is suitable for quality control testing offluorescent-retroreflective sheeting and marking materials.NOTE 1Separation of the fluorescence and reflectance componentsf

19、rom the total colorimetric properties provides useful and meaningfulinformation to evaluate independently the luminescent and diffuse reflec-tive efficiency and consistency of these materials.5.6 This test method is the referee method for determiningthe conformance of fluorescent-retroreflective she

20、eting andmarking materials to standard daytime colorimetric specifica-tions.6. Apparatus6.1 Bispectrometer, with either 45:0 or 0:45 (illumination-:viewing) geometry.6.1.1 The tolerance on the inclination of the 45-degree axisshall be 2 degrees (45 6 2 degrees).6.1.2 The tolerance on the 0-degree ax

21、is shall be 2 degreesfrom the normal (0 6 2 degrees).NOTE 2For maximum reproducibility smaller tolerances on the axisangles are recommended.6.1.3 For the 45:0 condition, the illumination geometry maybe annular, circumferential or uniplanar and the viewing shallbe normal to the specimen. For the 0:45

22、 condition, theillumination shall be normal to the specimen and the viewinggeometry may be annular, circumferential or uniplanar.6.1.4 The referee geometry shall be annular 45:0.NOTE 3Reciprocity between 45:0 and 0:45 geometry for commercialinstruments may not be observed in practice for retroreflec

23、tive materialsbecause of the variation in axis angles and aperture sizes of instruments.6.1.4.1 Circumferential instruments are acceptable providedthe procedure described in 9.3.1 is followed.6.1.4.2 Uniplanar instruments are acceptable provided theprocedure described in 9.3.2 is followed.6.1.5 The

24、referee aperture sizes shall be 10 degrees forillumination and 10 degrees for viewing. Use of aperture sizesdeviating from these may affect the measurement results. SeePractice E1767 for fundamentals of specification of apertures.NOTE 4Fluorescent colorimetric properties (for example, Fluores-cence

25、tristimulus values (XYZ)F) are not significantly influenced by theaperture sizes. Reflectance colorimetric properties (for example, Reflec-tance tristimulus values (XYZ)R) may be greatly affected by aperture sizes.Consequently total colorimetric properties (for example, Total tristimulusvalues (XYZ)

26、T) may be greatly affected.6.1.6 The illumination monochromator shall illuminate thespecimen over the wavelength range from 300 to 780 nm atintervals of 10 nm or less.6.1.7 The viewing monochromator shall detect the speci-men radiance over the wavelength range from 380 to 780 nmat intervals of 10 nm

27、 or less.6.1.8 The minimum illuminated sample area shall be 100mm2with no dimension less than 5 mm.6.2 Calibration Standards, as outlined in Practice E2153,supplied by the instrument manufacturer or obtained sepa-rately, with calibration values no older than 24 months.6.3 Verification StandardsVerif

28、ication of the precisionand bias of the entire system, including calculation of tristimu-lus values, shall be conducted on an annual basis usingnon-retroreflective/non-fluorescent, fluorescent/non-retroreflective and fluorescent retroreflective color standardswith calibration values traceable to an

29、accredited NationalStandards Laboratory. The calibration values for the verifica-tion panels shall be no older than 36 months.NOTE 5Stable fluorescent/non-retroreflective and fluorescent retrore-flective color artifact standards are not widely available as StandardReference Materials (SRMs). However

30、, measurement services are avail-able from Independent Testing Laboratories and National StandardsLaboratories to calibrate artifacts for use as Verification Standards.7. Test Specimen7.1 Specimen Preparations:7.1.1 Samples shall be tested mounted on the substrate thatwill be utilized for the intend

31、ed application. Apply the sampleto the substrate in accordance with the recommendations of thematerials manufacturer.7.1.2 If the sample is not supplied with its intended sub-strate, or if the intended substrate is not defined, then thesample shall be mounted or backed by a black panel, such as abla

32、ck tile. The black panel shall have a luminance factor (Y)ofless than 4 %.NOTE 6The measurement results will depend upon the spectralreflectance properties of the material behind the specimen as well as thespecimen thickness.7.1.3 Specimens should be uniform in physical propertiesover the area measu

33、red.7.1.4 Number of Test SpecimensMeasurements shall bemade on a minimum of 3 test specimens.7.1.5 Specimens that have been subjected to additionaltesting, such as outdoor or machine exposure testing, shall betested on the substrate used for these additional tests.7.2 Test ConditionsUnless otherwise

34、 specified, conditionall test specimens at a temperature of 23 6 2C and 50 6 5%relative humidity for 24 h prior to testing.7.3 SamplingUnless otherwise specified test samplesshall be selected according to the following sampling plan.7.3.1 Sheeting for Traffc Control ApplicationsTestsamples shall be

35、cut from 1 m2of sheeting. The test samplesshall be cut from the lower left corner, center and upper rightE2301 122corner of the sheeting as shown in Fig. 1. This insures testsamples reflect crossweb and downweb variability of thesheeting.7.3.1.1 For materials manufactured in widths less than 1 mthe

36、size of the sample shall be such that the width times thelength shall equal 1 m2(that is, length 3 width=1m2). Anexample is shown in Fig. 1B.7.3.2 Marking Materials for Personal Safety ApplicationsTest samples shall be cut from a 2 m length by sample width ofmaterial as shown in Fig. 2. Test samples

37、 shall be cut from thebeginning, middle and end of the 2 m long length of testmaterial. This insures test samples reflect variability of themarking material.7.3.3 Materials Subjected to Outdoor ExposureSamplingof materials subjected to outdoor exposure shall conform tothese sampling requirements to

38、the extent practical based onthe number and size of the exposed test specimen.8. Calibration and Verification8.1 Calibrate the bispectrometer in accordance with PracticeE2153,or8.2 Verify the accuracy of the instrumental data by measure-ment of a series of calibrated verification standards.9. Proced

39、ure9.1 Handle the specimen carefully; avoid touching the areato be measured.9.2 Clean the specimen prior to measurement as necessary,for example when measuring specimens that have been sub-jected to outdoor or machine exposure testing.9.2.1 Washing PanelsGently wash the panels using a softcloth or s

40、ponge and clean water or a dilute solution (1 % byweight in water, maximum concentration) of a mild detergent.After washing, rinse thoroughly with clean water, and blot drywith a soft clean cloth.After washing and drying, condition thepanels at room temperature for at least 2 h prior to conductingan

41、y property measurements.9.3 Position the test specimen at the measurement port ofthe instrument.9.3.1 If the measurement geometry is circumferential, thenthe testing laboratory must verify that the apertures in the ringare sufficiently close for the measurement to approximatemeasurement with annular

42、 geometry. This may depend on theoptical construction of the specimen, and must be determinedby the testing laboratory. Otherwise treat the instrument as auniplanar geometry (see 9.3.2).9.3.2 If the measurement geometry is uniplanar, then asequence of measurements shall be made on the same speci-men

43、 area at incremental rotations, and the measurement valuesshall be averaged over all the rotations. The number ofrotations must be sufficient to assure good approximation to anannular measurement. The number depends on the opticalconstruction of the specimen and must be determined by thetesting labo

44、ratory. The averaging over rotations shall beapplied to the values in the Donaldson matrix.9.4 Obtain the illuminant independent Donaldson matrix foreach test specimen at illumination and viewing samplingintervals of no greater than 10 nm (see Practice E2153 and theinstrument manufacturers instructi

45、ons).10. Calculation10.1 Tristimulus Values:10.1.1 Tristimulus Values for CIE D65Calculate the indi-vidual Total tristimulus values (XYZ)T, Reflectance tristimulusvalues (XYZ)Rand Fluorescence tristimulus values (XYZ)Fforeach test specimen from the respective Donaldson matrix forthe CIE 1931 Standar

46、d Observer and CIE D65 (see PracticeE2152).10.1.1.1 Calculate the averages and standard deviations forthe individual tristimulus values (X, Y, and Z) for eachcomponent (Total, Reflectance, and Fluorescence) for CIE D65for each set of test specimens:Total tristimulus values: XT-average = (S XT)/n; YT

47、-average=(S YT)/n; ZT-average = (S ZT)/n);Reflectance tristimulus values: XR-average = (S XR)/n;YR-average = (S YR)/n; ZR-average = (S ZR)/n);Fluorescence tristimulus values: XF-average = (S XF)/n;YF-average = (S YF)/n; ZF-average = (S ZF)/n10.1.2 Tristimulus Values for Daylight 15 000 KCalculatethe

48、 individual Total tristimulus values (XYZ)T, Reflectancetristimulus values (XYZ)Rand Fluorescence tristimulus values(XYZ)Ffor each test specimen from the respective Donaldsonmatrix for the CIE 1931 Standard Observer and Daylight15 000 K (see Practice E2152).10.1.2.1 The spectral power distribution f

49、or Daylight15 000 K shall be calculated in accordance with the proceduredescribed in CIE 15:2004 for other D Illuminants (tabulatedvalues at 10 nm intervals for CIE D65 and Daylight 15 000 Kare provided in Annex A1).10.1.2.2 Calculate the averages and standard deviations forthe individual tristimulus values (X, Y, and Z) for eachFIG. 1E2301 123component (Total, Reflectance, and Fluorescence) for Daylight15 000 K for each set of test specimens.10.2 Colorimetric Quantities:10.2.1 CIE 1931 Total Chromaticity Coordinates (x,y) forCIE D65Calculate the average