ASTM D6966-2003 Standard Practice for Collection of Settled Dust Samples Using Wipe Sampling Methods for Subsequent Determination of Metals《金属连续测定用擦拭取样法选定的沉降粉尘样品的收集用标准实施规程》.pdf

《ASTM D6966-2003 Standard Practice for Collection of Settled Dust Samples Using Wipe Sampling Methods for Subsequent Determination of Metals《金属连续测定用擦拭取样法选定的沉降粉尘样品的收集用标准实施规程》.pdf》由会员分享，可在线阅读，更多相关《ASTM D6966-2003 Standard Practice for Collection of Settled Dust Samples Using Wipe Sampling Methods for Subsequent Determination of Metals《金属连续测定用擦拭取样法选定的沉降粉尘样品的收集用标准实施规程》.pdf（4页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: D 6966 03Standard Practice forCollection of Settled Dust Samples Using Wipe SamplingMethods for Subsequent Determination of Metals1This standard is issued under the fixed designation D 6966; the number immediately following the designation indicates the year oforiginal adoption or, in t

2、he case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice covers the collection of settled dust onsurfaces using the wipe sampli

3、ng method. These samples arecollected in a manner that will permit subsequent extractionand determination of target metals in the wipes using labora-tory analysis techniques such as atomic spectrometry.1.2 This practice does not address the sampling designcriteria (that is, sampling plan which inclu

4、des the number andlocation of samples) that are used for clearance, hazardevaluation, risk assessment, and other purposes. To provide forvalid conclusions, sufficient numbers of samples should beobtained as directed by a sampling plan.1.3 This practice contains notes that are explanatory and arenot

5、part of the mandatory requirements of this practice.1.4 The values stated in SI units are to be regarded as thestandard.1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-pr

6、iate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2D 1356 Terminology Relating to Sampling and Analysis ofAtmospheresD 4840 Guide for Sample Chain-of-Custody ProceduresE 1792 Specification for Wipe Sampl

7、ing Materials for Leadin Surface Dust3. Terminology3.1 For definitions of terms not listed here, see TerminologyD 1356.3.2 Definitions:3.2.1 batch, na group of field or quality control (QC)samples that are collected or processed together at the sametime using the same reagents and equipment.3.2.2 sa

8、mpling location, na specific area within a sam-pling site that is subjected to sample collection.3.2.2.1 DiscussionMultiple sampling locations are com-monly designated for a single sampling site (see 3.2.3).3.2.3 sampling site, na local geographic area that containsthe sampling locations (see 3.2.2)

9、.3.2.3.1 DiscussionA sampling site is generally limited toan area that is easily covered by walking.3.2.4 wipe, na disposable towellette that is moistenedwith a wetting agent. (E 1792)3.2.4.1 DiscussionThese towellettes are used to collectsamples of settled dust on surfaces for subsequent determina-

10、tion of metals content in the collected dust.3.3 Definitions of Terms Specific to This Standard:3.3.1 field blank, na wipe (see 3.2.4) that is exposed to thesame handling as field samples except that no sample iscollected (no surface is actually wiped).3.3.1.1 DiscussionAnalysis results from field b

11、lanks pro-vide information on the analyte background level in the wipe,combined with the potential contamination experienced bysamples collected within the batch (see 3.2.1) resulting fromhandling.4. Summary of Practice4.1 Wipe samples of settled dust are collected on surfacesfrom areas of known dim

12、ensions with wipes satisfying certainrequirements, using a specified pattern of wiping.4.2 The collected wipes are then ready for subsequentsample preparation and analysis for the measurement of metalsof interest.5. Significance and Use5.1 This practice is intended for the collection of settled dust

13、samples for the subsequent measurement of target metals. Thepractice is meant for use in the collection of settled dustsamples that are of interest in clearance, hazard evaluation, riskassessment, and other purposes.1This practice is under the jurisdiction of ASTM Committee D22 on Samplingand Analys

14、is of Atmospheres and is the direct responsibility of SubcommitteeD22.04 on Workplace Atmospheres.Current edition approved October 1, 2003. Published December 2003.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Boo

15、k of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.5.2 This practice is recommended for the collection ofsettled dust samples from ha

16、rd, relatively smooth nonporoussurfaces. This practice is less effective for collecting settleddust samples from surfaces with substantial texture such asrough concrete, brickwork, textured ceilings, and soft fibroussurfaces such as upholstery and carpeting. Collection efficiencyfor metals such as l

17、ead from smooth, hard surfaces has beenfound to exceed 75 % (E 1792).6. Apparatus and Materials6.1 Sampling TemplatesOne or more of the following: 10cm by 10 cm (minimum dimensions) reusable or disposablealuminum or plastic template(s), or disposable cardboardtemplates, (full-square, rectangular, sq

18、uare “U-shaped,” rect-angular “U-shaped,” or “L-shaped,” or both); or templates ofalternative areas having accurately known dimensions (seeNote 1). Templates shall be capable of lying flat on a surface.NOTE 1For most surfaces, it is recommended to collect settled dustfrom a minimum surface area of 1

19、00 cm2to provide sufficient material forsubsequent laboratory analysis. However, larger areas (for example, 30 cmby 30 cm) may be appropriate for surfaces having little or no visiblesettled dust, while a smaller sampling area (for example, 10 cm by 10 cm)may be appropriate for surfaces with high lev

20、els of visible settled dust. Itis recommended to have a suite of templates with various samplingdimensions.6.2 Wipes, for collection of settled dust samples fromsurfaces. Wipes shall be individually wrapped and fully wetted.The background metal(s) content of the wipes should be as lowas possible. At

21、 a maximum, the background level of targetmetal(s) shall be no more than one-tenth the target concentra-tion the metal(s) to be measured.NOTE 2Wipes meeting the requirements of Specification E 1792 maybe suitable.6.3 Sample Containers, sealable, rigid-walled, 30-mL mini-mum volume.NOTE 3Screw-top pl

22、astic centrifuge tubes are an example of asuitable rigid-walled sample container.NOTE 4Use of a sealable plastic bag for holding and transporting thesettled dust wipe sample is not recommended due to the potential loss ofcollected dust within the plastic bag during transportation and laboratoryhandl

23、ing. Quantitative removal and processing of the settled dust wipesample by the laboratory is significantly improved through the use ofsealable rigid-walled containers.6.4 Measuring Tool, tape or ruler, capable of measuring tothe nearest 60.1 cm.6.5 Plastic Gloves, powderless.6.6 Cleaning Cloths, for

24、 cleaning of templates and otherequipment.NOTE 5Wipes used for dust sampling (6.2) can be used for cleaningtemplates and other sampling equipment, but other cleaning cloths orwipes not meeting the requirements described in (6.2) may be suitable forthis purpose.6.7 Adhesive Tape, suitable for securin

25、g the template(s) tothe surface(s) to be sampled, and for demarcating samplingareas if templates are not used.NOTE 6Masking tape, for example, functions well for these purposes.6.8 Disposable Shoe Covers, optional.7. Procedure7.1 Use one of the following two procedures for collectingsettled dust sam

26、ples from each sampling location. For wide,flat locations, it is recommended to use the template-assistedsampling procedure (see 7.1.1.2(a). For small locations (forexample, window sill, section of a piece of equipment, orportion of a vehicle interior), it will ordinarily be necessary touse the conf

27、ined-area sampling procedure (see 7.1.1.2(b).NOTE 7Metal contamination problems during field sampling can besevere and may affect subsequent wipe sample analysis results. Contami-nation can be minimized through frequent changing of gloves, use of shoecovers (see 6.8), and regular cleaning of samplin

28、g equipment withcleaning cloths (see 6.6). Use of disposable shoe covers between differentlocations, and removal of them prior to leaving the sampling site orentering vehicles, can be helpful in minimizing inadvertent transfer ofcontaminated dust from one location to another.7.1.1 Sampling Procedure

29、:7.1.1.1 Don a pair of clean, powderless, plastic gloves (see6.5 and Note 7).7.1.1.2 Use either a template-assisted sampling procedure(a) or tape-defined sampling procedure (b):(a.) Carefully place a clean template on the surface to besampled in a manner that minimizes disturbance of settled dustat

30、the sampling location. Tape the outside edge of the templateto prevent the template from moving during sample collection.(b.) Alternatively, mark the defined area to be sampled withadhesive tape (6.7) being careful not to disturb the settled dust,and measure the area to be sampled using the measurin

31、g tool(6.4).7.1.1.3 Obtain a wipe (6.2) and, if there is a possibility forthe package containing the wipe to be contaminated with dust,clean the outside of the package with a cleaning cloth (6.6).7.1.1.4 Remove the wipe from its package, and inspect thewipe to ensure that it is fully wetted and not

32、contaminated withdust or other material. Discard the wipe if it is found to be toodry or contaminated, or both.7.1.1.5 Using an open flat hand with the fingers together,place the wipe on the surface to be sampled. Wipe the selectedsurface area, side to side, in an overlapping “S” or “Z” patternwhile

33、 applying pressure to the fingertips (refer to Figs. 1 and2). Wipe the surface so that the entire selected surface area iscovered. Perform the wiping procedure using the fingers andnot the palm of the hand.7.1.1.6 Repeat 7.1.1.5 using a different brand of wipe (afterselecting a different sampling lo

34、cation) if the wipe originallyused significantly changes shape (for example, rolls up bycurling) or tears during the wiping process.NOTE 8Some surfaces (for example, rough surfaces) may causecertain wipes to curl up or otherwise significantly change shape during thewiping process. A type of wipe tha

35、t maintains its integrity should beselected for each surface sampled.7.1.1.7 Fold the wipe in half with the collected dust sidefolded inward and repeat the preceding wiping procedure(7.1.1.5) within the selected sampling area using an up anddown overlapping “S” or “Z” pattern at right angles to the

36、firstwiping (see Figs. 1 and 2 and Note 9).NOTE 9Wipes are folded to envelop the collected dust within thewipe, to avoid loss of the collected dust, and to expose a clean wipeD6966032surface for further dust collection from the sampling location. For sampleareas containing large amounts of settled d

37、ust, care must be taken duringwiping to capture all of the dust present within the wipe.7.1.1.8 Fold the wipe in half again with the collected dustside folded inward and repeat the wiping procedure one moretime, concentrating on collecting settled dust from edges andcorners within the selected surfa

38、ce area (see Figs. 1 and 2 andNote 9).7.1.1.9 Fold the wipe again with the collected dust sidefolded inward and insert the wipe into a sample container (6.3).7.1.1.10 Label the sample container with sufficient informa-tion to uniquely and indelibly identify the sample, and recordthe dimensions (in s

39、quare centimetres) of the selected samplingarea (that is, the internal dimensions defined by the template orthe taped area). Discard the gloves.7.2 Collect field blanks at a minimum frequency of 5 % (atleast one field blank for every 20 wipe samples collected). Theminimum number of field blanks to c

40、ollect for each batch ofwipe samples used shall be three. Place field blanks in samplecontainers and label these samples in the same fashion as thecollected surface dust samples (see 7.1.1.10).7.3 Follow sampling chain of custody procedures to ensuresample traceability. Ensure that the documentation

41、 whichaccompanies the samples is suitable for a chain of custody tobe established in accordance with Guide D 4840.8. Records8.1 Field data related to sample collection shall be docu-mented in a sample log form or field notebook (see Note 10).If field notebooks are used, then they shall be bound with

42、pre-numbered pages. All entries on sample data forms and fieldnotebooks shall be made using ink, with the signature and dateof entry. Any entry errors shall be corrected by using only asingle line through the incorrect entry (no scratch outs),accompanied by the initials of the person making the corr

43、ec-tion, and the date of the correction (see Note 11).NOTE 10Field notebooks are useful for recording field data evenwhen preprinted sample data forms are used.NOTE 11These procedures are important to properly document andtrace field data.8.2 At a minimum, the following information shall bedocumente

44、d:8.2.1 Project or client name, address, and city/state/countrylocation.8.2.2 General sampling site description.NOTE 1Only the center of the wiping path is shown, not the entire wiping width. Fig. 1a) shows the first “S” wiping pattern over the surface areato be sampled; Fig 1b) demonstrates the sec

45、ond “S” wiping course over the surface; and Fig. 1c) shows the final wiping which is targeted toward edgesand corners.FIG. 1 Schematic of a Side-to-Side Overlapping “S” Wiping PatternNOTE 1Only the center of the wiping path is shown, not the entire wiping width. Fig. 2a) shows the first “Z” wiping p

46、attern over the surface areato be sampled; Fig 2b) demonstrates the second “Z” wiping course over the surface; and Fig. 2c) shows the final wiping which is targeted toward edgesand corners.FIG. 2 Schematic of a Side-to-Side Overlapping “Z” Wiping PatternD69660338.2.3 Information as to the specific c

47、ollection protocol used(for example, template-assisted; “Z”-wiping pattern, etc.).8.2.4 Information as to the specific type or brand of wipesused, including manufacturer and lot number.8.2.5 Information on quality control (QC) samples: whichsamples are associated with what group of field blanks.8.2.

48、6 For each sample collected (including field blanks): anindividual and unique sample identifier and date of collection.This information shall be recorded on the sample container inaddition to the field documentation.8.2.7 For field samples (not including field blanks), recordin field documentation (

49、field notebook or sample log form) thedimensions of each area sampled (in square centimetres).8.2.8 For each sample collected: name of person collectingthe sample, and specific sampling location information fromwhich the sample was removed.9. Keywords9.1 metals measurement; sample collection; settled dust;surfaces; wipeASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent r