ASTM D3756-2018 Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields.pdf
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1、Designation: D3756 97 (Reapproved 2010)D3756 18Standard Test Method forEvaluation of Resistance to Electrical Breakdown by Treeingin Solid Dielectric Materials Using Diverging Fields1This standard is issued under the fixed designation D3756; the number immediately following the designation indicates
2、 the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.INTRODUCTIONWhen failure occurs in solid organic dielectric
3、s that are subjected to very high, continuous, andnonuniform electrical gradients, it generally occurs by a mechanism called treeing. Materials ofdifferent molecular structures have different degrees of resistance to failure by treeing, and thisresistance can sometimes be increased by the addition o
4、f other materials in low concentration.2Trees that grow by a molecular degradation mechanism resulting from partial discharge (corona) arecalled electrical trees to distinguish them from water and electrochemical trees which are quitedifferent.This test method makes use of two opposing thin cylindri
5、cal electrodes, one sharpened to a point,the other with a hemispherical end. They are molded or inserted into blocks of the material to betested. Because of the shape of the electrodes this is often called a needle test. This test provides astatistical estimate of electrical treeing initiation and p
6、ropagation of solid dielectric materials in high,diverging electrical fields.1. Scope1.1 This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiationor growth, or both, of tubular tree-like channels resulting from partial discharge (
7、corona) and molecular decomposition that occurin the region of very high, diverging electric fields.3,41.2 This test method is primarily for use at a power frequency of 50 or 60 Hz.1.3 The test may is able to be carried out at room temperature or temperatures above or below room temperature. Thetemp
8、erature shouldshall not exceed the softening or melting point of the sample material.1.4 This test method can be used for any solid material into which needles can be cast, molded, or inserted with heat aftermolding. The resistance to tree initiation is measured by the double-needle characteristic v
9、oltage, which is only applicable tonon-opaque materials so that tree can be observed optically. The resistance to tree initiation and growth is reported by thedouble-needle voltage life, which is applicable to both opaque and non-opaque materials.1.5 The values stated in SI units are to be regarded
10、as the standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and determine theapplicability of regulato
11、ry limitations prior to use.1.7 This international standard was developed in accordance with internationally recognized principles on standardizationestablished in the Decision on Principles for the Development of International Standards, Guides and Recommendations issuedby the World Trade Organizat
12、ion Technical Barriers to Trade (TBT) Committee.1 This test method is under the jurisdiction of ASTM Committee D09 on Electrical and Electronic Insulating Materials and is the direct responsibility of SubcommitteeD09.12 on Electrical Tests.Current edition approved Oct. 1, 2010Nov. 1, 2018. Published
13、 October 2010November 2018. Originally approved in 1990. Last previous edition approved in 20042010as D3756 97 (2010).(2004). DOI: 10.1520/D3756-97R10.10.1520/D3756-18.2 Symposium on Engineering Dielectrics, ASTM STP 783, ASTM, 1982, and Symposium on Engineering Dielectrics, ASTM STP 926, ASTM, 1986
14、.3 W. D. Wilkens, Chapter 7, “Statistical Methods for the Evaluation of Electrical Insulating Systems,” Engineering Dielectrics, Vol IIB, Electrical Properties of SolidInsulating Materials, Measurement Techniques, R. Bartnikas, Editor, ASTM STP 926, ASTM, Philadelphia, 1987.4 R. M. Eichorn, Chapter
15、4, “Treeing in Solid Organic Dielectric Materials,” Engineering Dielectrics, Vol IIA, Electrical Properties of Solid Insulating Materials:Molecular Structure and Electrical Behavior, R. Bartnikas and R. M. Eichorn, Editors, ASTM STP 783, ASTM Philadelphia, 1983.This document is not an ASTM standard
16、and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases onl
17、y the current versionof the standard as published by ASTM is to be considered the official document.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States12. Referenced Documents2.1 ASTM Standards:5D149 Test Method for Dielectric Breakdown V
18、oltage and Dielectric Strength of Solid Electrical Insulating Materials atCommercial Power FrequenciesD1711 Terminology Relating to Electrical InsulationD1928 Practice for Preparation of Compression-Molded Polyethylene Test Sheets and Test Specimens (Withdrawn 2001)6D2275 Test Method for Voltage End
19、urance of Solid Electrical Insulating Materials Subjected to Partial Discharges (Corona) onthe Surface2.2 Other Document:ANSI/IEEE 930-1987 IEEE Guide for the Statistical Analysis of Electrical Insulation Voltage Endurance Data73. Terminology3.1 Definitions:3.1.1 partial discharge, nrefer to D1711.3
20、.2 Definitions of Terms Specific to This Standard:3.2.1 characteristic voltage or DNCV (double-needle characteristic voltage), nthat voltage which, when applied for 1 h 1 hbetween the ends of two thin cylindrical electrodes (one sharpened to a point, the other with a hemispherical end) in a group of
21、replicate specimens, produces observable dielectric damage at the point of the sharp electrode in half of the specimens.3.2.2 median voltage life (t50), nthe time, determined from a Weibull plot, when 50 % failure occurs from a group of 10tenidentical specimens subjected to the same voltage stress.4
22、. Summary of Method4.1 In this test method, specimens are prepared and needles inserted to serve as electrodes. Voltage is applied to the needles andcontinued for 1 h in the double-needle characteristic voltage test or until electrical breakdown occurs in the double-needle voltagelife test. Results
23、are expressed as the voltage at which half of the specimens show dielectric damage in 1 h, or the median timeto failure of a group of specimens subjected to a given continuous voltage, at a selected or predetermined temperature.5. Significance and Use5.1 This is a laboratory test designed to simulat
24、e the effects of (1) the presence of rough interfaces between conductor orsemiconductive screen and primary insulation in an insulation system, (2) the presence of foreign particles (contaminants) in aninsulation system, and (3) the presence of small voids or cavities within the insulation.5.2 This
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