REG NASA-LLIS-1412-2004 Lessons Learned Plasma Arcs from Pyro Firing May Cause Prolonged NSI Shorts (2003).pdf
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1、Lessons Learned Entry: 1412Lesson Info:a71 Lesson Number: 1412a71 Lesson Date: 2004-04-19a71 Submitting Organization: JPLa71 Submitted by: Joseph Savino/Carol DumainSubject: Plasma Arcs from Pyro Firing May Cause Prolonged NSI Shorts (2003) Abstract: NSI firing circuit design has not previously take
2、n into account the high probability of plasma shorts and subsequent hard-shorting, as seen during testing on MER, which allowed ground (chassis) return current during pyrotechnic events. Mars Exploration Rover experience has shown that molten NSI fragments can cause a prolonged NSI pin-to-case short
3、 that can damage flight hardware. Thirteen design, analysis, inspection, and test recommendations in the areas of Parts Selection and Reliability Analysis, Power/Pyro Design, and System Grounding are offered to account for this possibility.Description of Driving Event: During integration and test of
4、 Mars Exploration Rover (MER-A), the 6-amp, Single Point Ground (SPG) fuse-located on the Rover Electronics Module (REM) chassis was found to be blown. The JPL MER SPG Fuse was part of a system design that provided a grounded power bus (through the fuse) while safely allowing for the fault condition
5、 of a high-side power bus short-to-chassis by blowing the fuse and operating in a “degraded“ mode (floating bus). (Since the NSI power source return was connected through the fuse to chassis, plasma short currents went through it.) The blown fuse was in turn attributed to the firing of six pyros fou
6、r weeks earlier to permit removal and rework of a circuit board. Electrical overstress analysis and tests cleared MER-A to fly with the embedded blown fuse, but the failure investigation revealed a previously unrecognized “plasma effect” failure mechanism for NASA Standard Initiators (NSIs).Provided
7、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-refer to D descriptionDProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-refer to D descriptionDProvided by IHSNot for ResaleNo reproduction or networking permitt
8、ed without license from IHS-,-,-refer to D descriptionDBy design, NASA pyro devices such as cable cutters, pin pullers, and separation nuts incorporate two NSIs. NSI firing always generates some conductive plasma, and MER firing circuits were designed to withstand a pin-to-pin or pin-to-case plasma
9、arc lasting around 5-6 milliseconds after the NSI bridgewire opened. However, designers were unaware that a prolonged NSI pin-to-case short could result due to deposition of molten NSI residual. Thus, the number and magnitude of plasma shorts/ hard shorts on MER were much higher than expected. Pin-t
10、o-case metal deposition occurs after the plasma arc is extinguished, due to zirconium fragments forming a conductive path across the ceramic charge cup. The MER investigation revealed that the path resistance will increase after NSI cool-down, but the resistance will remain too low to safely limit c
11、urrent until the firing relay opens (32 milliseconds) or until the SPG fuse blows. The results may damage circuit components because the firing circuit current is significantly higher during the short, and the circuit elements are not sized to withstand this higher current for a full 32 milliseconds
12、. Later bench tests showed that, depending on circuit parameters, ground fault currents of as much as 15-20 amps for 32 milliseconds were possible.This incident led to a JPL-wide search for all NSIs fired during ground test on flight hardware. They were examined to verify that their resistance, as m
13、easured from the “high side” to the case, post-fire, exceeded 100 kilohm, indicating little shorting effects.These shorting effects do not affect whether the NSI will fire properly since they occur after the firing. Once the NSI fires (within the first millisecond), its job is done and what happens
14、to the remaining circuit components afterwards is moot. The real problem is firing NSIs during test. That is when circuit components may be damaged to the point where the circuit will fail to fire the next time Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
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