BS EN 60191-6-16-2007 Mechanical standardization of semiconductor devices - Glossary of semiconductor tests and burn-in sockets for BGA LGA FBGA and FLGA《半导体器件的机械标准化 球栅阵列封装(BGA) 栅格.pdf
《BS EN 60191-6-16-2007 Mechanical standardization of semiconductor devices - Glossary of semiconductor tests and burn-in sockets for BGA LGA FBGA and FLGA《半导体器件的机械标准化 球栅阵列封装(BGA) 栅格.pdf》由会员分享,可在线阅读,更多相关《BS EN 60191-6-16-2007 Mechanical standardization of semiconductor devices - Glossary of semiconductor tests and burn-in sockets for BGA LGA FBGA and FLGA《半导体器件的机械标准化 球栅阵列封装(BGA) 栅格.pdf(14页珍藏版)》请在麦多课文档分享上搜索。
1、 g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58devices Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGAT
2、he European Standard EN 60191-6-16:2007 has the status of a British StandardICS 31.080.01Mechanical standardization of semiconductor BRITISH STANDARDBS EN 60191-6-16:2007BS EN 60191-6-16:2007This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31
3、July 2007 BSI 2007ISBN 978 0 580 55248 9Amendments issued since publicationAmd. No. Date Commentscontract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.National forewordThis British Standard is the UK implementatio
4、n of EN 60191-6-16:2007. It is identical to IEC 60191-6-16:2007.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to i
5、nclude all the necessary provisions of a EUROPEAN STANDARD EN 60191-6-16 NORME EUROPENNE EUROPISCHE NORM June 2007 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue
6、 de Stassart 35, B - 1050 Brussels 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60191-6-16:2007 E ICS 31.080.01 English version Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tes
7、ts and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007) Normalisation mcanique des dispositifs semi-conducteurs - Partie 6-16: Glossaire des supports de test et de dverminage pour les BGA, LGA, FBGA et FLGA (CEI 60191-6-16:2007) Mechanische Normung von Halbleiterbauelementen - Teil
8、6-16: Glossar fr Fassungen fr die Prfung und Voralterung von BGA, LGA, FBGA und FLGA (IEC 60191-6-16:2007) This European Standard was approved by CENELEC on 2007-05-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this Europe
9、an Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (Engli
10、sh, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, B
11、elgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Forewor
12、d The text of document 47D/679/FDIS, future edition 1 of IEC 60191-6-16, prepared by SC 47D, Mechanical standardization for semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60191-6-16 on 2007-05-01. The follo
13、wing dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-02-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2010-05-01 Annex ZA has been a
14、dded by CENELEC. _ Endorsement notice The text of the International Standard IEC 60191-6-16:2007 was approved by CENELEC as a European Standard without any modification. _ EN 60191-6-16:2007 2 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES Part 6-16: Glossary of semiconductor tests and burn-in
15、sockets for BGA, LGA, FBGA and FLGA 1 Scope This part of IEC 60191 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA. This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA. 2 Normative refer
16、ences The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60191-1:1966, Mechanical standardizatio
17、n of semiconductor devices Part 1: Preparation of outline drawings of semiconductor devices IEC 60191-2:1966, Mechanical standardization of semiconductor devices Part 2: Dimensions IEC 60191-3:1999, Mechanical standardization of semiconductor devices Part 3: General rules for the preparation of outl
18、ine drawings of integrated circuits IEC 60191-4:1999, Mechanical standardization of semiconductor devices Part 4: Coding system and classification into forms of package outlines for semiconductor devices 3 Terms and definitions For the purposes of this document, the following terms and definitions a
19、pply. NOTE 1 Long terms are indicated in two lines. NOTE 2 A symbol indicates the dimensional symbol in drawing. NOTE 3 A dash (-) in the columns of “Drawing part” and “Symbol” indicates no correspondence to symbols or drawing parts. EN 60191-6-16:2007 3 3.1 General Table 1 General No. Term Definiti
20、on Symbol Drawing part 101 IC socket connector to electrically connect and mechanically hold IC package - - 102 production socket socket used in the production of PCB assemblies for electrical equipment to facilitate package replacement - - 103 test and burn-in socket socket mainly used for electric
21、al characteristics test, burn-in and reliability test of package with its production process. Designed for reliable contact, durable actuation and high environmental operating temperature - - 104 clamshell type socket socket having a style that surrounds the package with hinged base and lid - Figure
22、 1 105 open-top type socket socket having a style to load/unload package from the top opening of socket by pressing down the cover mechanism - Figure 2 3.2 Clamshell type Table 2 Clamshell type No. Term Definition Symbol Drawing part 201 base base part to hold contacts and other socket parts and to
23、be assembled on PCB - Figure 1(1) 202 lid part making a pair with base whose function is to hold the package - Figure 1(2) 203 latch latch to fix the cover with base at closed position - Figure 1(3) 204 hinge hinge to join base and lid - Figure 1(4) 205 alignment plate supporting part to align termi
24、nals with through holes on PCB for ease of socket terminal insertion - Figure 1(5) 206 alignment pin pin mounted on socket to define relative position of socket with PCB - Figure 1(6) 207 contact electrically connecting part of socket consisting of contact point with package lead and terminal portio
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