GOST R ISO IEC 10373-3-2011 Identification cards Test methods Part 3 Integrated circuit cards with contacts and related interface devices《识别卡 试验方法 第3部分 带触点和相关接口设备的集成电路卡》.pdf

《GOST R ISO IEC 10373-3-2011 Identification cards Test methods Part 3 Integrated circuit cards with contacts and related interface devices《识别卡 试验方法 第3部分 带触点和相关接口设备的集成电路卡》.pdf》由会员分享，可在线阅读，更多相关《GOST R ISO IEC 10373-3-2011 Identification cards Test methods Part 3 Integrated circuit cards with contacts and related interface devices《识别卡 试验方法 第3部分 带触点和相关接口设备的集成电路卡》.pdf（46页珍藏版）》请在麦多课文档分享上搜索。

1、 /10373-32011 3 ISO/IEC 10373-3:2010Identification cards Test methods Part 3: Integrated circuit cards with contacts and related interface devices(IDT) 27 2002 . 184- , 1.02004 . 1 - () 22 , 42 22 3 13 2011 . 1007-4 / 10373-3:2010 . . 3: - (ISO/IEC 10373-3:2010 Identification cards Testmethods Part

2、3: Integrated circuit cards with contacts and related interface devices). - , - 5 6 , 4, - . () () , - . - () . , , 2013 , - - II / 10373-320111 12 13 24 , 24.1 24.2 .24.3 .24.4 .24.5 .24.6 34.7 .34.7.1 ( ) .34.7.2 ( IFD) 64.7.3 .104.8 105 .125.1 VCC .125.1.1 .125.1.2 125.1.3 .135.2 I/ 135.2.1 .135.

3、2.2 135.2.3 .145.3 LK .145.3.1 .145.3.2 145.3.3 .155.4 RST .155.4.1 .155.4.2 155.4.3 .165.5 SPU (C6).166 166.1 -166.1.1 - (R) .166.1.2 166.2 =0176.2.1 I/ =0.176.2.2 I/ =0 .176.2.3 I/ =0.176.3 =1186.3.1 I/ =1.186.3.2 I/ =1 196.3.3 (CWT) .196.3.4 IFD (CWT).206.3.5 (BGT).206.3.6 216.3.7 226.3.8 226.3.9

4、 .23III / 10373-320116.3.10 IFSD .236.3.11 IFD .247 IFD .247.1 .247.1.1 .247.1.2 247.1.3 .257.2 VCC .257.2.1 .257.2.2 257.2.3 .267.3 I/ 267.3.1 .267.3.2 267.3.3 .277.4 CLK .277.4.1 .277.4.2 277.4.3 .297.5 RST .297.5.1 .297.5.2 297.5.3 .307.6 SPU (6).307.7 .307.7.1 .307.7.2 307.7.3 .308 IFD 308.1 -30

5、8.1.1 ( ) .308.1.2 ( ) 318.2 =0318.2.1 I/ =0.318.2.2 I/ =0 .318.2.3 I/ =0.328.3 =1328.3.1 I/ =1 .338.3.2 I/ =1 338.3.3 (CW).348.3.4 IFD 348.3.5 (BGT).358.3.6 IFD .358.3.7 IFD .378.3.8 IFSC 378.3.9 378.4 IFD IFD .388.4.1 .388.4.2 388.4.3 .38 () .39IV / 10373-32011 3 Identification cards. Test methods

6、. Part 3. Integrated circuit cards with contacts and related interface devices 201301011 ( ) - , / 7816. , / 7816, - , , . , . , . / 10373-1 , , - . , , - . -. , , / 7816-3. IFD, -, , . . , - . , , . - :- , , -, ;- , , , - , .2 :/ 7810:2003 . (ISO/IEC 7810:2003, Identification cards Physical charact

7、eristics)1 / 10373-32011 / 7816-3:2006 . . 3. (ISO/IEC 7816-3:2006, Identification cards Integratedcircuit cards Part 3: Cards with contacts Electrical interface and transmission protocols)/ 7816-4:2005 . . 4., (ISO/IEC 7816-4:2005, Identificationcards Integrated circuit cards Part 4: Organization,

8、security and commands for interchange)3 :3.1 (card): , / 7816.3.2 DUT (device under test): IFD, .3.3 -etu (etu-factor): , (PPS), / 7816-3, 6.3.13.4 IFD (interface device): / 7816-3.3.5 (normal use): , / 7810:2003, 4.1, , - , , .3.6 (test method): .3.7 (test scenario): , - , , -.3.8 , (typical protoc

9、ol andapplication specific communication): DUT - , , DUT, .4 , 4.1 , - 23 C c177 3 C, 40 % 60 %, .4.2 , 24 , .4.3 - , .4.4 (, -) (, -) c177 5 %, .4.5 , -, .2 / 10373-320114.6 GND () , , , .4.7 4.7.1 (- )4.7.1.1 VCC (UCC) 1 VCC UCC A, B, C 1 6 c177 20 tR,tF A, B, C 0 500 c177 100 4.7.1.2 ICC 2 ICC IC

10、C 0 200 c177 2 20 0 100 c177 1 1 0 200 c177 10 1 4.7.1.3 SPU (C6). 5.5 / 7816-3.4.7.1.4 RST 3 RST UIH, UIL A, 1 6 c177 20 UIH C 1 2 c177 20 UIL C 1 1 c177 20 tR,tF02 c177 20 tR tF 10 % 90 % UH min UL max.4.7.1.5 RST 4 RST IIH 30 200 c177 10 100 IIL 200 30 c177 10 100 3 / 10373-320114.7.1.6 I/O 5 I/O UIH, UIL: ,: A, 1 6 c177 20 UIH: ,: C 1 2 c177 20 UIL: ,: C 1 1 c177 20 tR,tF: ,: 02 c177 100 tR tF 10 % 90 % UH min UL max.4.7.1.7 I/O 6 I/O ( ) IIH: ,: 300 30 c177 10 100 IIL: ,: 1,5 0,2 c177 50 100 : ,: