BS EN 120004-1988 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Ambient rated photocouplers with phototransisto.pdf

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1、BRITISH STANDARD BS EN 120004:1993 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Ambient rated photocouplers with phototransistor output The European Standard EN 120004:1992 has the status of a British Sta

2、ndard.BSEN120004:1993 BSI 05-2000 ISBN 0 580 34140 2 Amendments issued since publication Amd. No. Date of issue Comments 8003 October 1993 Indicated by a sideline in the marginBSEN120004:1993 BSI 05-2000 i Contents Page National foreword ii Foreword 2 Foreword iii Text of CECC 20004 1BSEN120004:1993

3、 ii BSI 05-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)20004:1987 “Harmonized system of quality assessment for electronic components. Blank deta

4、il specification: Ambient rated photocouplers with phototransistor output”. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those use

5、d in British Standards; attention is drawn especially to the following. In 1992 the CENELEC Electronics Components Committee (CECC) accepted CECC20004:1987 as European Standard EN120004:1992. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a

6、 full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality” Part2:1983 “Specification for national implementation of CECC basic rules and rules of proc

7、edure”. The Technical Committee has reviewed the provisions of IEC191-2, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. A related British Standard for IEC191-2, published by the International Electrotechnical Commission, is

8、 BS3934“Specification for dimensions of semiconductor devices and integrated electronic circuits”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC20000 in any detail specification for the

9、se devices. With respect to Issue1, the most important changes are the additional requirements for photocouplers specified to bridge basic or supplementary insulation or to bridge double or reinforced insulation. Detail specification layout. The front page layout of detail specifications released to

10、 BS CECC family or blank detail specifications will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Stand

11、ard does not of itself confer immunity from legal obligations. International Standard a Corresponding British Standard CECC 20000:1982 BS CECC 20000:1983 Harmonized system of quality assessment for electronic components: Generic specification: Semiconductor optoelectronic and liquid crystal devices

12、(Identical) a Undated in text. Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, the EN title page, page 2, the CECC title page, pages ii to iv, pages1to14 and aback cover. This standard has been updated (see copyright date) and may have had amendments inco

13、rporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 120004 July 1992 UDC: Supersedes CECC 20004 Issue 2:1987 Descriptors: Quality, electronic components, photocouplers English version Blank Detail Specification: Ambie

14、nt rated photocouplers with phototransistor output Spcification Particulire Cadre: Photocoupleurs temprature ambiante spcifie, avec phototransistor en sortie Vordruck fr Bauartspezifikation: Umgebungsbezogene Optokoppler mit Fototransistor-Ausgang This European Standard was approved by the CENELEC E

15、lectronic Components Committee (CECC) on27 January 1992. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical reference

16、s concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a C

17、ENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands

18、, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation E

19、lectrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1992 Copyright reserved to CENELEC members Ref. No. EN 120004:1992 EEN120004:1992 BSI 05-2000 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those m

20、ember countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality as

21、sessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECCWG20, “Opt

22、o-Electronic Components and Liquid Crystal Devices”. The text of the draft based on document CECC20004 Issue2:1987 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3006 the following documents were approv

23、ed by CECC as EN120004 on27January1992: CECC 20004 Issue 1:1987 with Amendment 1 The following dates were fixed: latest date of announcement of the EN at national level (doa) 1992-12-22 latest date of publication of an identical national standard (dop) 1993-06-22 latest date of declaration of nation

24、al standards obsolescence 1993-06-22 latest date of withdrawal of conflicting national standards (dow) 2002-12-22EN120004:1992 ii BSI 05-2000 Contents Page Foreword iii 1 Mechanical description 1 2 Short description 1 3 Levels(5) of quality assessment 1 4 Limiting values 1 5 Electrical characteristi

25、cs 3 6 Marking 4 7 Ordering information 4 8 Test conditions and inspection requirements 4 9 Additional information 9 Appendix A Endurance test conditions and limits 10EN120004:1992 BSI 05-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of th

26、e European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures f

27、or electronic components, and by the grant of an internationally recognized Mark, or certificate, of Conformity. The components produced under the system are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prep

28、ared for those countries taking part in the system who wish to issue national harmonized specifications for AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTOR OUTPUT. It should be read in conjunction with the current Regulations for the CECC System At the date of printing of this specification, the me

29、mber countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the UnitedKingdom. Preface This new edition of this blank detail specification was prepared by CECC Working group 20: “SEMICONDUCTOR O

30、PTOELECTRONIC AND LIQUID CRYSTAL DEVICES”. It is one of a series of blank detail specifications for semiconductor devices, based on the generic specification CECC20000. With respect to issue 1 the most important changes are the additional requirement for photocouplers specified to bridge basic or su

31、pplementary insulation or to bridge double or reinforced insulation. Voting The amendments inserted in this Issue2 were circulated to the CECC for voting in documents listed below and were ratified by the president of the CECC for printing as a CECC Specification. NOTEThis specification is published

32、 initially in English and French. The German text will follow as soon as it has been prepared. Documents Voting dates Reports on voting CECC(Secretariat)1831 January 1986 CECC(Secretariat)1900 CECC(Secretariat)1855 March 1986 CECC(Secretariat)1920iv blankEN120004:1992 BSI 05-2000 1 AMBIENT RATED PHO

33、TOCOUPLER WITH PHOTOTRANSISTOR OUTPUT Name (address) of responsible ONH (and possibly of body from which specification is available) ) Page of CECC 20004-XXX * CECC detail specification number plus issue number and/or date ELECTRONIC COMPONENT OF ASSESSED QUANTITY IN ACCORDANCE WITH: CECC 20000, iss

34、ue 1 and national references if different + National number of detail specification This box may not be used if national number includes CECC number , 1Mechanical description / DETAIL SPECIFICATION FOR: - Either outline references (code A) or base andcase references (codes B + C): Type number (s) of

35、 relevant device (s) and, if appropriate structurally similar devices from IEC 191-2: national if applicable ORDERING INFORMATION: seeclause7 of this specification OUTLINE DRAWING AND CONNECTIONS (Terminal connected to case, if any) 2Short description . Semiconductor material: Ga As/S1 . Encapsulati

36、on: metal/glass/plastic/ . Application: Isolated signal transmission Power: ambient-rated (T amb ) may be transferred to, or given with more details in, clause 9 of this specification It should be stated here if the device is suitable tobridge basic or supplementary insulation or tobridge double or

37、reinforced insulation. MARKING: letters and figures/colour code see2.5 of CECC20000 and/or clause 6 of this specification Polarity indication if special method is used Some important quick reference data may be added 3Level(s) of quality assessment Class S, T or V (according to endurance test) 0 4 L

38、imiting values (Absolute maximum rating system) 1 These apply over the operating temperature range, unless otherwise stated. X denotes that d value shall be inserted in the detail specification Clause Repeat only clause numbers used, with text. Additional values, ifany shall be given at the appropri

39、ate place without clause number(s). Curves should preferably be given in clause 9 of this specification Symbol Value min. max. Unit 4.1 Operating ambient temperature T amb X X C 4.2 Storage temperatures T stg X X C 4.3 Soldering temperature Soldering time and minimum distance to case shall be given

40、Recommended mounting conditions (temperature, duration .) may be given in clause 9 of this specification T sld X C 4.4 Input reverse voltage V R X V 4.5 Collector emitter voltage I B= 0 V CEO X V 4.6 Where there is a base connection, collector base voltage with I E= 0 V CBO X V 4.7.1 Where there is

41、a base connection emitter base voltage with I C= 0 V EBO X V (Continued on next page) Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200: Qualified Products List.EN120004:1992 2 BSI 05-2000 NOTEAll input terminals shall be

42、 short-circuited and all output terminals shall be short-circuited. Clause Repeat only clause numbers used, with text. Additional values, ifany shall be given at the appropriate place without clause number(s). Curves should preferably be given in clause9 of this specification Symbol Value Unit min.

43、max. and/or 4.7.2 Emitter collector voltage (where there is no base connection) V ECO X V 4.8 Input-to-output working voltage (device operating) V IOWM X V 4.9 Continuous input forward current at T amb= 25 C see derating curve or derating factor I F X mA 4.10 Peak input forward current at T amb= 25

44、C under specified pulse condition. See derating curve or derating factor. I FRM X A 4.11 Output transistor Power dissipation at T amb= 25 C P (output) X W 4.12 Total package power dissipation at T amb= 25 C See derating curve and/or derating factor P tot X W ISOLATION RELATED VALUES 4.13 Continuous

45、or repetitive peak isolation voltage (45 Hz to 65 Hz) (see NOTE) V IORM X V 4.14 Where appropriate, surge isolation voltage 1,2 4s/50 4s pulses of each polarity (see NOTE) V IOSM (X) V 4.15 Where appropriate, external air gap (clearance) Inputterminals to output terminals V IO1 (X) 4.16 Where approp

46、riate, external tracking path (creepage distance) Input terminals to output terminals V IO2 (X) 4.17 Where appropriate, tracking resistance (“KB-value”) according to IEC 112 V TR (X) ADDITIONAL REQUIREMENTS FOR PHOTOCOUPLERS INTENDED TO BRIDGE BASIC OR SUPPLEMENTARY INSULATION OR TO BRIDGE DOUBLE OR

47、 REINFORCED INSULATION Operation of the device at the following limiting values may lead to permanent damage and satisfactory operation may no longer be assumed. However, the isolation resistance (see sub-clause5.12) shall not be impaired and shall stay within the specified limits. The case shall no

48、t burst nor shall parts break away and the case shall not melt or burst into flame. 4.18 Ambient temperature X C 4.19 Maximum input voltage (d.c. and/or r.m.s.) X V 4.20 Maximum input current (d.c. and/or r.m.s.) X A 4.21 Maximum output voltage (d.c. and/or r.m.s.) X V 4.22 Maximum output current (d

49、.c. and/or r.m.s.) X AEN120004:1992 BSI 05-2000 3 5 Electronic characteristic See clause 8 of this specification for inspection requirements (Groups A and C) Signs between brackets correspond to characteristic given as “Where appropriate” or as alternatives: Those characteristic marked “where appropriate” in this clause and in the inspection section shall either be committed or if specified, shall then be measured. For equivalent characteristics given as alternatives, the choose should preferably be