ISO IEC IEEE 15939-2017 Systems and software engineering - Measurement process《系统和软件工程 测量过程》.pdf
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1、Systems and software engineering Measurement process Ingnierie des systmes et du logiciel Processus de mesure INTERNATIONAL STANDARD ISO/IEC/ IEEE 15939 Reference number ISO/IEC/IEEE 15939:2017(E) First edition 2017-0 5 ISO/IEC 2017 IEEE 2017 ii ISO/IEC/IEEE 15939:2017(E) COPYRIGHT PROTECTED DOCUMEN
2、T ISO/IEC 2017, Published in Switzerland IEEE 2017 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without pr
3、ior written permission. Permission can be requested from either ISO or IEEE at the address below or ISOs member body in the country of the requester. ISO copyright office Institute of Electrical and Electronics Engineers, Inc Ch. de Blandonnet 8 CP 401 3 Park Avenue, New York CH-1214 Vernier, Geneva
4、, Switzerland NY 10016-5997, USA Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org stds.iprieee.org www.iso.org www.ieee.orgISO/IEC/IEEE 15939:2017(E) ISO / IEC 2017 All rig h ts reserve d IEEE 2017 All righ ts r ese r ved iiiContents Page 1 Scope 1 2 Normative references . 1 3 Terms and d
5、efinitions 1 4 Conformance 6 4.1 Intended usage 6 4.2 Tailoring this document . 6 4.3 Full conformance to outcomes . 6 4.4 Full conformance to tasks . 7 4.5 Tailored conformance 7 5 Application of this document . 7 6 Measurement Process 10 6.1 Purpose 10 6.2 Outcomes . 10 6.3 Activities and Tasks 10
6、 6.3.1 Establish and sustain measurement commitment. 10 6.3.2 Prepare for measurement. . 11 6.3.3 Perform measurement. . 15 6.3.4 Evaluate measurement. . 17 Annex A (inf o rmat ive) The measurement information model . 19 A.1 General . 19 A.2 Model description . 20 A.2.1 Entity . 20 A.2.2 Attribute .
7、 20 A.2.3 Base measure 20 A.2.4 Derived measure . 21 A.2.5 Indicator . 21 A.2.6 Measurable concept . 22 A.3 Examples 22 A.3.1 A productivity example . 22 A.3.2 A quality example 23 A.3.3 A project progress example . 24 Annex B (inf o rmat ive) Measurement process information items and records 26 Ann
8、ex C (inf o rmat ive) Example criteria for selecting measures . 28 Annex D (inf o rmat ive) Example criteria for evaluating an information product 30 D.1 General . 30 D.2 Use of information products 30 D.3 Confidence in an information product . 30 D.4 Evidence of fitness for purpose of an informatio
9、n product . 30 D.5 Understandability of information products . 31 D.6 Satisfaction of the assumptions of an indicator model . 31 D.7 Accuracy of a measurement procedure . 31 D.8 Repeatability of a measurement method 32 D.9 Reproducibility of a measurement method 32 Annex E (inf o rmat ive) Example c
10、riteria for evaluating the performance of the measurement process 33 E.1 General . 33 E.2 Timeliness . 33 E.3 Efficiency 33 E.4 Defect containment 33 E.5 Customer satisfaction 33 E.6 Process compliance 33 ISO/IEC/IEEE 15939:2017(E) iv ISO / IEC 2017 All rig h ts reserve d IEEE 2017 All righ ts rese
11、r vedAnnex F (informat ive) Example elements of measurement planning . 34 Annex G (inf o rmat ive) Guidelines for reporting information items 35 List of Figures Figure 1 Measurement process model 9 Figure A.1 Key relationships in the measurement information model . 19 Figure A.2 Measurement construc
12、t for “productivity” 23 Figure A.3 Measurement construct for “quality” 24 Figure A.4 Measurement construct for “progress” . 25 Figure B.1 Information items and records of measurement activities 27 ISO/IEC/IEEE 15939:2017(E) ISO / IEC 2017 All rig h ts reserve d IEEE 2017 All righ ts r ese r ved vFor
13、eword ISO (the I nternation al O rganizat ion for Sta n da rdizat ion) a nd I E C ( t he I nterna tion al Electro techni ca l Commis s ion) f orm the spec ialized sys t em f or w orldwi d e s t a nd ardi z a tion. N a tion al b odies t ha t a r e members o f ISO or I EC p a r ti ci p a te i n th e d
14、e ve lopme n t of I nte r n a ti o n al S t a nd a rd s thr o ugh tech nical co mmit t ees e st ablished by t he r espective or ganiz a ti on t o de al w ith par t icu l ar f ields o f te chni c a l a c ti vi ty. ISO an d IEC te chni c a l c o m m i t t e e s c o l l a b o r a t e i n f i e l d s o
15、f m u t u a l i n t e r e s t . O t h e r i n t e rnatio nal or ganiz a tions, g overnm ental and n o n g o vernment a l , in lia ison with ISO a n d IEC, a lso take p a r t in t h e w o r k . In t he f ield o f informati o n technology, ISO and IEC h a ve established a joint t echnica l committ ee,
16、 ISO/IEC J TC 1. IEEE Stan dar d s documents are de velope d within t he IEEE Societie s and the S t and a rd s Co ordin a ting C om mit t ees of t he I EEE Stan dards Association (IEE ESA) Stan dards B o ar d. T h e IEEE develops i ts s tandards t hr ough a consensu s d e v elopment p r ocess, a p
17、p rov e d by t he A m e rican N a tion al St a n da rd s Ins t it ut e, which bring s t og ether volunt eers represent i ng v aried viewpoint s a nd i nt erest s t o a c hi e v e t h e f i na l product . Volunt eers a r e not necessa rily m embers o f t h e Inst it ut e a nd serve wit h out compensa
18、 tion. While the IEEE administers the proce s s a n d e s t a b l i s h e s r u l e s t o p r o m o t e f a i r n e s s i n t h e c o n s e n s u s d e v e lopment process, the I EEE does n ot i n de pe nde n tl y e v alua te , te s t , or verify the a ccur a cy o f a n y of t he inf o rmat ion cont
19、a in ed in it s st a n d a rd s . Inte rna t i o n a l St and a rd s are dr af te d i n a c c o rd ance wi t h the rule s given in the IS O /I EC Directives, P ar t 2. At te nti o n i s c alle d t o t he p ossi b i li ty t h a t i mple me n ta ti on o f th i s s t a n d a r d m a y r e q u i r e t h
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