IEEE C37 26-2014 en Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits《低压(1000 V AC或更低)电感试验电路功率因数的测量方法指南.pdf

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1、 IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003) IEEE Std C37.26-

2、2014 (Revision of IEEE Std C37.26-2003) IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 21 August 2014 IEEE-SA Standards Board Abstract: Methods for determining

3、the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current test

4、ing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuit

5、s (under 1000 V ac) but may also be used for higher voltages. Keywords: IEEE C37.26, inductive test circuits, power factor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers,

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32、ably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inqu

33、iries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advise

34、d that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE guide

35、 was completed, the IEEE C37.26 Working Group had the following membership: T. W. Olsen, Chair Keith Flowers, Vice Chair R. Paul Barnett Douglas J. Edwards Louis Grahor Randall Groves Chad Kennedy Albert Livshitz The following members of the individual balloting committee voted on this guide. Ballot

36、ers may have voted for approval, disapproval, or abstention. R. Paul Barnhart William Bloethe Ted Burse Carl Bush William Bush William Byrd Eldridge Byron Gary Donner Randall Dotson Douglas J. Edwards Keith Flowers Doaa Galal Louis Grahor Randall Groves Ajit Gwal Gary Heuston Harry Josten Laszlo Kad

37、ar John Kay Yuri Khersonsky Jim Kulchisky Chung-Yiu Lam Albert Livshitz John McClelland T. David Mills Daleep Mohla Charles Morse Michael Newman T. W. Olsen Amit Patel Bansi Patel Edward Peters Michael Roberts Richard Rohr Bartien Sayogo Nikunj Shah Michael Swearingen John Vergis Yingli Wen Larry Yo

38、nce Jian Yu When the IEEE-SA Standards Board approved this guide on 21 August 2014, it had the following membership: John Kulick, Chair Jon Rosdahl, Vice Chair Rich Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faur

39、e Gary Hoffman Mike Janezic Jeffrey Katz Joseph Koepfinger* David Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Copyright 2014 IEEE. All rights reserved. vii Also included are the fol

40、lowing nonvoting IEEE-SA Standards Board liaisons: Dick DeBlasio, DOE Representative Mike Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Erin Spiewak IEEE-SA Standards Technical Community Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not pa

41、rt of IEEE Std C37.26-2014, IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits. This guide covers methods used to measure the power factor in low-voltage test circuits. Because the power- factor measurement for high-capacity test circuits

42、is particularly difficult and different methods may yield different results, the methods that are least likely to yield error are recommended in this guide for any particular circuit condition. This low-voltage guide was originally created and issued in 1972 as a compatible companion to the high- vo

43、ltage American National Standards Institute (ANSI) C37.05-1964 (R1969), American National Standard Methods for Determining the Values of a Sinusoidal Current Wave and a Normal-Frequency Recovery Voltage for AC High-Voltage Circuit Breakers, and ANSI C37.5-1969, American National Standard Methods for

44、 Determining Values of a Sinusoidal Current Wave, Normal-Frequency Recovery Voltage, and a Guide for Calculation of Fault Currents for Application of AC High-Voltage Circuit Breakers Rated on a Total Current Basis. The original guide served for many years, as use of the methods in this guide over se

45、veral decades demonstrated the validity of the methods. It was revised in 2003 with few, if any, fundamental changes. This revision again makes only minor changes, as the underlying physics have not changed. Where possible, references have been changed to undated references (so that the latest versi

46、on always applies); to coordinate with this change, references to specific clauses or tables in other standards have been changed to refer to the subject instead of the precise clause number. Changes have also been made in selected word usage. It is recognized that laboratories may utilize computer-based data acquisition and analysis programs that may calculate values of the test power factor. Such programs should be validated to assure that the results obtained are consistent with values obtained using the methods in this guide.