IEEE 1484 13 6-2015 en IEEE Recommended Practice for Learning Technology-Open Archives Initiative Object Reuse and Exchange Abstract Model (OAI CORE)-Mapping to.pdf
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1、IEEE Recommended Practice for Learning TechnologyOpen Archives Initiative Object Reuse and Exchange Abstract Model (OAIORE)Mapping to the Conceptual Model for Resource Aggregation Sponsored by the Learning Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Computer So
2、ciety IEEE Std 1484.13.6-2015IEEE Std 1484.13.6-2015IEEE Recommended Practice for Learning TechnologyOpen Archives Initiative Object Reuse and Exchange Abstract Model (OAIORE)Mapping to the Conceptual Model for Resource AggregationSponsorLearning Technology Standards Committeeof theIEEE Computer Soc
3、ietyApproved 16 February 2015IEEE-SA Standards BoardCopyrights and permissionsDefinitions in scope notes in Clause 7 and Clause 8 are reprinted from ORE SpecificationVocabulary, copyright 17 October 2008 http:/www.openarchives.org/ore/1.0/vocabulary.html with permission from the Open Archives Initia
4、tive.Grateful acknowledgmentsThe Resource Aggregation Models for Learning, Education, and Training (RAMLET) Working Group would like to thank Revelytix, Inc., for making available the Knoodl ontology tools that were used to aid in the development and maintenance of the ontology files.Abstract: Speci
5、fied in this recommended practice are how the elements and attributes defined in the Open Archives Initiative Object Reuse and Exchange (OAIORE) Abstract Model and expressed in the OAIORE Resource Map Implementation in RDF/XML relate to the components of the conceptual model for resource aggregation
6、 defined in IEEE Std 1484.13.1-2012.Keywords: aggregation format, conceptual model, content aggregation, digital aggregation, digital resource, IEEE 1484.13.6, OAIORE, Open Archives Initiative Object Reuse and Exchange Abstract Model, RAMLET, resource aggregation, resource aggregation formatThe Inst
7、itute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2015 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 March 2015. Printed in the United States of America.IEEE is a registered trademark in the U.
8、S. Patent marks of W3C are registered and held by its host institutions MIT, ERCIM, Keio, and Beihang.XMLExtensible Markup Language; Language by W3Cclaimed as a trademark or generic term by MIT, ERCIM, and/or Keio on behalf of the W3C.PDF: ISBN 978-0-7381-9557-5 STD20122Print: ISBN 978-0-7381-9558-2
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