IEC 62007-2-2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 Measuring methods《光纤系统用半导体光电器件.第2部分 测量方法》.pdf

《IEC 62007-2-2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 Measuring methods《光纤系统用半导体光电器件.第2部分 测量方法》.pdf》由会员分享，可在线阅读，更多相关《IEC 62007-2-2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 Measuring methods《光纤系统用半导体光电器件.第2部分 测量方法》.pdf（82页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 62007-2 Edition 2.0 2009-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor optoelectronic devices for fibre optic system applications Part 2: Measuring methods Dispositifs optolectroniques semiconducteurs pour application dans les systmes fibres optiques Partie 2: Mthodes de mesure I

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16、estions, visitez le FAQ du Service clients ou contactez-nous: Email: 11Hcsciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62007-2 Edition 2.0 2009-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor optoelectronic devices for fibre optic system applications Part 2: Measuring methods

17、 Dispositifs optolectroniques semiconducteurs pour application dans les systmes fibres optiques Partie 2: Mthodes de mesure INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE W ICS 31.080.01; 31.260; 33.180.01 PRICE CODE CODE PRIX ISBN 2-8318-1023-6 Registered trade

18、mark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 62007-2 IEC:2009 CONTENTS FOREWORD. 0H4 INTRODUCTION. 1H6 1 Scope. 2H7 2 Normative references . 3H7 3 Terms, definitions and abbreviations 4H7 3.1 Terms and definitions 5H7 3.2 Abbre

19、viations 6H8 4 Measuring methods for photoemitters. 7H8 4.1 Outline of the measuring methods . 8H8 4.2 Radiant power or forward current of LEDs and LDs with or without optical fibre pigtails 9H8 4.3 Small signal cut-off frequency (f c ) of LEDs and LDs with or without optical fibre pigtails 10H9 4.4

20、 Threshold current of LDs with or without optical fibre pigtails 11H10 4.5 Relative intensity noise of LEDs and LDs with or without optical fibre pigtails 12H12 4.6 S 11parameter of LEDs, LDs and LD modules with or without optical fibre pigtails 13H13 4.7 Tracking error for LD modules with optical f

21、ibre pigtails, with or without cooler 14H15 4.8 Spectral linewidth of LDs with or without optical fibre pigtails 15H17 4.9 Modulation current at 1 dB efficacy compression (I F (1 dB) ) of LEDs 16H18 4.10 Differential efficiency ( d ) of a LD with or without pigtail and an LD module 17H20 4.11 Differ

22、ential (forward) resistance r dof an LD with or without pigtail 18H22 5 Measuring methods for receivers 19H23 5.1 Outline of the measuring methods . 20H23 5.2 Noise of a PIN photodiode. 21H23 5.3 Excess noise factor of an APD with or without optical fibre pigtails 22H25 5.4 Small-signal cut-off freq

23、uency of a photodiode with or without optical fibre pigtails 23H27 5.5 Multiplication factor of an APD with or without optical fibre pigtails 24H28 5.6 Responsivity of a PIN-TIA module . 25H30 5.7 Frequency response flatness (S/S) of a PIN-TIA module 26H32 5.8 Output noise power (spectral) density P

24、 no, of a PIN-TIA module 27H33 5.9 Low frequency output noise power (spectral) density (P no , LF ) and corner frequency (f cor ) of a PIN-TIA module 28H35 5.10 Minimum detectable power of PIN-TIA module 29H36 Bibliography 30H38 Figure 1 Equipment setup for measuring radiant power and forward curren

25、t of LEDs and LDs 31H8 Figure 2 Circuit diagram for measuring small-signal cut-off frequency LEDs and LDs 32H10 Figure 3 Circuit diagram for measuring threshold current of a LD. 33H11 Figure 4 Graph to determine threshold current of lasers. 34H11 Figure 5 Circuit diagram for measuring RIN of LEDs an

26、d LDs 35H12 Figure 6 Circuit diagram for measuring the S 11parameter LEDs, LDs and LD modules 36H14 62007-2 IEC:2009 3 Figure 7 Cathode and anode connected to the package of a LD 37H15 Figure 8 Output radiant power versus time. 38H16 Figure 9 Output radiant power versus case temperature 39H16 Figure

27、 10 Circuit diagram for measuring linewidth of LDs. 40H17 Figure 11 Circuit diagram for measuring 1 dB efficacy compression of LDs 41H19 Figure 12 Plot of log V 2versus log I 1 . 42H20 Figure 13 Circuit diagram for measuring differential efficiency of a LD . 43H21 Figure 14 Current waveform for diff

28、erential efficiency measurement 44H21 Figure 15 Circuit diagram for measuring differential resistance 45H22 Figure 16 Current waveform for differential resistance . 46H23 Figure 17 Circuit diagram for measuring noise of a PIN photoreceiver . 47H24 Figure 18 Circuit diagram for measuring noise with s

29、ynchronous detection 48H25 Figure 19 Circuit diagram for measuring excess noise of an APD. 49H26 Figure 20 Circuit diagram for measuring small-signal cut-off wavelength of a photodiode 50H28 Figure 21 Circuit diagram for measuring multiplication factor of an APD 51H29 Figure 22 Graph showing measure

30、ment of I R1and I R2 . 52H30 Figure 23 Circuit diagram for measuring responsivity of a PIN-TIA module 53H31 Figure 24 Circuit diagram for measuring frequency response flatness of a PIN-TIA module 54H32 Figure 25 Circuit diagram for measuring output noise power (spectral) density of a PIN-TIA module

31、under matched output conditions. 55H34 Figure 26 Circuit diagram for measuring output noise power (spectral) density of a non-irradiated PIN-TIA module in the low frequency region. 56H35 Figure 27 Graph of V mversus frequency 57H36 Figure 28 Circuit diagram for measuring minimum detectable power of

32、a PIN-TIA module at a specified bit-error rate (BER) or carrier-to-noise ratio (C/N) 58H37 4 62007-2 IEC:2009 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SEMICONDUCTOR OPTOELECTRONIC DEVICES FOR FIBRE OPTIC SYSTEM APPLICATIONS Part 2: Measuring methods FOREWORD 1) The International Electrotechnical

33、Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end

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43、h patent rights. International Standard IEC 62007-2 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre optics. This second edition cancels and replaces the first edition published in 1997, and its amendment 1(1998). It is a technical r

44、evision. This edition includes the following significant technical changes with respect to the previous edition: a) descriptions related to analogue characteristics have been removed; b) some definitions and terms have been revised for harmonisation with other standards originating from SC 86C. 6200

45、7-2 IEC:2009 5 The text of this standard is based on the following documents: FDIS Report on voting 86C/868/FDIS 86C/870/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accord

46、ance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 62007 series can be found, under the general title Semiconductor optoelectronic devices for fibre optic system applications, on the IEC website. The committee has decided that the contents of this publication will remain unchan

47、ged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 6 62007-2 IEC:2009 INTRODUCTION Semiconductor op

48、tical signal transmitters and receivers play important roles in optical information networks. This standard covers the measurement procedures for their optical and electrical properties that are intended for digital communication systems. These properties are essential to specify their performance.

49、62007-2 IEC:2009 7 SEMICONDUCTOR OPTOELECTRONIC DEVICES FOR FIBRE OPTIC SYSTEM APPLICATIONS Part 2: Measuring methods 1 Scope This part of IEC 62007 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. All optical fibres and cables that are defi