SAE ARP 1360A-2001 Detection of Chloride and Bromide Contamination of Electronic Equipment《电子设备氯化物和溴化物污染的检测》.pdf

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1、AEROSPACERECOMMENDEDPRACTICEARP1360REV.AIssued 1975-06ReaffirmedRevised 2001-04Superseding ARP1360Detection of Chloride and Bromide Contamination of Electronic Equipment1. SCOPE:1.1 Purpose:This recommended practice covers a test for detecting residual chlorides and bromides on electronicequipment.1

2、.2 The detailed procedures noted herein are based on laboratory and production experience and reflect those design practices and fabrication procedures, such as wave soldering, that require the use of activated flux for solder connections. This procedure has been used as a means of satisfying the in

3、tent of MIL-STD-454, Requirement 5, which permits the use of only R or RMA flux.1.3 Application:Primarily to establish qualitatively and quickly the effectiveness of cleaning processes used during production operations to remove chloride and bromide contamination.2. PREPARATION OF SOLUTIONS:2.1 Chlo

4、ride and/or Bromide-Free Water:Rinse water shall be distilled or deionized water having resistivity not lower than 1 megohm-cm, measured using an in-line cell.2.2 Silver Nitrate Solution:Shall be approximately 5% by weight silver nitrate in chloride/bromide-free water containing 1 mL of 70% nitric a

5、cid per liter of solution.20 0310-SAE Technical Standards Board Rules provide that: “This report is published by SAE to advance the state of technical and engineering sciences. The use of this report is entirely voluntary, and its applicability and suitability for any particular use, including any p

6、atent infringement arising therefrom, is the sole responsibility of the user.” SAE reviews each technical report at least every five years at which time it may be reaffirmed, revised, or cancelled. SAE invites your written comments and suggestions. Copyright 2010 SAE International All rights reserve

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9、with SAENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SAE ARP1360 Revision A- 2 -3. PROCEDURE:3.1 Rinse surfaces to be tested with water meeting the requirements of 2.1, adjusting quantity of water used as required to rinse desired amount of surface area. Quantit

10、y of rinse water should be kept to a minimum. Drops of rinse water may be used on small, localized areas.3.2 Drain rinse water into suitable glassware that has been adequately rinsed with water in accordance with 2.1 or, in case small amounts of rinse water are used, transfer rinse water by means of

11、 clean pipette or dropper to a properly rinsed test tube or black spot plate.3.3 Large quantities of rinse water may be reduced in volume to increase test sensitivity by boiling off excess water.3.4 Add silver nitrate solution (see 2.2) at a ratio of one drop of reagent per 200 mL of rinse water. In

12、 a darkened room, beam a focusable spot light through the glass beaker containing the rinse solution. Examine for turbidity, using Tyndall effect by observing at right angles to the beam, against a dull black background. Rinse water shall be considered bromide and chloride-free if no turbidity appea

13、rs within two minutes.3.4.1 The standard used for turbidity comparison shall be the source water used for rinsing, with the silver nitrate test solution added as in the chloride test, and contained in glassware or spot plate of the same diameter as used in the actual test.3.4.2 Because of the high s

14、ensitivity of this test when run in a darkened room, the exterior of the glassware must be clean in order to avoid light-scattering which could interfere with chloride haze observation.4. NOTES:4.1 The change bar ( l ) located in the left margin is for the convenience of the user in locating areas w

15、here technical revisions, not editorial changes, have been made to the previous issue of this specification. An (R) symbol to the left of the document title indicates a complete revision of the specification, including technical revisions. Change bars and (R) are not used in original publications, n

16、or in specifications that contain editorial changes only.4.2 Processes involving use of solutions or compounds containing chlorides and/or bromides, such as soft soldering, etching, and plating, must be followed by adequate cleaning to ensure removal of chlorides and bromides. Electronic assemblies

17、are subject to contamination during all phases of manufacturing and testing and must be properly cleaned prior to conformal coating and final assembly, after which further cleaning for the removal of ionic contamination is not possible. Subject testing can be used to determine the presence of contam

18、ination at various stages of assembly and thereby ensure chloride and bromide-free final assemblies.Copyright SAE International Provided by IHS under license with SAENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SAE ARP1360 Revision A- 3 -4.3 ARP1332 contains a s

19、imilar chloride ion test which requires a 24-hour waiting period between sampling and measuring. This method requires only two minutes between sampling and measuring and is more adaptable to production line operations.PREPARED UNDER THE JURISDICTION OFAMS COMMITTEE “B”Copyright SAE International Provided by IHS under license with SAENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-