ECA EIA-60384-8-2017 Fixed Capacitors for Use in Electronic Equipment - Part 8 Sectional Specification Fixed Capacitors of Ceramic Dielectric Class 1.pdf

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1、EIASTANDARDFixed Capacitors for Use in Electronic Equipment - Part 8: Sectional Specification: Fixed Capacitors of Ceramic Dielectric, Class 1EIA-60384-8 (IEC 60384-8:2015, IDT) November 2017 Electronic Components Industry Association ANSI/EIA-60384-8-2017 Approved: November 1, 2017 EIA-60384-8NOTIC

2、EEIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the

3、 proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications

4、 preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not a

5、ssume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60384-8:2015 Edition 4: Fixed Capacitors for Use in Electronic Equipment - Part 8:

6、 Sectional Specification Fixed Capacitors of Ceramic Dielectric, Class 1. This document is the EIA Standard EIA-60384-8-2017: Fixed Capacitors for Use in Electronic Equipment - Part 8: Sectional Specification Fixed Capacitors of Ceramic Dielectric, Class 1.The text, figures and tables of IEC 60384-8

7、:2015 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for infor

8、mation purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regu

9、latory limitations before its use. (From Standards Proposal No. 5390.03, formulated under the cognizance of the Steering Committee for Passive Electronic Components Standards (S-1).Published by Electronic Components Industry Association 2017 Engineering Department 2214 Rock Hill Road, Suite 265 Hern

10、don, VA 20170 PLEASE ! DONT VIOLATE THE LAW!This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS Markit 15 Inverness

11、Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956) i CONTENTS FOREWORD . v1 General . 11.1 Scope . 11.2 Object . 11.3 Normative references 11.4 Information to be given in a detail specification . 11.4.1 General . 11.4.2 Outline drawing and dimensi

12、ons 21.4.3 Mounting . 21.4.4 Ratings and characteristics 21.4.5 Marking . 31.5 Terms and definitions 31.6 Marking . 31.6.1 General . 31.6.2 Marking for code of temperature coefficient . 41.6.3 Marking on the body 41.6.4 Marking of the packaging . 41.6.5 Additional marking . 42 Preferred ratings and

13、characteristics . 42.1 Preferred characteristics . 42.2 Preferred values of ratings 42.2.1 Rated temperature . 42.2.2 Rated voltage (UR) 52.2.3 Category voltage (UC) . 52.2.4 Preferred values of nominal capacitance and associated tolerance values 52.2.5 Temperature coefficient () 53 Quality assessme

14、nt procedures . 93.1 Primary stage of manufacture . 93.2 Structurally similar components 93.3 Certified test records of released lots 93.4 Qualification approval . 93.4.1 General . 93.4.2 Qualification approval on the basis of the fixed sample size procedure 93.4.3 Tests . 103.5 Quality conformance

15、inspection 153.5.1 Formation of inspection lots . 153.5.2 Test schedule 163.5.3 Delayed delivery 163.5.4 Assessment levels . 164 Test and measurement procedures 174.1 General . 174.2 Visual examination and check of dimensions 174.3 Electrical tests 174.3.1 Capacitance 174.3.2 Tangent of loss angle (

16、tan ) . 18ii 4.3.3 Insulation resistance (Ri) . 184.3.4 Voltage proof . 194.4 Temperature coefficient () and temperature cyclic drift of capacitance 204.4.1 General . 204.4.2 Preliminary drying 204.4.3 Measuring conditions . 204.4.4 Requirements 204.5 Robustness of terminations . 204.6 Resistance to

17、 soldering heat . 204.6.1 General . 204.6.2 Initial measurement . 204.6.3 Test conditions 204.6.4 Final inspection, measurements and requirements. 204.7 Solderability 214.7.1 General . 214.7.2 Test conditions 214.7.3 Final inspection, measurements and requirements. 214.8 Rapid change of temperature

18、(if required) . 214.8.1 General . 214.8.2 Initial measurement . 214.8.3 Test conditions 214.8.4 Recovery . 214.9 Vibration . 224.9.1 General . 224.9.2 Test conditions 224.9.3 Final inspection, measurements and requirements. 224.10 Bump (repetitive shock) 224.10.1 General . 224.10.2 Initial measureme

19、nts . 224.10.3 Test conditions 224.10.4 Final inspection, measurements and requirements. 224.11 Shock (non-repetitive shock) . 234.11.1 General . 234.11.2 Initial measurements . 234.11.3 Test conditions 234.11.4 Final inspection, measurements and requirements. 234.12 Climatic sequence. 244.12.1 Gene

20、ral . 244.12.2 Initial measurements . 244.12.3 Dry heat 244.12.4 Damp heat, cyclic, Test Db, first cycle . 244.12.5 Cold. 244.12.6 Low air pressure 244.12.7 Damp heat, cyclic, Test Db, remaining cycles 244.13 Damp heat, steady state . 254.13.1 General . 254.13.2 Initial measurement . 254.13.3 Test c

21、onditions 25iii 4.13.4 Recovery . 264.13.5 Final inspection, measurements and requirements. 264.14 Endurance 274.14.1 General . 274.14.2 Initial measurement . 274.14.3 Test conditions 274.14.4 Recovery . 274.14.5 Final inspection, measurements and requirements. 274.15 Component solvent resistance (i

22、f required) . 284.16 Solvent resistance of the marking (if required) 28Annex A (normative) Figures with limits of variation of capacitance with temperature for certain temperature coefficients and classes 29Bibliography 38Figure A.1 : +100 (106/K) . 29Figure A.2 : 0 (106/K) 30Figure A.3 : 33 (106/K)

23、 . 31Figure A.4 : 75 (106/K) . 31Figure A.5 : 150 (106/K) . 32Figure A.6 : 220 (106/K) . 33Figure A.7 : 330 (106/K) . 33Figure A.8 : 470 (106/K) . 34Figure A.9 : 750 (106/K) . 34Figure A.10 : 1 000 (106/K) 35Figure A.11 : 1 500 (106/K) 35Figure A.12 : 2 200 (106/K) 36Figure A.13 : 3 300 (106/K) 36Fi

24、gure A.14 : 4 700 (106/K) 37Figure A.15 : 5 600 (106/K) 37Table 1 Preferred tolerances on nominal capacitance 5Table 2 Nominal temperature coefficient and tolerances 6Table 3 Combination of temperature coefficient and tolerance . 7Table 4 Sampling plan together with numbers of permissible non-confor

25、ming items for qualification approval tests, assessment level EZ 11Table 5 Test schedule for qualification approval. 12Table 6 Lot-by-lot inspection 16Table 7 Periodic tests 17Table 8 Tangent of loss angle 18Table 9 Insulation resistance requirements 19Table 10 Test voltages for single layer ceramic

26、 capacitors . 19Table 11 Test voltages for leaded multilayer ceramic capacitors 19Table 12 Temperature cyclic drift limits 20iv Table 13 Requirements 21Table 14 Preferred severities (of non-repetitive shock) 23Table 15 Maximum capacitance change . 23Table 16 Number of damp heat cycles . 25Table 17 F

27、inal inspection, measurements and requirements 25Table 18 Test conditions for damp heat, steady state . 26Table 19 Final inspection, measurements and requirements 26Table 20 Endurance test conditions . 27Table 21 Final inspection, measurements and requirements 27v INTERNATIONAL ELECTROTECHNICAL COMM

28、ISSION_ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1 FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committee

29、s (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Rep

30、orts, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and

31、non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements

32、 of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and ar

33、e accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote inte

34、rnational uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

35、the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All use

36、rs should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or oth

37、er damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication.

38、Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such paten

39、t rights. International Standard IEC 60384-8 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This fourth edition cancels and replaces the third edition published in 2005. This fourth edition is a result of maintenance activities related to the prev

40、ious edition. All changes that have been agreed upon can be categorized as minor revisions. The text of this standard is based on the following documents: vi FDIS Report on voting 40/2338/FDIS 40/2363/RVD Full information on the voting for the approval of this standard can be found in the report on

41、voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60384 series, published under the general title Fixed capacitors for use in electronic equipment, can be found on the IEC website. The committee ha

42、s decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or

43、amended. EIA-60384-8 Page 1 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1 1 General 1.1 Scope This part of IEC 60384 is applicable to fixed capacitors of ceramic dielectric with a defined temperature coefficient (die

44、lectric Class 1), intended for use in electronic equipment, including leadless capacitors but excluding fixed surface mount multilayer capacitors of ceramic dielectric, which are covered by IEC 60384-21 (Class 1). Capacitors for electromagnetic interference suppression are not included, but are cove

45、red by IEC 60384-14. 1.2 Object The object of this standard is to prescribe preferred ratings and characteristics and to select from IEC 60384-1:2008, the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. T

46、est severities and requirements prescribed in detail specifications referring to this sectional specification shall be of equal or higher performance level because lower performance levels are not permitted. 1.3 Normative references The following documents, in whole or in part, are normatively refer

47、enced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60063:1963, Preferred number series for resistors and capacitors IEC 6

48、0063:1963/AMD1:1967 IEC 60063:1963/AMD2:1977 IEC 60068-1:2013, Environmental testing Part 1: General and guidance IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Part 1: Generic specification IEC 61193-2:2007, Quality assessment systems Part 2: Selection and use of sampling plans

49、for inspection of electronic components and packages ISO 3:1973, Preferred numbers Series of preferred numbers 1.4 Information to be given in a detail specification 1.4.1 General Detail specifications shall be derived from the relevant blank detail specification. EIA-60384-8 Page 2 Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification. When more severe requirements a