DLA SMD-5962-89785 REV K-2006 MICROCIRCUIT HYBRID LINEAR DUAL CHANNEL HIGH GAIN OPTOCOUPLER《双通道高增益振荡器 混合微型电路》.pdf

《DLA SMD-5962-89785 REV K-2006 MICROCIRCUIT HYBRID LINEAR DUAL CHANNEL HIGH GAIN OPTOCOUPLER《双通道高增益振荡器 混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89785 REV K-2006 MICROCIRCUIT HYBRID LINEAR DUAL CHANNEL HIGH GAIN OPTOCOUPLER《双通道高增益振荡器 混合微型电路》.pdf（19页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED G Added device types 03, 04, and 05 as class K devices. Changed boilerplate to add one-part part numbers. Redrew entire document. -sld 97-11-07 K. A. Cottongim H Updated drawing to the latest requirements. -sld 05-10-24 Raymond Monnin J Added devic

2、e type 06. -sld 06-02-21 Raymond Monnin K Made changes to table I for the following tests ICCL, tPLH, and tPHL. Changed footnote 1 in table I. -sld 06-04-14 Raymond Monnin REV SHEET REV K K K SHEET 15 16 17 REV STATUS REV K K K K K K K K K K K K K K OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 P

3、MIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Donald R. Osborne COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, DUAL CHANNEL, HI

4、GH GAIN, OPTOCOUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-01-30 AMSC N/A REVISION LEVEL K SIZE A CAGE CODE 67268 5962-89785 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E367-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

5、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outline

6、s and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following examples: For class H devices: 5962-89785 01 P X Drawing nu

7、mber Device type Case outline Lead finish per (See 1.2.2) (See 1.2.4) MIL-PRF-38534 For class K devices: 5962 - 89785 03 K P X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Dr

8、awing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit f

9、unction as follows: Device type Generic number Circuit function 01 1/ HCPL-5731,66071-001 Dual channel, optocoupler with common supply voltage and ground connections 02 1/ HCPL-6731 Dual channel, optocoupler with separate supply voltage and ground connections 03 2/ HCPL-573K,66058-300 Dual channel,

10、optocoupler with common supply voltage and ground connections 04 2/ HCPL-673K,66124-300 Dual channel, optocoupler with separate supply voltage and ground connections 05 2/ 66071-300 Dual channel, optocoupler with common supply voltage and ground connections 06 1/ 66124-004 Dual channel, optocoupler

11、with common supply voltage and ground connections 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H,

12、 K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. 1/ Device types 01, 02, and 06 are class H (high reliability). 2/ Device

13、types 03, 04, and 05 are class K (highest reliability). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 3 DSCC FORM 2234 A

14、PR 97 H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limi

15、ted temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of t

16、hat class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufa

17、cturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line 2 CQ CC1-N20 20 Square chip ca

18、rrier X C-3 24 Square chip carrier Y See figure 1 8 Dual-in-line Z See figure 1 8 Gull wing 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC). -0.5 V dc to +20 V dc 2/ Peak input current (each channel, 1.0 ms durati

19、on). 20 mA Average input current, IF(each channel). 10 mA 3/ Reverse input voltage, VR(each channel). 5.0 V dc Output current, IO(each channel) . 40 mA Output voltage range, VO(each channel) -0.5 V dc to +20 V dc 2/ Power dissipation, PD(each channel) . 50 mW 4/ Storage temperature range. -65C to +1

20、50C Lead temperature (soldering, 10 seconds) . +260C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC): Case outlines P, 2, and X . See MIL-STD-1835 Case outlines Y and Z 28C/W 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended

21、operation at the maximum levels may degrade performance and affect reliability. 2/ GND pin should be the most negative voltage at the detector side. Keeping VCCas low as possible, but 2.0 V, will provide the lowest total IOHover temperature. 3/ Derate IFat 0.33 mA/C above +110C. 4/ For device type 0

22、1 and 03, output power is collector output power plus one-half of the total supply power. For device type 02, 04, 05, and 06 output power is collector output power plus total supply current. Derate at 1.66 mW/C above +110C. Provided by IHSNot for ResaleNo reproduction or networking permitted without

23、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 4 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range, (VCC) +2.0 V dc to +18 V dc High level input current range, IFH(ea

24、ch channel) 0.5 mA to 5.0 mA Low level input voltage, VFoff(each channel). 0.8 V dc maximum Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of th

25、is drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Te

26、st Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assis

27、t.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of t

28、his drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance w

29、ith MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections

30、herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimens

31、ions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 P

32、ropagation delay times test circuit and waveform. The propagation delay times test circuit and waveform shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall a

33、pply over the full specified operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 5 DSCC FORM 2234

34、 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit VCC= 4.5 V, IF= 0.5 mA, IOL= 1.5 mA 1/ 01,02,03,04,05 0.4 VCC= 4.5 V, IF= 1.6 mA, IOL= 4.8 mA 1/ 0.4 Low level output voltage VOLV

35、CC= 4.5 V, IF= 5.0 mA, IOL= 10 mA 1/ 1,2,3 All 0.4 V VO= 0.4 V, IF= 0.5 mA, VCC= 4.5 V 1/ 2/ 01,02,03,04,05 300 VO= 0.4 V, IF= 1.6 mA, VCC= 4.5 V 1/ 2/ 300 Current transfer ratio hF(CTR)VO= 0.4 V, IF= 5.0 mA, VCC= 4.5 V 1/ 2/ 1,2,3 All 200 % High level output current IOHVCC= VO= 18 V, IF= 2.0 A 1/ 3

36、/ 1,2,3 All 250 A 01,03 40 High level supply current ICCHVCC= 18 V, IF= 0 mA 1/ 1,2,3 02,04,05,06 20 A 01,03 4.0 low level supply current ICCLVCC= 18 V, IF= 1.6 mA 1/ 1,2,3 02,04,05,06 2.0 mA 1 1.0 1.7 2 1.7 3 01,03 1.8 V Input forward voltage VFIF= 1.6 mA 1/ 1,2,3 02,04,05,06 1.0 1.8 V Input revers

37、e breakdown voltage VBR IR=10 A 1/ 1,2,3 All 5.0 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL

38、K SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit Input to output insulation leakage current IIORelative humidity = 45%, t = 5 seconds, TA= +25C

39、, VIO= 1500 V dc 4/ 1 All 1.0 A VCC= 5.0 V, IF= 0.5 mA, RL= 4.7 k, see figure 3 01-05 60 VCC= 5.0 V, IF= 1.6 mA, RL= 1.5 k, see figure 3 50 Propagation delay time, low to high output level 1/ tPLH VCC= 5.0 V, IF= 5.0 mA, RL= 680, see figure 3 9,10,11 All 30 s VCC= 5.0 V, IF= 0.5 mA, RL= 4.7 k, see f

40、igure 3 01-05 100 VCC= 5.0 V, IF= 1.6 mA, RL= 1.5 k, see figure 3 30 Propagation delay time, High to low output level 1/ tPHL VCC= 5.0 V, IF= 5.0 mA, RL= 680, see figure 3 9,10,11 All 10 s Common mode transient immunity at high output level 1/ 8/ |CMH| VCM= 50 Vp-p, 5/ 6/ 8/ VCC= 5.0 V, RL= 1.5 k, I

41、F= 0 mA 9,10,11 All 500 V/s Common mode transient immunity at low output level 1/ 8/ |CML| VCM= 50 Vp-p, 6/ 7/ 8/ VCC= 5.0 V, RL= 1.5 k, IF= 1.6 mA 9,10,11 All 500 V/s See footnotes at top of next page.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

42、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ The conditions and limits apply to each channel. 2/ Current transfer ratio is define

43、d as the ratio of output collector current IO, to the forward LED input current, IF, times 100 percent. 3/ IF= 2 A for channel under test. For all other channels IF= 10 mA. 4/ Device considered a two-terminal device. Pins 1 through 4 are shorted together and pins 5 through 8 are shorted together for

44、 device types 01 and 03, case P, Y, and Z. Pins 1, 5, 20, and 24 are shorted together and pins 10, 12, 14, and 15 are shorted together for device type 01 and 05, case X. Pins 1, 2, 3, 19, and 20 are shorted together and pins 7 through 15 are shorted together for device types 02, 04, 05, and 06. 5/ C

45、MHis the maximum tolerable common mode transient to assure that the output will remain in a high logic state (i.e., VO 2.0 V). 6/ In applications were dV/dt may exceed 50,000 V/s (such as a static discharge) a series resistor, RCC, should be included to protect the detector IC from destructively hig

46、h surge currents. The recommended value is: 1.0 V 1.0 V Device types 01 and 03: RCC= = k Device types 02, 04, 05, and 06: RCC= = k 0.3 IF(mA)0.15 IF(mA) 7/ CMLis the maximum tolerable common mode transient to assure that the output will remain in a logic low state (i.e., VO 0.8 V). 8/ Parameter shal

47、l be tested as part of device initial characterization and after design or process changes. Parameters shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89785 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL