ISO IEC GUIDE 99-2007 International vocabulary of metrology - Basic and general concepts and associated terms (VIM)《计量学的国际词汇 基本与一般概念与相关术语(VIM)》.pdf

《ISO IEC GUIDE 99-2007 International vocabulary of metrology - Basic and general concepts and associated terms (VIM)《计量学的国际词汇 基本与一般概念与相关术语(VIM)》.pdf》由会员分享，可在线阅读，更多相关《ISO IEC GUIDE 99-2007 International vocabulary of metrology - Basic and general concepts and associated terms (VIM)《计量学的国际词汇 基本与一般概念与相关术语(VIM)》.pdf（108页珍藏版）》请在麦多课文档分享上搜索。

1、 First edition 2007 Premire dition 2007 ISO/IEC 2007 GUIDE 99 International vocabulary of metrology Basic and general concepts and associated terms (VIM) Vocabulaire international de mtrologie Concepts fondamentaux et gnraux et termes associs (VIM) ISO/IEC GUIDE 99:2007(E/F) PDF disclaimer This PDF

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9、Standard is permitted in teaching manuals, instruction booklets, technical publications and journals for strictly educational or implementation purposes. The conditions for such reproduction are: that no modifications are made to the terms and definitions; that such reproduction is not permitted for

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13、res destins la vente; la prsente Norme internationale est cite comme document source. la seule exception mentionne ci-dessus, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et le

14、s microfilms, sans laccord crit de lISO ladresse ci-aprs ou du comit membre de lISO dans le pays du demandeur. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland/Publi en Suisse ii ISO/I

15、EC 2007 All rights reserved/Tous droits rservsISO/IEC GUIDE 99:2007(E/F) ISO/IEC 2007 All rights reserved/Tous droits rservs iiiContents Page Foreword .v Introduction.vii Conventions.xi Scope.1 1 Quantities and units2 2 Measurement .16 3 Devices for measurement 34 4 Properties of measuring devices.3

16、7 5 Measurement standards (Etalons) 46 Annex A (informative) Concept diagrams 54 Bibliography81 List of acronyms.86 Alphabetical index88 ISO/IEC GUIDE 99:2007(E/F) iv ISO/IEC 2007 All rights reserved/Tous droits rservsSommaire Page Avant-propos. vi Introduction . ix Conventions xiii Domaine dapplica

17、tion. 1 1 Grandeurs et units 2 2 Mesurages. 16 3 Dispositifs de mesure 34 4 Proprits des dispositifs de mesure 37 5 talons. 46 Annexe A (informative) Schmas conceptuels . 54 Bibliographie 81 Liste des sigles 86 Index alphabtique 91 ISO/IEC GUIDE 99:2007(E/F) ISO/IEC 2007 All rights reserved/Tous dro

18、its rservs vForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject f

19、or which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on

20、 all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. Draft Guides adopted by the responsible Committee or Group are circulated to the member bodies for voting. Publication as a Guide requires appro

21、val by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. This first edition of ISO/IEC Guide 99 canc

22、els and replaces the second edition of the International vocabulary of basic and general terms in metrology (VIM). It is equivalent to the third edition of the VIM. For further information, see the Introduction (0.2) Note that in this document, GUM is used to refer to the industry-recognized publica

23、tion, adopted as ISO/IEC Guide 98-3:2008. When a specific subclause number is cited, the reference is to ISO/IEC Guide 98-3:2008. ISO/IEC GUIDE 99:2007(E/F) vi ISO/IEC 2007 All rights reserved/Tous droits rservsAvant-propos LISO (Organisation internationale de normalisation) est une fdration mondial

24、e dorganismes nationaux de normalisation (comits membres de lISO). Llaboration des Normes internationales est en gnral confie aux comits techniques de lISO. Chaque comit membre intress par une tude a le droit de faire partie du comit technique cr cet effet. Les organisations internationales, gouvern

25、ementales et non gouvernementales, en liaison avec lISO participent galement aux travaux. LISO collabore troitement avec la Commission lectrotechnique internationale (CEI) en ce qui concerne la normalisation lectrotechnique. Les Normes internationales sont rdiges conformment aux rgles donnes dans le

26、s Directives ISO/CEI, Partie 2. Les projets de Guides adopts par le comit ou le groupe responsable sont soumis aux comits membres pour vote. Leur publication comme Guides requiert lapprobation de 75 % au moins des comits membres votants. Lattention est appele sur le fait que certains des lments du p

27、rsent document peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. LISO ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et averti de leur existence. Cette premire dition du Guide ISO/CEI 99 annule et remplace la deuxime dition du

28、Vocabulaire international des termes fondamentaux et gnraux de mtrologie (VIM). Elle est quivalente la troisime dition du VIM. Pour plus dinformation, voir lIntroduction (0.2) Dans le prsent document, GUM renvoie la publication reconnue dans lindustrie qui a maintenant t adopte sous la rfrence Guide

29、 ISO/CEI 98-3:2008. Lorsquun paragraphe spcifique est cit, il est fait rfrence au Guide ISO/CEI 98-3:2008. ISO/IEC GUIDE 99:2007(E/F) ISO/IEC 2007 All rights reserved/Tous droits rservs viiIntroduction 0.1 General In general, a vocabulary is a “terminological dictionary which contains designations a

30、nd definitions from one or more specific subject fields” (ISO 1087-1:2000, 3.7.2). The present Vocabulary pertains to metrology, the “science of measurement and its application”. It also covers the basic principles governing quantities and units. The field of quantities and units could be treated in

31、 many different ways. Clause 1 of this Vocabulary is one such treatment, and is based on the principles laid down in the various parts of ISO 31, Quantities and units, currently being replaced by ISO 80000 and IEC 80000 series Quantities and units, and in the SI Brochure, The International System of

32、 Units (published by the BIPM). The second edition of the International vocabulary of basic and general terms in metrology (VIM) was published in 1993. The need to cover measurements in chemistry and laboratory medicine for the first time, as well as to incorporate concepts such as those that relate

33、 to metrological traceability, measurement uncertainty, and nominal properties, led to this third edition. Its title is now International vocabulary of metrology Basic and general concepts and associated terms (VIM), in order to emphasize the primary role of concepts in developing a vocabulary. In t

34、his Vocabulary, it is taken for granted that there is no fundamental difference in the basic principles of measurement in physics, chemistry, laboratory medicine, biology, or engineering. Furthermore, an attempt has been made to meet conceptual needs of measurement in fields such as biochemistry, fo

35、od science, forensic science, and molecular biology. Several concepts that appeared in the second edition of the VIM do not appear in this third edition because they are no longer considered to be basic or general. For example, the concept response time, used in describing the temporal behaviour of

36、a measuring system, is not included. For concepts related to measurement devices that are not covered by this third edition of the VIM, the reader should consult other vocabularies such as IEC 60050, International Electrotechnical Vocabulary, IEV. For concepts concerned with quality management, mutu

37、al recognition arrangements pertaining to metrology, or legal metrology, the reader is referred to documents given in the bibliography. Development of this third edition of the VIM has raised some fundamental questions about different current philosophies and descriptions of measurement, as will be

38、summarized below. These differences sometimes lead to difficulties in developing definitions that could be used across the different descriptions. No preference is given in this third edition to any of the particular approaches. The change in the treatment of measurement uncertainty from an Error Ap

39、proach (sometimes called Traditional Approach or True Value Approach) to an Uncertainty Approach necessitated reconsideration of some of the related concepts appearing in the second edition of the VIM. The objective of measurement in the Error Approach is to determine an estimate of the true value t

40、hat is as close as possible to that single true value. The deviation from the true value is composed of random and systematic errors. The two kinds of errors, assumed to be always distinguishable, have to be treated differently. No rule can be derived on how they combine to form the total error of a

41、ny given measurement result, usually taken as the estimate. Usually, only an upper limit of the absolute value of the total error is estimated, sometimes loosely named “uncertainty”. In the CIPM Recommendation INC-1 (1980) on the Statement of Uncertainties, it is suggested that the components of mea

42、surement uncertainty should be grouped into two categories, Type A and Type B, according to whether they were evaluated by statistical methods or otherwise, and that they be combined to yield a variance according to the rules of mathematical probability theory by also treating the Type B components

43、in terms of variances. The resulting standard deviation is an expression of a measurement uncertainty. A view of the Uncertainty Approach was detailed in the Guide to the expression of uncertainty in measurement (GUM) (1993, corrected and reprinted in 1995) that focused on the mathematical treatment

44、 of measurement uncertainty through an explicit measurement model under the assumption that the measurand can be characterized by an essentially unique value. Moreover, in the GUM as well as in IEC documents, guidance is provided on the Uncertainty Approach in the case of a single reading of a calib

45、rated instrument, a situation normally met in industrial metrology. ISO/IEC GUIDE 99:2007(E/F) viii ISO/IEC 2007 All rights reserved/Tous droits rservsThe objective of measurement in the Uncertainty Approach is not to determine a true value as closely as possible. Rather, it is assumed that the info

46、rmation from measurement only permits assignment of an interval of reasonable values to the measurand, based on the assumption that no mistakes have been made in performing the measurement. Additional relevant information may reduce the range of the interval of values that can reasonably be attribut

47、ed to the measurand. However, even the most refined measurement cannot reduce the interval to a single value because of the finite amount of detail in the definition of a measurand. The definitional uncertainty, therefore, sets a minimum limit to any measurement uncertainty. The interval can be repr

48、esented by one of its values, called a “measured quantity value”. In the GUM, the definitional uncertainty is considered to be negligible with respect to the other components of measurement uncertainty. The objective of measurement is then to establish a probability that this essentially unique valu

49、e lies within an interval of measured quantity values, based on the information available from measurement. The IEC scenario focuses on measurements with single readings, permitting the investigation of whether quantities vary in time by demonstrating whether measurement results are compatible. The IEC view also allows non-negligible defin