DLA SMD-5962-00514 REV A-2013 MICROCIRCUIT LINEAR DUAL NON-INVERTING POWER DRIVER MONOLITHIC SILICON.pdf

《DLA SMD-5962-00514 REV A-2013 MICROCIRCUIT LINEAR DUAL NON-INVERTING POWER DRIVER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-00514 REV A-2013 MICROCIRCUIT LINEAR DUAL NON-INVERTING POWER DRIVER MONOLITHIC SILICON.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redrawn. Update drawing to current requirements. - drw 13-01-10 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY L.G. Traylor DLA LAND AND MARITIME COLUMBUS, OHIO 4

2、3218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Rajesh Pithadia APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, DUAL NON-INVERTING POWER DRIVER, MONOLITHIC SILICON DRA

3、WING APPROVAL DATE 01-08-21 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-00514 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E169-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARI

4、TIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are availa

5、ble and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 00514 01 Q P A Federal stock class designator RHA designator (see 1.2.1) Device

6、type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicate

7、s a non-RHA device. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 UC1708 Dual non-inverting power driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance lev

8、el as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in

9、-line P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

10、UIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/, 2/ Supply voltage (VCC) . 35 V Output Current (Each Output, Source or Sink): Steady-State . 0.5 A Peak Transient 3 A Output Voltage . -0.3 V

11、to (VIN+ 0.3) V Enable and Shutdown Inputs . -0.3 V to 6.2 V A and B inputs -0.3 V to (VIN+ 0.3) V Operating Junction Temperature 150C Storage Temperature Range . -65C to 150C Lead Temperature (Soldering, 10 seconds) . 300C Thermal resistance, junction-to-case (JC): Case E 13C/W Case P 17C/W Case 2

12、15C/W Thermal resistance, junction-to-ambient (JA) : Case E 85C/W Case P 129C/W Case 2 80C/W 1.4 Recommended operating conditions. Supply voltage (VCC) 10 V to 35 V Ambient temperature range . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following

13、 specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, Gene

14、ral Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit D

15、rawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the

16、references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operatio

17、n at the maximum levels may degrade performance and affect reliability. 2/ All voltages are with respect to Logic Gnd pin. All currents are positive into, negative out of, device terminals. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC

18、ROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as m

19、odified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-385

20、35 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.3 Electrical

21、performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requ

22、irements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where m

23、arking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-

24、38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order t

25、o supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MI

26、L-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens

27、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device ty

28、pe Limits Unit Min Max VINSupply current IINOutputs low 1, 2, 3 01 26 mA Outputs high 18 Enable = 0 V 4 A, B and Shutdown inputs VA, VB, Low level 1, 2, 3 01 0.8 V VSHUTDOWNHigh Level 2.0 A, B input current low IA,B(L)VA,B= 0.4 V 1, 2, 3 01 -1 mA A, B input current high IA,B(H)VA,B= 2.4 V 1, 2, 3 01

29、 -200 50 A A, B Input leakage current high IA,B(M)VA,B= 35.3 V 1, 2, 3 01 200 A Shutdown input current low ISD(L)VSHUTDOWN= 0.4 V 1, 2, 3 01 100 A Shutdown input current high ISD(H)VSHUTDOWN= 2.4 V 1, 2, 3 01 500 A Shutdown input current high ISD(M)VSHUTDOWN= 6.2 V 1, 2, 3 01 1.5 mA Enable input cur

30、rent low IE(L)VENABLE= 0 V 1, 2, 3 01 -600 200 A Enable input current high IE(H)VENABLE= 6.2 V 1, 2, 3 01 200 A Enable threshold rising VETH(R)1, 2, 3 01 3.6 V Enable threshold falling VETH(F)1, 2, 3 01 1.0 3.4 V Output high sat., VIN- VOUTVSAT(H)IOUT= -50 mA 1, 2, 3 01 2.0 V IOUT = -500 mA 2.5 Outp

31、ut low sat., VOUTVSAT(L)IOUT= 50 mA 1, 2, 3 01 0.5 V IOUT = 500 mA 2.5 From A, B Input to output 2/ Rise time delay tPLH1CL = 0 pF 9, 10, 11 01 40 ns CL = 1000 pF 3/ 45 CL = 2200 pF 50 10% to 90% Rise tTLH1CL = 0 pF 9, 10, 11 01 75 ns CL = 1000 pF 3/ 80 CL = 2200 pF 85 See footnotes at end of table.

32、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continue

33、d. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max From A, B Input to output continued 2/ Fall time delay tPHL1CL = 0 pF 9, 10, 11 01 40 ns CL = 1000 pF 3/ 45 CL = 2200 pF 50 90% to 10% Fall tTHL1CL = 0 pF 9, 10, 11 01 20 ns CL = 10

34、00 pF 3/ 45 CL = 2200 pF 55 From shutdown input to output 2/ Rise time delay tPLH2CL = 0 pF 9, 10, 11 01 75 ns CL = 1000 pF 3/ 80 CL = 2200 pF 85 10% to 90% Rise tTLH2CL = 0 pF 9, 10, 11 01 75 ns CL = 1000 pF 3/ 80 CL = 2200 pF 85 Fall time delay tPHL2CL = 0 pF 9, 10, 11 01 45 ns CL = 1000 pF 3/ 50

35、CL = 2200 pF 55 90% to 10% Fall tTHL2CL = 0 pF 9, 10, 11 01 20 ns CL = 1000 pF 3/ 45 CL = 2200 pF 55 Total supply current I(IN)TOTF = 200 kHz, 50% duty cycle, both channels; CL = 0 pF, 1, 2, 3 01 25 mA F = 200 kHz, 50% duty cycle, both channels; CL = 2200 pF 45 1/ VIN= 10 V to 35 V. TA= TJ. 2/ VIN=

36、20 V, delays measured to 10% output change. 3/ These parameters, specified at 1000pF, although guaranteed over recommended operating conditions, are not tested in production. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

37、NG SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline P E 2 Terminal number Terminal Symbol 1 Enable NC NC 2 Input A Input A NC 3 Gnd Enable Input A 4 Input B Logic gnd Enable 5 Output B NC Logic gnd 6 Vin Shut

38、down NC 7 Output A Input B NC 8 NC NC Shutdown 9 - Pwr gnd B Input B 10 - Output B NC 11 - VIN NC 12 - NC Pwr gnd B 13 - NC Output B 14 - VIN Vin 15 - Output A NC 16 - Pwr gnd A NC 17 - - NC 18 - - Vin 19 - - Output A 20 - - Pwr gnd A NC = Not connected FIGURE 1. Terminal connections. Provided by IH

39、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 NOTE: Shutdown feature available only in case outlines P and 2. FIGURE 2.

40、 Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection

41、. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For devi

42、ce classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or app

43、roved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be ma

44、de available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as speci

45、fied in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with M

46、IL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including gro

47、ups A, B, C, D, and E inspections and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. TABLE II. Electrical test requirements. Test requirements Subgroups (in acco

48、rdance with MIL-PRF-38535, table III) Device class Q Device class V Interim electrical parameters (see 4.2) 1 1 Final electrical parameters (see 4.2) 1, 2, 3, 9, 10, 11 1/ 1, 2, 3, 9, 10, 11 1/ Group A test requirements (see 4.4) 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 Group C end-point electrical parameters (see 4.4) 1 1 Group D end-point electrical parameters (see 4.4) 1 1 Group E end-point ele