BS 9940-04 0-1984 Harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Sectional specification fixed resistor netwo.pdf

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1、BRITISH STANDARD BS9940-04.0: 1984 IEC115-6: 1983 QC400400: 1983 Incorporating Amendment No.1 Harmonized system of quality assessment for electronic components Fixedresistors for use in electronic equipment Part04.0: Sectional specification: Fixed resistor networks with individually measurable resis

2、tors IEC title: Fixed resistors for use in electronic equipment Part6: Sectional specification: Fixed resistor networks with individually measurable resistors UDC 621.316.8:621.38BS9940-04.0:1984 This BritishStandard, having been prepared under the directionof the Electronic Components Standards Com

3、mittee, was published underthe authority of the BoardofBSI and comes intoeffecton 28 September 1984 BSI 01-2000 The following BSI references relate to the work on this standard: Committee reference ECL/4 Draft for comment78/30152DC ISBN 0 580 14001 6 Committees responsible for this BritishStandard T

4、he preparation of this BritishStandard was entrusted by the Electronic Components Standards Committee (ECL/-) to Technical Committee ECL/4 upon which the following bodies were represented: British Telecommunications Electronic Components Industry Federation Electronic Engineering Association Ministr

5、y of Defence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No. Date of issue Comments 5916 September 1989 Indicated by a sideline in the marginBS9940-04.0:19

6、84 BSI 01-2000 i Contents Page Committees responsible Inside front cover National foreword ii Section 1. General 1.1 Scope 1 1.2 Object 1 1.3 Related documents 1 1.4 Information to be given in a detail specification 1 1.5 Marking 2 Section 2. Preferred ratings, characteristics and test severities 2.

7、1 Preferred characteristics 3 2.2 Preferred values of ratings 4 2.3 Preferred test severities 5 Section 3. Quality assessment procedures 3.1 Structurally Similar Components 7 3.2 Qualification Approval 7 3.3 Quality Conformance Inspection 11 Appendix A Standardized schematic diagrams and pin identif

8、ications for fixed resistor networks 12 A.1 Diagrams for “Single-In-Line” configurations 12 A.2 Diagrams for “Dual-In-Line” and “Flat Pack” configurations 13 Table I 3 Table II 4 Table III Test schedule for Qualification Approval 8 Table IV A 11 Table IV B 11 Publications referred to Inside back cov

9、erBS9940-04.0:1984 ii BSI 01-2000 National foreword This Part of this BritishStandard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication115-6 (QC400400) “Fixed resistors for use in electronic equipment. Part6: Sectional specif

10、ication: Fixed resistor networks with individually measurable resistors”, published in 1983 by the International Electrotechnical Commission (IEC), including Amendment No.1 (February1987). This standard is a harmonized specification within the IECQ system of quality assessment for electronic compone

11、nts. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a BritishStandard without deviation. Some terminology and certain conventions are not identical with those used in BritishStandards. Cross-references. The BritishStandard harmoni

12、zed with QC001001 and QC001002 is BS9000 “General requirements for a system for electronic components of assessed quality” Part1:1981 “Specification of basic rules and procedures”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards a

13、re responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standards Corresponding BritishStandards IEC63:1963 BS2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance

14、of capacitors for telecommunication equipment (Technically equivalent) IEC68 BS2011 Basic environmental testing procedures IEC68-1:1981 Part1.1:1983 General and guidance (Identical) IEC115-1:1982 (QC400000:1982) BS9940 Harmonized system of quality assessment for electronic components. Fixed resistor

15、s for use in electronic equipment Part0:1983 Generic specification (Identical) IEC410:1973 BS6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to14, an ins

16、ide back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-04.0:1984 BSI 01-2000 1 Section 1. General 1.1 Scope This standard applies to fixed resistor n

17、etworks in which each individual resistor can be measured. The resistors may be individually isolated or interconnected in any circuit configuration which permits the measurement of each individual resistor. NOTEA separate sectional specification covering complex networks will be published as IEC Pu

18、blication115-7 (under consideration). 1.2 Object The object of this standard is to prescribe preferred ratings and characteristics and to select from IEC Publication115-1 (1982), the appropriate Quality Assessment procedures, tests and measuring methods and to give general performance requirements f

19、or this type of resistor network. Test severities and requirements prescribed in detail specifications referring to this sectional specification shall be of equal or higher performance level, because lower performance levels are not permitted. 1.3 Related documents IEC publications NOTEThe above ref

20、erences apply to the current editions except for IEC Publication68, for which the referenced edition in the applicable test clauses of the generic specification shall be used. 1.4 Information to be given in a detail specification Detail specifications shall be derived from the relevant blank detail

21、specification. Detail specifications shall not specify requirements inferior to those of the Generic or Sectional specification. When more severe requirements are included, they shall be listed in Sub-clause1.8 of the detail specification and indicated in the test schedules, for example by an asteri

22、sk. NOTEThe information given in Sub-clauses 1.4.1 and 1.4.3 may, for convenience, be presented in tabular form. The following information shall by given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional speci

23、fication. 1.4.1 Outline drawing and dimensions There shall be an illustration of the network as an aid to easy recognition and for comparison of the network with others. Dimensions and their associated tolerances, which affect interchangeability and mounting, shall be given in the detail specificati

24、on. All dimensions shall preferably be stated in millimetres, however when the original dimensions are given in inches, the converted metric dimensions in millimetres shall be added. 1.4.2 Mounting The detail specification shall specify the method of mounting to be applied for normal use and for the

25、 application of the vibration and the bump or shock tests. The resistor networks shall be mounted by their normal means. The design of the resistor network may be such that special mounting fixtures are required in its use. In this case the detail specification shall describe the mounting fixtures a

26、nd they shall be used in the application of the vibration and bump or shock tests. Publication63:(1963) Preferred Number Series for Resistors and Capacitors. Amendment No.1 (1967) Amendment No.2 (1977) Publication68: Basic Environnmental Testing Procedures. Publication115-1:(1982) Fixed Resistors fo

27、r Use in Electronic Equipment. Part1: Generic Specification. Publication410:(1973) Sampling Plans and Procedures for Inspection by Attributes. Publication QC001001:(1981) Basic Rules of the IEC Quality Assessment System for Electronic Components (IECQ). Publication QC001002:(1981) Rules of Procedure

28、s of the IEC Quality Assessment System for Electronic Components (IECQ).BS9940-04.0:1984 2 BSI 01-2000 1.4.3 Style (IEC Publication115-1, Sub-clause 2.2.3) For the purpose of this standard the style is a combination of rated dissipation and temperature characteristic (or coefficient) of resistance.

29、It shall be represented by a double-letter code e.g.AB, BC, CD, etc., which is arbitrarily chosen for each dissipation/temperature characteristic combination covered by a detail specification. The style designation, therefore, has no meaning unless the number of the detail specification is also give

30、n. 1.4.4 Ratings and characteristics The ratings and characteristics shall be in accordance with the relevant clauses of this specification together with the following: 1.4.4.1 Rated resistance range SeeSub-clause2.2.1. The preferred values are those of the E-series of IEC Publication63. NOTEWhen pr

31、oducts approved to the detail specification have different ranges, the following statement should be added: “The range of values available in each style is given in the qualified products list”. 1.4.5 Marking The detail specification shall specify the content of the marking on the network and on the

32、 package. Deviations from Sub-clause1.5 of this specification, shall be specifically stated. 1.5 Marking 1.5.1 The information given in the marking is selected from the following list, the relative importance of each item is indicated by its positions on the list: 1) Network identification which ena

33、bles reference back to the detail specification for identification of each element. 2) The identification of terminations as given in the detail specification. 3) Year and month (or week) of manufacture. 4) Detail specification and style. 5) Manufacturers name or trade mark. 1.5.2 The network shall

34、be clearly marked with1) and2) above and with as many of the remaining items as practicable. Any duplication of information in the marking should be avoided. 1.5.3 The package containing the networks shall be clearly marked with the information listed in1),3),4) and5) above. 1.5.4 Any additional mar

35、king shall be so applied that no confusion can arise.BS9940-04.0:1984 BSI 01-2000 3 Section 2. Preferred ratings, characteristics and test severities 2.1 Preferred characteristics The values given in detail specifications shall preferably be selected from the following: 2.1.1 Preferred climatic cate

36、gories The resistor networks covered by this specification are classified into climatic categories according to the general rules given in IEC Publication68-1. The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following: The severi

37、ties for the cold and dry heat tests are the lower and upper category temperatures respectively. Because of the construction of some resistor networks these temperatures will occur between two of the preferred temperatures given in IEC Publication68-2. In this event the nearest preferred temperature

38、 within the actual temperature range of the resistor network shall be chosen for this severity. 2.1.2 Temperature coefficient and temperature characteristics of resistance The preferred limits of change in resistance for the temperature characteristic of resistance test are given in Table I. Each li

39、ne in the table gives the preferred temperature coefficient and corresponding temperature characteristic for20 C to70 C and limits of change in resistance for the measurement of the temperature characteristic of resistance (seeIEC Publication115-1, Sub-clause 4.8) on the basis of the category temper

40、ature ranges of Sub-clause2.1.1 of this sectional specification. Table I 2.1.3 Limits for change in resistance For each stability class the preferred limits for change in resistance for each of the tests listed in the heading of Table II are as indicated. NOTEThe clause numbers in the heading of Tab

41、le II refer to IEC Publication 115-1. Lower category temperature: 55 C,40 C and25 C Upper category temperature: +85 C,+100 C,+125 C and+155 C Duration of the damp heat, steady-state test:4,10,21 and56days Temperature coefficient Temperature characteristic 20 C/70 C Temperature characteristic of resi

42、stance (limits of percentage change in resistance) Reference temperature/lower category temperature Reference temperature/upper category temperature 10 6 / C % +20/55 +20/40 +20/25 +20/+85 +20/+100 +20/+125 +20/+155 150/ 1500 250 100 50 25 15 0.75 7.5 1.25 0.5 0.25 0.125 0.075 +1.13 +11.3 1.88 0.75

43、0.375 0.188 0.113 +0.9/ +9 1.5 0.6 0.3 0.15 0.09 +0.68/ +6.8 1.13 0.45 0.23 0.113 0.068 0.98/ 9.8 1.62 0.65 0.325 0.162 0.098 1.2/ 12 2 0.8 0.4 0.2 0.12 1.58/ 15.8 2.62 1.05 0.525 0.262 0.158 2.03/ 20.3 3.38 1.35 0.675 0.338 0.203BS9940-04.0:1984 4 BSI 01-2000 Table II 2.2 Preferred values of rating

44、s 2.2.1 Rated resistance SeeIEC Publication 115-1, Sub-clause 2.2.7. 2.2.2 Tolerances on rated resistance The preferred tolerances on rated resistance are: 10%, 5%, 2%,1%, 0.5%, 0.25% and 0.1%. 2.2.3 Rated dissipation The preferred values of rated dissipation, at70 C, are: The detail specification s

45、hall prescribe the applicable value of rated dissipation for each resistor element in the network and also the maximum allowable total dissipation for the network. The derated values of dissipation at temperatures in excess of70 C shall be as indicated by the following curve: A larger area of operat

46、ion may be given in the detail specification, provided it includes all the area given above. In this event the detail specification shall state the maximum allowable dissipation at temperatures other than70 C. All break points on the curve shall be verified by test. 2.2.4 Limiting element voltage Th

47、e preferred values of limiting element voltage are:10V,15V,25V,35V,50V,100V and500V d.c. or a.c.r.m.s. Stability class in% Long-term tests Short-term tests 4.23 4.24 4.25.1 4.25.3 Climatic sequence Damp heat, steady state Endurance at70 C Endurance at upper category temperature 4.13 4.16 4.18 4.19 4

48、.22 Overload Robustness of terminations Resistance to soldering heat Rapid change of temperature Vibration 10 5 2 1 0.5 0.25 0.1 (10%+0.57) (5%+0.17) (2%+0.17) (1%+0.057) (0.5%+0.057) (0.25%+0.057) (0.1%+0.017) (2%+0.17) (1%+0.057) (0.5%+0.057) (0.25%+0.057) (0.1%+0.017) (0.05%+0.017) (0.02%+0.017)

49、For the network: 0.25W,0.5W,1W,1.5W,2W and4W. For the resistor element: 0.05W,0.1W,0.125W,0.25W,0.5W and1W.BS9940-04.0:1984 BSI 01-2000 5 2.2.5 Isolation voltage between individual resistor elements (when applicable) The value of the isolation voltage between the individual resistor elements shall be given in the detail specification. 2.2.6 Insulation resistance between individual resistor elements (when applica