DLA DSCC-VID-V62 03604 REV A-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE NAND GATE MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED A Update boilerplate paragraphs to current requirements. - PHN 09-02-17 Charles F. Saffle Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE REV A A A A A A A A A A A REV STATUS OF PAGES PAGE 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARE
2、D BY Thanh V. Nguyen DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO 43218-3990 Original date of drawing CHECKED BY Thanh V. Nguyen APPROVED BY Thomas M. Hess TITLE MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE NAND GATE, MONOLITHIC SILICON SIZE A CODE IDENT. NO. 16236 D
3、WG NO. V62/03604 YY-MM-DD 02-11-07 REV A PAGE 1 OF 11 AMSC N/A 5962-V037-09 .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03604 REV A PAGE 2 1. SCOPE 1.1 Scope.
4、 This drawing documents the general requirements of a high performance quadruple 2-input positive NAND gate microcircuit, with an operating temperature range of -55C to +125C. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item
5、drawing establishes an administrative control number for identifying the item on the engineering documentation: V62/03604 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01 74AHC00-EP Quadrupl
6、e 2-input positive NAND gate 1.2.2 Case outline(s). The case outlines are as specified herein. Outline letter Number of pins JEDEC PUB 95 Package style X 14 MS-012 Plastic small-outline package Y 14 MO-153 Plastic small-outline package 1.2.3 Lead finishes. The lead finishes are as specified below or
7、 other lead finishes as provided by the device manufacturer: Finish designator Material A Hot solder dip B Tin-lead plate C Gold plate D Palladium E Gold flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, C
8、OLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03604 REV A PAGE 3 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V to 7.0 V Input voltage range (VI). -0.5 V to 7.0 V 2/ Output voltage range (VO) . -0.5 V to VCC+ 0.5 V 2/ Input clamp current (IIK) (VI 0) . -20 mA O
9、utput clamp current (IOK) (VO 0 or VO VCC) . 20 mA Continuous output current (IO) (VO= 0 to VCC) 25 mA Continuous current through VCCor GND. 50 mA Storage temperature range (TSTG). -65C to 150C Package thermal impedance (JA): 3/ X package .86C/W Y package .113C/W 1.4 Recommended operating conditions
10、. 4/ 5/ Supply voltage range (VCC) . 2.0 V to 5.5 V Input voltage range (VI). 0.0 V to 5.5 V Output voltage range (VO) . 0.0 V to VCCMinimum high level input voltage (VIH): VCC= 2.0 V 1.5 V VCC= 3.0 V 2.1 V VCC= 5.5 V 3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V 0.5 V VCC= 3.0 V 0.9 V VC
11、C= 5.5 V 1.65 V Maximum high level output current (IOH): VCC= 2.0 V -50 A VCC= 3.3 V 0.3 V -4.0 mA VCC= 5.0 V 0.5 V -8.0 mA Maximum low level output current (IOL): VCC= 2.0 V 50 A VCC= 3.3 V 0.3 V 4.0 mA VCC= 5.0 V 0.5 V 8.0 mA Maximum input transition rise or fall rate (t/V): VCC= 3.3 V 0.3 V 100 n
12、s/V VCC= 5.0 V 0.5 V 20 ns/V Operating free-air temperature range (TA). -55C to +125C 1/ Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyon
13、d those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2/ The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 3/ The package th
14、ermal impedance is calculated in accordance with JESD 51-7. 4/ Use of this product beyond the manufacturers design rules or stated parameters is done at the users risk. The manufacturer and/or distributor maintain no responsibility or liability for product used beyond the stated limits. 5/ All unuse
15、d inputs of the device must be held at VCCor GND to ensure proper device operation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03604 REV A PAGE 4 2. APPLICABL
16、E DOCUMENTS JEDEC PUB 95 - Registered and Standard Outlines for Semiconductor Devices JEDEC STD 51-7 - High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages (Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington
17、, VA 22201-3834 or online at http:/www.jedec.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, CAGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 U
18、nit container. The unit container shall be marked with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are as specified in 1.3, 1.4, and table I her
19、ein. 3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline(s). The case outline(s) shall be as shown in 1.2.2 and figure 1. 3.5.2 Truth table. The truth table shall be as shown in figure 2. 3.5.3
20、Logic diagram. The logic diagram shall be as shown in figure 3. 3.5.4 Terminal connections. The terminal connections shall be as shown in figure 4. 3.5.5 Test circuit and timing waveforms. The test circuit and timing waveforms shall be as shown in figure 5. Provided by IHSNot for ResaleNo reproducti
21、on or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03604 REV A PAGE 5 TABLE I. Electrical performance characteristics. 1/ Limits Test Symbol Conditions VCC Temperature, TA Device type Min Max Unit 2.0 V 1.9 3
22、.0 V 2.9 IOH= -50 A 4.5 V 25C, -55C to 125C 4.4 25C 2.58 IOH = -4 mA 3.0 V -55C to 125C 2.48 25C 3.94 High level output voltage VOH IOH= -8 mA 4.5 V -55C to 125C All 3.80 V 2.0 V 0.1 3.0 V 0.1 IOL= 50 A 4.5 V 25C, -55C to 125C 0.1 25C 0.36 IOL = 4 mA 3.0 V -55C to 125C 0.5 25C 0.36 Low level output
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