IEC 61788-16-2013 Superconductivity - Part 16 Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave freque.pdf

《IEC 61788-16-2013 Superconductivity - Part 16 Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave freque.pdf》由会员分享，可在线阅读，更多相关《IEC 61788-16-2013 Superconductivity - Part 16 Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave freque.pdf（66页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 61788-16 Edition 1.0 2013-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 16: Electronic characteristic measurements Power-dependent surface resistance of superconductors at microwave frequencies Supraconductivit Partie 16: Mesures de caractristiques lectroniques Rsistance

2、 de surface des supraconducteurs aux hyperfrquences en fonction de la puissance IEC61788-16:2013 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in a

3、ny form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights

4、 to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd

5、, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordon

6、nes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global

7、 organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an

8、amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publicatio

9、ns. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and elect

10、rical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this pu

11、blication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique e

12、t aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/

13、searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inf

14、orm sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30

15、 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou s

16、i vous avez des questions contactez-nous: csciec.ch. IEC 61788-16 Edition 1.0 2013-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 16: Electronic characteristic measurements Power-dependent surface resistance of superconductors at microwave frequencies Supraconductivit Partie 1

17、6: Mesures de caractristiques lectroniques Rsistance de surface des supraconducteurs aux hyperfrquences en fonction de la puissance INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE V ICS 17.220.20; 29.050 PRICE CODE CODE PRIX ISBN 978-2-83220-582-2 Registered trad

18、emark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr.

19、colourinside 2 61788-16 IEC:2013 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Requirements . 8 5 Apparatus . 8 5.1 Measurement system 8 5.1.1 Measurement system for the tan of the sapphire rod . 8 5.1.2 Measurement system for the power d

20、ependence of the surface resistance of superconductors at microwave frequencies . 9 5.2 Measurement apparatus 10 5.2.1 Sapphire resonator 10 5.2.2 Sapphire rod 10 5.2.3 Superconductor films . 11 6 Measurement procedure . 11 6.1 Set-up . 11 6.2 Measurement of the tan of the sapphire rod 11 6.2.1 Gene

21、ral . 11 6.2.2 Measurement of the frequency response of the TE021mode . 11 6.2.3 Measurement of the frequency response of the TE012mode . 13 6.2.4 Determination of tan of the sapphire rod . 13 6.3 Power dependence measurement 14 6.3.1 General . 14 6.3.2 Calibration of the incident microwave power to

22、 the resonator. 15 6.3.3 Measurement of the reference level . 15 6.3.4 Surface resistance measurement as a function of the incident microwave power . 15 6.3.5 Determination of the maximum surface magnetic flux density 15 7 Uncertainty of the test method 16 7.1 Surface resistance. 16 7.2 Temperature

23、17 7.3 Specimen and holder support structure . 18 7.4 Specimen protection 18 8 Test report 18 8.1 Identification of the test specimen . 18 8.2 Report of power dependence of Rsvalues. 18 8.3 Report of test conditions 18 Annex A (informative) Additional information relating to Clauses 1 to 7 . 19 Anne

24、x B (informative) Uncertainty considerations . 24 Bibliography 29 Figure 1 Measurement system for tan of the sapphire rod . 9 Figure 2 Measurement system for the microwave power dependence of the surface resistance . 9 61788-16 IEC:2013 3 Figure 3 Sapphire resonator (open type) to measure the surfac

25、e resistance of superconductor films . 10 Figure 4 Reflection scattering parameters (|S11| and |S22|) . 13 Figure 5 Term definitions in Table 3 . 17 Figure A.1 Three types of sapphire rod resonators . 19 Figure A.2 Mode chart for a sapphire resonator (see IEC 61788-15) 20 Figure A.3 Loaded quality f

26、actor QLmeasurements using the conventional 3 dB method and the circle fit method . 21 Figure A.4 Temperature dependence of tan of a sapphire rod measured using the two-resonance mode dielectric resonator method 3 22 Figure A.5 Dependence of the surface resistance Rson the maximum surface magnetic f

27、lux density Bs max3 23 Table 1 Typical dimensions of the sapphire rod 11 Table 2 Specifications of the vector network analyzer 16 Table 3 Specifications of the sapphire rods 17 Table B.1 Output signals from two nominally identical extensometers 25 Table B.2 Mean values of two output signals . 25 Tab

28、le B.3 Experimental standard deviations of two output signals 25 Table B.4 Standard uncertainties of two output signals 26 Table B.5 Coefficient of Variations of two output signals 26 4 61788-16 IEC:2013 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SUPERCONDUCTIVITY Part 16: Electronic characteristic

29、 measurements Power-dependent surface resistance of superconductors at microwave frequencies FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IE

30、C is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)

31、 and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with

32、the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as near

33、ly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that

34、 sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees

35、 undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide an

36、y attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest ed

37、ition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether d

38、irect or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispe

39、nsable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61788-16

40、 has been prepared by IEC technical committee 90: Superconductivity. The text of this standard is based on the following documents: FDIS Report on voting 90/309/FDIS 90/318/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the abov

41、e table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 61788 series, published under the general title Superconductivity, can be found on the IEC website. 61788-16 IEC:2013 5 The committee has decided that the contents of this

42、 publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour insid

43、e logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 61788-16 IEC:2013 INTRODUCTION Since the discovery of high-Tcsupercond

44、uctors (HTS), extensive researches have been performed worldwide for electronic applications and large-scale applications. In the fields of electronics, especially in telecommunications, microwave passive devices such as filters using HTS are being developed and testing is underway on sites 1,2,3,41

45、. Superconductor materials for microwave resonators, filters, antennas and delay lines have the advantage of ultra-low loss characteristics. Knowledge of this parameter is vital for the development of new materials on the supplier side and the design of superconductor microwave components on the cus

46、tomer side. The parameters of superconductor materials needed to design microwave components are the surface resistance Rsand the temperature dependence of the Rs. Recent advances in HTS thin films with Rs, several orders of magnitude lower than normal metals has increased the need for a reliable ch

47、aracterization technique to measure this property 5,6. Among several methods to measure the Rsof superconductor materials at microwave frequencies, the dielectric resonator method 7,8,9 has been useful due to that the method enables to measure the Rsnondestructively and accurately. In particular, th

48、e sapphire resonator is an excellent tool for measuring the Rsof HTS materials 10. In 2002, the International Electrotechnical Commission (IEC) published the dielectric resonator method as a measurement standard 11. The test method given in this standard enables measurement of the power-dependent su

49、rface resistance of superconductors at microwave frequencies. For high power microwave device applications such as those of transmitting devices, not only the temperature dependence of Rsbut also the power dependence of Rsis needed to design the microwave components. Based on the measured power dependence, the RF current density dependence of the surface resistance can be evaluat