DLA SMD-5962-90602 REV A-2001 MICROCIRCUIT DIGITAL-LINEAR WIDEBAND VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单片 宽带 视频多路复用器 线性数字微型电路》.pdf

《DLA SMD-5962-90602 REV A-2001 MICROCIRCUIT DIGITAL-LINEAR WIDEBAND VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单片 宽带 视频多路复用器 线性数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90602 REV A-2001 MICROCIRCUIT DIGITAL-LINEAR WIDEBAND VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单片 宽带 视频多路复用器 线性数字微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Drawing updated to reflect current requirements. - ro 01-07-18 R. MONNINREVSHEETREVSHEETREV STATUS REV AAAAAAAAAAAAAOF SHETS SHET 1234567891011213PMIC N/A PREPARED BY DAN WONNELLDEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYSAND

2、RA ROONEYCOLUMBUS, OHIO 43216http:/www.dscc.dla.milTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMICHAEL A. FRYEMICROCIRCUIT, DIGITAL-LINEAR, WIDEBAND /VIDEO MULTIPLEXER, MONOLITHIC SILICONAND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL DATE94-12-06AMSC N/AREVISION LEVELASIZE

3、ACAGE CODE672685962-90602SHEET1 OF 13DSCC FORM 2233APR 97 5962-E519-01DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE

4、SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q andM) and space application (device class V). A choice of case outlines and lead finis

5、hes are available and are reflected in thePart or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in thePIN.1.2 PIN. The PIN is as shown in the following example:5962 - 90602 01 M R XFederalstock classdesignatorRHAdesignator(see 1.2.1)Dev

6、icetype(see 1.2.2)DeviceclassdesignatorCaseoutline(see 1.2.4)Leadfinish(see 1.2.5) / (see 1.2.3)/Drawing number1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels andare marked with the appropriate RHA designator. Device class M RHA marked devi

7、ces meet the MIL-PRF-38535, appendix Aspecified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:Device type Generic number Circuit function01 DG534AA 4-channel wideb

8、and / video multiplexer1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level asfollows:Device class Device requirements documentationM Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microc

9、ircuits in accordance with MIL-PRF-38535, appendix AQ or V Certification and qualification to MIL-PRF-385351.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleR GDIP1-T20 or CDIP2-T20 20 Dual-in-line

10、1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,appendix A for device class M.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CE

11、NTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET3DSCC FORM 2234APR 971.3 Absolute maximum ratings. 1/+V to V -0.3 V dc to 21 V dc+V to GND . -0.3 V dc to 21 V dc-V to GND . -10 V dc to 0.3 V dcDigital inputs . (-V) 0.32 V dc to (-VL) + 0.3 V dc or 20 mA,whichever occurs firstDigital inputs

12、 (VS, VD) (-V) 0.32 V dc to (-V) + 21 V dc or 20 mA,whichever occurs firstCurrent (continuous, any terminal) 20 mAPeak current, S or D, (pulsed 1 ms, 10 % duty cycle maximum) 40 mAPower dissipation (PD) 1200 mW 2/Storage temperature range . -65C to +150CLead temperature (soldering, 10 seconds) . +30

13、0CJunction temperature (TJ) . +150CThermal resistance, junction-to-case (JC) . See MIL-STD-18351.4 Recommended operating conditions.Positive supply voltage (+V) +15 V dcNegative supply voltage (-V) . -3 V dcLogic supply voltage (VL) +5 V dcAmbient operating temperature range (TA) . -55C to +125C2. A

14、PPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed inthe issue of the Department of Defe

15、nse Index of Specifications and Standards (DoDISS) and supplement thereto, cited in thesolicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1

16、835 - Interface Standard Electronic Component Case Outlines.1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.2/ Derate linearly at 16 mW/C above TA= +75C.Provided by IHSNot f

17、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET4DSCC FORM 2234APR 97HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings

18、.MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a confli

19、ct between the text of this drawing and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirem

20、ents for device classes Q and V shall be in accordance withMIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. Themodification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements f

21、ordevice class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifiedherein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specifiedin MIL-PRF-38535 and herein for device classes Q a

22、nd V or MIL-PRF-38535, appendix A and herein for device class M.3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.3 Truth table. The truth table shall be as specified on figure 2.3.

23、3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, theelectrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over thefull ambient operating temperature range.3.4 Electric

24、al test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also bemarked as listed in

25、 MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to spacelimitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, theRHA designator shall still be marked. Marking for device classes Q and V sha

26、ll be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required inMIL-PRF-38535. The compliance mark for device class M

27、shall be a “C“ as required in MIL-PRF-38535, appendix A.3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certif

28、icate ofcompliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for thisdrawing shall affirm that the manufacturers pr

29、oduct meets, for device classes Q and V, the requirements of MIL-PRF-38535and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or fordevice class

30、 M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5

31、000REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxDrain-source ONresistancerDSIS= -10 mA, VS= 0 V,1,3 01 90 (ON)VAIL= 0.8 V, VAIH= 2 V,sequence each sw

32、itch on2 120Resistance matchbetween channelsrDS(ON)IS= -10 mA, VS= 0 V,VAIL= 0.8 V, VAIH= 2 V,sequence each switch on101 9Source OFF leakagecurrentISVS= 8 V, VD= 0 V,101 5nA(OFF) EN = 0.8 V 2,3 50Drain OFF leakagecurrentIDVS= 0 V, VD= 8 V,101 20nA(OFF) EN = 0.8 V 2,3 500Drain ON leakagecurrentID(ON)

33、+VS= VD= 8 V101 20nAIS(ON)2,3 1000Address input currentIAIVAI= 0 V, 2 V, 5 V1,3 01 1 A210Multiplexer switchingtimetTRANSRL= 1 k, CL= 45 pF,9,11 01 300 nssee figure 3 10 500Break-before-makeintervaltOPENRL= 1 k, CL= 45 pF9,10,11 01 25 nsEN, WR , turn ON time tON RL = 1 k, CL = 45 pF,9,11 01 300 nssee

34、 figure 3 10 500EN, turn OFF timetOFFRL= 1 k, CL= 45 pF,9,11 01 175 nssee figure 3 10 300See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS,

35、OHIO 43216-5000REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics Continued.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxPositive supply current +I Any one channel selectedwith address inputs at GND1,

36、2 01 2 mAor +5 V 3 5Negative supply current -I Any one channel selectedwith address inputs at GND1,2 01 -1.8 mAor +5 V 3 -2.0Logic supply currentIL1,2,3 01 500 AReset to writetRWtRW= 50 ns, see figure 3,see 4.4.1d7,8 01WR , RS minimumpulse widthtMPWtMPW= 200 ns,see figure 3,see 4.4.1d7,8 01A0, A1, A

37、2, EN datavalid to strobetDWtDW= 100 ns, see figure 3,see 4.4.1d7,8 01A0, A1, A2, EN datavalid after strobetWDtWD= 50 ns, see figure 3,see 4.4.1d7,8 01Address and enableoutput currentIAOVAO= 2.7 V1,3 01 -2.5 mA2-1.6VAO= 0.4 V1,3 2.521.6ON state inputcapacitanceCS(ON)TA= +25C, see 4.4.1c401 45pFOFF s

38、tate inputcapacitanceCS(OFF)TA= +25C, see 4.4.1c401 5pFOFF state outputcapacitanceCD(OFF)TA= +25C, see 4.4.1c401 10pFLogic input capacitanceCATA= +25C, see 4.4.1c401 15pFSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

39、ANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET7DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics Continued.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin M

40、axOFF isolationVISOTA= +25C, see 4.4.1e12 01 50 dBCrosstalkVCTTA= +25C, see 4.4.1e12 01 50 dBCharge transfer errorVCTETA= +25C, see 4.4.1e12 01 -15 +15 mV1/ Unless otherwise specified, +V = 15 V, -V = -3 V, VL= 5 V, WR = 0.8 V, and RS , EN = 2 V.3.8 Notification of change for device class M. For dev

41、ice class M, notification to DSCC-VA of change of product (see 6.2herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity re

42、tainthe option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be madeavailable onshore at the option of the reviewer.3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be inmicrocircuit

43、 group number 82 (see MIL-PRF-38535, appendix A).4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance withMIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modificati

44、on in the QM planshall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall bein accordance with MIL-PRF-38535, appendix A.4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be c

45、onductedon all devices prior to qualification and technology conformance inspection. For device class M, screening shall be inaccordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.4.2.1 Additional criteria for device class M.a. Burn

46、-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revisionlevel control and shall be made available to the preparing or acquiring activity upon request. The test circuit shallspecify the inputs, outputs, bia

47、ses, and power dissipation, as applicable, in accordance with the intent specified intest method 1015.(2) TA= +125C, minimum.b. Interim and final electrical test parameters shall be as specified in table II herein.Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

48、rom IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET8DSCC FORM 2234APR 97Device type 01Case outline RTerminalnumberTerminal symbol1GND2A3+V4SA15GND6SA274 / 28RS9WR10A111A012 EN13I / O14VL15SB216 GND17SB118 -V19DB20 NCFIGUR

49、E 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90602DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET9DSCC FORM 2234APR 97I / OA1 A0 ENWR RS 4 / 2 1/ON switchXXXX 1 1 Maintains previou