DLA SMD-5962-11209 REV D-2011 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL DC-DC CONVERTER.pdf
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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE
2、FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Greg Cecil APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER DRAWING APPROVAL DATE 11-10-03 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-11209 SHEET 1 OF 13 DSCC FORM 2233
3、 APR 97 5962-E459-11Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing document
4、s five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 P
5、IN. The PIN shall be as shown in the following example: 5962 - 11209 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (
6、RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. Only the RHA levels specified herein are available (see 4.3.5). 1.2.2 Device type. The device type identify the circui
7、t function as follows: Device type Generic number Circuit function 01 MFP0507S DC-DC converter, 16.5 W, 5 A outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-3853
8、4 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Stand
9、ard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperatu
10、re range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. T
11、hese exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers inte
12、rnal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 10 Flat package Provided by IHSNot for ResaleNo reproductio
13、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings.
14、 1/ Input voltage range (continuous) . 0.0 to +6.0 V dc Input voltage (transient) . +15.0 V dc Power dissipation (PD, full load, +125C) . 2.7 W 2/ Output power 2/ 16.5 W Lead soldering temperature (10 seconds) . +300C Storage temperature range -70C to +150C 1.4 Recommended operating conditions. Inpu
15、t voltage range +3.0 V dc to +6.0 V dc Output voltage range . +0.64 V to +3.5 V Case operating temperature range (TC) . -55C to +125C 1.5 Radiation features. Device type 01 (RHA levels P and R): 3/ Total ionizing dose (TID): MIL-STD-883 method 1019, condition A 100 Krad(Si) MIL-STD-883 method 1019,
16、condition D 30 Krad(Si) Enhanced low dose rate sensitivity (ELDRS) Single event effects (SEE): Single event latch-up (SEL) 85.4 MeV cm2/mg Single event burn-out (SEB) . 85.4 MeV cm2/mg 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standa
17、rds, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF
18、 DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these docume
19、nts are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device, except for input voltage transi
20、ents up to 15 V for no more than 1 second. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output power and power dissipation are dependent on output voltage. 3/ Limits are guaranteed by design or process, but not production tested. Provided by IHSNot for
21、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 2.2 Non-Governmental publication. The following document(s) form a part of this docu
22、ment to the extent specified herein. AMERICAN SOCIETY FOR TESTING AND MATERIAL (ASTM) ASTM 1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced Heavy Ion Irradiation of Semiconductor Devices. (Copies of this document are available online at http:/www.astm.org/ or ASTM In
23、ternational, P. O. BOX C700, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applic
24、able laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of
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