ASTM E1854-2013 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts《确保电子部件的中子引起的位移损伤试验一致性的标准实施规程》.pdf

《ASTM E1854-2013 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts《确保电子部件的中子引起的位移损伤试验一致性的标准实施规程》.pdf》由会员分享，可在线阅读，更多相关《ASTM E1854-2013 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts《确保电子部件的中子引起的位移损伤试验一致性的标准实施规程》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: E1854 13Standard Practice forEnsuring Test Consistency in Neutron-InducedDisplacement Damage of Electronic Parts1This standard is issued under the fixed designation E1854; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision

2、, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice sets forth requirements to ensure consis-tency in neutron-induced displacement damage test

3、ing ofsilicon and gallium arsenide electronic piece parts. This re-quires controls on facility, dosimetry, tester, and communica-tions processes that affect the accuracy and reproducibility ofthese tests. It provides background information on the technicalbasis for the requirements and additional re

4、commendations onneutron testing.1.2 Methods are presented for ensuring and validatingconsistency in neutron displacement damage testing of elec-tronic parts such as integrated circuits, transistors, and diodes.The issues identified and the controls set forth in this practiceaddress the characterizat

5、ion and suitability of the radiationenvironments. They generally apply to reactor sources,accelerator-based neutron sources, such as 14-MeV DTsources, and252Cf sources. Facility and environment charac-teristics that introduce complications or problems areidentified, and recommendations are offered t

6、o recognize,minimize or eliminate these problems. This practice may beused by facility users, test personnel, facility operators, andindependent process validators to determine the suitability of aspecific environment within a facility and of the testing processas a whole. Electrical measurements ar

7、e addressed in otherstandards, such as Guide F980. Additional information onconducting irradiations can be found in Practices E798 andF1190. This practice also may be of use to test sponsors(organizations that establish test specifications or otherwisehave a vested interest in the performance of ele

8、ctronics inneutron environments).1.3 Methods for the evaluation and control of undesiredcontributions to damage are discussed in this practice. Refer-ences to relevant ASTM standards and technical reports areprovided. Processes and methods used to arrive at the appro-priate test environments and spe

9、cification levels for electronicssystems are beyond the scope of this practice; however, theprocess for determining the 1-MeV equivalent displacementspecifications from operational environment neutron spectrashould employ the methods and parameters described herein.Some important considerations and

10、recommendations are ad-dressed in Appendix X1 (Nonmandatory information).1.4 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its us

11、e. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 The ASTM standards listed below present methods forensuring proper determination of neutron

12、 spectra and fluences,gamma-ray doses, and damage in silicon and gallium arsenidedevices. The proper use of these standards is the responsibilityof the radiation metrology or dosimetry organization affiliatedwith facility operations. The references listed in each standardare also relevant to all par

13、ticipants as background material fortesting consistency.2.2 ASTM Standards:2E170 Terminology Relating to Radiation Measurements andDosimetryE181 Test Methods for Detector Calibration and Analysis ofRadionuclidesE261 Practice for Determining Neutron Fluence, FluenceRate, and Spectra by Radioactivatio

14、n TechniquesE262 Test Method for Determining Thermal Neutron Reac-tion Rates and Thermal Neutron Fluence Rates by Radio-activation TechniquesE263 Test Method for Measuring Fast-Neutron ReactionRates by Radioactivation of Iron1This practice is under the jurisdiction of ASTM Committee E10 on NuclearTe

15、chnology and Applicationsand is the direct responsibility of SubcommitteeE10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.Current edition approved June 1, 2013. Published July 2013. Originally approvedin 1996. Last previous edition approved in 2007 as E1854 - 07. DOI: 10.

16、1520/E1854-13.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor D

17、rive, PO Box C700, West Conshohocken, PA 19428-2959. United States1E264 Test Method for Measuring Fast-Neutron ReactionRates by Radioactivation of NickelE265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32E393 Test Method for Measuring Reaction Rate

18、s by Analy-sis of Barium-140 From Fission DosimetersE481 Test Method for Measuring Neutron Fluence Rates byRadioactivation of Cobalt and SilverE482 Guide for Application of Neutron Transport Methodsfor Reactor Vessel Surveillance, E706 (IID)E496 Test Method for Measuring Neutron Fluence andAverage E

19、nergy from3H(d,n)4He Neutron Generators byRadioactivation TechniquesE523 Test Method for Measuring Fast-Neutron ReactionRates by Radioactivation of CopperE526 Test Method for Measuring Fast-Neutron ReactionRates by Radioactivation of TitaniumE666 Practice for Calculating Absorbed Dose From Gammaor X

20、 RadiationE668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining AbsorbedDose in Radiation-Hardness Testing of Electronic DevicesE704 Test Method for Measuring Reaction Rates by Radio-activation of Uranium-238E705 Test Method for Measuring Reaction Rates by Radio

21、-activation of Neptunium-237E720 Guide for Selection and Use of Neutron Sensors forDetermining Neutron Spectra Employed in Radiation-Hardness Testing of ElectronicsE721 Guide for Determining Neutron Energy Spectra fromNeutron Sensors for Radiation-Hardness Testing of Elec-tronicsE722 Practice for Ch

22、aracterizing Neutron Fluence Spectra inTerms of an Equivalent Monoenergetic Neutron Fluencefor Radiation-Hardness Testing of ElectronicsE798 Practice for Conducting Irradiations at Accelerator-Based Neutron SourcesE844 Guide for Sensor Set Design and Irradiation forReactor Surveillance, E 706 (IIC)E

23、944 Guide for Application of Neutron Spectrum Adjust-ment Methods in Reactor Surveillance, E 706 (IIA)E1018 Guide for Application of ASTM Evaluated CrossSection Data File, Matrix E706 (IIB)E1249 Practice for Minimizing Dosimetry Errors in Radia-tion Hardness Testing of Silicon Electronic Devices Usi

24、ngCo-60 SourcesE1250 Test Method for Application of Ionization Chambersto Assess the Low Energy Gamma Component ofCobalt-60 Irradiators Used in Radiation-Hardness Testingof Silicon Electronic DevicesE1297 Test Method for Measuring Fast-Neutron ReactionRates by Radioactivation of NiobiumE1855 Test Me

25、thod for Use of 2N2222A Silicon BipolarTransistors as Neutron Spectrum Sensors and Displace-ment Damage MonitorsE2005 Guide for Benchmark Testing of Reactor Dosimetryin Standard and Reference Neutron FieldsE2450 Practice for Application of CaF2(Mn) Thermolumi-nescence Dosimeters in Mixed Neutron-Pho

26、ton Environ-mentsF980 Guide for Measurement of Rapid Annealing ofNeutron-Induced Displacement Damage in Silicon Semi-conductor DevicesF1190 Guide for Neutron Irradiation of Unbiased ElectronicComponents3. Functional Responsibilities3.1 The following terms are used to identify key roles andresponsibi

27、lities in the process of reactor testing of electronics.Some participants may perform more than one role, and therelationship among the participants may differ from testprogram to test program and from facility to facility.3.2 SponsorIndividual or organization requiring the testresults and ultimatel

28、y responsible for the test specifications anduse of the results (for example, a system developer or procur-ing activity). Test sponsors should consider the objectives ofthe test and the issues raised in this practice. They shall clearlycommunicate to the user the test requirements, includingspecific

29、 test methods.3.3 UserGenerally, the individual or team who contractsfor the use of the facility, specifies the characteristics needed toaccomplish the test objectives, and makes sure that the docu-mentation of the test parameters is complete. If the test sponsordoes not communicate clear requiremen

30、ts and sufficient infor-mation to fully interpret them, the user shall communicate tothe sponsor, prior to the test, the assumptions made and anylimitations of applicability of test data because of theseassumptions. This may require consultation with a testspecialist, who may be internal or external

31、 to the user organi-zation. Facility users also should consider the objectives oftheir tests and the issues raised in this practice. The user mayalso conduct the tests. The user shall communicate theenvironmental, procedural (including specific test methods, ifany) and reporting requirements to the

32、other participantsincluding the tester, the facility operators, and the test special-ist.3.4 Facility OrganizationThe group responsible for pro-viding the radiation environment. The facility organizationshall provide pre-test communication to the user on facilitycapabilities, cautions, and limitatio

33、ns, as well as dosimetrycapabilities, characteristics of the test environment, and testconsistency issues unique to the facility and/or test stationwithin the facility. If there is no independent validator, thefacility shall also be required to provide the user with docu-mentation on the controls, c

34、alibrations, and validation tests,which verify its suitability for the proposed tests. Post-test, thefacility shall report dosimetry results, relevant operationalparameters, and any occurrences that might affect the testresults. The radiation facility and test station used in the testshall meet the

35、criteria specified in Section 5.3.5 Dosimetry GroupIndividual or team providing data ofrecord on dose, dose rate, neutron fluence, and spectra.3.6 Test SpecialistIndividual providing radiation test ex-pertise. This individual may identify the appropriate damageE1854 132function(s) and may fold them

36、with neutron spectra todetermine/predict damage and damage ratios. This individualmay also provide information on experiment limitations, cus-tom configurations that are advantageous, and interpretation ofdosimetry results.3.7 ValidatorIndependent person who may be responsiblefor verifying either th

37、e suitability of the radiation environment,the quality of the radiation test including the electricalmeasurements, or the radiation hardness of the electronic partproduction line.4. Significance and Use4.1 This practice was written primarily to guide test partici-pants in establishing, identifying,

38、maintaining, and using suit-able environments for conducting high quality neutron tests. Itsdevelopment was motivated, in large measure, because inad-equate controls in the neutron-effects-test process have in somepast instances resulted in exposures that have differed byfactors of three or more fro

39、m irradiation specifications. Aradiation test environment generally differs from the environ-ment in which the electronics must operate (the operationalenvironment); therefore, a high quality test requires not onlythe use of a suitable radiation environment, but also control andcompensation for cont

40、ributions to damage that differ fromthose in the operational environment. In general, the responsi-bility for identifying suitable test environments to accomplishtest objectives lies with the sponsor/user/tester and test spe-cialist part of the team, with the assistance of an independentvalidator, i

41、f available. The responsibility for the establishmentand maintenance of suitable environments lies with the facilityoperator/dosimetrist and test specialist, again with the possibleassistance of an independent validator. Additional guidance onthe selection of an irradiation facility is provided in P

42、racticeF1190.4.2 This practice identifies the tasks that must be accom-plished to ensure a successful high quality test. It is the overallresponsibility of the sponsor or user to ensure that all of therequired tasks are complete and conditions are met. Otherparticipants provide appropriate documenta

43、tion to enable thesponsor or user to make that determination.4.3 The principal determinants of a properly conducted testare: (1) the radiation test environment shall be wellcharacterized, controlled, and correlated with the specifiedirradiation levels; (2) damage produced in the electronicmaterials

44、and devices is caused by the desired, specifiedcomponent of the environment and can be reproduced at anyother suitable facility; and (3) the damage corresponding to thespecification level derived from radiation environments inwhich the electronics must operate can be predicted from thedamage produce

45、d by the test environment. In order to ensurethat these requirements are met, system developers, procurers,users, facility operators, and test personnel must collectivelymeet all of the essential requirements and effectively commu-nicate to each other the tasks that must be accomplished andthe condi

46、tions that must be met. Criteria for determining andmaintaining the suitability of neutron radiation environmentsfor 1-MeVequivalent displacement damage testing of electron-ics parts are presented in Section 5. Mandatory requirementsfor test consistency in neutron displacement damage testing ofelect

47、ronic parts are presented in Section 5. Additional back-ground material on neutron testing and important consider-ations for gamma dose and dose rate effects are presented in(non-mandatory) Appendix X1 and Appendix X2, but compli-ance is not required.4.4 Some neutron tests are performed with a speci

48、fic endapplication for the electronics in mind. Others are performedmerely to ensure that a 1-MeV-equivalent-displacement-damage-specification level is met. The issues and controlspresented in this practice are necessary and sufficient to ensureconsistency in the latter case. They are necessary but

49、may notbe sufficient when the objective is to determine device perfor-mance in an operational environment. In either case, a corol-lary consistency requirement is that test results obtained at asuitable facility can be replicated within suitable precision atany other suitable facility.4.4.1 An objective of radiation effects testing of electronicdevices is often to predict device performance in operationalenvironments from the data that is obtained in the testenvironments. If the operational and test environments differmaterially from each other, then damage equivalence method-ol