IEEE C37 41-2008 en Standard Design Tests for High-Voltage ( 1000 V) Fuses Fuse and Disconnecting Cutouts Distribution Enclosed Single-Pole Air Switches Fuse Di.pdf

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1、IEEE Std C37.41-2008(Revision ofIEEE Std C37.41-2000)IEEE Standard Design Tests for High-Voltage(1000 V) Fuses, Fuse and DisconnectingCutouts, Distribution Enclosed Single-Pole AirSwitches, Fuse Disconnecting Switches, and FuseLinks and Accessories Used with These Devices IEEE3 Park Avenue New York,

2、 NY 10016-5997, USA13 March 2009IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on May 4, 2009 at 0

3、6:41 from IEEE Xplore. Restrictions apply.iv Copyright 2009 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.41-2008, IEEE Standard for Design Tests for High-Voltage (1000 V) Fuses, Fuse and Disconnecting Cutouts, Distribution Enclosed Single-Pole Air Switches, F

4、use Disconnecting Switches, and Fuse Links and Accessories Used with These Devices. IEEE Std C37.41-2008 is a revision of IEEE Std C37.41-2000, done in order to bring it up to date and into agreement with current requirements for high-voltage fuses and switches. Distribution class oil cutouts were d

5、evices formerly covered by IEEE/ANSI standards. However, ANSI C37.44-1981, which covered specifications for such devices, has been withdrawn. Since these devices are now considered obsolete, testing for oil cutouts has been removed from this standard. The rules covering homogeneous series testing of

6、 expulsion fuses have been greatly expanded, and homogeneous series testing for parallel current-limiting fuses has been introduced. Certain information, previously in ANSI C37.53.1, concerning the testing of motor-starter fuses has been incorporated. Several changes to current-limiting fuse testing

7、 have been made to align more closely with the latest IEC test requirements. At the request of testing authorities, several clarifications concerning test methods and interpretation of results have been added. The Revision of Fuse Standards Working Group of the IEEE Subcommittee on High-Voltage Fuse

8、s prepared the standard. Liaison was maintained with the International Electrotechnical Commission (IEC) during the development of the revisions in order to incorporate the latest activities at the time of publication. The Switchgear Committee of the IEEE Power and Energy Society has recently approv

9、ed and published IEEE Std C37.100.1-2007 B4.aAlthough IEEE Std C37.100.1-2007 is not specifically referenced in this document, any information that may apply to fuse devices has been incorporated. This standard is one of a series of complementary standards covering various types of high-voltage fuse

10、s and switches, arranged so that certain standards apply to all devices while other standards provide additional specifications for a particular device. For any device, IEEE Std C37.40, this IEEE Std C37.41, plus any additional standards covering that device, constitute a complete standard for the d

11、evice. In addition, IEEE Std C37.48provides application, operation, and maintenance guidance for all the devices, and it is supplemented by IEEE Std C37.48.1-2002B3, which is an operation, classification, application, and coordination guide for current-limiting fuses. At the time this standard was a

12、pproved, this series was comprised of the following standards: ANSI C37.42, American National Standard Specifications for High Voltage Expulsion Type Distribution Class Fuses, Cutouts, Fuse Disconnecting Switches and Fuse Links. ANSI C37.46, American National Standard for High Voltage Expulsion and

13、Current-Limiting Type Power Class Fuses and Fuse Disconnecting Switches. ANSI C37.47, American National Standard for High-Voltage Current-Limiting Type Distribution Class Fuses and Fuse Disconnecting Switches. IEEE Std C37.40, IEEE Standard Service Conditions and Definitions for High-Voltage Fuses,

14、Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories. IEEE Std C37.41, IEEE Standard Design Tests for High-Voltage (1000 V) Fuses, Fuse and Disconnecting Cutouts, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Fuse Links and A

15、ccessories Used with These Devices. aThe numbers in brackets correspond to those of the bibliography in Annex F . Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on May 4, 2009 at 06:41 from IEEE Xplore. Restrictions apply.v Copyright 2009 IEEE. All rights reserved. IEEE Std C3

16、7.43, IEEE Standard for Specifications for High-Voltage Expulsion, Current-Limiting and Combination Type Distribution and Power Class External Fuses, With Rated Voltages from 1kV through 38kV, Used for the Protection of Shunt Capacitors.IEEE Std C37.45,IEEE Standard Specifications for High-Voltage D

17、istribution Class Enclosed Single-Pole Air Switches with Rated Voltages from 1 kV through 8.3 kV. IEEE Std C37.48, IEEE Guide for Application, Operation, and Maintenance of High-Voltage Fuses, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories. IEEE Std C37.

18、48.1, IEEE Guide for the Operation, Classification, Application, and Coordination of Current-Limiting Fuses with Rated Voltages 138 kV. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard do

19、es not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable la

20、ws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization,

21、and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these docu

22、ments may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda,

23、or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE

24、 at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA website at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards

25、.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Authorized licensed use limited to: IHS Stephanie

26、Dejesus. Downloaded on May 4, 2009 at 06:41 from IEEE Xplore. Restrictions apply.vi Copyright 2009 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this draft standard may require use of subject matter covered by patent rights. By publication of this d

27、raft standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Cl

28、aims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this draft standard are expressly advised that determination of the validity of any pat

29、ent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was submitted to the IEEE-SA Standards Board, the Revision of fuse Standards Working Group ha

30、d the following membership: John G. Leach, Chair Glenn R. Borchardt, Secretary Chris Ambrose John G. Angelis L. Ronald Beard Sheila Brown Fernando Calderon H. Edward Foelker Dan Gardner Stephen P. Hassler Gary Haynes Frank G. Ladonne James R. Marek Frank J. Muench Donald M. Parker R. Neville Parry P

31、hilip Rosen Tim E. Royster John S. Schaffer Mark W. Stavnes Frank M. Stepniak John G. St.Clair Janusz Zawadzki This document was sponsored by the Switchgear Committee of the IEEE Power and Energy Society. When this document was approved, the members of the Switchgear Committee had the following memb

32、ership: Ted A. Burse, Chair Bill Long, Vice Chair Ken Edwards, Secretary Michael Wactor, Standards Coordinator Roy Alexander Chris Ambrose John G. Angelis Charles J. Ball Paul D. Barnhart Robert Behl W. J. (Bill) Bergman Anne Bosma John Brunke Ray Capra Patrick DiLillo Alexander Dixon Randall Dotson

33、 Denis Dufournet Peter W. Dwyer Douglas Edwards Marcel Fortin Mietek Glinkowski S. S. (Dave) Gohil Keith I. Gray Carlos Isaac Richard Jackson Frank G. Ladonne Stephen Lambert John G. Leach Dave Lemmerman James R. Marek Neil McCord Nigel P. McQuin Steven Meiners Alec Monroe Georges Montillet Anne F.

34、Morgan Frank J. Muench Yasin Musa Jeffrey Nelson T. W. Olsen Michael Orosz Robert J. Puckett Carl Reigart Timothy Royster Roderick Sauls Devki Sharma Michael D. Sigmon R. Kirkland Smith H. M. Smith David Stone Alan D. Storms Thomas Tobin Rich York Janusz Zawadzki Authorized licensed use limited to:

35、IHS Stephanie Dejesus. Downloaded on May 4, 2009 at 06:41 from IEEE Xplore. Restrictions apply.vii Copyright 2009 IEEE. All rights reserved. The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman

36、 Steven Alexanderson Michael Baldwin Steven Bezner William Bloethe Glenn Borchardt James Bouford Harvey Bowles Chris Brooks Robert Brown Eldridge Byron Thomas Callsen Yunxiang Chen Tommy Cooper F. A. Denbrock Carlo Donati Gary Engmann Marcel Fortin Daniel Gardner Manuel Gonzalez Edwin Goodwin Randal

37、l Groves Ajit Gwal John Harder Ronald Hartzel Gary Heuston William Hurst Richard Jackson Joseph L. Koepfinger David W. Krause Jim Kulchisky Saumen Kundu Frank G. Ladonne Chung-Yiu Lam Stephen Lambert John G. Leach R. Long Federico Lopez G. Luri Frank Mayle Gary Michel Georges Montillet Frank J. Muen

38、ch Jerry Murphy Jeffrey Nelson Michael S. Newman Joe Nims T. W. Olsen Miklos Orosz Donald Parker R. Neville Parry Iulian Profir Michael Roberts Timothy Robirds Charles Rogers Timothy Royster Thomas Rozek Bartien Sayogo James E. Smith James Smith Francois Soulard James Swank Michael Swearingen John V

39、ergis Janusz Zawadzki When the IEEE-SA Standards Board approved this standard on 10 November 2008, it had the following membership: Robert M. Grow, Chair Tom A. Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeBlasio Andrew Drozd Mark Epstein Alexander

40、Gelman William R. Goldbach Arnold M. Greenspan Kenneth S. Hanus James Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sahazizian Malcolm V. Thaden Howard L. Wolfm

41、an Don Wright*Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael Janezic, NIST Representative Jennie M. Steinhagen IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Man

42、ager, Technical Program Development Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on May 4, 2009 at 06:41 from IEEE Xplore. Restrictions apply.viii Copyright 2009 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 Background 2 1.4 Description of

43、 fuse-enclosure packages (FEPs) using expulsion type indoor power class fuses . 2 1.5 Description of FEPs using current-limiting type indoor distribution and power class fuses . 3 2. Normative references 3 3. Required tests . 4 3.1 General 4 3.2 Device tests 5 3.3 FEP tests 6 3.4 Test values . 6 3.5

44、 Testing responsibility 6 3.6 Test report 6 4. Common test requirements . 6 4.1 General 6 4.2 Test site conditions 7 4.3 Frequency and wave shape of test voltage . 7 4.4 Devices to be tested . 7 4.5 Acceptance criteria 7 4.6 Test-conductor dimensions 8 4.7 Mounting and grounding of the device for te

45、sts 9 5. Dielectric tests .11 5.1 General .11 5.2 Measurement of test voltages .11 5.3 Description of power-frequency dry-withstand voltage tests .11 5.4 Description of power-frequency wet-withstand voltage tests on outdoor devices 12 5.5 Description of power-frequency dew-withstand voltage tests on

46、 indoor devices .12 5.6 Description of impulse withstand voltage tests 12 5.7 Distribution class expulsion type fuses, cutouts, and fuse disconnecting switch test connections and test values .13 5.8 Distribution class enclosed single-pole air switch test connections and test values .14 5.9 Power cla

47、ss expulsion fuses, power class current-limiting fuses, and power class fuse disconnecting switch test connections and test values .14 5.10 Distribution class current-limiting fuse and fuse disconnecting switch test connections and test values 15 5.11 Distribution class, power class expulsion and cu

48、rrent-limiting type fuses, and fuse disconnecting switches used in FEPs .16 5.12 Distribution and power class external fuses for shunt capacitors .18 6. Interrupting tests 18 6.1 Procedures common to all interrupting tests .18 6.2 Interrupting tests on a homogeneous series of expulsion type fuses.20

49、 6.3 Description of interrupting tests on distribution class open-link cutouts 26 6.4 Description of interrupting tests on distribution class fuse cutouts (open and enclosed) (except current-limiting fuses) 26 Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on May 4, 2009 at 06:41 from IEEE Xplore. Restrictions apply.ix Copyright 2009 IEEE. All rights reserved. 6.5 Description of interrupting tests on power class fuses and fuse disconnecting switches (except current-limiting fuses and liquid-submerged expulsion fuses) .32 6.6 Description o