IEEE C37 41 ERTA-2009 en Errata to IEEE Standard Design Tests for High-Voltage ( 1000 V) Fuses Fuse and Disconnecting Cutouts Distribution Enclosed Single-Pole .pdf

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1、22 May 2009 1 STD95852 IEEE Std C37.41-2008 (Revision of IEEE Std C37.41-2000) Errata to IEEE Standard Design Tests for High-Voltage (1000 V) Fuses, Fuse and Disconnecting Cutouts, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Fuse Links and Accessories Used with T

2、hese Devices Sponsor Switchgear Committee of the IEEE Power see 6.2. f A fuse cutout support fuse base shall be capable, at a minimum, of the number of tests listed as “Number of tests required on each fuseholder and its fuse support.” For test series 1, this represents three tests with the minimum

3、fuse link rating using one fuseholder and support, and three tests with the maximum fuse link rating using another fuseholder and support. The same quantities would be used for test series 2, whereas for test series 3, one fuse holder and its support would be used for the two required tests. For tes

4、t series 4 and 5, the same fuseholder and support is used for the four required tests. Only the manufacturer has the discretion to permit a fuseholder, or cutout support to be used for more than the specified number of individual tests. After each test on a fuseholder that uses replaceable links, on

5、ly the fuse link and the expendable cap, if used, may be replaced. Only the manufacturer has the discretion to use an expendable cap for more than one test if it is determined that the cap was not damaged during a previous test. If the fuse element is an integral part of the fuseholder, then the num

6、ber of fuseholders to be tested is the number listed for “Number of tests required on each fuseholder and fuse support.” The mounting brackets used for the cutout testing should be as specified in ANSI C37.42. Any deviation from this specification shall be noted in the test report for the device. 22

7、 May 2009 3 STD95852 Table 8Interrupting performance tests and test circuit parameters for slant-voltage-rated (multiple-voltage-rated) distribution class fuse cutouts Parameters Test series 1 2 3 4 5 6aPower-frequency recovery voltage Rated maximum voltage to the left of the slant +5%, 0% Rated max

8、imum voltage to the right of the slant +5%, 0% Transient recovery voltage (TRV) See Table 9, column 1 See Table 9, column 2 See Table 9, column 4 See Noteb See Table 9, column 2 Prospective or test current rms symmetrical Rated interrupting current +5%, 0% From 70% to 80% rated interrupting current

9、From 20% to 30% rated interrupting currentc From 400 A to 500 AdFrom 2.7 to 3.3 times fuse link ratingeRated interrupting current +5%, 0% X/R ratio (power factor) See Table 10 From 1.3 to 0.75 (from 0.6 to 0.8) See Table 10 Making angle related to voltage zerodegrees 1st test: from 5 to +15 2nd test

10、: from 85 to 105 3rd test: from 130 to 150 From 85 to 105 Random timing 1st test: from 5 to +15 2nd test: from 85 to 105 3rd test: from 130 to 150 Fuse link ratingfMin Max Min Max Min Max Min Min Min,gMax,gNumber of tests required with above fuselink ratingh3 3 3 3 1 1 2 2 3 3 Number of tests requir

11、ed on each fuseholder and fuse supporth3 3 3 3 2 4 3 3 Number of fuseholders to be testedh1 1 1 1 1 1 1 1 Number of fuse supports to be testedh1 1 1 1 1 1 1 1 Duration of power-frequency recovery voltage after interruption Dropout fuses Not less than 0.5 s Non-dropout fuses Not less than 0.5 s a Tes

12、t series 6 uses two identically rated cutouts in electrical series connection. Test-circuit ground must not be between the cutouts. b The TRV for this test circuit shall be critically damped. Shunting the load reactance with a resistance having a value equal to approximately 40-times the value of th

13、e reactance is usually adequate to critically damp the circuit. However, if this value does not result in critical damping, the resistance may be reduced to achieve critical damping. For testing convenience, an oscillatory TRV may be acceptable with the agreement of the manufacturer. Critical dampin

14、g is obtained when: XffRno2=where fois the natural frequency of the test circuit without damping fnis the power frequency X is the reactance of the circuit at power frequency c For cutouts with an interrupting rating of 2.8 kA or less, Test Series 3 need not be made. d For cutouts rated 200 A, Test

15、Series 4 need not be made. e If the test involves a melting time appreciably higher than 2 s, the current may be increased to obtain a melting time of approximately 2 s. f“Min” and “max” represent the minimum and maximum rated currents of a homogeneous series, see 6.2. gUse same fuse link rating in

16、both cutouts. 22 May 2009 4 STD95852 h A fuse cutout support fuse base shall be capable, at a minimum, of the number of tests listed as “Number of tests required on each fuseholder and its fuse support”. For test series 1, this represents three tests with the minimum fuse link rating using one fuseh

17、older and support, and three tests with the maximum fuse link rating using another fuseholder and support. The same quantities would be used for test series 2, while for test series 3, one fuse holder and its support would be used for the two required tests. For test series 4 and 5, the same fusehol

18、der and support is used for the four required tests. Only the manufacturer has the discretion to permit a fuseholder, or cutout support, to be used for more than the specified numbe r of individual tests. After each test on a fuseholder that uses replaceable links, only the fuse link and the expenda

19、ble cap, if used, may be replaced. Only the manufacturer has the discretion to use an expendable cap for more than one test, if it is determined that the cap was not damaged during a previous test. If the fuse element is an integral part of the fuseholder, the number of fuseholders to be tested is the number listed for “Number of tests required on each fuseholder and fuse support.” The mounting brackets used for the cutout testing should be as specified in Std. C37.42. Any deviation from this specification shall be noted in the test report for the device.