IEC TR 62652-2010 Effects of engaging and separating under electrical load on connector interfaces in cabling used to support IEEE 802.af (Power-over-Ethernet) .pdf
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1、 IEC/TR 62652 Edition 1.0 2010-03 TECHNICAL REPORT Effects of engaging and separating under electrical load on connector interfaces in cabling used to support IEEE 802.3af (power-over-ethernet) applications IEC/TR 62652:2010(E) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC
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6、eb: www.iec.ch About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Cat
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10、22 919 02 11 Fax: +41 22 919 03 00 IEC/TR 62652 Edition 1.0 2010-03 TECHNICAL REPORT Effects of engaging and separating under electrical load on connector interfaces in cabling used to support IEEE 802.3af (power-over-ethernet) applications INTERNATIONAL ELECTROTECHNICAL COMMISSION U ICS 13.220.10 P
11、RICE CODE ISBN 2-8318-1087-3 Registered trademark of the International Electrotechnical Commission colour inside 2 TR 62652 IEC:2010(E) CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references .7 3 Abbreviations .7 4 General 8 5 Telecommunications industry information .8 6 Technical infor
12、mation .9 6.1 Electrical discharges .9 6.2 Surface plating. long and short term effects.10 6.3 IEEE 802.3af Power-over-Ethernet environment (PoE) .11 6.4 Factors affecting the connector durability and definition of a nominal contact zone12 6.5 Acceptance criteria13 7 Test procedures, test set-up des
13、cription and results.14 7.1 General .14 7.2 Tests 1A and 2A Evaluation of the mechanical damage15 7.3 Tests 3A15 7.4 Test 4A Comparison of different IEC 60603-7 connectors.17 7.4.1 General .17 7.4.2 Tests Visual inspection of contacts.17 7.4.3 Results and observations to test 4A.17 7.5 Test 5A Resis
14、tive test setup simulating PoE power stress 19 7.5.1 General .19 7.5.2 Test setup .19 7.5.3 Tests Visal inspection of contacts.19 7.5.4 Results and observations to test 5A.19 7.6 Test 6A Engaging and separating with IEEE 802.3af hardware.20 7.6.1 PoE hardware20 7.6.2 Tests Visual inspection of conta
15、cts.21 7.6.3 Results Test 6A 21 7.7 Test 7A and 8A Effect of speed of contact separation.22 7.8 Tests 9A, 10A and 11A Effect of the cord length.22 7.9 Test 12A Effect of polarity 23 7.10 Test 13 A Investigation of IEC 60603-7-7 or IEC 61076-3-110 connecting hardware.24 7.11 Tests 14A and 15 A. 100 m
16、 long cable test25 8 Conclusions26 9 Future work 26 Bibliography28 Figure 1 Illustration of a typical shielded 8-way connector according IEC 60603-7 .9 Figure 2 Illustration of an IEC 60603-7-7 or IEC 61076-3-110 connector9 Figure 3 Connecting hardware contacts .10 Figure 4 Endspan PSE Alternative A
17、 according to IEEE 802.3af .11 TR 62652 IEC:2010(E) 3 Figure 5 Midspan PSE Alternative B according to IEEE 802.3af11 Figure 6 Cables used in the study12 Figure 7 Illustration of contact engaging cycle13 Figure 8 Illustration of a nominal contact area concept.13 Figure 9 Illustration of a low level c
18、ontact resistance (bulk) test.14 Figure 10 IEC 60603-7-7 connector contacts .15 Figure 11 Test circuit A16 Figure 12 Test results of tests 1A and 3A.16 Figure 13 Test circuit B17 Figure 14 Damage due to electrical discharges18 Figure 15 Test 4A Changes in LLCR .18 Figure 16 Test circuit C19 Figure 1
19、7 Test 5A observations .20 Figure 18 Test 5A results show little change in LLCR.20 Figure 19 Test circuit D21 Figure 20 Test results test 6A 21 Figure 21 Test circuit E22 Figure 22 LLCR (bulk) change .22 Figure 23 Test circuit F 23 Figure 24 Test 12A Observed minor damage to the plug connector surfa
20、ce 24 Figure 25 Discharge effects for the IEC 60603-7-7 connector 25 Figure 26 Test results test 13A 25 Figure 27 Change in the LLCR due to electrical and mechanical discharge for IEC 60603-7 connectors including 2 m, 10 m, and 100 m cables combined.26 Table 1 Some factors affecting the connecting h
21、ardware durability 12 Table 2 Selected parameters of the test set up and procedures .14 4 TR 62652 IEC:2010(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ EFFECTS OF ENGAGING AND SEPARATING UNDER ELECTRICAL LOAD ON CONNECTOR INTERFACES IN CABLING USED TO SUPPORT IEEE 802.3af (POWER-OVER-ETHERNET) AP
22、PLICATIONS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardiza
23、tion in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is
24、entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the I
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