IEC 60512-16-5-2008 Connectors for electronic equipment - Tests and measurements - Part 16-5 Mechanical tests on contacts and terminations - Test 16e Gauge rete.pdf

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1、 IEC 60512-16-5Edition 1.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 16-5: Mechanical tests on contacts and terminations Test 16e: Gauge retention force (resilient contacts) Connecteurs pour quipements lectroniques Essais et mes

2、ures Partie 16-5: Essais mcaniques des contacts et des sorties Essai 16e: Force de rtention du calibre (contacts lastiques) IEC60512-16-5:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication

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16、erv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-5Edition 1.0 2008-07INTERNATIONAL STANDARD NORME INTERNATION

17、ALEConnectors for electronic equipment Tests and measurements Part 16-5: Mechanical tests on contacts and terminations Test 16e: Gauge retention force (resilient contacts) Connecteurs pour quipements lectroniques Essais et mesures Partie 16-5: Essais mcaniques des contacts et des sorties Essai 16e:

18、Force de rtention du calibre (contacts lastiques) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE EICS 31.220.10 PRICE CODECODE PRIXISBN 2-8318-9880-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechn

19、ique Internationale 2 60512-16-5 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-5: Mechanical tests on contacts and terminations Test 16e: Gauge retention force (resilient contacts) FOREWORD 1) The International Electrotechnica

20、l Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this en

21、d and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Comm

22、ittee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in ac

23、cordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all

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25、ponsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any diverge

26、nce between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6)

27、 All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damag

28、e or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publi

29、cation. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all su

30、ch patent rights. International Standard IEC 60512-16-5 has been prepared by subcommittee 48B, Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 16e of IEC 60512-8, issued in 1993. This

31、standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. The text of this standard is based on the following documents: FDIS Report on voting 48B/1886/FDIS 48B/1919/RVD Full information on the voting for the approval of this sta

32、ndard can be found in the report on voting indicated in the above table. 60512-16-5 IEC:2008 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measu

33、rements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication

34、 will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-16-5 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-5: Mechanical tests on contacts and terminations Test 16e: Gauge retention force (resilient contacts) 1 Scope and object This part of I

35、EC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to determine the

36、holding capacity of contacts with resilient features by means of gauges. The test is also applicable to the grounding contact spring, and other similar contact systems, where the ability to retain a gauge is to be demonstrated. In these cases, the component detail specification shall contain suffici

37、ent detail, given under 5 d) to f), to enable the test to be done. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced docu

38、ment (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination ISO 1302, Geometrical Product Specifications (GPS) Indication of surface texture in technical product documentation 3 Preparati

39、ons 3.1 Preparation of specimen The specimen shall consist of a connector with its terminations, and may be wired if so specified in the detail specification. If lubricant is specified for use with the contact system, it shall be applied in the manner specified in the detail specification. Any preco

40、nditioning given in the detail specification shall be applied. 3.2 Equipment Set(s) of gauges as specified in the detail specification, shall be provided. 3.3 Mounting If mounting of the specimen is appropriate, it shall be as specified in the detail specification. 60512-16-5 IEC:2008 5 4 Test metho

41、d 4.1 Method A individual contact gauges 4.1.1 Female contacts Each contact to be tested shall have the maximum size gauge specified inserted and withdrawn three times. After which, the minimum size retention force gauge specified shall be inserted. 4.1.2 Male contacts Each contact to be tested shal

42、l be inserted into and withdrawn from the minimum size gauge specified three times. After which, the contact shall be inserted into the maximum size retention force gauge specified. 4.2 Method B multiple contact gauges As for method A, except that contacts shall be tested in specified groups using g

43、auges having multiple contact engaging elements. After which appropriate individual maximum or minimum gauges shall be used. 4.3 Measurements and requirements 4.3.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried out. 4.3.2 During testing Contacts shall support the weig

44、ht of the individual contact retention force gauge in the vertically downward direction. The gauge shall be maintained for 5 s minimum. 4.3.3 After testing Visual examination according to IEC 60512-1-1 shall be carried out. Special attention shall be given to the resilient features of the specimen.

45、5 Details to be specified When this test is required by a detail specification, the following shall be given therein: a) whether preconditioning is required; b) specification and means of application of any lubricant to be applied; c) whether the specimen is to be wired, and if so, details of this;

46、d) whether special mounting of the specimen is required; e) details of gauges to be used, including Surface Roughness according to ISO 1302; f) number of specimens to be tested; g) any deviation from the standard test method. _ 6 60512-16-5 CEI:2008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNEC

47、TEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 16-5: Essais mcaniques des contacts et des sorties Essai 16e: Force de rtention du calibre (contacts lastiques) AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de le

48、nsemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes interna

49、tionales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationa