IEC 60747-14-2-2000 Semiconductor devices - Part 14-2 Semiconductor sensors Hall elements《半导体器件 第14-2部分 半导体元件 霍尔元件》.pdf

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1、INTERNATIONAL STANDARD IEC 60747-14-2 First edition 2000-11 Semiconductor devices Part 14-2: Semiconductor sensors Hall elements Dispositifs semiconducteurs Partie 14-2: Capteurs semiconducteurs Elments effet de Hall Reference number IEC 60747-14-2:2000(E)Publication numbering As from 1 January 1997

2、 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base

3、publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technolog

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6、arches, technical committees and date of publication. On-line information is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications (www.iec.ch/JP.htm) is also available by email. Ple

7、ase contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00INTERNATI

8、ONAL STANDARD IEC 60747-14-2 First edition 2000-11 Semiconductor devices Part 14-2: Semiconductor sensors Hall elements Dispositifs semiconducteurs Partie 14-2: Capteurs semiconducteurs Elments effet de Hall PRICE CODE IEC 2000 Copyright - all rights reserved No part of this publication may be repro

9、duced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission 3, rue de Varemb Geneva, Switzerland Telefax: +41 22 919 0300 e-mail: inmailiec.ch IEC web site h

10、ttp:/www.iec.ch G For price, see current catalogueCommission Electrotechnique InternationaleInternational Electrotechnical Commission2 60747142 IEC:2000(E) CONTENTS Page FOREWORD 3 INTRODUCTION 4 Clause 1 General 5 1.1 Scope . 5 1.2 Normativereferences 5 1.3 Definitions. 5 1.4 Symbols 6 2 Essentialr

11、atingsandcharacteristics. 7 2.1 General. 7 2.2 Ratings(limitingvalues) 8 2.3 Characteristics 8 3 Measuringmethods 9 3.1 General. 9 3.2 OutputHallvoltage(V H ) 9 3.3 Offsetvoltage(V o ) 11 3.4 Inputresistance(R in ) 12 3.5 Outputresistance(R out ) 13 3.6 TemperaturecoefficientofoutputHallvoltage( a V

12、 H ) 13 3.7 Temperaturecoefficientofinputresistance( a Rin ) 1460747142 IEC:2000(E) 3 INTERNATIONALELECTROTECHNICALCOMMISSION _ SEMICONDUCTORDEVICES Part142:SemiconductorsensorsHallelements FOREWORD 1) TheIEC(InternationalElectrotechnicalCommission)isaworldwideorganizationforstandardizationcomprisin

13、g allnationalelectrotechnicalcommittees(IECNationalCommittees).TheobjectoftheIECistopromote internationalcooperationonallquestionsconcerningstandardizationintheelectricalandelectronicfields.To thisendandinadditiontootheractivities,theIECpublishesInternationalStandards.Theirpreparationis entrustedtot

14、echnicalcommittees;anyIECNationalCommitteeinterestedinthesubjectdealtwithmay participateinthispreparatorywork.International,governmentalandnongovernmentalorganizationsliaising withtheIECalsoparticipateinthispreparation.TheIECcollaboratescloselywiththeInternationalOrganization forStandardization(ISO)

15、inaccordancewithconditionsdeterminedbyagreementbetweenthetwo organizations. 2) TheformaldecisionsoragreementsoftheIEContechnicalmattersexpress,asnearlyaspossible,an internationalconsensusofopinionontherelevantsubjectssinceeachtechnicalcommitteehasrepresentation fromallinterestedNationalCommittees. 3

16、) Thedocumentsproducedhavetheformofrecommendationsforinternationaluseandarepublishedintheform ofstandards,technicalspecifications,technicalreportsorguidesandtheyareacceptedbytheNational Committeesinthatsense. 4)Inordertopromoteinternationalunification,IECNationalCommitteesundertaketoapplyIECInternat

17、ional Standardstransparentlytothemaximumextentpossibleintheirnationalandregionalstandards.Any divergencebetweentheIECStandardandthecorrespondingnationalorregionalstandardshallbeclearly indicatedinthelatter. 5)TheIECprovidesnomarkingproceduretoindicateitsapprovalandcannotberenderedresponsibleforany e

18、quipmentdeclaredtobeinconformitywithoneofitsstandards. 6)AttentionisdrawntothepossibilitythatsomeoftheelementsofthisInternationalStandardmaybethesubject ofpatentrights.TheIECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights. InternationalStandardIEC60747142hasbeenpreparedbysubcommittee

19、47E:Discrete semiconductordevices,ofIECtechnicalcommittee47:Semiconductordevices. Thetextofthisstandardisbasedonthefollowingdocuments: FDIS Reportonvoting 47E/158/FDIS 47E/171/RVD Fullinformationonthevotingfortheapprovalofthisstandardcanbefoundinthereporton votingindicatedintheabovetable. Thispublic

20、ationhasbeendraftedinaccordancewiththeISO/IECDirectives,Part3. Thecommitteehasdecidedthatthecontentsofthispublicationwillremainunchangeduntil2005. Atthisdate,thepublicationwillbe reconfirmed; withdrawn; replacedbyarevisededition,or amended. Abilingualversionofthisstandardmaybeissuedatalaterdate.4 60

21、747142 IEC:2000(E) INTRODUCTION ThispartofIEC60747shouldbereadinconjunctionwithIEC607471.Itprovidesbasic informationonsemiconductor terminology; lettersymbols; essentialratingsandcharacteristics; measuringmethods; acceptanceandreliability.60747142 IEC:2000(E) 5 SEMICONDUCTORDEVICES Part142:Semicondu

22、ctorsensorsHallelements 1General 1.1Scope ThispartofIEC60747providesstandardsforpackagedsemiconductorHallelementswhich utilizetheHalleffect. 1.2 Normativereferences Thefollowingnormativedocumentscontainprovisionswhich,throughreferenceinthistext, constituteprovisionsofthispartofIEC60747.Fordatedrefer

23、ences,subsequentamendments to,orrevisionsof,anyofthesepublicationsdonotapply.However,partiestoagreements basedonthispartofIEC60747areencouragedtoinvestigatethepossibilityofapplyingthe mostrecenteditionsofthenormativedocumentsindicatedbelow.Forundatedreferences,the latesteditionofthenormativedocument

24、referredtoapplies.MembersofISOandIECmaintain registersofcurrentlyvalidInternationalStandards. IEC607471:1983, SemiconductordevicesDiscretedevicesandintegratedcircuitsPart1: General IEC6134051:1998, ElectrostaticsPart51:Protectionofelectronicdevicesfromelectro staticphenomenaGeneralrequirements 1.3De

25、finitions ForthepurposeofthisInternationalStandard,thefollowingdefinitionsapply. 1.3.1 semiconductorHallelement semiconductordevicethatgeneratesthevoltageuponapplicationofamagneticfieldwith magneticfluxdensity,beingproportionaltothecontrolvoltage(seebelow)andthemagnetic fluxdensity 1.3.2 Hallmobilit

26、y electronmobilitymeasuredwiththeusageoftheHalleffect 1.3.3 controlcurrent currenttobeappliedcontinuouslytotheinputterminalsofthedevicewhentheoutput terminalsarenotconnectedtoexternalcircuit 1.3.4 controlvoltage voltagetobeappliedcontinuouslytotheinputterminalsofthedevicewhentheoutput terminalsareno

27、tconnectedtoexternalcircuit6 60747142 IEC:2000(E) 1.3.5 offsetvoltage(orresidualvoltage) voltagetobederivedbetweentheoutputterminalswhenaspecifiedcurrentorvoltageis appliedtotheinputterminalsofthedevicewithoutmagneticfield 1.3.6 outputHallvoltage thedifferencebetweenthevoltage,whichisderivedacrossth

28、eoutputterminalswhena specifiedcurrentorvoltageisappliedtotheinputterminalsofthedeviceinaspecified magneticfield,andtheoffsetvoltage 1.3.7 residualratio theratiooftheoffsetvoltagetotheoutputHallvoltage 1.3.8 inputresistance resistancebetweentheinputterminalsofthedevicewhentheoutputterminalsarenot co

29、nnectedtoexternalcircuit 1.3.9 outputresistance resistancebetweentheoutputterminalsofthedevicewhentheinputterminalsarenot connectedtoexternalcircuit 1.3.10 temperaturecoefficientofoutputHallvoltage relativechangeinoutputHallvoltagereferredtothechangeintemperature 1.3.11 temperaturecoefficientofinput

30、resistance relativechangeininputresistancereferredtothechangeintemperature 1.4Symbols 1.4.1 Clauses2,3and4ofIEC607471,chapterV,apply. ForthefieldofpackagedHallelements,thefollowingadditionalspecialsubscriptsare recommended: c control o offset HH a l l in input out output60747142 IEC:2000(E) 7 Table1

31、Lettersymbols Nameanddesignation Lettersymbol Remarks Hallmobility m H Controlcurrent I c Controlvoltage V c Offsetvoltageorresidualvoltage V o OutputHallvoltage V H Residualratio V o /V H Inputresistance R in Outputresistance R out Temperaturecoefficient ofoutputHallvoltage a VH Temperaturecoeffici

32、ent ofinputresistance a Rin 1.4.2Terminals TheterminalnumbersandtheirdesignationforpackagedHallelementsareshowninfigure1 andtable2.Thedesignationoftheterminalsislistedbelow.The(+)and( - )signsoftheoutput terminalsassumethatthemagneticlineofforcepassesthroughfromthetoptothebottomof theHallelement. Ta

33、ble2Terminalnumbers Terminalnumber Voltage/current 1V c (+)orI c (+) 2V H (+) 3 V c (- )orI c (- ) 4 V H (- ) 2 Essentialratingsandcharacteristics 2.1General 2.1.1 Elementmaterials UsefulmaterialsforHallelementsaresemiconductormaterialslikeGaAs,InSb,InAs,Si,etc. RatingsofHallelementsdependontheeleme

34、ntmaterials. 2.1.2 Handlingprecautions Duetoaratherthinlayerofsemiconductorsensingregion,thedevicesmaybeirreversibly damagedifanexcessivevoltageisallowedtobuildup,forexampleduetocontactwith electrostaticallychargedpersons,leakagecurrentsfromsolderingirons,etc. Whenhandlingthedevices,thehandlingpreca

35、utionsgiveninIEC607471,chapter IX, clause1,shallthereforebeobserved.8 60747142 IEC:2000(E) 2.2 Ratings(limitingvalues) 2.2.1Temperatures 2.2.1.1 Minimumandmaximumstoragetemperatures(T stg ) 2.2.1.2 Minimumandmaximumoperatingtemperatures(T opr ) 2.2.2Bias 2.2.2.1 Maximumcontrolcurrent(I cmax ) 2.2.2.

36、2 Maximumcontrolvoltage(V cmax ) 2.2.3 Deratingcurve 2.2.3.1 Controlcurrentderatingcurve Maximumcontrolcurrentateachtemperatureshallbestatedorbedepictedintheformofa figure. 2.2.3.2 Controlvoltagederatingcurve Maximumcontrolvoltageateachtemperatureshallbestatedorbedepictedintheformofa figure. 2.3Char

37、acteristics Characteristicsaretobegivenat25C,except where otherwise stated; other temperatures shouldbetakenfromthelistinIEC607471,chapterVI,clause5. 2.3.1 Unloadedelectricalcharacteristics 2.3.1.1 OutputHallvoltage(V H ) Maximumandminimumvalues,ataspecifiedmagneticfluxdensityandcontrolvoltageor cur

38、rent,atanoperatingtemperatureof25C. 2.3.1.2 Inputresistance(R in ) Maximumandminimumvalues,ataspecifiedvoltageorcurrentwithoutanymagneticflux density,atanoperatingtemperatureof25C. 2.3.1.3 Outputresistance(R out ) Maximumandminimumvalues,ataspecifiedvoltageorcurrentwithoutanymagneticflux density,ata

39、noperatingtemperatureof25C. 2.3.1.4 Offsetvoltage(V o ) Maximumandminimumvalues,ataspecifiedcontrolvoltageorcurrentwithoutanymagnetic fluxdensity,atanoperatingtemperatureof25C. 2.3.1.5 TemperaturecoefficientofoutputHallvoltage( a V H ) Averagevalueataspecifiedtemperaturerange(understoodastherangegiv

40、enin3.6.4),ata specifiedcontrolcurrentunderspecifiedmagneticfluxdensity.60747142 IEC:2000(E) 9 2.3.1.6 Temperaturecoefficientofinputresistance( a Rin ) Averagevalueataspecifiedtemperaturerange(understoodastherangegivenin3.7.3),ata specifiedcontrolcurrentwithoutanymagneticfluxdensity. 2.3.1.7Dielectr

41、ic strength Maximumandminimumvaluesataspecifiedvoltagewithrespecttoanyexternalsurfaceof thedevice. 2.3.2 Dimensionaldrawing 2.3.2.1Dimensions Thedrawingshallprovidedimensionswithspecifiedtolerance. 2.3.2.2 Positionofterminals Thepositionofthefourterminalsshallbeshowninthefigure. 3Measuring methods 3

42、.1General 3.1.1 Generalprecautions ThegeneralprecautionsarelistedinchapterVII,clause2,ofIEC607471.Inaddition,special careshouldbetakentouselowrippled.c.suppliesandtodecoupleadequatelyallbiassupply voltages. 3.1.2 Handlingprecautions Duetotheratherthinlayerofsemiconductorsensingregion,thedevicesmaybe

43、irreversibly damagedifanexcessivevoltageisallowedtobuildup,forexampleduetocontactwith electrostaticallychargedpersons,leakagecurrentsfromsolderingirons,etc. Whenhandlingthedevices,thehandlingprecautionsgiveninIEC607471,chapterIX, clause1,orIEC6134051,shall,therefore,beobserved. 3.2 OutputHallvoltage

44、(V H ) 3.2.1Purpose TomeasureoutputHallvoltageunderspecifiedconditions. 3.2.2 Principlesofmeasurements MeasuringtheoutputHallvoltageistoevaluatethesensitivityofthedevicestotheapplied magneticfluxdensity,whichisinturnameasureofhowwellthecurrentdevicesmatch applicationcircuits.10 60747142 IEC:2000(E) B:Magneticfluxdensity V H = m H (W/L) B V C V H 1 2 4 3 W 1,3:Inputterminals 2,4:Outputterminals V C d L IEC1871/2000 Figure1Theprincipl