EIA RS-186-13E-1978 STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 13 INSULATION RESISTANCE TEST.pdf
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1、- _. _- EIA Lb-13E 78 3234b00 0028572 7 / ANSI/EIA RS-186-E-78 Approved October .27, 1978 .- IA STANDARD STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 13: INSULATION RESISTANCE TEST -RSl8643E (Revision of RS-186-0, Method 13) OCTOBER 1978 EZlgineering Depcsrtmeirf EECTRONiC QND
2、USTRIES ASSOCIATION 1 EIA 386-33E 78 m 3234600 0028573 O m NOTICE EIA engineering standards are designed to serve the public interest through eliminating mis- understandings between manufactlirers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchase
3、r in selecting and obtaining with mini- mum delay the proper product for his particular need. Existence of such standards shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standar
4、ds pre- clude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended standards are adopted by EU without regard to whether or not their adop- tion may involve patents on articles, materials, or processes. By such act
5、ion, EU does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. This EIA Recommended Standard is considered to have international standardization impli- cations, but the International Electrotechnical Commission has
6、 chosen to write this test procedure for each type of component. There is therefore no valid comparison between this EIA recommended standard and the International Electrotechnical Commission recommendation. % These differences are well known to the US. Committee of Experts for the International Ele
7、ctrotechnical Commission Technical Committee 50 and resolution of these differences wiil be sought in future meetings of TC-50. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2QQ1 Ep Street, N. W., Waehington, D. C. 20006 Q Electronic InduStriea Aeaoalaon 19 79 All righta rese
8、rved PRICE: $3.00 EIA 8b-13E 78 E 3234b00 0028574 2 E RS-186-13E Page 1 STANDARD TEST METHODS FOR PASSIVIE ELECTRONIC COMPONENT PARTS METIIOD 13 INSULATIQN RESISTANCE TEST (From EIA Standard RS-186-D and Standards Proposal No. 1271 formulated under the cognizance of the EL4 P-9 Committee on Test Mel
9、hods and Procedures.) INTRODUCTION This Test Method forms a part of the EIA Standard RS-186 which contains test guidance, definitions and standard test conditions. 1. PURPOSE This test is to measure the resistance offered by the insulating members of a component part to an impressed direct voltage t
10、ending to produce a leakage of current through or on the surface of these . members. A knowledge of insulation resistance is important, even when the values are comparatively e high, as these values may.be limiting factors in the design of high-impedance circuits. Low insulation resistance, by permi
11、tting the flow of large leakage currents, can.disturb the operation of circuits intended to be isolated, for example, by forming feedback loops. Excessive leakage currents can eventually lead to deterioration of the insulation by heating or direct-current electrolysis. Insulation- resistance measure
12、ments should not be considered the equivalent of dielectric withstanding voltage or electric breakdown tests. A clean, dry insulation may have a high insulation resistance, and yet possess a mechanical fault that would cause failure in the dielectiic withstanding voltage test. Con- versely, a dirty,
13、 deteriorated insulation with low insulation resistance might not break down under a high potential. Since insulating members composed of different materials or combinations of materials may have inherently different insulation resistance, the numerical value of measured insula- tion resistance cann
14、ot properly be taken as a direct measure of the degree of cleanliness or absence of deterioration. The test is especially helpful in determining the extent to which insulating proper- ties are affected be deteriorative influences, such as heat, moisture, dirt, oxidation, or loss of volatile material
15、s. 2. PRECAUTIONS 2.1 Hazardous Voltages - Persons performing the test should bear in mind that the voltages used are dangerous, particularly since they will be direct current voltages. 2.2 Factors Affecting Measurements - Factors affecting insulation-resistance measurements include tem- I perature,
16、 humidity, residual charges, polarity in special cases, charging current or time constant of instrument and test voltage, previous conditioning, and duration of uninterrupted test voltage appli- cation (electrification time). In connection with this last-named factor, it is characteristic of certain
17、 component parts (for example, capacitors and cables) for the current to fall from an instantaneous high value to a steady lower value at a rate of decay which depends on such factors as time, test voltage, temperature, insulating materials, capacitance, and external circuit resistance. Consequently
18、, the measured insulation resistance will increase for an appreciable time as the test voltage is applied uninterruptedly. Because of this phenomenon, it may take many minutes to approach maximum insulation-resistance readings, but specifications usually require that readings be made after a specifi
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