DLA SMD-5962-95716-1995 MICROCIRCUIT DIGITAL CMOS OCTAL LATCHING BUS DRIVER MONOLITHIC SILICON《数字的互补金属氧化物半导体八角闭塞装置母线驱动器硅单片电路线型微电路》.pdf

《DLA SMD-5962-95716-1995 MICROCIRCUIT DIGITAL CMOS OCTAL LATCHING BUS DRIVER MONOLITHIC SILICON《数字的互补金属氧化物半导体八角闭塞装置母线驱动器硅单片电路线型微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-95716-1995 MICROCIRCUIT DIGITAL CMOS OCTAL LATCHING BUS DRIVER MONOLITHIC SILICON《数字的互补金属氧化物半导体八角闭塞装置母线驱动器硅单片电路线型微电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、JUL 94 DISTRIBUTION STATEMENT A Approved for public release, distribution IS unlimited 5962-E238-96 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SflD-5962-457Lb D 9999996 0084536 473 D SIZE A STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPL

2、Y CENTER DAYTON, OHIO 45444 1. SCOPE .- 1.1 m. product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class VI, and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Nunber (PIN). 1

3、.2.1 of MIL-STD-883, lnProvisions for the use of MIL-STD-883 in conjunction with cqliant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHA) levels are refiected in the PIN. This drawing forms a part of a one part -*one part nunber docunentation system (see 6.6 herein). Two D

4、evice class M microcircuits represent non-JAN class B microcircuits in accordance with When 1.2 m. lhe PIN shall be as shown in the following example: TzlI-=LLLf Federal RHA Devi ce Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1

5、.2.4) (see 1.2.5) LU (see 1.2.3) / Drawing nunber 1.2.1 MA desianatec . Device class M RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA

6、designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-) indicates a 1.2.2 pevice tm e(s1. The device type(s) shall identify the circuit function as follows: Device tvD e Generic nunber Circuit funct i on 5962-9571 6 REVISION LEVEL SHEET 2 o1 82C82/7 Latchup re

7、sistant CMOS octal latching bus driver 1.2.3 Device class desi- . The device class designator shall be a single letter identifying the product assurance level as follows: pevice class pevice reauirements docwntation I M Vendor self-certification to the requirements for non-JAN class E microcircuits

8、in accordance with 1.2.1 of MIL-STD-883 P or V Certification and qualification to MIL-1-38535 1.2.4 Case outline(s) . The case outtinets) shall be as designated in MIL-STD-1835 and as follows: DescriDtive desianatoc Jerminals .Eahur/ ins 1-8,9,11 Logical 88188 input voltage Logi ca i lOB1 input 1 VI

9、L voltage cc = 4.5 v 3J ins 1-8,9,11 I 2.9 1 IV cc = 4.5 V, = GND OH = -8.0 mA, Pins 12-19 Al l - Al 1 - Al 1 Al l CC = 4.5 Vf GND roup D end-point electrical parameters (see 4.4) 1 1 I 1,7,9 1,7,9 117,9 Standby power supply current Output Leakage current Input Leakage current I I 1 I I ICCSB +/- 2.

10、0 pA IOZL, IOZH +/- 2.0 pA IIH,IIL +/- 200 nA Group A test 1 1,2,3,4,7,8,9 ,2,3,4,7, requirements (see 4.4) 10,ll 8,9,10,11 I I 1 I 1,2,3,7,8,9 10,ll 10,ll z/ I 1237889 I :roup C end-point electrical parameters (see 4.4) ;roup E end-point electrical parameters (see 4.4) U PDA applies to subgroup 1 a

11、nd 7. u PDA applies to subgroups 1,7 and deltas. 1/ Delta limits as specified in Table IIB herein shall be required where specified and the delta values shall be completed with reference to the zero hour electrical parameters (See Table I). Table IIB. Delta Limits I Parameter I Symbol Delta limits 4

12、.4.2.1 Add itional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883. a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under docunent revision level control and shall be made available to the preparing or acquiring act

13、ivity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005. b. TA +125C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. I SIZE I I 5962-9

14、571 6 REVISION LEVEL SHEET STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-95Lb 9999996 008452b 310 Q . The steady-state life test durat

15、ion, test condition and test temperature, or approved alternatives shall be as specified in the device manufa-curers PM plan in accordance with MIL-1-38535. manufacturers TRB, in accordance with MIL-1-38535, and shall be made available to the acquiring or preparing activity upon request. accordance

16、with the intent specified in test method 1005. 4.4.2.2 The test circuit shall be maintained under docunent revision level control by the device The test circuit shall specify the irputs, outputs, biases, ad power dissipation, as applicable, in 4.4.3 woun D -tia . The group D inspection end-point ele

17、ctrical parameters shall be as specified in table IIA herein. , 4.4.4 Doua E wctipn . . Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). device class M shall be M and D. RHA levels for device classes P and V shall be M, D, L, R, c, G

18、, and H and for a. b. End-point electrical parameters shall be as specified in table IIA herein. for device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-1-38535, appendix A, for the RHA level being tested. vehicle shall be subjected to radiation har

19、dness assured tests as specified in MIL-1-38535 for the RHA level being tested. defined in table I at TA = +25*C i5*C, after exposure, to the subgroups specified in table IIA herein. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. for device classe

20、s Q and V, the devices or test All device classes must meet the postirradiation end-point electrical parameter limits as c. 5. PACKAGING SIZE A STANDARD MICROCIRCUIT DRAWING DEFENSEELECTRONICSSUPPLYCENTER DAYTON, OHIO 45444 REVISION LEVEL 5.1 Wsinq reauirementa . The requirements for packaging shall

21、 be in accordance with MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes P and V. 6. NOTES 6.1 med use. Microcircuits conforming to this drawing are intended for use for Covermnt microcircuit applications (original equipment), design applications, and logistics purpo

22、ses. 6.1.1 WlaceabiLity . Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.1.2 Substitutability. Device class P devices will replace device class M devices. 6.2 Confisurati on cont rol of SMDs. record for the indi

23、vidual docunents. Form 1692, Engineering Change Proposal. All proposed changes to existing SHDs will be coordinated with the users of This coordination will be accomplished in accordance with MIL-STD-973 using DD 6.3 &cord of w. Military and industrial users shall inform Defense Electronics Supply C

24、enter when a system application requires configuration control and which SMDDs are applicable to that system. of users and this list will be used for coordination and distribution of changes to the drawings. covering microelectronic devices (FSC 5962) should contact DESC-EC, telephone (513) 296-6047

25、. DESC will maintain a record Users of drawings 6.4 m. Cmnts on this drawing should be directed to DESC-EC, Dayton, Ohio 45444-5270, or telephone (513) 296-5377. 5962-9571 6 SHEET 12 . DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS

26、-,-,-6.6 Qne Dart - one iyrt r&xr systm . The one part - one part ndxr system described below has been developed to allow for transitions between identical generic devices covered by the three major microcircuit requirements docunents (MIL-H-38534, MIL-1-38535, and 1.2.1 of MIL-STD-883) withoh the n

27、ecessity for the generation of unique PINS. The three military requirements docunents represent different class levels, and previously when a device manufacturer upgraded military product from one class level to another, the benefits of the ripgraded product were uiavailable to the Original Equipmen

28、t Manufacturer (OEM), that was contractually locked into the original unique PIN. establishing a one part nunber system covering all three docunents, the OEM can acquire to the highest class level available for a given generic device to meet system neecis without modifying the original contract part

29、s selection cri ter ia. By i litarv doc-on fonpar Manufacturing Docunent source listinq Listina -. Exanple PIN - New MIL-H-38534 Standard Microcircuit 5962-XXXXXZZ(H or K)YY WL-38534 Drawings Neu MIL-1-38535 Standard Microcircuit 5962-XXXXXZZ(Q or V)YY ML-38535 Drawings MIL-BUL-103 MIL-BUL-103 New 1

30、.2.1 of MIL-STD-883 Standard 5962-XXXXXZZ(M)YY MIL-BUL-103 MIL-BUL-103 Microcircuit Drawings 6.7 Sources of swly. 6.7.1 QML-38535. have agreed to this drawing. . Sources of supply for device classes Q and V are listed in The vendors listed in PML-38535 have subnitted a certificate of compliance (see

31、 3.6 herein) to DESC-EC and 6.7.2 7 . Approved sources of supply for class M are listed in UIL-BUL-103. herein) has been subnitted to and accepted by DESC-EC. The vendors listed in MIL-BUL-103 have agreed to this drawing and a certificate of conpliance (see 3.6 1 SIZE I 1 5962-9571 6 REVISION LEVEL

32、SHEET STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE:95-12-28 Y Approved sources of

33、supply for Si 5962-95716 are listed belon for imnediate acquisition only and shall be added to MIL-BUL-103 during the next revision. The vendors listed below have agreed to this drawing and a certificate of conpliance has been submitted to and accepted by DESC-EC. MIL-BUL-103 will be revised to incl

34、ude the addition or deletion of sources. This bulletin is superseded by the next dated revision of MIL-NIL-103. Vendor CAGE mmber Standard microcircuit drawing PIN Vendor simi lar PIN 1/ 5962-9571601VRC 34371 MD82C82/7 Vendor CAGE A 34371 Vendor name - Harris Semiconductor P.O. Box 883 Melbourne Fi 32902-0883 The information contained herein is disseminated for convenience only and the Goverment assunes no liability whatsoever for any inaccuracies in this information bulletin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-