DLA SMD-5962-93170 REV A-1996 MICROCIRCUIT DIGITAL CMOS 8-16 BIT PARALLEL INTERFACE TIMER MONOLITHIC SILICON《硅单片 8-16位并行接口 限时器 氧化物半导体数字微型电路》.pdf

《DLA SMD-5962-93170 REV A-1996 MICROCIRCUIT DIGITAL CMOS 8-16 BIT PARALLEL INTERFACE TIMER MONOLITHIC SILICON《硅单片 8-16位并行接口 限时器 氧化物半导体数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-93170 REV A-1996 MICROCIRCUIT DIGITAL CMOS 8-16 BIT PARALLEL INTERFACE TIMER MONOLITHIC SILICON《硅单片 8-16位并行接口 限时器 氧化物半导体数字微型电路》.pdf（30页珍藏版）》请在麦多课文档分享上搜索。

1、 - SMD-59b2-93170 REV A W 9999996 008b4bb 9TO DEFENSE LOGISTICS AGENCY DEFENSE ELECTRONICS SUPPLY CENTER 1507 WILMINGTON PIKE DAYTON, OH 45444-5765 IN REPLY REFERTO: DESC-ELDC (Mr. Gauder/ (AV 986) 513-296-8526/1tg) FEB 2 6 SUBJECT: Notice of Revision (NOR) 5962-R052-96 for Standard Microcircuit Dra

2、wing (SMD) 5962-93170. Military/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR shoul

3、d be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current c

4、ertificate of compliance on file at DESC along with a DESC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DESC is otherwise notified. If you have comments or questions, please contact Larry T. Gauder at (AV1986-85

5、26 /(513)296-8526. 1 Encl / MONICA L. POELKING J Chief, Custom Microelectronics Branch Licensed by Information Handling ServicesSMD-59b2-93L70 REV A 9999996 008b4b7 837 m MICROCIRCUIT, DIGITAL, CMOS, 8-16 BIT PARALLEL INTERFACE/TlMER, MONOLITHIC SILICON NOTICE OF REVISION (NOR) b. NEU a. Initial A 1

6、. DATE I (YYMMDD) a. (X one) 96- 02 - 02 This revision described below has been authorized for the docunent listed. X (1) Existing docunent supplemented by the NOR may be used in manufacture. (2) Revised docunent must be received before manufacturer may incorporate this change. Public reporting.burd

7、en.for this collection-is esfiFted to average 2 hours per response including the time for review1 instructions searching existig data sources, gathering and maintaining the data needed. and caetina and reviewing the collection of information. Send comnents reaardina b. ACTIVITY AUTHORIZED TO APPROVE

8、 CHANGE FOR GOVERNMENT 4. ORIGINATOR b. ADDRESS (Street, City, State, Zip Code) a. TYPED NAHE (First, Middle Initial, Defense Electronics Supply Center 1507 Uilmington Pike Dayton, OH 45444-5765 Last) c. TYPED NAME (First, Middle Initial, Last) 5. CAGE COOE 67268 7. CAGE COOE 67268 d. TITLE Chief, C

9、ustom Microelectronics 15a. ACT IV1 TY ACCOMPL ISH I NG REVI SION DESC-ELDC 9. TITLE OF DOCUMENT e. SIGNATURE Monica L. Poelking b. REVIS ION COMPLETED (Signature) Larry T. Gauder 10. REVISION LETTER Form Approved WE NO. 0704-0188 2. PROCURING ACTIVITY NO. 3. DOOAAC 6. NOR NO. 5962- R052-96 8. DOCUM

10、ENT NO. 5962-93170 11. ECP NO. 12. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES Al 1 13. DESCRIPTION OF REVISION Monica L. Poelking f. DATE SIGNED (Y YMMDD ) 96 - 02 - 02 C. DATE SIGNED (YYMMDD) 96- 02- 02 DD Form 1695, APR 92 Previous editions are obsolete Licensed by Information Handling Se

11、rvicesSMD-5762-93170 REV A = h 008b4b8 773 M Condi t ions -55C 5 TC 5 +125C unless otherwise specified Test “IL Low level input voltage (input H1) 13. DESCRIPTION OF REVISION - CONTINUED Devi ce Group A I Limits type subgroups o1 ,o2 1, 2, 3 II Sheet 4: continued, TABLE I. add the following: Revisio

12、n level block; add I1Al1 Docunent No.: 5962-93170 Revision: A Sheet: 2 of 2 NOR NO: 5962-R052-96 I I 1, 2, -0.3 0.5 Units V II Licensed by Information Handling ServicesW 9999996 0049617 142 DESCRIPTION DATE (Y R - WO-DA) LTR APPROVED REV SHEET REV SHEET REV SHEET 15 16 17 REV STATUS OF SHEETS APPROV

13、ED BY Monica L. Poeking DRAWING APPROVAL DATE 93 - 09- 16 REVISION LEVEL PMIC NIA STANDARDIZED MILITARY DRAWING MICROCIRCUIT, DIGITAL, CMOS, 8-16 BIT PARALLEL INTERFACE/TIMER MONOLITHIC SILICON SIZE CAGE CODE 5962-93170 A 67268 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE

14、 DEPARTMENT OF DEFENSE AMSC N/A PREPARED BY Thomas M. Hess DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CHECKED BY Thomas M. Hess 1 OF 26 I SHEET )ESC FORM 193 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 5962 - E356-93 Licensed by Information Hand

15、ling Services999999b 0049bL8 089 1. SCOPE 1.1 Scope. This drauing forms a part of a one part - one part nubr docunentation systm (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, 9, and M) and space application (device classes S and V), and a

16、choice of case outlines and lead finishes are available end are reflected in the Part or Identifying Nunber (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance uith 1.2.1 of MIL-STO-883, iiProvisions for the use of MIL-STD-883 in conjunction uith compliant non-J

17、AN devices“. When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. I 1.2 PI)(. lhe PIN shall be as shown in the follouing exanple: o1 M X X 5962 93170 - I I - I I Lead Case T I I I Devi ce Devi ce I II RHA I Federal stock class designator type class outline

18、finish designator (see 1.2.1) (see 1.2.2) designator (See 1.2.4) (see 1.2.5) 1 (see 1.2.3) / Drauing mmber 1.2.1 RHA designator. Device classes M, 8, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked uith the appropriate RHA designator. Device classes Q and

19、 Y RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device tm(s1. lhe device type(s) shall identify the circuit function as follous: Device twx Generic der Circuit function STANDAR

20、DIZED S12E MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL o1 02 5962-93 170 SHEET 2 68230-8 68230-10 8-16 Bit Parallel Interface/Timer 8-16 Bit Parallel Interface/Timer 1.2.3 Device class designator. The device class designator shall be a single letter identif

21、ying the product assurance level as follous: Device class Device reauirements docunentation I M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance uith 1.2.1 of MIL-STD-883 B or S P or V Certification and qualification to MIL-M-38510 Certification and qual

22、if ication to MIL- 1-38535 1.2.4 Case outline(s1. lhe case outline(s) shall be as designated in MIL-STO-1835 and as follows: Outline letter DeSCriDtiVe designator Terminals Package style X Y M)IPl-TLS or CDIP2-TU CQCCl-N52 48 52 Dual in line Square Leedless chip carrier 1.2.5 lead finish. The lead f

23、inish shall be as specified in MIL-M-38510 for classes i#, B, and S or UJL-1-38535 for classes 9 and V. Finish letter llXmt shall not be marked on the microcircuit or its packaging. lhe iX1i designation is I for use in specifications uhen lead finishes A, B, and C are considered acceptable and inter

24、changeable without preference. Licensed by Information Handling Services1.3 1.4 STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Absolute maximun ratinm. u Supply voltage range with respect to GND (VCC) . Storage tenperature range . Maximun power dissipation (PD) .

25、 Lead tenperature (soldering, 5 seconds). Junction tenperature (TJ) . Thermal resi stance, junction- to-case (6JC) : Recomnended operating conditions. Supply voltage range (Vcc) . High level input voltage range (VIH): ALL inputs Lou level input voltage range (VIL): All inputs Maxim Lou Level output

26、voltage (VOL! . Case operating tenperature range (TC) . Minimun high level output voltage (Vo ) SIZE 5962-93170 A REVISION LEVEL SHEET 3 -0.3 V dc to +7.0 V dc -55C to +150c 1.0 u +27OoC +17O0C See MIL-STD-1835 4.75 V dc minimun to 5.25 V dc maximun 2.0 V dc to 5.25 V dc GND -0.3 V dc to 0.8 V dc 2.

27、4 v dc 0.5 v dc -55OC to +125“C - I/ Stresses above the absolute maximun rating may cause permanent damage to the device. the maximun levels may degrade performance end affect reliability. Extended operation at Licensed by Information Handling Services777777b 0047b20 737 2. APPLICABLE DOCUMENTS 2.1

28、Goverwnt specifications. standards. bulletin. and handbook. Unless otherwise specified, the following specifications, standards, bulletin, and handbook of the issw listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of th

29、is drawing to the extent specified herein. SPECIFICATIONS MI LI TARY MIL-U-38510 - Microcircuits, General Specification for. MIL-1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MI LITARY MI L-STO-480 MIL-STD-883 - Test Methods and Procedures for Microelectronics. M

30、IL-STO-1835 - Microcircuit Case utl ines. - Configuration Control -Engineering Changes, Devi at ions and Waivers. BULLETIN MILITARY MIL-BUL-103 - List of Standardized ni litary Drawings (SMDs). HANDBOOK MIL I TARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specifications, standard

31、s, bulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. ) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references

32、 cited herein, the text of this drawing shall take precedence. 3. REPUIREHENTS 3.1 Item reauirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as spe

33、cified herein. The individual item requirements for device ciasses B and S shall be in accordance with MIL-H-38510 and as specified herein. included in this SMD. MIL-1-38535, the device manufacturers Quality Management (PMI plan, and 8s specified herein. For device classes B and S, a full electrical

34、 characterization table for each device type shall be lhe individual item requirements for device classes CI and V shall be in accordance with 3.2 Desian. construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 for device classes

35、M, 8, and S and MIL-1-38535 for device classes P and V and herein. 3.2.1 Case wtline(s2. The case outLine(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Functionel block diagram. 3.3 Electrical performance characteristics and postirradiation parameter limits. herein,

36、the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. The terminal connections shall be as specified on figure 1. lhe functional block diagram shall be as specified on figure 2. Unle

37、ss otherwise specified 3.4 Electrical test reauirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 5962-93170 i REVISION LEVEL SHEET STANDARD1 2ED MILITARY DRAWIN DEFENSE ELECTRONICS SUPPLY CENTER DAY

38、TON, OBI0 45444 DESC FORM 193A JUL 91 Licensed by Information Handling Services9999996 0049b2L 673 3.5 Marking. lhe pert shall be merked with the PtN listed in 1.2 herein. Marking for device cless M shall be in accordance with MIL-STO-883 (see 3.1 herein). MIL-BUL-103. Marking for device classes B a

39、nd S shall be in accordance with MIL-M-38510. Q and V shall be in accordance with MIL-1-38535. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes 3.5.1 Certification/comliance mark. The canpLiance mark for device class I4 shalt be a “C“ as required in MIL-S

40、lD-883 (see 3.1 herein). in MIL-M-38510. lhe certification mark for device classes B and S shall be a I1J1l or I8JAid8l as required The certification mark for device classes CI and V shall be a 8QML11 as required in MIL-1.38535. 3.6 Certificate of caripliance. For device class M, a certificate of co

41、mpliance shall be required from a manufacturer in order to be listed as an approved source of supply in M1L-BUL-103 (see 6.7.3 herein). classes CI and V, a certificate of conpliame shall be required from a OUL-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.

42、2 herein). lhe certificate of compliance suknitted to DESC-EC prior to Listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M, the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of

43、HL-1-38535 and the requirements herein. For device 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STO-883 (see 3.1 herein) or device classes B and S in MIL-M-38510 or for device classes CI and V in MIL-1-38535 shall be provided with each lot of mic

44、rocircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-480. 3.9 Verification and review for devi

45、ce class M. For device class M, DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation Offshore docunentation shall be made available onshore at the option of the reviewer. this drawing shall be in microcircuit group

46、 nunber 105 (see MIL-M-38510, appendix E). 3-10 Microcircuit group assiamnt for device classes M. B. and S. Device classes M, B, and S devices covered by 1 3.11 Serialization for device class S. All device class S devices shall be serialized in accordance with MIL-M-38510. 4.1 Samlina and inspection

47、. For device class M, sanpling and inspection procedures shall be in accordance with I section 4 of MIL-M-38510 to the extent specified in MIL-STO-883 (see 3.1 herein). sanpling and inspection procedures shall be in accordance with MIL-M-38510 and method 5005 of MIL-STD-883, except as niodified here

48、in. MIL-1-38535 and the device manufacturers QM plan. For device classes B and S, For device classes Q and V, sampling and inspection procedures shall be in accordance with 4. QUALITY ASSURANCE PROVISIDFIS STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DATN, OHIO 45444 SIZE 5962-93

49、170 A REVISION LEVEL SHEET DESC FORM 193A JUL 91 Licensed by Information Handling Services999999b 0049b22 SOT H Condi ti ons Group A -55C 5 Tc 5 125Y unless otherwise specified 1/ subgroups Test SYnibol Device Limits Unit type High Level inpit voltage (all inputs) Lou level input voltage (all inputs) Lou level output PC3/TOT, PC5/= STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER - Lou level output voltage DO/D7, DTACK Lou level output voltage PAO-PAT, PBO-PB7, H2, H4, PCO-PC2, PC4, PC6, PC7 SIZE 5962-93170 A High level output DO-D7, DTACK