DLA SMD-5962-90914 REV F-2008 MICROCIRCUIT LINEAR VOLTAGE REFERENCE ADJUSTABLE MONOLITHIC SILICON《线性微电路的参考电压和可调单片硅的详细规范》.pdf
《DLA SMD-5962-90914 REV F-2008 MICROCIRCUIT LINEAR VOLTAGE REFERENCE ADJUSTABLE MONOLITHIC SILICON《线性微电路的参考电压和可调单片硅的详细规范》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-90914 REV F-2008 MICROCIRCUIT LINEAR VOLTAGE REFERENCE ADJUSTABLE MONOLITHIC SILICON《线性微电路的参考电压和可调单片硅的详细规范》.pdf(13页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change dimensions for case outline X. Changes in accordance with NOR 5962-R171-93. Technical and editorial changes throughout. 93-07-01 M. A. FRYE B Change vendor similar part number for the 01 device. Editorial changes throughout. 94-06-10 M. A.
2、 FRYE C Drawing update to reflect current requirements. Make change to drawing description. - ro 00-07-07 R. MONNIN D Made change to replace reference to MIL-STD-973 with reference to MIL-PRF-38535. - ro 03-03-26 R. MONNIN E Add device type 02 and case outline Y. Make changes to 1.2.4, 1.3, TABLE I,
3、 and figure 2. - ro 06-03-16 R. MONNIN F Made correction to VREFtest condition in table I from IR= 20 A to IR= 20 mA. Made correction to the limits of the minimum operating current test, IC, in table I. -rrp 08-06-16 R. HEBER REV SHET REV SHET REV STATUS REV F F F F F F F F F F F F OF SHEETS SHEET 1
4、 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHALE A. FRYE AND AGENCIES OF T
5、HE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-07 MICROCIRCUIT, LINEAR, VOLTAGE REFERENCE, ADJUSTABLE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-90914 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E423-08 Provided by IHSNot for ResaleNo reproduction or networking perm
6、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90914 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (dev
7、ice classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as show
8、n in the following example: 5962 - 90914 01 M X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices me
9、et the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The
10、 device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LM185BY Adjustable voltage reference diode with temperature coefficient 02 LM185B Adjustable voltage reference diode 1.2.3 Device class designator. The device class designator is a single letter
11、identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL
12、-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 3 Can Y GDFP1-G10 10 Flat pack with gull wing leads 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The
13、lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90914 DEFENSE SUPPLY CENTER COLUMBUS CO
14、LUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Reverse current (IR) 30 mA Forward current (IF) 10 mA Power dissipation (PD) 113 mW Lead temperature (soldering, 10 seconds) : Cases X and 2 . +300C Case Y . +260C Storage temperature range . -55C
15、 to +125C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC): Case X . 80C/W Case Y . 23C/W Case 2 . 25C/W Thermal resistance, junction-to-ambient (JA): Case X . 440C/W Case Y . 194C/W Case 2 . 100C/W 1.4 Recommended operating conditions. Ambient operating temperature range
16、(TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the soli
17、citation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT
18、OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Phila
19、delphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been
20、 obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC
21、ROCIRCUIT DRAWING SIZE A 5962-90914 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified he
22、rein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class l
23、evel B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. T
24、he case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performan
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