DLA SMD-5962-89810 REV G-2007 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL HIGH GAIN OPTOCOUPLER《单通道高增益振荡器 线性混合微型电路》.pdf

《DLA SMD-5962-89810 REV G-2007 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL HIGH GAIN OPTOCOUPLER《单通道高增益振荡器 线性混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89810 REV G-2007 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL HIGH GAIN OPTOCOUPLER《单通道高增益振荡器 线性混合微型电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 31757. Changes to table II and figure 2. Editorial changes throughout. 92-03-11 Alan Barone B Add case outlines X and Y. Rewrite entire document. 93-08-31 K. Cottongim C Changes in accordance with NOR 5962-R236-93. 93-09-29 Kendal

2、l A. Cottongim D Changes in accordance with NOR 5962-R041-94. 93-11-12 Kendall A. Cottongim E Added device type 02 as class K. Rewrite entire document. sld 97-11-21 K. A. Cottongim F Update drawing boilerplate. 02-08-21 Raymond Monnin G Update drawing to the latest requirements. gc 07-01-31 Joseph R

3、odenbeck REV SHEET REV SHEET REV STATUS REV G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Donald Osborne POST OFFICE BOX 3990 COLUMBUS, OHIO 43216-5000 http:/www.dscc.dla.mil THIS D

4、RAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, HIGH GAIN, OPTOCOUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-01-30 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-89810 SHEET 1 OF 11 DSCC F

5、ORM 2233 APR 97 5962-E246-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. T

6、his drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflect

7、ed in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: For class H devices: 5962-89810 01 P X Drawing number Device type Case outline Lead finish (see 1.2.2) (see 1.2.4) (see 1.2.5) For class K devices: 5962 - 89810 02 K P X Federal RHA Device Device Case Lead stock class design

8、ator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked wit

9、h the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 1/ HCPL-5701, 66058 Low input current, high gain optocoupler 02 2/ HCPL-570K, 66058-300 Low

10、 input current, high gain optocoupler 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) o

11、r QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applicatio

12、ns where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantee

13、s (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; theref

14、ore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1

15、/ Device type 01 is class H (high reliability). 2/ Device type 02 is class K (highest reliability).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-500

16、0 REVISION LEVEL G SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5

17、 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V dc to 20 V dc 2/ Peak input current ( 1.0 ms duration) 20 mA Average input current (IF). 10 mA 3/ Reverse input voltage (VR). 5.0 V dc Output current (IO) . 40 m

18、A Output voltage range (VO) -0.5 V dc to 20 V dc 2/ Power dissipation (PD) 50 mW 4/ Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +260C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC): Case outline P See MIL-STD-1835 Case outlines X and

19、Y 28C/W 1.4 Recommended operating conditions. Supply voltage range (VCC) (each channel) 2.0 V dc to 18 V dc High level input current range (IFH). 0.5 mA to 5.0 mA Low level input voltage (VFoff). 0.8 V dc maximum Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Gove

20、rnment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICA

21、TION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit D

22、rawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses a

23、bove the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ GND pin should be the most negative voltage at the detector side. Keeping VCCas low as possible, but 2.0 V, will provide the lowest

24、total IOHover temperature. 3/ Derate IFat 0.33 mA/C above +110C. 4/ Output power is collector output power plus total supply power. Derate at 1.66 mW/C above +110C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

25、5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document

26、, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall

27、 include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as define

28、d in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimension

29、s shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Propagation delay times test circuit and waveform(s). T

30、he propagation delay times test circuit and waveform(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperatu

31、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be mark

32、ed with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from

33、the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufa

34、cturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the

35、 manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sa

36、mpling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or network

37、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise sp

38、ecified Group A subgroups Device type Limits Unit Min Max VCC= 4.5 V, IF= 0.5 mA, IOL= 1.5 mA 1,2,3 All 0.4 V VCC= 4.5 V, IF= 1.6 mA, IOL= 4.8 mA 1,2,3 All 0.4 V Low level output voltage VOLVCC= 4.5 V, IF= 5.0 mA, IOL= 10 mA 1,2,3 All 0.4 V VO= 0.4 V, IF= 0.5 mA, VCC= 4.5 V 1/ 1,2,3 All 300 % VO= 0.

39、4 V, IF= 1.6 mA, VCC= 4.5 V 1/ 1,2,3 All 300 % Current transfer ratio hF(CTR)VO= 0.4 V, IF= 5.0 mA, VCC= 4.5 V 1/ 1,2,3 All 200 % High level output current IOH VCC= VO= 18 V, IF= 2.0 A 1,2,3 All 250 A High level supply current ICCHVCC= 18 V, IF= 0 mA 1,2,3 All 20 A Low level supply current ICCLVCC=

40、18 V, IF= 1.6 mA 1,2,3 All 2.0 mA 1 All 1.0 1.7 2 All 1.7 Input forward voltage VFIF= 1.6 mA 3 All 1.8 V Input reverse breakdown voltage VBRIR= 10 A 1,2,3 All 5.0 V Input to output insulation leakage current IIOVIO= 1500 V dc, 2/ relative humidity = 45%, t = 5 seconds, TA= +25C 1 All 1.0 A See footn

41、otes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performa

42、nce characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max IF= 0.5 mA, RL= 4.7 k, VCC= 5.0 V, see figure 3 9,10,11 All 60 IF= 1.6 mA, RL= 1.5 k, VCC= 5.0 V, see figure 3 9,10,11 All 50 Propagation delay time, low

43、 to high output level tPLHIF= 5.0 mA, RL= 680, VCC= 5.0 V, see figure 3 9,10,11 All 30 s IF= 0.5 mA, RL= 4.7 k, VCC= 5.0 V, see figure 3 9,10,11 All 100 IF= 1.6 mA, RL= 1.5 k, VCC= 5.0 V, see figure 3 9,10,11 All 30 Propagation delay time, high to low output level tPHLIF= 5.0 mA, RL= 680, VCC= 5.0 V

44、, see figure 3 9,10,11 All 10 s Common mode transient immunity at high output level CMH VCM= 50 Vp-p, 3/ 5/ 6/ VCC= 5.0 V, RL= 1.5 k, IF= 0 mA 9,10,11 All 500 V/s Common mode transient immunity at low output level CML VCM= 50 Vp-p, 4/ 5/ 6/ VCC= 5.0 V, RL= 1.5 k, IF= 1.6 mA 9,10,11 All 500 V/s 1/ Cu

45、rrent transfer ratio is defined as the ratio of output collector current IO, to the forward LED input current, IF, times 100 percent. 2/ Device considered a two-terminal device. Pins 1 through 4 are shorted together and pins 5 through 8 are shorted together. 3/ CMHis the maximum tolerable common mod

46、e transient to assure that the output will remain in a high logic state (i.e., VO 2.0 V). 4/ CMLis the maximum tolerable common mode transient to assure that the output will remain in a low logic state (i.e., VO 0.8 V). 5/ In applications where dV/dt may exceed 50,000 V/s (such as a static discharge

47、) a series resistor, RCC, should be included to protect the detector ICs from destructively high surge currents. The recommended value is: 6/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameters shall be guaranteed to the limits speci

48、fied in table I for all lots not specifically tested. k (mA)I0.15V.0 1= RFCCProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 4.57 .180 A1 1.40