DLA SMD-5962-85133-1986 MICROCIRCUITS DIGITAL HMOS 80-BIT NUMERIC PROCESSOR EXTENSION MONOLITHIC SILICON《硅单块 80比特扩展数字处理器 高性能金属氧化物半导体 数字微型电路》.pdf

《DLA SMD-5962-85133-1986 MICROCIRCUITS DIGITAL HMOS 80-BIT NUMERIC PROCESSOR EXTENSION MONOLITHIC SILICON《硅单块 80比特扩展数字处理器 高性能金属氧化物半导体 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-85133-1986 MICROCIRCUITS DIGITAL HMOS 80-BIT NUMERIC PROCESSOR EXTENSION MONOLITHIC SILICON《硅单块 80比特扩展数字处理器 高性能金属氧化物半导体 数字微型电路》.pdf（17页珍藏版）》请在麦多课文档分享上搜索。

1、c -3 DESC-DWG-85133 59 W 7777775 000qb04 2 -B 1 Defense Electronics Supply Center Dayton, Ohio Original date of drawing: 27 October 1986 REVISIONS DESCRIPTION ilable for use by AMCC NIA SIZE 5962-851 33 CODE IDENT. NO. DWG NO. A 14933 REV PAGE I OF 17 1 5962-E943-01 DISTRIBUTION STATEMENT A. Approve

2、d for public release; distribution is unlimited. DESC FORM 193 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1, SCOPE MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 1.1 Scope. This drawing describes device requirements for class

3、B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN levices“. 1.2 Part number, The complete part number shall be as shown in the following example: A 14933 5962-85133 REV PAGE 2 + 1 + + I 1 “J I I I I I I 1 1 Drawing n

4、umber Device type Case outline Lead finish per (1.2.11 (1.2.2) MI L-M-385 10 1.2.1 Device types. The device types shall identify the circuit function as follows: Device type Generic number Circuit function Frequency o1 80287-10 I#)-bit HMOs numeric 10 MHz processor extension O2 03 80287-a %bit HMuS

5、numeric a MH processor extension 80287-6 -bit HMS numeric 6 MHz processor extension 1.2.2 Case outline. The case outline shall be as designated in appendix C of MIL-M-38510, and as fol 1 ows : Out1 ine 1 etter u Case outline D-5 (U-lead, 9/16“ x 2 1/16“), dual-in-line package 1.3 Absolute maximum ra

6、tings. Storage temperature range - - - - - - - - - - - - - - Maximum power dissipation (Po)- - - - - - - - - - - - Lead temperature (soldering, 10 seconds)- - - - - - - Thermal resistance, junction-to-case (Jc)- - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - -65C ta +15OC 3.1a W 300

7、 C See MIL-M-38510, appendix C 150C Voltage on any pin with respect to ground - - - - - - -1.0 V dC to +7 V dc 1.4 Recommended operating conditions. Case operating temperature range- - - - - - - - - - - Supply voltage (Vcc)- - - - - - - - - - - - - - - - - -55C to +125“C 4.75 V dc to 5.25 V dc I SIZ

8、E I CODE IDENT. NO. I DWG NO. I )ESC FORM 193A FEB 86 I 4- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i + SIZE CODE IDENT. NO. MILITARY DRAWING A 14933 i DESC-DWG-85133 57 m 7777775 0004bOh h m DWG NO. 5962-85133 2. APPLICABLE DOCUMENTS 2.1 Gove

9、rnment specification and standard. Unless otherwise specified, the following specification nd standard, of the issue listed in that issue of the Department of Defense Index of Specifications nd Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECI

10、FICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with Specific cquisition functions should be obtained from the

11、 contracting activity or as directed by the ontracting activity.) eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REQUIREMENTS 3.1 In the event of a conflict between the text of this drawing and the Item requirements. The individual item requiremen

12、ts shall be in accordance with 1.2.1 of IIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and s specified herein. imensij an erein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical 3.2.1 Terminal connections. 3

13、.2.2 Logic diagram. The logic diagram shall be as specified on figure 2. 3.2.3 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical performance The terminal Connections shall be as specified on

14、 figure 1. haracteristics are as specified in table I and apply over the full recommended case operating emperature range. larked with the part number listed in 1.2 herein. In addition, the manufacturers part number may also e marked as listed in 6.5 herein. 3.5 Certificate of compliance. A certific

15、ate of compliance shall be required from a manufacturer in irder to be listed as an approved source of supply in 6.5. The certificate of compliance submitted to ESC-ECS prior to listing as an approved source of supply shall state that the manufacturers product ieets the requirements of MIL-STD-883 (

16、see 3.1 herein) and the requirements herein. ierein) shall be provided with each lot of microcircuits delivered to this drawing. 3.4 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be 3.6 Certificate of conformance. A certificate of conformance as required i

17、n MIL-STD-883 (see 3.1 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 3.7 Notification of change. Notification of change to OESC-ECS shall be required in accordance with IIL-STO-883 (see 3.1 herein). REV PAGE 3 I c- Provided by IHSNot for ResaleNo reproduction or networking permitted without license

18、 from IHS-,-,-I TABLE I o Electrical performance characteristics. Test ISymbol I Condi tions IGroup A IDevice I Limits I Unit I I 1 I I I TC -55C to +125C Isubgroupsl type I I VCC = 5.0 V *5% I I I Min I Max I I I l I I II I I I I I I I I II I I I Input high voltage IVIH i 1, 2, 3 I All 1 2.OiVcc V

19、I I I 1 1 1 +.5 I I I I I I 1, 2, 3 1 All 1 I IV I I II I I 2*01Vcc+1 I 1 3.81Vcc*l I il I 1 I 1 I 1 I I i II I I Input low voltage !VIL I I 1, 2, 3 I All I -.51 -8 I V Clock input low IhLC I vol tage : I CKM = 1 I l 1 CKM = O I I 1 I I I 1 I Output low voltage IVOL IIOL I 0.3 mR I 1, 2, 3 1 All I I

20、 ,451 V Output high voltage IvoH Input leakage current 111 IO V 5 VIN 5 Vcc I 1, 2, 3 i All 1 It10 1 PA Output leakage current1 ILO 1.45 V A VOUT 5 Vcc i 1, 2, 3 f All /i10 UA 1 I I I l I II I I I I I I I II I 1 1 1 I II 1 I 1, 2, 3 I All I 2.41 IV PH = -400 IlA I I 11 i Power supply current 1cc ITC

21、 = -55C I 3 I All I 1600 i #4 . I I ISee 4.3,lc I 1 II I capacitance (00-015) 1 ISee 4.3.1 I I Il I ISee 4.3.1 I I li 4 Input capacitance ICIN IFC = 1 MHz 1 4 IA111 fi0 i pF . Input/output IC0 IFC = 1 FIHz 1 4 1 All I 1 2 I pi- CLK capacitance CCLK IFC = 1 MHz 1 4 f All 1 i 12 1 pF I I I I I I I 11

22、1 ns : i9* lus li I o1 Il00 Is00 I I CLK period ICLCL 1 - i/ CKM i: 1 I 1 O2 1125 1500 1 1 03 1166 1500 I 1 O1 I 40 1166 I 1 I CKM = O I 1 I I 02 I 50 1166 i I 03 1 62.51166 I I I 1 l I I I 1 1 I 1 O1 1 53 1343 1 1 I 02 1 68 1343 I I 1 03 I100 1343 1 I I O1 I 11 1146 I I 1 at Oa6 I 102, 03 I 15 1146

23、 I I I at o*8 t 1/ 19, 10, ill II I nc CLK low time ftCLCH I - CKM 1 I I CKM = O I I See footnates at end of table, SIZE MI LllARY DRAW1 NG A CODE IDENT. NO. DWG NO. 14933 5962-85133 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 4 Provided by IHSNot for ResaleNo reproduction or networking

24、permitted without license from IHS-,-,- DESC-DWG-B5133 57 m 7777775 000LibB T M SIZE CODE IDENT. NO. MILITARY DRAWING A 14933 TABLE I. Electrical performance characteristics - Continued. Test ISymbol I Conditions IGroup A IOevice I Limits I Unit I I I I I I TC = -55C to +125“C Icubgroupsl type IV VC

25、C = 5.0 V *5% 1 I I Min I Max I I I I I I1 I 1 I I i I I O1 I 28 1230 I CKM = 1 I at 2.0 V I o2 I 43 123u I I 03 I 50 I230 I I I I I I O1 1 18 1151 I 1 I CKM = O I I at 3.6 V I 102, 03 I 20 1151 I I I II I I I I I 1 I I I 19, 10, 111 Ali i i 10 i ns I I I I II I I 1 II I 1 I I I I ItCL 113.6 V to 1.

26、0 V if CKM = 1 19, 10, ill All I I 10 I ns i/ I I II I l I II I 1 I 19, io, 111 All I 75 i .I ns I i/ I I II inactive I I i/ 19, 13, ill01, 02 I 18 I I ns I I 03 I 30 I 1 inactive I I MPWR, NPRO active timeltWLWH I at 0.8 v 19, 10, lllO1, o2 1 90 I 1 ns I I 03 I 95 I I I I Il I/ I I I I I 1 19, 10,

27、111 All I U i II i/ I I Command valid to IAVRL I - I I I I I I I 1 I 19, li), ill o1 Il00 I I ns I i/ 102, 03 1130 I I I I 1 1 1 II I I I I 19, 10, ill o1 I 60 I 102, 03 I 85 I i/ I FKRactive time ILKH I at 0.8 V - I 1 I I I I I 19, 10, ill o1 1200 I I ns 102, 03 1250 I I i/ I PEACK inactive time It

28、KmL 1 at 2.0 V - I I I I I I 19, 10, lll01, O2 I 40 I I ns I i/ 1 I03 150 I I I i/ 19, 10, 111 All 1-30 I I ns I I I1 I NPWR NPRD inactive toltCHKL I - i/ 19, 10, ill o1 I 22 I I ns 102, 03 I 30 I I Command hold from ItWHAX I - I I I II I i/ 19, 10, ill II I ns CLK hiyh time ICHCL I - ItC CH211.0 V

29、to 3.6 V if CKM = 1 I/ I y I - I 3 I - CLK rise time CLK fall time Data setup to IPiR ItovwH I - Data hold from NPblR Itwox I - I I I I I - IRLRH - Minimum delay from ItMHRL I - I ns ITPIJR or Nmm active ItAVWL I PEREQ active to I - NPKD active I ns - E?iR inactive to ItKHCH i - mpGnT, Nmm inactive

30、I - 1 PEKCR active I I TPLT, TPRD inactive ItRHAX I DWG NO. 5962-85133 See footnotes at end of table. DEFENSEELECTRONICSSUPPLYCENTER DAYTON, OHIO REV PAGE 5 4- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I . Test PEACK active setup t M, Nmm activ

31、e RprJR, NPRO to CLK setup time V!X, APRD from CLK hold time RESET to CLK setup time RESET from CLK hold time 3pRb inactive to data float KPll active to data valid FRRoff active to mTsr inactive FTEX active to inactive BLE I. Electrical performance characteristics - Continued. Symbol I Conditions I

32、I 18roup A Device I I lsubgroupsl type I I I I I l I 1 19, 10, lllOi, 02 I 40 I I03 I50 I I ns I I III I I i9, 10, 11I o1 i 53 I Limits I Unit TC = -55C to +125C VCC 5.0 V *5% il KLCL I - IVCL I - 11 y I ns I 102. 03 I 70 I LIH il y is, IO, iii 01 i 37 i i ns I 102, 03 I 45 I I - III 1 I I 19, 10, 1

33、11 All I 20 I 19, 10, 111 A17 1 20 I I I I i tRSCL - I I t 11 I i/ y I I I Ins III I I ns kLRS I - is, 10, iii 01 i i 25 i ns I02 I 1351 I 03 I I 37.51 I I I I I I II 19, 10, 111 All I 1 60 I ns I III I I i/ y HQZ 1 - LQV I DO-DI5 1 oading: I I I I 1 - 5/lC = 100 PF d 11 1 I I I I I I I I I I l is,

34、io, iii AII iiou i i ns t r It1 I t I I I I I I 1 I I l l l I is, io, ii; AH i iioo i tis I III tWLBV IlNW loading = I 1 I t I I /ICL = 100 pF - 11 I l I I l I I tKLML ion last data transfer of is, io, iii AII i i127 i ns 1 numeric i nctruction JI I I Ili I I I t I I ee footnotes at end of table. I

35、SIZE CODE IDENT. NO. DWG NO. MILITARY DRAWING A 14933 5962-85133 DAYTON, OHIO +REV PAGE DEFENSE ELECTRONICS SUPPLY CENTER : i I I DESC FORM 193A FEB 86 I 4- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-SL33 57 M 7777775 OOOLIbLO B M SIZE

36、CODE IDENT. NO. MILITARY DRAWING A 14933 TABLE I. Electrical performance characteristics - Continued. DWG NO. 5962-85133 I I 1 I I Wri te-to-write I I I I Read- to- read I I I I Wri te-to-read I I I I Read-to-wri te I I Test I Symbol Comnand inactive time ItCMDI DEFENSEELECTRONICSSUPPLYCENTER DAYTON

37、, OHIO Data hold from IRHQH Nmm inactive I REV PAGE 7 I I I I Conditions Group A Device i Limits i Unit I Min I Max = -55C to +125“C !subgroups1 type I TC“, = 5.0 Y *5% ! i/ is, 10, li i i ins at 2.0 Y - I III IO1 1751 I 1 I I 102, 03 I 95 I I I I III I 1-1 I I IO1 1751 I I 102, 03 I 95 I I I I III

38、I 1-1 I I IO1 1751 I I 102, 03 I 95 I I I I III I III I I io1 1751 I I 102, 03 I 95 I I DO-D15 loading = is, io, iii AII i 3 i i ns I1 1 I III i/ I I I - CL = 100 PF l/ See figures 3 and 4. r/ Guaranteed if not tested. !/ This is an asynchronous input. This specification is given for testing purpose

39、s only, to assure recognition at a specific CLK edge. L/ Float condition occurs when output current is less than ILO on DO-D15. i/ Due to test equipment limitations, actual tested values may differ from those specified, but specified values are guaranteed. 4. QUALITY ASSURANCE PROVISIONS 4.1 Samplin

40、g and ins ection. Sampling and inspection procedures shall be in accordance with section 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be t of MIL-M-38510 to theextent specified in MIL-STD-883 (see 3.1 herein). :onducthall apply: a. Burn-in test (method 1

41、015 of MIL-STD-883). (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to

42、 burn-in are optional at the discretion of the manufacturer. I I I DESC FORM 193A FEB 86 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_- -_ - - DESC-DWG-5133 59 9999995 0004b11i T TABLE II. Electrical test requirements, I I Subgroups I I MIL-STO-8

43、83 test requirements I (per method I I 5005, table I) I I I I I 1 Interim electrical parameters I I I I I (inethod 5004) I I I d- Irinal electrical test parameters I lrouo A test reaurements I I I l“, 2, 3, 7*, I I I 5, 9, 10, 11 I (method 5004) i (method 5005) i 1, 2, 3, 7, I I I 8, 9, 10, 11 1 1Gr

44、oups C and D end-point I electrical parameters I 2, 8(Hot), 10 I I (method 5005) I I I I L I I for group C periodic I l inspections I I i Additional electrical subgroups I - *PDA applies to subgroups 1 and 7. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance w

45、ith iethod 5005 of MIL-STD-883 including groups A, B, C, and O inspections. The following additional :riteria shall apply. 4.3.1 Group A inspection. a, Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STO-883 shall be omitted. c. Subgroup 4 (GIN, Co

46、, and CCLK measurementsi shall be measured only for the initial test and after process or design changes which may affect input capacitance. 4.3.2 Groups C and 0 inspections. a, End-point electrical parameters shall be as specified in table II herein. b, Steady-state life test (method 1005 of MIL-ST

47、O-883) conditions: (1) Test condition A, 6, C, or O using the circuit submitted with the certificate of compliance (see 3.5 herein), (2) TA = +125*C, minimum. (3) Test duration: 1,000 hours, except as permitted by appendix B of MIL-M-38510 and method 1005 of MIL-STO-883, 5, PACKAGING 5.1 Packaging r

48、equirements, The requirements for packaging shall be in accordance with MIL-M-38510. SIZE CODE IDENT. NO. DWG NO. MILITARY DRAWING A 14933 5 9 6 2 - 8 5 13 3 DEFENSEELEGTRONICSSUPPLYCENTER DAYTON, OHIO REV PAGE 8 ESC FORM 193A FEB 88 Provided by IHSNot for ResaleNo reproduction or networking permitt

49、ed without license from IHS-,-,-DESC-DWG-85133 57 W 7797775 0004bL2 1 W SIZE CODE IDENT. NO. MILITARY DRAW1 NG A 14933 SI - L so 7 COD/ IN TA NC DI 5 DI4 DI3 DI 2 vcc vss DI I DIO NC D9 D8 07 D6 D5 D4 D3 _- NOTE: N.C. pin must not be connected. DWG NO. 5962-85133 FIGURE 1. Terminal connections. DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO