ASTM E1362-2015 Standard Test Methods for Calibration of Non-Concentrator Photovoltaic Non-Primary Reference Cells《校准非集中光电二次参比电池的标准试验方法》.pdf

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1、Designation: E1362 10E1362 15Standard Test MethodMethods forCalibration of Non-Concentrator PhotovoltaicSecondaryNon-Primary Reference Cells1This standard is issued under the fixed designation E1362; the number immediately following the designation indicates the year oforiginal adoption or, in the c

2、ase of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 ThisThese test method coversmethods cover calibration and characterization of secondaryno

3、n-primary terrestrial photo-voltaic reference cells to a desired reference spectral irradiance distribution. The recommended physical requirements for thesereference cells are described in Specification E1040. Reference cells are principally used in the determination of the electricalperformance of

4、a photovoltaic device.1.2 SecondaryNon-primary reference cells are calibrated indoors using simulated sunlight or outdoors in natural sunlight byreference to a primary reference cell previously calibrated to the same desired reference spectral irradiance distribution.previouslycalibrated reference c

5、ell, which is referred to as the calibration source device.1.2.1 The non-primary calibration will be with respect to the same reference spectral irradiance distribution as that of thecalibration source device.1.2.2 The calibration source device may be a primary reference cell calibrated in accordanc

6、e with Test Method E1125, or anon-primary reference cell calibrated in accordance with these test methods.1.2.3 For the special case in which the calibration source device is a primary reference cell, the resulting non-primary referencecell is also referred to as a secondary reference cell.1.3 Secon

7、daryNon-primary reference cells calibrated according to thisthese test methodmethods will have the same radiometrictraceability as the of the primary reference cell used for the calibration. that of the calibration source device. Therefore, if theprimary reference cellcalibration source device is tr

8、aceable to the World Radiometric Reference (WRR, see Test Method E816),the resulting secondary reference cell will also be traceable to the WRR.1.4 ThisThese test method appliesmethods apply only to the calibration of a photovoltaic cell that demonstrates a linearshort-circuit current versus irradia

9、nce characteristic over its intended range of use, as defined in Test Method E1143.1.5 ThisThese test method appliesmethods apply only to the calibration of a photovoltaic cell that has been fabricated using asingle photovoltaic junction.1.6 The values stated in SI units are to be regarded as standa

10、rd. No other units of measurement are included in this standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the appli

11、cability of regulatorylimitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E490 Standard Solar Constant and Zero Air Mass Solar Spectral Irradiance TablesE691 Practice for Conducting an Interlaboratory Study to Determine the Precision of a Test MethodE772 Terminology of Solar Energy C

12、onversionE816 Test Method for Calibration of Pyrheliometers by Comparison to Reference PyrheliometersE927 Specification for Solar Simulation for Photovoltaic TestingE948 Test Method for Electrical Performance of Photovoltaic Cells Using Reference Cells Under Simulated Sunlight1 This test method is u

13、nder the jurisdiction of ASTM Committee E44 on Solar, Geothermal and Other Alternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved June 1, 2010Dec. 1, 2015. Published July 2010February 2016. Originally appro

14、ved in 1995. Last previous edition approved in 20052010 asE1362-05.-10. DOI: 10.1520/E1362-10.10.1520/E1362-15.2 For referencedASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at serviceastm.org. For Annual Book of ASTM Standardsvolume information, refer to the st

15、andards Document Summary page on the ASTM website.This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accura

16、tely, ASTM recommends that users consult prior editions as appropriate. In all cases only the current versionof the standard as published by ASTM is to be considered the official document.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United State

17、s1E973 Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a PhotovoltaicReference CellE1021 Test Method for Spectral Responsivity Measurements of Photovoltaic DevicesE1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Ref

18、erence Cells Under Global Irradiation(Withdrawn 2004)3E1040 Specification for Physical Characteristics of Nonconcentrator Terrestrial Photovoltaic Reference CellsE1125 Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Using a TabularSpectrumE1143 Test M

19、ethod for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test ParameterE1328 Terminology Relating to Photovoltaic Solar Energy Conversion (Withdrawn 2012)3G173 Tables for Reference Solar Spectral Irradiances: Direct Normal and Hemispherical on 37 Tilted Surface3. Term

20、inology3.1 DefinitionsDefinitions of terms used in thisthese test methodmethods may be found in Terminology E772 and inTerminology E1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 junction temperature, calibration source device, photovoltaic, nsynonym forthe reference cell temperature.

21、used tomeasure the incident irradiance during the calibration. E13283.2.2 monitor solar cell, na solar cell used to measure the irradiance of the solar simulator during the calibration; prior to thecalibration procedure, the monitor solar cell is compared against the calibration source device using

22、a transfer-of-calibrationprocedure.3.2.3 non-primary reference cell, photovoltaic, na photovoltaic reference cell calibrated against another reference cell inaccordance with Test Method E1362. E7723.2.4 primary reference cell, photovoltaic, na photovoltaic reference cell calibrated in sunlight in ac

23、cordance with TestMethod E1125. E7723.2.5 secondary reference cell, photovoltaic, na photovoltaic reference cell calibrated against a primary reference cell inaccordance with Test Method E1362. E7723.2.6 test light source, na source of radiant energy used for the secondary reference cell calibration

24、, either natural sunlightor a solar simulator.3.3 Symbols:3.3.1 The following symbols and units are used in thisthese test method:methods:Aactive area, reference cell (m2),Ccalibration constant, Am2W1,CTtransfer calibration ratio (dimensionless),Das a subscript, refers to the reference cell to be ca

25、librated,Eirradiance, Wm(Wm2,),Et0total irradiance, Wmreference spectral irradiance distribution (Wm2,),IE0current, A,()reference spectral irradiance distribution (Wm2m1 or Wm2nm1),Ii pprimary reference cell short-circuit current, A,as a subscript, refers to the ith calibration data point,I or IsSCs

26、econdary reference cell short-circuit current, A,short-circuit current, (A),IscMshort-circuit current, A,monitor solar cell (A),Lcollimator length, m,Mspectral mismatch parameter,parameter (dimensionless),ntotal number of calibration data points,rQ(,T)collimator receiving aperture radius, m,quantum

27、efficiency (electrons/photon or %),Rcollimator opening aperture radius, m,as a subscript, refers to the calibration source device,RaA()absolute spectral response, AWresponse (AW11,),Rsrrelative spectral response,standard deviation,Sstandard deviation,Ttemperature, C,(C),T0temperature coefficient of

28、reference cell, Ccalibration temperature, (C),1,Tocollimator opening angle, , andtemperature difference, (C),wavelength, nm or m.wavelength (nm or m), and()partial derivative of quantum efficiency with respect to temperature (electrons per photonC1 or %C1).3.3.2 Symbolic quantities that are function

29、s of wavelength appear as X().E1362 1524. Summary of Test Method4.1 The calibration constant, C, of a photovoltaic refererence cell is defined as the ratio of its short-circuit current to the totalirradiance when illuminated with a reference spectral irradiance distribution (such as Standard E490 or

30、 Tables G173). In integralform, the calibration constant is:C 5ISCE05A*RA!E0!d*E0!d (1)4.2 A reference cell is used to measure irradiance through Eq 2:E 5ISCC (2)4.3 Errors and difficulties associated with measuring A and RA() in Eq 1 can be avoided by comparing the short-circuit currentof a referen

31、ce cell to be calibrated (ID) against that of a previously calibrated reference cell (that is, the calibration source device,IR), while both cells are illuminated with a test light source. The calibration constant of the calibration source device transformsshort-circuit current to total irradiance s

32、o that Eq 1 becomes:CD 5 IDIRCR(3)4.4 For calibrations in natural sunlight, the calibration source device and the cell to be calibrated are placed on a normalincidence tracking platform, and the short-circuit currents of both devices are measured simultaneously.4.5 For calibrations in simulated sunl

33、ight, the calibration source device is first placed in the test plane, and a transfer-of-calibration procedure is performed to a monitor solar cell. The calibration source device is then replaced with the cell to becalibrated in the same location, and the non-primary calibration is then performed.4.

34、6 Calibration TemperatureThese procedures assume the calibration temperatures, T0, of both the calibration source deviceand the cell to be calibrated are 25C; other calibration temperatures may be substituted if desired.4.7 Calibration Data CollectionRaw calibration constant data are corrected for s

35、pectral and temperature differences using thespectral mismatch parameter, M (see 5.2 and Test Method E973).4.8 Light SoakingNewly manufactured reference cells must be light soaked at an irradiance level greater than 850 W/m2 for20 h prior to initial characterization.4.9 CharacterizationThe calibrati

36、on of a secondary photovoltaic reference cell consists of measuring the short-circuit currentof the cell under natural or simulated sunlight using a primary reference cell to measure the incident irradiance. In addition to theshort-circuit current, the relative spectral response of the cell to be ca

37、librated and the relative spectral irradiance of the light sourcemust be determined. Errors in the short-circuit current due to the spectral irradiance of the light source and the spectral responseof the primary reference cell are then corrected by dividing the short-circuit current by the spectral

38、mismatch parameter. Also, ifthe temperature of the cell is not 25 6 1C, the temperature coefficient for the short-circuit current is needed. The list of necessarytest methods is as follows:Prior to calibration, the non-primary cell is characterized using the following procedures:4.9.1 The spectral r

39、esponse of the cell to beQuantum efficiency at the calibration temperature, Q(,T0 calibrated is ), determinedin accordance with Test Methods E1021.4.9.2 The cells short-circuit current temperature coefficientPartial derivative of quantum efficiency with respect to temperatureD()=QD/T is determined e

40、xperimentally by measuring short-circuit current at various temperatures(), determined inaccordance with Annex A1 of Test Methods E973and computing the temperature coefficient4.9.3 Linearity of short-circuit current versus irradiance is irradiance, determined in accordance with Test Method E1143.4.1

41、.4 The relative spectral distribution of the light source is determined using a spectral irradiance measurement instrument asspecified in Test Method E973.5. Significance and Use5.1 It is the intent of these test methods to provide a recognized procedure for calibrating, characterizing, and reportin

42、g thecalibration data for non-primary photovoltaic reference cells that are used during photovoltaic device performance measurements.5.2 The electrical output of photovoltaic devices is dependent on the spectral content of the source illumination and its intensity.To make accurate measurements of th

43、e performance of photovoltaic devices under a variety of light sources, it is necessary toaccount for the error in the short-circuit current that occurs if the relative spectral response of the primary reference cell is notidentical to the spectral response of the cell to be calibrated. device under

44、 test. A similar error occurs if the spectral irradiancedistribution of the test light source is not identical to the desired reference spectral irradiance distribution. These errors areaccounted for by quantified with the spectral mismatch parameter M (Test Method E973), a quantitative measure of t

45、he error inthe short-circuit current measurement. It is the intent of this test method to provide a recognized procedure for calibrating,characterizing, and reporting the calibration data for secondary photovoltaic reference cells.).5.2.1 Test Method E973 requires four quantities for spectral mismat

46、ch calculations:E1362 1535.2.1.1 The quantum efficiency of the reference cell to be calibrated (see 7.1.1),5.2.1.2 The quantum efficiency of the calibration source device (required as part of its calibration),NOTE 1See 10.10 of Test Method E1021 for the identity that converts spectral responsivity t

47、o quantum efficiency.5.2.1.3 The spectral irradiance of the light source (measured with the spectral irradiance measurement equipment), and,5.2.1.4 The reference spectral irradiance distribution to which the calibration source device was calibrated (see G173).5.2.2 Temperature CorrectionsTest Method

48、 E973 provides means for temperature corrections to short-circuit current using thepartial derivative of quantum efficiency with respect to temperature.5.3 A secondarynon-primary reference cell is calibrated in accordance with these test methods is with respect to the samereference spectral irradian

49、ce distribution as the primary reference cell used during the calibration. that of the calibration sourcedevice. Primary reference cells canmay be calibrated by use of Test Method E1125 or Test Method E1039.NOTE 2No ASTM standards for calibration of primary reference cells to the extraterrestrial spectral irradiance distribution presently exist.5.4 A secondarynon-primary reference cell should be recalibrated yearly, or every six months if the cell is in continuous useoutdoors.5.5