ASTM E1021-2012 red 5625 Standard Test Method for Spectral Responsivity Measurements of Photovoltaic Devices 《光电器件波谱反应的测量标准试验方法》.pdf

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1、Designation:E102106 Designation: E1021 12Standard Test Method forSpectral Responsivity Measurements of PhotovoltaicDevices1This standard is issued under the fixed designation E1021; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, t

2、he year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1This test method is to be used to determine either the absolute or relative spectral responsivity response o

3、f a single-junctionphotovoltaic device. This test method requires the use of a bias light.1.21.1 This test method is to be used to determine either the absolute or relative spectral responsivity response of a single-junctionphotovoltaic device.1.2 Because quantum efficiency is directly related to sp

4、ectral responsivity, this test method may be used to determine thequantum efficiency of a single-junction photovoltaic device (see 10.10).1.3 This test method requires the use of a bias light.1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included

5、 in this standard.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatorylimitations prior to use

6、.2. Referenced Documents2.1 ASTM Standards:2E691 Practice for Conducting an Interlaboratory Study to Determine the Precision of a Test MethodE772 Terminology of Solar Energy ConversionE927 Specification for Solar Simulation for Photovoltaic TestingE948 Test Method for Electrical Performance of Photo

7、voltaic Cells Using Reference Cells Under Simulated SunlightE973 Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a PhotovoltaicReference CellE1036 Test Methods for Electrical Performance of Nonconcentrator Terrestrial Photovoltaic Modules and Arrays

8、 UsingReference CellsE1125 Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Using a TabularSpectrum E1328Terminology Relating to Photovoltaic Solar Energy ConversionE1362 Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference

9、CellsE2236 Test Methods for Measurement of Electrical Performance and Spectral Response of Nonconcentrator MultijunctionPhotovoltaic Cells and ModulesG173 Tables for Reference Solar Spectral Irradiances: Direct Normal and Hemispherical on 37 Tilted Surface3. Terminology3.1 DefinitionsDefinitions of

10、terms used in this test method may be found in Terminology E772and in Terminology E1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 chopper, na rotating blade or other device used to modulate a light source.3.2.2 device under test (DUT), na photovoltaic device that is subjected to a spe

11、ctral responsivity measurement.1This test method is under the jurisdiction of ASTM Committee E44 on Solar, Geothermal and Other Alternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved Nov. 1, 2006. Published

12、 January 2007. Originally approved in 1993. Last previous edition approved in 2001 as E102195 (2001). DOI:10.1520/E1021-06.Current edition approved March 1, 2012. Published April 2012. Originally approved in 1993. Last previous edition approved in 2006 as E1021 06. DOI:10.1520/E1021-12.2For referenc

13、edASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at serviceastm.org. For Annual Book of ASTM Standardsvolume information, refer to the standards Document Summary page on the ASTM website.1This document is not an ASTM standard and is intended only to provide the

14、user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current versionof the standard

15、 as published by ASTM is to be considered the official document.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.3.2.3 irradiance mode calibration, na calibration method in which the reference photodetector measures the irradianceprodu

16、ced by the monochromatic beam.3.2.4 monitor photodetector, na photodetector incorporated into the optical system to monitor the amount of light reachingthe device under test, enabling adjustments to be made to accommodate varying light intensity.3.2.5 monochromatic beam, nchopped light from a monoch

17、romatic source reaching the reference photodetector or deviceunder test.3.2.6 monochromator, nan optical device that allows a selected wavelength of light to pass while blocking other wavelengths.3.2.7 power mode calibration, na calibration method in which the reference photodetector measures the po

18、wer in themonochromatic beam.3.2.8 quantum effciency, nnumber of collected electrons per incident photon at a specific wavelength in percent units.3.2.9reference photodetector, na photodetector used to quantify the amount of light in monochromatic beam.3.2.103.2.9 spectral bandwidth, nthe range of w

19、avelengths in a monochromatic light source, determined as the difference betweenits half-maximum-intensity wavelengths.3.3 Symbols:3.3.1 The following symbols and units are used in this test method.Ailluminated device area, m2,cspeed of light in vacuum, 299792458 ms1,CVMimonitor photodetector calibr

20、ation value for irradiance mode, AmAm2WW1,CVMpmonitor photodetector calibration value for power mode, AWAW1small wavelength interval, nm or m,Eo reference total irradiance, Wm2,Eo(l)reference spectral irradiance, Wm2nm1or Wm2m1,EMmonochromatic source irradiance, Wm2,Errfractional error in measuremen

21、t, dimensionless,hPlancks constant, Js, Plancks constant, 6.6260695731034Js,Icurrent, A,Imcmonitor photodetector current during calibration, A,lmtmonitor photodetector current during test, A,Iscsolar cell short-circuit current, A,IoIscunder Eo(l), A,Jscsolar cell short-circuit current density, Am2,K

22、irelative-to-absolute spectral responsivity conversion constant for irradiance mode, Am2W1,Kprelative-to-absolute spectral responsivity conversion constant for power mode, AW1,lwavelength, nm or m,loa specific wavelength, nm or m,Mspectral mismatch parameter,Pmonochromatic beam power reaching the ph

23、otodetector, W,fpower of the monochromatic beam or irradiance of the monochromatic beam, W or Wm2,qelementary charge, C, elementary charge, 1.60217656531019C,Qexternal quantum efficiency, external quantum efficiency dimensionless or percent,Riaabsolute spectral responsivity for irradiance mode, Am2W

24、1,Rpaabsolute spectral responsivity for power mode, AW1,Rirrelative spectral responsivity for irradiance mode, dimensionless,Rprrelative spectral responsivity for power mode, dimensionless,SRspectral responsivity, AW1or Am2W1.3.3.2 Symbolic quantities that are functions of wavelength appear as X (l)

25、.4. Summary of Test MethodsMethod4.1 The spectral responsivity of a photovoltaic device, defined as the output current per input irradiance or radiant power at agiven wavelength, and normally reported over the wavelength range to which the device responds, is determined by the followingprocedure:4.1

26、.1 Amonochromatic, chopped beam of light is directed at normal incidence onto the cell. Simultaneously, a continuous whitelight beam (bias light) is used to illuminate the DUTat irradiance levels between one third and one half of normal end use operatingconditions intended for the device. See Fig. 1

27、.4.1.2 The magnitude of the ac (chopped) component of the current at the intended voltage is monitored as the wavelength ofthe incident light is varied over the spectral response range of the device.4.2 Measurement of the absolute spectral responsivity of a device requires knowledge of the absolute

28、beam power or irradianceproduced by the monochromatic beam. The total power or irradiance of the monochromatic beam incident on the device isE1021 122determined by the reference photodetector (see 6.1). The absolute spectral responsivity of the device can then be computed usingthe measured device ph

29、otocurrent and the power or irradiance of the monochromatic beam.4.3 The choice of power versus irradiance mode may depend on the spatial non-uniformity of the test device. Overall spectralresponse of a test device with substantial spatial non-uniformity of response should be performed in irradiance

30、 mode.4.4 The test procedure can be adapted to provide absolute or relative spectral responsivity measurements, depending on thecalibration device used, its calibration mode and the relative sizes of the calibration device, the monochromatic beam size, and thedevice being measured.5. Significance an

31、d Use5.1 The spectral responsivity of a photovoltaic device is necessary for computing spectral mismatch parameter (see Test MethodE973). Spectral mismatch is used in Test Method E948 to measure the performance of photovoltaic cells in simulated sunlight, inTest Methods E1036 to measure the performa

32、nce of photovoltaic modules and arrays, in Test Method E1125 to calibratephotovoltaic primary reference cells using a tabular spectrum, and in Test Method E1362 to calibrate photovoltaic secondaryreference cells. The spectral mismatch parameter can be computed using absolute or relative spectral res

33、ponsivity data.5.2 This test method measures the differential spectral responsivity of a photovoltaic device. The procedure requires the use ofwhite-light bias to enable the user to evaluate the dependence of the differential spectral responsivity on the intensity of lightreaching the device. When s

34、uch dependence exists, the overall spectral responsivity should be equivalent to the differential spectralresponsivity at a light bias level somewhere between zero and the intended operating conditions of the device.5.3 The spectral responsivity of a photovoltaic device is useful for understanding d

35、evice performance and materialcharacteristics.5.4 The procedure described herein is appropriate for use in either research and development applications or in product qualitycontrol by manufacturers.5.5 The reference photodetectors calibration must be traceable to SI units through a National Institut

36、e of Standards andTechnology (NIST) spectral responsivity scale or other relevant radiometric scale.3 ,4The calibration mode of the photodetector(irradiance or power) will affect the procedures used and the kinds of measurements that can be performed.5.6 This test method does not address issues of s

37、ample stability.5.7Using results obtained by this test method and additional measurements, one can compute the internal quantum efficiency ofa device.5.7 Using results obtained by this test method and additional measurements including reflectance versus wavelength, one cancompute the internal quantu

38、m efficiency of a device. These measurements are beyond the scope of this test method.5.8 This test method is intended for use with a single-junction photovoltaic cell. It can also be used to measure the spectralresponsivity of a single junction within a series-connected, multiple-junction photovolt

39、aic device if electrical contact can be madeto the individual junction(s) of interest.5.9 With additional procedures (see Test Methods E2236), one can determine the spectral responsivity of individual junctionswithin series-connected, multiple-junction, photovoltaic devices when electrical contact c

40、an only be made to the entire devicestwo terminals.5.10 Using forward biasing techniques5, it is possible to extend the procedure in this test method to measure the spectralresponsivity of individual series-connected cells within photovoltaic modules. These techniques are beyond the scope of this te

41、stmethod.3Larason, T. C., Bruce, S. S., and Parr, A. C., NIST Special Publication 250-41 Spectroradiometric Detector Measurements, Washington, DC, U.S. Government PrintingOffice, 1998. Also available at http:/ois.nist.gov/sdm/4Eppeldauer, G., Racz, M., and Larason, T., “Optical characterization of d

42、iffuser-input standard irradiance meters,” SPIE Vol 3573, 1998, pp. 220-224.5Emery, K. A., “Measurement and Characterization of Solar Cells and Modules,” Handbook of Photovoltaic Science and Engineering, Chapter 16, pp. 701-747, Luque,A., and Hegedus, S., Eds., John Wiley errors at specific waveleng

43、ths can be substantially higher):95 % repeatability limit (within laboratory) 0.3 %95 % reproducibility limit (between laboratory) 1.7 %11.2 BiasThe contribution of bias to the total error will depend upon the bias of each individual parameter used for thedetermination of the spectral responsivity.

44、The procedures prescribed in these test methods are designed to reduce bias errors asmuch as is reasonably possible.11.2.1 For relative spectral responsivity measurements, wavelength-independent bias errors cancel because of the normalizationperformed. However, bias errors which vary with wavelength

45、 (such as errors due to non-flat detector responsivity) will stillintroduce error into the final results.11.2.2 For absolute spectral responsivity measurements, bias errors do not cancel out from normalization and thereforepropagate directly into the final results. Of all possible sources of bias, t

46、wo will most likely dominate the total error: photodetectorcalibration and the area measurements. Errors due to multiple reflections between apertures and detector surfaces can also occurwhen irradiance responsivity and power responsivity are converted to each other. Waveform-related errors can also

47、 occur when themodulated current measurement instrumentation is calibrated for square wave or sinusoidal signals and the measurement systemproduces trapezoidal waveforms (see 10.5).12. Measurement Uncertainty12.1 Measurement uncertainty is an estimate of the magnitude of systematic and random measur

48、ement errors that may bereported along with the measurement errors and the measurement results. An uncertainty statement relates to a particular resultobtained in a laboratory carrying out this test method, as opposed to precision and bias statements which are mandatory parts ofthe method itself and

49、 normally derived from an interlaboratory study conducted during development of the test method.12.2 It is neither appropriate for, nor the responsibility of, this test method to provide explicit values that a user of the testmethod would quote as their estimate of uncertainty. Uncertainty values must be based on data generated by a laboratory reportingresults using the test method.12.3 Measurement uncertainties should be evaluated and expressed according to the NIST guidelines8and