ASTM D7331-2007 488 Standard Practice for Sewn Products Marker Data Interchange《缝纫产品标记数据交换的标准实施规程》.pdf
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1、Designation: D 7331 07Standard Practice forSewn Products Marker Data Interchange1This standard is issued under the fixed designation D 7331; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in par
2、entheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice describes a format for transferring markerdata from a CAD marker software system to another or to aCAM software system.1.2 This pract
3、ice does not support curve interpolation ordefinitions. All curves are represented by discrete vectors andare dependent on the resolution of the CAD software1.3 This practice is concerned in limiting differences whenprocessing the same data on different CAD systems.1.4 This practice is not intended
4、to represent the dimensionrelationships between pattern pieces or between pattern sizes,or the correspondence between 2D or 3D sewn product patternpiece geometries.1.5 This practice does not specify the file format for themarker data exchange.1.6 A consistent XML implementation of this practice isre
5、commended.1.7 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Re
6、ferenced Documents2.1 ASTM Standards:2D 6963 Terminology Relating to Sewn Products Automa-tion3. Terminology3.1 For all terminology related to Sewn Products Automa-tion, see Terminology D 6963.3.2 The following terms are relevant to this standard: drillhole, grainline, line, notch, style.3.3 The fol
7、lowing terms are new terms related to SewnProducts Automation:3.3.1 absolute pattern matching, nnesting specificationwhere the nested piece position shall have a specified positionin regard to a repeat line.3.3.2 bundle, nset of nested pieces that are intended to beprocessed together because they ar
8、e issued from the samegraded style and are parts of the same end users product.3.3.2.1 DiscussionAll bundle pieces are to be cut on thesame material.3.3.3 bundle group, nset of bundles that are used to defineconstraints.3.3.3.1 DiscussionAbundle may be part of several bundlegroups for several differ
9、ent constraints. Example: pockets fromthe jacket and the trousers of a suit may have a mutual rotationconstraint.3.3.4 constraint, ndescription of the behavior that one orseveral nested piece of the marker should follow during markerprocessing.3.3.5 effciency, narea of the produced pieces located on
10、the up side of the fabric, including blocking, versus area of themarker, defined by its length and its width.3.3.5.1 DiscussionPieces area inside fusing blocks isconsidered when calculating efficiency. Fusing blocks area isnot considered.3.3.6 fabric category, nidentifies the category to whichthe fa
11、bric belongs.3.3.6.1 DiscussionThe category allows the definition offabric groups that will be used for pattern matching constraintsdefinitions.3.3.7 fabric type, ncharacteristic of a pattern piece used toidentify the material type the piece has to be made of.3.3.8 flip, ntransformation of a geometr
12、y that gives thesymmetry of the graded piece geometry either across the X axisor across the Y axis or across both, that is equivalent to a 180degrees rotation.3.3.8.1 DiscussionThe X and Y axis to consider are thosefrom the graded piece referential.3.3.9 graded piece, nexplicit description of one or
13、 morespecific sizes of a pattern piece, and related information used toproduce it.1This practice is under the jurisdiction ofASTM Committee D13 on Textiles andis the direct responsibility of Subcommittee D13.66 on Sewn Product Automation.Current edition approved Dec. 1, 2007. Published January 2008.
14、2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box
15、C700, West Conshohocken, PA 19428-2959, United States.3.3.10 graded piece repetition, ninstance of a gradedpiece in a graded style.3.3.10.1 DiscussionA graded piece may have severalgraded piece repetitions if its geometry is repeated severaltimes in the graded style. A graded piece repetition can be
16、:3.3.10.2 unflippedthe repetition geometry is the gradedpiece geometry.3.3.10.3 X flippedthe repetition geometry is obtained byan X flip of the graded piece geometry.3.3.10.4 Y flippedthe repetition geometry is obtained by aY flip of the graded piece geometry.3.3.10.5 XY flippedthe repetition geomet
17、ry is obtained bya Y flip and an X flip of the graded piece geometry.3.3.11 graded style, nexplicit description of one or morespecific sizes of a style, and related information used forproduction.3.3.11.1 DiscussionA graded style is composed of gradedpieces.3.3.12 marker, nmain object that can be ex
18、changed usingthis practice and that contains all the theoretical informationneeded to process nesting and production of a set of nestedpieces on a flat material.3.3.13 markerOrder, nset of data containing all necessaryinformation to nest a set of bundles.3.3.14 material, ndescription of the material
19、 structure. Itincludes material geometric information and optional repeatlines description.3.3.15 mutual constraint, nconstraint that applies to sev-eral nested pieces in such way that all these nested pieces mustrespect this constraint in the same way.3.3.16 nested piece, nthe smallest entity that
20、can benested. Can be nested or not.3.3.16.1 DiscussionA nested piece is an instance of agraded piece repetition and contains geometrical descriptionand positioning parameters.3.3.17 pattern piece, ndesign level description of anelementary part of a sewn product.3.3.17.1 DiscussionThe Pattern piece i
21、s a design entity,not suited for production. It is not included in the marker.3.3.18 plaid fabric, nfabric which has repeat lines in boththe X and Y directions.3.3.19 plot line, ninternal line intended to be plot.3.3.20 repeat line, nline that is a characteristic of astructured fabric and that is pe
22、riodically repeated at a knownincrement throughout the whole material.3.3.20.1 DiscussionAn X repeat line is parallel to the Xaxis and is repeated along the Y direction. Similarly, a Y repeatline is parallel to the Y axis and is repeated along the Xdirection.3.3.21 relative pattern matching, nnestin
23、g specificationwhere nested pieces positions are mutually constrained to havethe same offset (non-symmetrical matching) or opposite offset(symmetrical matching) in regard to a repeat line.3.3.22 shrinkage, ndimensional reduction that a materialwill undergo in the part of the processing that will fol
24、low thecutting phase.3.3.22.1 DiscussionTwo-dimensional anisotropic shrink-age is modeled by two one-dimensional coefficients (X shrink-age and Y shrinkage) that represent respectively the reductionfactor that will later apply along each of the X andYdirections.3.3.23 splice mark, ngeometrical infor
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