IEEE 671 CORR 1-2010 en Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors Jerk Acceleration Velocity and Displacement Cor.pdf
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4、2g70g87g85g82g81g76g70g3g54g92g86g87g72g80g86g3g54g82g70g76g72g87g92g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g42g92g85g82g3g68g81g71g3g36g70g70g72g79g72g85g82g80g72g87g72g85g3g51g68g81g72g79g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16
5、g24g28g28g26g15g3g56g54g36g3g3g20g19g3g36g88g74g88g86g87g3g21g19g20g19g25g26g20g55g48g16g20g28g27g24g18g38g82g85g3g20g16g21g19g20g19IEEE Std 671-1985/Cor 1-2010 Corrigendum to IEEE Std 671-1985 (Reaff 2008) IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angula
6、r Sensors: Jerk, Acceleration, Velocity, and Displacement Corrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Block Diagrams Sponsor Gyro and Accelerometer Panel of the IEEE Aerospace and Electronic Systems Society Approved 17 June 2010 IEEE-SA Standards Board Abstract: IEEE Std 6
7、71-1985 provides specifications and test requirements for a non-gyroscopic inertial angular sensor that may measure angular jerk, acceleration, rate, or displacement with or without response down to zero frequency. A standard specification format is provided. A compilation of recommended test proced
8、ures, derived from those presently used in the industry, is also provided. Informative annexes cover design features and theoretical principles of operation. This corrigendum makes changes to 4.7.2.6 to delete a sentence that does not belong there, to add a subclause that was inadvertently left out,
9、 and to renumber the existing subclauses. Changes are also being made to fix the block diagrams in Annex A, to correct a misspelling of inertia, and to add a missing symbol. Keywords: angular acceleration, angular displacement, angular jerk, angular rate, gyro, gyroscope, inertial instrument, inerti
10、al sensor, non-gyroscopic inertial angular sensor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 August 2010. Printed in the United
11、 States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Introduction This
12、 introduction is not part of IEEE Std 671-1985/Cor1-2010, IEEE Standard for IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement Corrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Bl
13、ock Diagrams. This is the first corrigendum to IEEE Std 671-1985 (Reaff 2008). Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requ
14、irements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so.
15、 Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. B
16、y making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of ne
17、w editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a
18、 given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information a
19、bout the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users
20、are encouraged to check this URL for errata periodically. v Copyright 2010 IEEE. All rights reserved. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementa
21、tion of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for whic
22、h a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminato
23、ry. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants The following individuals
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