IEEE 644-1994 en Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields From AC Power Lines《交流电力线路工业频率电场和磁场的测量方法 n n n》.pdf
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1、Copyright 1998 IEEE All Rights Reserved 1IEEE Std 644-1994 (R2008)(Revision of IEEE Std 644-1987)IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields From AC Power LinesSponsorTransmission and Distribution Committeeof theIEEE Power Engineering SocietyReaffirmed 27
2、 March 2008Approved December 13, 1994IEEE Standards BoardAbstract: Uniform procedures for the measurement of power frequency electric and magnetic fields fromalternating current (ac) overhead power lines and for the calibration of the meters used in thesemeasurements are established. The procedures
3、apply to the measurement of electric and magnetic fieldsclose to ground level. The procedures can also be tentatively applied (with limitations, as specified in thestandard) to electric fields near an energized conductor or structure.Keywords: ac power lines, electric field, magnetic field, measurem
4、entThe Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1995 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1995.Printed in the United States of America.ISBN 1-55937-499-3No part of this
5、publication may be reproduced in any form, in an electronic retrieval system or otherwise, without theprior written permission of the publisheriiIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the StandardsCoordinating Committees of the IEEE Standards
6、 Board. Members of the committees serve voluntarily and withoutcompensation. They are not necessarily members of the Institute. The standards developed within IEEE represent aconsensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that haveexp
7、ressed an interest in participating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no otherways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of th
8、e IEEEStandard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to changebrought about through developments in the state of the art and comments received from users of the standard. EveryIEEE Standard is subjected to review at least every five years for
9、revision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of somevalue, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have thelatest editi
10、on of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments.Interpretations:
11、 Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEEE Standards represent a consens
12、us of all concerned interests, it isimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reasonIEEE and the members of its technical committees are not able to provide an instant response to interpretation requestsexcept in those cases whe
13、re the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIEEE Standards documents may involve the use of patented technology. Their app
14、roval by the Institute ofElectrical and Electronics Engineers does not mean that using such technology for the purpose of conforming tosuch standards is authorized by the patent owner. It is the obligation of the user of such technology to obtain allnecessary permissions.iiiIntroduction(This introdu
15、ction is not part of IEEE Std 644-1994, IEEE Standard Procedures for This Measurement of Power Frequency Electricand Magnetic Fields From AC Power Lines.)This standard is a revision of IEEE Std 644-1987 (a revision of IEEE Std 644-1979), which establishes uniformprocedures for measuring power freque
16、ncy electric and magnetic fields in the vicinity of ac power lines. The followingrevisions have been made and are intended to improve the usefulness of the document:a) Text has been introduced that permits the measurement of the resultant magnetic field using three-axis(orsingle-axis) magnetic field
17、 meters. This change required revisions in the calibration procedure clauses andan explanation of the difference between maximum field value and resultant field value.b) Text (with appropriate bibliographical references) has been added to note that magnetic field calibration coilsystems other than t
18、he one described in the standard may be used for calibration purposes, provided that thefields produced have comparable uniformity.c) Corrections in the text and improved figures.d) Clarification of text related to calibration uncertainty in the calibration clauses.The working group draft was prepar
19、ed by the AC Magnetic Fields Task Force of the AC Fields Working Group(R.G.Olsen, Chair) of the Corona and Field Effects Subcommittee of the Transmission and Distribution Committee.The Task Force had the following membership:M. Misakian, Chair K. BellT. D. Bracken R. E. CarberryV. L. ChartierR. Cont
20、iD. W. DenoF. M. DietrichG. GelaK. C. JaffaG. B. JohnsonP. S. MaruvadaS. J. MaurerT. J. McDermottR. C. MukherjiJ. C. NipleR. G. OlsenG. B. RauchS. RodickS. A. SeboC. H. ShihJ. M. SilvaJ. R. StewartJ. M. Van NameP. S. WongL. E. ZaffanellaThe following persons were on the balloting committee:J. E. App
21、lequistJ. F. BuchK. BuchholzJ. J. BurkeV. L. ChartierW. T. CrokerG. A. DavidsonF. A. DenbrockW. E. FeeroL. H. FinkG. GelaE. J. GoodwinI. S. GrantW. S. C. Henry H. M. HesseW. JanischewskyjJ. G. KappenmanG. G. KaradyN. KolcioJ. H. Mallory P. S. MaruvadaT. J. McDermottF. D. MyersD. L. NickelS. L. Nilss
22、onR. G. OswaldR. J. PiwkoJ. R. RedmonE. W. ReidD. ReisingerF. A. M. Rizk N. P. SchmidtB. R. ShperlingJ. M. SilvaJ. R. StewartJ. M. Van Name F. S. YoungivWhen the IEEE Standards Board approved this standard on December 13, 1994, it had the following membership:Wallace S. Read, Chair Donald C. Loughry
23、, Vice Chair Andrew G. Salem, Secretary Gilles A. BarilBruce B. BarrowJos A. Berrios de la PazClyde R. CampJames CostantinoStephen L. DiamondDonald C. FleckensteinJay Forster*Ramiro GarciaDonald N. HeirmanRichard J. HollemanJim IsaakBen C. JohnsonSonny KasturiLorraine C. KevraE. G. “Al” KienerIvor N
24、. KnightJoseph L. Koepfinger*D. N. “Jim” LogothetisL. Bruce McClungMarco W. MigliaroMary Lou PadgettArthur K. ReillyRonald H. ReimerGary S. RobinsonLeonard L. Tripp*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. Aggarwal James BeallRichard B. Engelma
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