DLA SMD-5962-88655-1989 MICROCIRCUIT DIGITAL FAST CMOS OCTAL D-TYPE FLIP-FLOP MONOLITHIC SILICON《硅单片八进制D型触发器高速互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-88655-1989 MICROCIRCUIT DIGITAL FAST CMOS OCTAL D-TYPE FLIP-FLOP MONOLITHIC SILICON《硅单片八进制D型触发器高速互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88655-1989 MICROCIRCUIT DIGITAL FAST CMOS OCTAL D-TYPE FLIP-FLOP MONOLITHIC SILICON《硅单片八进制D型触发器高速互补型金属氧化物半导体数字微电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREVSHEETREVSHEETREV STATUSOF SHEETSREVSHET 1234567891011213PMIC N/APREPARED BY Larry T. Gauder DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444STANDARDIZEDMILITARYDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTME

2、NT OF DEFENSEAMSC N/A CHECKED BYRay MonninMICROCIRCUITS, DIGITAL, FAST CMOS, OCTAL D-TYPE, FLIP-FLOP, MONOLITHIC SILICONAPPROVED BYMichael A. FryeDRAWING APPROVAL DATE30 MAY 1989SIZEACAGE CODE672685962-88655REVISION LEVELSHEET 1 OF 13DESC FORM 193SEP 87 5962-E1257-4DISTRIBUTION STATEMENT A. Approved

3、 for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET2DESC FORM 193AJUL 911. SCOPE1.1 Scope. T

4、his drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. 1.2 Part number. The complete part number shall be as shown in the following example:5962 - 88655 01 R X

5、G0DG0DG0DG0DG0D G0D G0D G0D Drawing number Device type Case outline Lead finish per(see 1.2.1) (see 1.2.2) MIL-M-385101.2.1 Device types. The device types shall identify the circuit function as follows:Device type Generic number Circuit function01 54FCT534 Octal D-type flip-flops, with three-state o

6、utputs02 54FCT534A Octal D-type flip-flops, with three-state outputs1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows:Outline letter Case outlineR D-8 (20-lead, 1.060“ x .310“ x .200“), dual-in-line packageS F-9 (20-lead, .540“ x .300“ x .100“

7、), flat package2 C-2 (20-terminal, .358“ x .358“ x .100“), square chip carrier package 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc to +6.0 V dcInput voltage range -0.5 V dc to V + 0.5 V dcCCOutput voltage range . -0.5 V dc to V + 0.5 V dcCCDC input diode current (I ) -20 mAIKDC ou

8、tput diode current (I ) -50 mAOKDC input current . 100 mAMaximum power dissipation (P ) 2/ 500 mWDThermal resistance, junction-to-case (G14 ) . See MIL-M-38510, appendix CJCStorage temperature range -65G28C to +125G28CJunction temperature (T ) . +175G28CJLead temperature (soldering, 10 seconds) +300

9、G28C1.4 Recommended operating conditions. Supply voltage range (V ) . +4.5 V dc to +5.5 V dcCCMaximum low level input voltage (V ) . 0.8 V dcILMinimum high level input voltage (V ) . 2.0 V dcIHCase operating temperature range (T ) -55G28C to +125G28CC1/ All voltages referenced to GND.2/ Must withsta

10、nd the added P due to short circuit test, e.g., I .DOSProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET3DESC FORM 193AJUL 912. APPLICABLE

11、 DOCUMENTS2.1 Government specification and standard. Unless otherwise specified, the following specification and standard, of the issuelisted in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent spec

12、ified herein.SPECIFICATIONSMILITARYMIL-M-38510 - Microcircuits, General Specification for.STANDARDSMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.(Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should beobt

13、ained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text ofthis drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual ite

14、m requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall

15、be as specified inMIL-M-38510 and herein.3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.2 Truth table. The truth table shall be as specified on figure 2.3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.3.3 Electrical performa

16、nce characteristics. Unless otherwise specified herein, the electrical performance characteristics are asspecified in table I and apply over the full case operating temperature range. 3.4 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the par

17、tnumber listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in 6.4 herein. 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as anapproved source of supply in 6.4. The certificate of compli

18、ance submitted to DESC-ECS prior to listing as an approved source ofsupply shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirementsherein.3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 her

19、ein) shall be provided witheach lot of microcircuits delivered to this drawing.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET4DESC FOR

20、M 193AJUL 91TABLE I. Electrical performance characteristics.Test Symbol Conditions-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunless otherwise specifiedGroup AsubgroupsDevicetypeLimits 2/UnitMin MaxHigh level output voltage VOHV = 4.5 V,CC V = 0.8 VILV = 2.0 VIHI = -300 G29AOH1, 2, 3 All 4.3 VI = -

21、12 mAOH1, 2, 3 All 2.4 VLow level output voltage VOLV = 4.5 V, CCV = 0.8 VILV = 2.0 VIHI = 300 G29AOL1, 2, 3 All 0.2 VI = 32 mAOLAll 0.5 VInput clamp voltage VIKV = 4.5 V, I = -18 mACC IN1Al -1.2VHigh level inpu current IIHV = 5.5 V, V = 5.5 VCC IN1, 2, 3 All 5.0 G29ALow level input current IILV = 5

22、.5 V, V = GNDCC IN1, 2, 3 All -5.0 G29AHigh impedance output current IOZHV = 5.5 V, V = 5.5 VCC OUT1, 2, 3 All 10 G29ALow impedance output current IOZLV = 5.5 V, V = GNDCC OUT1, 2, 3 All -10 G29AShort circuit output current IOSV = 5.5 V 1/ V = 0.0 VCC OUT1, 2, 3 All -60 mAQuiescent power supply curr

23、ent(CMOS inputs)ICCQV G06 0.2 V or V G07 5.3 V,IN INV 5.5 V, f = f = 0 MHzCC I CP1, 2, 3 All 1.5 mAPower supply current(TTL inputs high)G8CICCV = 5.5 V, V = 3.4 V 2/CC IN1, 2, 3 All 2.0 mADynamic power supply current ICCDV = 5.5 V, ouputs openCC V G06 0.2 V or V G07 5.3 V,IN INOE = GNDone bit toggli

24、ng: 50% duty cycle3/Al 0.4mA/MHzTotal power supply current 4/ ICCV G06 0.2 V or V G07 5.3 V,IN INV 5.5 V, f = 10 Mhz,CC CPoutrputs open,one bit toggling: 50% duty cyclefI = 5 MHz, OE = GND1, 2, 3 All 5.5 mASee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permi

25、tted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET5DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics - Continued.Test Symbol Conditions-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunle

26、ss otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxTotal power supplycurrent 4/ICCV G06 0.2 V or V G07 5.3 V,IN INV 5.5 V, f = 10 Mhz,CC CPoutrputs open,one bit toggling: 50% duty cyclefI = 5 MHz, OE = GND1, 2, 3 All 6.0 mAFunctional tests See 4.3.1d 7, 8 AllInput capacitance CINSee 4

27、.3.1c 4 All 10 pFOutput capacitance COUTSee 4.3.1c 4 All 12 pFPropagation delay time,CP to Ont, PLHtPHLV = 5.0 VCCC = 50 pFLR = 500G36LSee figure 35/9, 10, 11 01 1.5 11.0 ns02 1.5 7.2Output enable time t ,PZHtPZL9, 10, 11 01 1.5 14.0 ns02 1.5 7.5Output disenable time t ,PHZtPLZ9, 10, 11 01 1.5 8.0 n

28、s02 1.5 6.5Setup time Dn to CP tsV = 5.0 VCCC = 50 pFLR = 500G36LSee figure 39, 10, 11 01 2.5 ns02 2.0Hold time Dn to CP th9, 10, 11 01 2.5 ns02 1.5CP pulse width(high or low)tPW9, 10, 11 01 7.0 ns02 6.01/ Not more than one output shorted at one time, and duration of the short circuit condition shou

29、ld not exceed one seconds.2/ TTL driven input (V = 3.4 V); all other inputs at V or GND.IN CC3/ This parameter is not directly testable, but is derived for use in total power supply calculations.4/ I = I + (G8CI x D x N ) + (I (f x N + f /2 )CC CCQ CC H T CCD I I CPWhere: D = Duty cycle for TTL inpu

30、ts highHN = Number of TTL inputs at DTHf = infrequency in MHZIN = Number of inputs at fIIf = clock frequency in MHzCP5/ The minimum limits are guaranteed, if not tested, to the limits specified in table I.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

31、-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET6DESC FORM 193AJUL 91Device type 01 and 02Package R, S, and 2TerminalnumberTerminal symbol1234567891011121314151617181920OEO0D0D1O1O2D2D3O3GNDCPO4D4D5O5O6D6D7O7VCCFIGURE 1. Terminal c

32、onnections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET7DESC FORM 193AJUL 91Device types 01 and 02 FunctionInputs OutputsOE CP DnOnH

33、i-Z HHLHXXZZLoad RegisterLLHHG1BG1BG1BG1BLHLHHLZZH = High voltage levelL = Low voltage levelX = IrrelevantZ = High impedance stateG1B = Low-to-high transitionFIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY D

34、RAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET8DESC FORM 193AJUL 91FIGURE 3. Switching waveforms and test circuit.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTR

35、ONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET9DESC FORM 193AJUL 91NOTES:1. Diagram shown for input control enable - low and input control - disable - high.2. Pulse generator for all pulses: t G06 2.5 ns, t G06 2.5 ns. frFIGURE 3. Switching waveforms and test circuit - coti

36、nued.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET10DESC FORM 193AJUL 91Test SwitchtPLZtPZLAll otherClosedClosedOpenNOTES:1. C includ

37、es probe and jig capacitance.L 2. R should be equal to Zout of the pulse generator.T3. Pulse generator for all pulses: PRR G06 1.0 Mhz; Z G06 50G36,outt = t = 2.5 ns r fFIGURE 3. Switching waveforms and test circuit - cotinued.Provided by IHSNot for ResaleNo reproduction or networking permitted with

38、out license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET11DESC FORM 193AJUL 913.7 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see 3.1herein)3.8 Verficat

39、ion and review. DESC, DESCs agent, and acquiring activity retain the option to review the manufactrers facility andapplicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampl

40、ing and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to theextent specified in MIL-STD-883 (see 3.1 herein).4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices priorto quality conformance inspection. The

41、 following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein).(2) T = +125G28C, minimum.Ab. Interim and final electrical test parameters shall be as specified in

42、table II herein, except interim electrical parameter testsprior to burn-in are optional at the discretion of the manufacturer.4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883including groups A, B, C, and D inspections. The foll

43、owing additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.c. Subgroups 4 (C and C measurements) shall be measured only for the initial test and after process or designI

44、N OUTchanges which may affect input capacitance. Test all applicable pins on five devices with zero failures.d. Subgroups 7 and 8 shall verify of the truth table as specified on figure 2 herein.4.3.2 Group Cand D inspections.a. End-point electrical parameters shall be as specified in table II herein

45、.b. Steady-state life test conditions, method 1005 of MIL-STD-883.(1) Test condition A, B, C or D using the circuit submitted with the certificate of compliance (see 3.5 herein).(2) T = +125G28C, minimum.A(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.Provided by I

46、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88655REVISION LEVEL SHEET12DESC FORM 193AJUL 91TABLE II. Electrical test requirements.MIL-STD-883 test requirements Subgroups(

47、per method 5005, table I)Interim electrical parameters(method 5004)- - -Final electrical test parameters(method 5004)1*, 2, 3, 7, 8, 9, 10, 11Group A test requirements(method 5004)1, 2, 3, 4, 7, 8, 9, 10, 11Group C and D end-pointelectrical parameters(method 5005) 1, 2, 3* PDA applies to subgroup 1.

48、5. PACKAGING5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510.6. NOTES6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist andqualified military devices that will perform the required function are not available for original equipment manufacturer application. When a military specification exists and the product covered by this drawing has been qualified listing on QPL-38510, the devicespecified herein will be inactivated and will not b