DLA DSCC-DWG-11018-2011 INDUCTORS SMD CHIP THIN FILM TIGHT TOLERANCE 0603.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.100 Source control drawingREV STATUS REV OF PAGES PAGES 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Ken Beymer DESIGN ACTIVITY DLA LAND AND MARITIME COLUMBUS, OH 43218-5000 Original date of drawing 12 September 2011 CHECKED BY Ke
2、n Beymer TITLE INDUCTORS, SMD, CHIP, THIN FILM, TIGHT TOLERANCE, 0603 APPROVED BY Michael A. Radecki SIZE A CODE IDENT. NO. 037Z3 DWG NO. 11018 REV PAGE 1 OF 8 AMSC N/A 5950-2011-E02Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIM
3、E COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11018 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for inductors, SMD, chip. These inductors are composed of a single or double layer dielectric thin film and are of small size and tight tolerances. 1.2 Part or Identifyin
4、g Number (PIN) The complete PIN is as follows: 11018- 100 J U * Drawing Number Inductance Value (see 1.2.1) Inductance Tolerance (see 1.2.2) Termination Tinish (see 1.2.3) Testing Option (see 1.2.4) 1.2.1 Inductance Value. The nominal inductance value, expressed in nanohenries (nH), is identified by
5、 a three-digit number. The first two digits represent significant figures and the last digit specifies the number of zeros to follow. When the nominal value is less than 10 nH, the letter “R” is used to indicate the decimal point. 1R2 indicates 1.2 nH. 150 indicates 15.0 nH. 1.2.2 Inductance Toleran
6、ce. The inductance tolerance is identified by a single letter in accordance with table I. TABLE I. Inductance Tolerance. Symbol Inductance Tolerance () B 0.1 nH C 0.2 nHD 0.5 nH G 2 percent J 5 percent 1.2.3 Termination Finish. Termination finish is identified by a single letter as shown in table II
7、. TABLE II. Termination Finish. Symbol Termination FinishU Base metallization-barrier metal-solder coated (tin/lead alloy with a minimum of 4 percent lead). 1.2.4 Testing Option. To require additional group C testing, use the appropriate letter from table III. If additional testing is not desired, l
8、eave this location blank. TABLE III. Testing Options. Letter Testing Option C Full additional testing L 500 hours life test only H 500 hours steady state humidity only T 100 temperature cycles only - No additional testing Provided by IHSNot for ResaleNo reproduction or networking permitted without l
9、icense from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11018 REV PAGE 3 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in section 3 this specification. This section does not include documents cited in other sections of th
10、is specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in section 3 of this specification, whether or not they are li
11、sted. 2.2 Government Documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contrac
12、t. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods Standard Electronic and Electrical Component Parts. MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are available online at https/assist.daps.dla.mil/
13、quicksearch or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents
14、are those cited in the solicitation or contract. AGILENT TECHNOLOGIES Agilent Application Note 1369-6 - How To Accurately Evaluate Low ESR, High Q RF Chip Devices. Agilent Literature Number 5968-5162E - 8720E Family Network Analyzers Configuration Guide. (Copies of these documents are available onli
15、ne at http:/ or from Agilent Technologies, Inc., 5301 Stevens Creek Blvd., Santa Clara CA 95051). INTERNATIONAL ELECTROTECHNICAL COMMISION (IEC) IEC 60068-2-58 - Test Methods for Solderability, Resistance to Dissolution of Metallization and to Soldering Heat of Surface Mounting Devices (SMD). IEC 60
16、068-2-21 - Robustness of Terminations and Integral Mounting Devices. (Copies of these documents are available online at http:/ or from Global Engineering Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood CO 80112-5776). 2.4 Order of precedence. Unless otherwise noted her
17、ein or in the contract, in the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by I
18、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11018 REV PAGE 4 TW B2 LB13. REQUIREMENTS 3.1 Item Requirements. The individual item requirements shall be as specified herein. These inductor
19、s shall be capable of meeting all stated electrical, environmental, and mechanical requirements. 3.2 Pure Tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin content of inductor components and solder shall not exceed 96 percent, by mass. Tin
20、shall be alloyed with a minimum of 4 percent lead or 4 percent silver, by mass (see 6.4). 3.3 Interface and Physical Dimensions. The interface and physical dimensions shall be as specified herein (see figure 1). NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general informat
21、ion only. FIGURE 1. Physical Dimensions and Configuration. 3.4 Electrical Characteristics. 3.4.1 Electrical Testing. When 100 percent electrically tested, the following conditions will apply: a. Inductance (L) (at +25C): Shall be as specified in 3.4.2. b. Quality Factor (Q) (at +25C): Shall be as sp
22、ecified in 3.4.3. c. Direct Current Resistance (Rdc) (at +25C): Shall be as specified in 3.4.4. Inches mm .0039 0.100 .0078 0.200 .0118 0.300 .0138 0.350 .0240 0.610 .0319 0.810 .0630 1.600 Dimensions L .0039 W .0039 T .0039 B1 +.0118 B2 .0078 .0630 .0319 .0240 .0000 .0138 Provided by IHSNot for Res
23、aleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11018 REV PAGE 5 3.4.2 Inductance (L). When tested on Agilent RF Impedance/Material Analyzer in accordance with Agilent Tecnologies Application Note 1369-6
24、, the Inductance shall be as shown in table IV within required tolerance as shown in table I. Test Frequency: 450 MHz 50MHz. 3.4.3 Quality Factor (Q). When tested on Agilent RF Impedance/Material Analyzer in accordance with Agilent Tecnologies Application Note 1369-6, the Quality Factor shall be as
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