CIE 44-1979 Absolute Methods for Reflection Measurement (1st Edition) (Reprint 1990) (E)《反射测量用绝对法(第1版)(1990年再版)(E)》.pdf

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1、CIE 44 79 R 9006145 00017b3 249 ISBN 92 9034 044 4 COMMISSION INTERNATIONALE DE LCLAIRAGE INTERNATIONAL COMMISSION ON ILLUMINATION INTERNATIONALE BELEUCHTUNGSKOMM ISSION ABSOLUTE METHODS FOR REFLECTION MEASUREMENT Pub. No. CIE44 1 st Edition 1979/Reprint 1990 UDC: 535.24 Photometry 535.36 Light scat

2、tering 535.65:006 Standardization of colour measurement COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesThis report has been approved by the majority of the Committee and is recommended for study and application. This report is not an Officially Agreed CIE

3、Recommendation approved by the National Committees of the Member Countries. It should be noted that any recommendations in this report are advisory and not mandatory. Ce rapport a reu lapprobation de la majorit du Comit, et il est recommand pour les tudes et applications. Ce rapport nest pas une Rec

4、ommandation officielle de la CIE approuve par les Comits Nationaux des Pays Membres. I1 doit tre not que toute recommandation y figurant est donne titre de conseil et non d obligation. Dieser Bericht entspricht der Mehrheit der Meinungen des Komitees und wird zum zuknftigen Studium empfohlen. Er ist

5、 keine Offiziell Anerkannte CIE-Empfehlung, die von den Nationalen Komitees der Mitgliedslander anerkannt wurde. Es muss darauf hingewiesen werden, dass alle Empfehlungen dieses Berichts nur als Anleitung dienen und nicht verbindlich sind. -1- COPYRIGHT International Commission on IlluminationLicens

6、ed by Information Handling Services CIE 44 79 E 900bL45 0001765 OLL Preface This technical report has been prepared by the CIE Technical Committee on Materials (TC-2.3), and was a part of the program of the TC-2.3 Subcommittee on Standards and Techniques under the chairmanship of W. Erb of PTB. The

7、prime author of the document was Dr. N. Ooba of the Electrotechnical Laboratory, Tanashi, Tokyo. The list of members who have been on the Committees roster during the period (1975-1979) are given below. Also listed, as consultants, are the members of the Subcommittee on Standards and Techniques who

8、collaborate with the chairman in the preparation of the report. It was not the intent of the Committee to compare various known methods of absolute reflectance measurement or to make a recommendatibn as to which method is preferred over the other. Such a recommendation would require extensive additi

9、onal experimental work that could not be carried out at this time. The aim of the Committee was to describe the available methods known to the Committee and this is the best the Committee could do at this time . Members of TC-2.3 Australia Austria Be 1 g ium Bulgaria Canada Czechos lavakia Denmark E

10、ng 1 and F in i an d France Germany Hungary Isr ae 1 Japan Nether 1 ands Norway Poland Por tug al Ruman i a Russia South Africa Spain Sweden Switaer land United States United States Members of Subcommittee on Standards and Techniques and Consultants J.E. Shaw H. Reiter W. Erb (Germany) - Chairman P.

11、 Massart M. Artom (Italy) V. Stefanova F.W. Billmeyer (USA) if. Budde W. Budde (Canada) J. Zetek F.J.J. Clarke (UK) Jens Gudum L. Fillinger (Hungary) F.J.J. Clarke H. Hammond (USA) T. Timonen H, Hemmendinger (USA) E. Barthes J. Krochmann (Germany) J. Krochmann R.D. oaano (Argentina) L. Fillinger L.

12、Morren (Belgium) H.L. Cahn Y. Mishima (Japan Gorow Baba M. Nonaka (Japan) F. Burghout S. Nndel (Germany) A. Augdal N. Ooba (Japan) M. Nowak H. Reiter (Austria) Joaquim Conceicao A. Reule (Germany) A. Pascale C.L. Sanders (Canada) Mme L. Dolgopolova J. Schanda (Hungary) I. Boyd R. Sve (France) A. Cru

13、z . W. Stanioch (Poland) Ake Stenius A. Stenius (Sweden) D. Eitle H. Terstiege (Germany) F. Grum (chairman) W.H. Venable (USA) M. Pearson (Secretary) Mateus A.R. Robertson (Canada) -2- COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesCIE 44 79 9006345 000L7b

14、b T58 ABSOLUTE METHODS FOR REFLECTION MEASUREMENTS Summary Measurements of reflectance or reflectance factor are made by comparison to appropriately chosen reference standards. In 1969 the CIE recommended that the perfect reflecting diffuser be taken as the ideal standard. As there is no existing ma

15、terial which corresponds to the perfect diffuser, the problem is one of transforming measurements made with reference to real physical standards to those of absolute values relative to the perfect reflecting diffuser. The main interest of this report is the theory and procedures by which this conver

16、sion is made rather than the properties of the materials, the measuring instruments or the preparation of the samples For this information the reader is requested to refer to the original papers . The material has been classified into principles of measurement rather than quantities to be determined

17、. These classifications are: Goriophotometric methods, Methods used in hemispherical irradiators, Methods using hemispherical or spheroidal mirrors, Methods using Kubelka-Munk theory, Methods based on the theory of integrating sphere. The methods based on the theory of integrating sphere include: th

18、e two Taylors methods, the Benford method, the Sharp-Little method, and the Double sphere method. By compiling this information under a single cover, the practitioners of this type of measurement have thus an access to a ready reference on this complex subject. METHODES ABSOLUES DE MESURES DE LA REF

19、LEXION Rsum Les mesures de facteur de rflexion et de facteur de rflectance sont faites par comparaison avec des matriaux de rfrence convenablement choisis. En 1969, la CIE recommanda que le diffuseur parfait par rfle- xion soit pris comme rfrence idale. Puisquil nexiste pas de matriau qui correspond

20、e au diffuseur parfait, le problme est celui de la transformation des mesures faites par rf- rence un talon physique rel, en mesures relatives au diffuseur parfait par rflexion. Lintr6-t principal de ce rapport est relatif la thorie et aux mthodes par lesquelles cette conversion est faite, plutt qua

21、ux proprits des matriaux, aux instruments de mesure ou ia prparation des chantillons. En ce qui concerne ces derniers sujets le lecteur est pri de se rfrer aux publications originales. -3- COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesCIE 44 79 9006345 O0

22、01767 994 Le sujet a 6th subdivis selon les principes de mesure, plutt que selon les grandeurs qui sont dtermines. Ces subdivisi,ons sont: Mthodes goniophotomtriques, Mthodes employant des diffuseurs hmisphriques, Mthodes utilisant des miroirs sphriques ou sphroldaux, Mthodes fondes sur la thorie de

23、 Kubelka et Munk, Mthodes fondes sur la thorie des sphres dintgration. Les mthodes fondes sur la thorie des sphres dt intgration comprennent: les deux mthodes de Taylor, la mthode de Benford, la mthode Sharp- Little et la mthode de la double sphre. En runissant cette information dans un mme document

24、, les utilisateurs de ce type de mesures auront ainsi accs 5 une rfrence commode sur ce sujet complexe. ABSOLUTE REFLEXIONS-MESSMETHODEN Zusammenfassung Bei Messungen des Ref lexionsgrades oder des Ref lexionsfaktors wird in der Praxis auf ausgewhlte Reflexionsnormale bezogen. 1969 ha9 die CIE den v

25、ollkommen mattweissen Krper als ideales Normal empfohlen. Da es kein Material mit den Eigenschaften des vollkommen mattweissen Krpers gibt, stellt sich die Aufgabe, die relativ zu verfgbaren Normalen erhaltenen Messergebnisse auf Absolutewerte, d.h. auf den vollkommen mattweissen Krper zu beziehen.

26、Das Hauptaugenmerk dieses Berichtes richtet sich auf die Theorie und die Methoden,mit denen absolute Reflexions werte gemessen werden knnen; die Eigenschaften der Materialien, die Messgerte und die Herstellung der Normale werden nur am Rande erwhnt. Fr nhere Ausknfte sei der Leser auf die Originalar

27、beiten verwiesen. Der Bericht gliedert sich nach dem Prinzip der Messverfahren wie folgt: goni ophot orne tr is Che Me thoden, Methoden mit halbkugeligen Strahlern, Methoden mit halbkugeligen oder sphrischen Spiegeln, Methoden, die auf der Kubelka-Munk Theorie beruhen. Methoden, die auf der Theorie

28、integrierender Kugeln aufbauen: Taylorsche Methoden, Benfordsche Methode, Sharp-Little Methode und Doppelkugelmethode. Durch die Zusammenstellung der Wirkungsweise der einzelnen Methoden in einem Bericht Erhlt der auf diesem Gebiet arbeitende Praktiker einen Zugang zu einer geschlossenen Ubersicht b

29、er ein komplexes Thema. -4- COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesCIE 44 79 9006145 0003768 820 D 1. 2. 3. 4. 5- 6. 7. 7. 1 7-2 7.3 7.4 7-5 8. TABLE OF CONTENTS Page In tr odu c t i on Terminology Gon i oph ot orne tr i c Methods Methods Using Hem

30、ispherical Irradiators Methods Using Spherical or Spheroidal Mirrors Methods Based on the Kubelka-Munk Theory Methods Based on the Theory of Integrating Sphere Taylors Method (1) Taylors Method (2) Benfords Method Sharp-Little Method Double Sphere Method Summarizing Remarks References 6 a 10 19 22 2

31、6 31 32 37 39 41 44 45 51 -5- COPYRIGHT International Commission on IlluminationLicensed by Information Handling Services CIE YY 79 II 9006345 0003769 767 1. Introduction Measurements of diffusely reflecting characteristics of materials are of great importance as the basic measurements of illuminati

32、ng engineering, and have become more and more requisite for many other fields of science, technology and industry that are concerned not only with human vision but also with various effects of every wavelength region of optical radiation on sub- stances. In general, measurements of such characterist

33、ics as reflectance or radiance factor are made by means of reflectometers in comparison with those of reference standards appropriately chosen. In connection with this, CIE recommended in 19311 that, in colorimetric measurements of opaque materials, smoked magnesium oxide was to be taken as the refe

34、rence standard, but this is superseded by an ideal standard, i.e. the perfect reflecting diffuser since 1969.* In fact, there is no existing material corresponding to the perfect diffuser with sufficient approximation, so that the characteristics of the reference standards must be measured in absolu

35、te scale in order to correct the measured values of the sample to be tested when a high accuracy is required. The purpose of this report is to survey the methods that are used for measuring the absolute* reflection values of such reference standards, by outlining the papers which have so far been pu

36、blished on this subject. ;Measurements that relate the reflection values of a material to that of the perfect reflecting diffuser are often called “absolute“ measurements. -6- COPYRIGHT International Commission on IlluminationLicensed by Information Handling Services CIE 44 79 9006145 0001770 489 M

37、The characteristic under investigation is expressed as the ratio of the reflected radiant flux from the sample to be measured and the flux incident on it, but generally direct measurements of these two fluxes are not practicable. Therefore the relation is converted into a new relation between quanti

38、ties which are practi- cally measurable with a accuracy required. The main interests are then directed in this report to the theory and procedure in which the above conversion is made, and accordingly descriptions on other subjects such as the preparations or the properties of the samples and such a

39、s measuring instruments are mostly omitted. The reader who wants to study these subjects and the details of principles as well is requested to refer to the original papers. As regards the properties and the preparations of reference standards, several references are added to the reference list. For

40、the purpose of surveying the methods, it will be more convenient to classify them according to the principles of measure- ments rather than to classify according to the quantities to be determined, because a group of different quantities is sometimes measured on the basis of the same principle. Ther

41、efore, in this report the following classification is made: -Goniphotometric methods -Methods using hemispherical irradiators -Methods using hemispherical or spheroidal mirrors -Methods based on Kubelka-Munk theory -Methods based on the theory of integrating sphere. COPYRIGHT International Commissio

42、n on IlluminationLicensed by Information Handling ServicesThe formulas presented in this report are those given by the authors quoted. For reasons of consistency, however, changes were sometimes made in terminology and in the use of symbols. It is a matter of course that the reported theories are of

43、ten contro- versial because they are based on assumptions and approximations. It was not the aim of this report to make refined studies on the theories but relate on them only as far as to seem necessary to understand the experimental procedures. None of the formulas or methods are warranted by CIE.

44、 2. Terminology In principle the terminology in this report refers to the CIE Vocabulary published in 1970.3 Some additional remarks are as follows: (i) Radiant and luminous quantities are used inter- changeably hereinafter; papers published in early dates are often concerned only with luminous quan

45、tities, so that terms such as luminous flux or luminance factor are used here for these papers, whereas recent papers are mostly concerned with spectral quantities, sometimes including W or IR regions, for which terms such as radiant flux or radiance factor are suitably used. Luminous quantities dif

46、fer from radiant quantities only in the respect that they are to be measured with detectors equivalent to the CIE standard photometric observer, and this difference is not essential as far as this report is concerned. (2) The term reflectance factor is defined as the ratio of the radiant flux reflec

47、ted in the directions delimited by a given cone with apex at a point of the surface under test to that reflected in the same directions by a perfect reflecting diffuser -8- COPYRIGHT International Commission on IlluminationLicensed by Information Handling Servicesidentically irradiated. If the solid

48、 angle of the cone approaches zero, or 2n sr, the reflectance factor approaches radiance factor, or reflectance, respectively. In the strict sense, values measured with actual instruments are to be expressed as reflectance factor together with the indication of the cone, but in general, the term rad

49、iance factor or reflectance is used for simplicity, hence in this report. However, it should be noted that these terms must be used after due consideration for the deviations of actual geometry used in the measurement from the ideal geometry. (3) The “perfect (reflecting) diffuser“ is the ideal uniform diffuser with a reflectance equal to 1. from the uniform diffuser which has only the same radiance in all directions. (4) on the geometry of irradiation and mea