BS IEC 62529-2012 IEEE standard for signal and test definition《有关信号和测试定义的IEEE标准》.pdf

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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationIEEE standard for signal and test definitionBS IEC 62529:2012National forewordThis British Standard is the UK implementation of IEC 62529:2012. It super-sedes BS IEC 62529:2007 w

2、hich is withdrawn.The UK participation in its preparation was entrusted to Technical CommitteeGEL/93, Design automation.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontr

3、act. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 77675 5ICS 25.040.01; 35.060Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under th

4、e authority of the StandardsPolicy and Strategy Committee on 31 August 2012.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS IEC 62529:2012IEC 62529Edition 2.0 2012-06INTERNATIONAL STANDARD Standard for Signal and Test Definition INTERNATIONAL ELECTROTECHNICAL COMMISS

5、ION XMICS 25.040; 35.060 PRICE CODEISBN 978-2-83220-103-9Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1641colourinsideBS IEC 62529:2012IEC 62529:2012 ii IEEE Std 1641-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Cont

6、ents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Application 1 1.4 Annexes . 2 2. Definitions, abbreviations, and acronyms. 2 2.1 Definitions . 2 2.2 Abbreviations and acronyms . 4 3. Structure of this standard 5 3.1 Layers 5 3.2 Signal Modeling Language (SML) layer . 6 3.3 BSC layer . 6 3.4 TSF l

7、ayer . 6 3.5 Test requirement layer . 6 3.6 Using the layers . 7 4. Signals and SignalFunctions . 7 4.1 Introduction . 7 4.2 Physical signal states . 8 4.3 Event states 9 4.4 Digital stream states . 9 5. SML layer . 10 6. BSC layer . 11 6.1 BSC layer base classes . 11 6.2 General description of BSCs

8、 11 6.3 SignalFunction template 12 7. TSF layer 12 7.1 TSF classes 13 7.2 TSF signals defined by a model . 13 7.3 TSF signals defined by an external reference 16 8. Test procedure language (TPL) 16 8.1 Goals of the TPL 16 8.2 Elements of the TPL 16 8.3 Use of the TPL . 17 9. Maximizing test platform

9、 independence. 17 Annex A (normative) Signal modeling language (SML) . 18 A.1 Use of the SML . 18 A.2 Introduction. 18 A.3 Physical types . 19 A.4 Signal definitions 22 A.5 Pure signals . 24 A.6 Pure signal-combining mechanisms 26 A.7 Pure function transformations . 32 BS IEC 62529:2012IEC 62529:201

10、2 IEEE Std 1641-2010 iii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. A.8 Measuring, limiting, and sampling signals . 32 A.9 Digital signals . 34 A.10 Basic component SML 38 A.11 Fast Fourier analysis support 63 Annex B (normative) Basic signal components (BSC) layer . 6

11、5 B.1 BSC layer base classes 65 B.2 BSC subclasses . 65 B.3 Description of a BSC 69 B.4 Physical class 76 B.5 PulseDefns class 87 B.6 SignalFunction class . 89 Annex C (normative) Dynamic signal descriptions 143 C.1 Introduction . 143 C.2 Basic classes 144 C.3 Dynamic signal goals and use cases 152

12、Annex D (normative) Interface definition language (IDL) basic components . 153 D.1 Introduction. 153 D.2 IDL BSC library . 153 Annex E (informative) Test signal framework (TSF) for C/ATLAS . 154 E.1 Introduction . 154 E.2 TSF library definition in extensible markup language (XML) 154 E.3 Interface d

13、efinition language (IDL) for the TSF for C/ATLAS 154 E.4 AC_SIGNAL . 155 E.5 AM_SIGNAL 157 E.6 DC_SIGNAL . 159 E.7 DIGITAL_PARALLEL 161 E.8 DIGITAL_SERIAL . 163 E.9 DIGITAL_TEST . 165 E.10 DME_INTERROGATION . 168 E.11 DME_RESPONSE 171 E.12 FM_SIGNAL . 174 E.13 ILS_GLIDE_SLOPE 177 E.14 ILS_LOCALIZER

14、180 E.15 ILS_MARKER 183 E.16 PM_SIGNAL 186 E.17 PULSED_AC_SIGNAL 188 E.18 PULSED_AC_TRAIN . 190 E.19 PULSED_DC_SIGNAL 192 E.20 PULSED_DC_TRAIN . 194 E.21 RADAR_RX_SIGNAL . 196 E.22 RADAR_TX_SIGNAL 199 E.23 RAMP_SIGNAL . 200 E.24 RANDOM_NOISE . 202 E.25 RESOLVER 204 E.26 RS_232 207 E.27 SQUARE_WAVE .

15、 208 E.28 SSR_INTERROGATION 210 E.29 SSR_RESPONSE 213 E.30 STEP_SIGNAL . 217 E.31 SUP_CAR_SIGNAL . 219 E.32 SYNCHRO 221 E.33 TACAN . 225 BS IEC 62529:2012IEC 62529:2012 iv IEEE Std 1641-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. E.34 TRIANGULAR_WAVE_SIGNAL . 229 E

16、.35 VOR 231 Annex F (informative) Test signal framework (TSF) library for digital pulse classes . 235 F.1 Introduction . 235 F.2 TSF library definition in extensible markup language (XML) 235 F.3 Graphical models of TSFs . 235 F.4 Pulse class family of TSFs 235 F.5 DTIF 252 Annex G (normative) Carri

17、er language requirements 254 G.1 Carrier language requirements 254 G.2 Interface definition language (IDL) 254 G.3 Datatypes 254 G.4 Data-processing requirements . 259 G.5 Control structures 263 Annex H (normative) Test procedure language (TPL) . 265 H.1 TPL layer 265 H.2 Elements of the TPL . 265 H

18、.3 Structure of test requirements . 265 H.4 Carrier language 265 H.5 Signal statements 265 H.6 Mapping of test statements to carrier language . 267 H.7 Test statement definitions . 267 H.8 Elements used in test statement definitions 285 H.9 Attributes with multiple properties . 288 H.10 Transferring

19、 data in digital signals 292 H.11 Creating test requirements 296 H.12 Delimiting TPL statements . 298 Annex I (normative) Extensible markup language (XML) signal descriptions 300 I.1 Introduction 300 I.2 XSD for BSCs 301 I.3 XSD for TSFs . 302 Annex J (informative) Support for ATLAS nouns and modifi

20、ers 308 J.1 Signal and test definition (STD) support for ATLAS signals 308 J.2 STD support for ATLAS nouns . 308 J.3 STD support for C/ATLAS noun modifiers . 311 J.4 Support for C/ATLAS extensions 319 Annex K (informative) Guide for maximizing test platform independence and test application intercha

21、ngeability . 320 K.1 Introduction. 320 K.2 Guiding principles. 320 K.3 Best practice rules . 320 Annex L (informative) Bibliography 323 Annex M (informative) IEEE List of Participants . 325 BS IEC 62529:2012IEC 62529:2012 IEEE Std 1641-2010 v Published by IEC under license from IEEE. 2010 IEEE. All

22、rights reserved. Standard for Signal and Test Definition FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-ope

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40、om IEEE. 2010 IEEE. All rights reserved. International Standard IEC 62529 / IEEE Std 1641-2010 has been processed through IEC technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement. This second edition cancels and replaces the first edition, published in 2007, and constitu

41、tes a technical revision. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting IEEE Std 1641-2010 93/322/FDIS 93/329/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IE

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43、nfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a

44、 colour printer. BS IEC 62529:2012IEC 62529:2012 IEEE Std 1641-2010 vii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. IEEE Std 1641-2010 (Revision of IEEE Std 1641-2004) IEEE Standard for Signal and Test Definition Sponsor IEEE Standards Coordinating Committee 20 on Test

45、and Diagnosis for Electronic Systems Approved 17 June 2010 IEEE-SA Standards Board BS IEC 62529:2012IEC 62529:2012 viii IEEE Std 1641-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Abstract: This standard provides the means to define and describe signals used in testi

46、ng. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. Keywords: ATE, ATLAS, automatic test equipment, IEEE 1641, signal definitions, test definitions, test requiremen

47、ts, test signals, unit under test, UUT IEEE is a registered trademark in the U.S. Patent most signals encountered in this standard have the reference type Time. Therefore, a Sinusoidal Voltage signal describes how the signals voltage changes with respect to time, in a sinusoidal manner. The use of t

48、ypes is such that SignalFunctions can be combined to build signals only when they have compatible types such as when one or more of the types are typeless, abstract, or generic or where the different signal types can be provided independently. Types that appear different and that represent a transfo

49、rm are allowed, as they represent a different method of specifying the same signal, e.g., Sinusoid (Voltage, Frequency) with Sinusoid (Voltage, Time). An example of an illegal signal definition is one in which both current and voltage are specified because both cannot be controlled independently. Extendibility is served by providing the capability to describe new signals formally by creating them from the existing signals in either the TSF or BSC layer. SignalFunctions are described in detail in Annex B. NOTETh