BS EN 62149-8-2014 Fibre optic active components and devices Performance standards Seeded reflective semiconductor optical amplifier devices《纤维光学有源元件和器件 性能标准 晶种反射半导体光学放大器设备》.pdf

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1、BSI Standards PublicationFibre optic active components and devices Performance standardsPart 8: Seeded reflective semiconductor optical amplifier devicesBS EN 62149-8:2014National forewordThis British Standard is the UK implementation of EN 62149-8:2014. It isidentical to IEC 62149-8:2014.The UK par

2、ticipation in its preparation was entrusted by TechnicalCommittee GEL/86, Fibre optics, to Subcommittee GEL/86/3, Fibre optic systems and active devices.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all t

3、he necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 81896 7ICS 33.180.20Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Stand

4、ard was published under the authority of theStandards Policy and Strategy Committee on 31 July 2014.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62149-8:2014EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62149-8 June 2014 ICS 33.180.20 English Version F

5、ibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices (IEC 62149-8:2014) Composants et dispositifs actifs fibres optiques - Normes de performances - Partie 8: Dispositifs amplificateurs optiques semiconducteurs rflchissan

6、ts rpartis (CEI 62149-8:2014) Aktive Lichtwellenleiterbauelemente und -gerte - Betriebsverhalten - Teil 8: Injizierte reflektierende optische Halbleiterverstrker (IEC 62149-8:2014) This European Standard was approved by CENELEC on 2014-05-29. CENELEC members are bound to comply with the CEN/CENELEC

7、Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to

8、 any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the

9、 official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembo

10、urg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-

11、CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62149-8:2014 E BS EN 62149-8:2014EN 62149-8:2014 - 2 - Foreword The text of document 86C/1144/CDV, future edition 1 of

12、 IEC 62149-8, prepared by SC 86C, “Fibre optic systems and active devices“, of IEC TC 86, “Fibre optics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62149-8:2014. The following dates are fixed: latest date by which the document has to be implemented at national level

13、 by publication of an identical national standard or by endorsement (dop) 2015-02-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2017-05-29 Attention is drawn to the possibility that some of the elements of this document may be the subject of

14、patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62149-8:2014 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography

15、, the following note has to be added for the standard indicated: IEC 60191 (all parts) NOTE Harmonized as EN 60191 (all parts). IEC 60747-5-1 NOTE Harmonized as EN 60747-5-1. IEC 60749 (all parts) NOTE Harmonized as EN 60749 (all parts). IEC 60825 (all parts) NOTE Harmonized as EN 60825 (all parts).

16、 IEC 60874 (all parts) NOTE Harmonized as EN 60874 (all parts). IEC 61290-1-3 NOTE Harmonized as EN 61290-1-3. IEC 62007-1 NOTE Harmonized as EN 62007-1. IEC 62007-2 NOTE Harmonized as EN 62007-2. IEC 62148-1 NOTE Harmonized as EN 62148-1. IEC 62149-1 NOTE Harmonized as EN 62149-1. BS EN 62149-8:201

17、4- 3 - EN 62149-8:2014 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, onl

18、y the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on

19、the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu Publication Year Title EN/HD Year IEC 60749-6 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature EN 60749-6 - IEC 60749-7 - Semiconductor devices - M

20、echanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases EN 60749-7 - IEC 60749-10 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock EN 60749-10 - IEC 60749-11 - Semiconductor devices - Mecha

21、nical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method EN 60749-11 - IEC 60749-12 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency EN 60749-12 - IEC 60749-25 - Semiconductor devices - Mechanical and climat

22、ic test methods - Part 25: Temperature cycling EN 60749-25 - IEC 60749-26 - Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) EN 60749-26 - IEC 60825-1 - Safety of laser products - Part 1: Equipment clas

23、sification and requirements EN 60825-1 - IEC 60950-1 - Information technology equipment - Safety - Part 1: General requirements EN 60950-1 - IEC 61300-2-4 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention EN

24、 61300-2-4 - BS EN 62149-8:2014EN 62149-8:2014 - 4 - Publication Year Title EN/HD Year IEC 61300-2-19 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) EN 61300-2-19 - IEC 61300-2-48 - Fibre optic interc

25、onnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling EN 61300-2-48 - IEC Guide 107 - Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications - - BS EN 62149-8:2014 2 IEC 62149-8:

26、2014 IEC 2014 CONTENTS INTRODUCTION . 5 1 Scope 6 2 Normative references 6 3 Terms, definitions, symbols and abbreviations . 7 3.1 Terms and definitions 7 3.2 Symbols and abbreviations . 7 4 Product parameters . 8 4.1 Absolute limiting ratings 8 4.2 Operating environment 8 4.3 Functional specificati

27、on. 8 5 Testing 8 5.1 General . 8 5.2 Characterization testing 8 5.3 Performance testing 9 6 Environmental specifications . 9 6.1 General safety 9 6.2 Laser safety 9 6.3 Electromagnetic compatibility (EMC) requirements 9 Annex A (normative) Specifications for seeded RSOA devices . 10 A.1 Absolute li

28、miting ratings 10 A.2 Operating environment 10 A.3 Functional specification. 10 A.4 Testing . 11 A.4.1 Characterization testing . 11 A.4.2 Performance testing. 11 Bibliography 14 Figure 1 Seeded DWDM transmission based on RSOA devices . 5 Table 1 Operating environment 8 Tableau A.1 Absolute limiting

29、 ratings . 10 Tableau A.2 Operating conditions for functional specification . 10 Tableau A.3 Functional specification 11 Tableau A.4 Performance test plan 12 Tableau A.5 Recommended performance test failure criteria 13 BS EN 62149-8:2014IEC 62149-8:2014 IEC 2014 5 INTRODUCTION Fibre optic laser devi

30、ces are used to convert electrical signals into optical signals. This part of IEC 62149 covers the performance specification for seeded reflective semiconductor optical amplifier (RSOA) devices in fibre optic telecommunication and optical data transmission applications.The optical performance criter

31、ia are generally well specified for a number of internationally agreed applications areas such as ITU-T Recommendation G.698.3. This standard aims to provide optical interface specifications towards the realization of transversely compatible seeded dense wavelength division multiplexing (DWDM) syste

32、ms. In the seeded DWDM system, seed light sources are used to generate broadband seed lights in C-band or L-band. After passing through DWDM DeMUXs in the link, the broadband seed lights are spectrum sliced according to the transmission characteristics of DWDM DeMUXs. Each spectrum sliced seed light

33、 is injected into a RSOA transmitter based on a RSOA device. Consequently, an output signal wavelength of a RSOA transmitter can be determined by a wavelength of an injected seed light. Figure 1 Seeded DWDM transmission based on RSOA devices Seeded RSOA devices for seeded DWDM systems are supplied b

34、y different manufacturers, but do not guarantee operation of seeded RSOA devices. Manufacturers using the standards are responsible for meeting the required performance and/or reliability and quality assurance under a recognized scheme. IEC 1194/14 11NN11NN1 N1 NBS EN 62149-8:2014 6 IEC 62149-8:2014

35、 IEC 2014 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES PERFORMANCE STANDARDS Part 8: Seeded reflective semiconductor optical amplifier devices 1 Scope This part of IEC 62149 covers the performance specification for seeded reflective semiconductor optical amplifier (RSOA) devices used for fibre optic te

36、lecommunication and optical data transmission applications. The performance standard contains a definition of the product performance requirements together with a series of sets of tests and measurements with clearly defined conditions, severities, and pass/fail criteria. The tests are intended to b

37、e run on a “once-off” basis to prove any products ability to satisfy the performance standards requirements. A product that has been shown to meet all the requirements of a performance standard can be declared as complying with the performance standard, but should then be controlled by a quality ass

38、urance/quality conformance program. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the refe

39、renced document (including any amendments) applies. IEC 60749-6, Semiconductor devices Mechanical and climatic test methods Part 6: Storage at high temperature IEC 60749-7, Semiconductor devices Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of ot

40、her residual gases IEC 60749-10, Semiconductor devices Mechanical and climatic test methods Part 10: Mechanical shock IEC 60749-11, Semiconductor devices Mechanical and climatic test methods Part 11: Rapid change of temperature Two-fluid-bath method IEC 60749-12, Semiconductor devices Mechanical and

41、 climatic test methods Part 12: Vibration, variable frequency IEC 60749-25, Semiconductor devices Mechanical and climatic test methods Part 25: Temperature cycling IEC 60749-26, Semiconductor devices Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing Huma

42、n body model (HBM) IEC 60825-1, Safety of laser products Part 1: Equipment classification and requirements IEC 60950-1, Information technology equipment Safety Part 1: General requirements BS EN 62149-8:2014IEC 62149-8:2014 IEC 2014 7 IEC 61300-2-4, Fibre optic interconnecting devices and passive co

43、mponents Basic test and measurement procedures Part 2-4: Tests Fibre/cable retention IEC 61300-2-19, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-19: Tests Damp heat (steady state) IEC 61300-2-48, Fibre optic interconnecting devices and pass

44、ive components Basic test and measurement procedures Part 2-48: Tests Temperature-humidity cycling IEC Guide 107, Electromagnetic compatibility Guide to the drafting of electromagnetic compatibility publications 3 Terms, definitions, symbols and abbreviations For the purposes of this document, the f

45、ollowing terms, definitions, symbols and abbreviations apply. NOTE Terminology concerning physical concepts, types of devices, general terms, and those related to ratings and characteristics of semiconductor devices can be found in IEC 60747-5-1. In addition, definitions for essential ratings and ch

46、aracteristics of semiconductor optoelectronic devices for fibre optic system applications can be found in IEC 62007-1. 3.1 Terms and definitions The following terms are defined for the specific characteristics of RSOA devices 3.1.1 central wavelength central wavelength of the seeded RSOA device when

47、 it is operated at the normal operating conditions which is specified in the sectional specification of the seeded RSOA devices 3.1.2 modulation speed digital modulation speed with an optimum modulation amplitude between the operating current and threshold current level 3.1.3 seed light light used t

48、o determine output wavelength of RSOA device 3.1.4 submount substrate upon which a RSOA is mounted for assembly into further packaging 3.2 Symbols and abbreviations Ms modulation speed ce central wavelength Ps seed light power Po optical output power R reflectance Ith threshold current Vth threshold

49、 voltage slope efficiency (at Iopin a TOSA and pigtailed package) PO continuous laser output power (at Iopin a TOSA and pigtailed package) BS EN 62149-8:2014 8 IEC 62149-8:2014 IEC 2014 T TEC capability ITEC TEC current VTEC TEC voltage Rthermthermistor Im monitor current ImR0 dark current Ctotcapacitance Abbreviation Term DWDM dense wavelength division multiplexing PDG Polarization depend