BS EN 15305-2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction《无损检验 使用X射线衍射分析剩余应力的试验方法》.pdf

《BS EN 15305-2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction《无损检验 使用X射线衍射分析剩余应力的试验方法》.pdf》由会员分享，可在线阅读，更多相关《BS EN 15305-2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction《无损检验 使用X射线衍射分析剩余应力的试验方法》.pdf（88页珍藏版）》请在麦多课文档分享上搜索。

1、g5g9g3g35g12g3g36g37g38g39g37g40g41g39g39g42g5g6g7g3g8g9g10g8g11g11g12g13g3g6g13g14g15g5g12g16g3g17g5g18g19g13g20g18g3g21g7g5g3g14g22g23g24g5g7g7g5g13g12g3g22g25g6g22g14g18g3g26g7g3g14g22g23g24g5g18g18g22g27g3g21g15g3g6g13g14g15g23g5g16g19g18g3g28g26g17g5g6g7g8g7g9g10g3g9g8g11g12g13g11g6g13g12g14g15

2、g4g16g17g18g19g20g21g22g19g23g24g17g8g17g18g19g23g15g25g3g26g3g8g17g18g19g3g27g17g19g28g14g16g29g14g20g3g6g17g18g23g16g21g30g31g3g9g19g20g17g18g18g30g15g30g31g32g18g23g18g3g33g32g3g34g4g20g30g32g13g23g29g29g20g30g22g19g23g14g15Incorporating corrigendum January 2009This British Standardwas published

3、under the authority of theStandards Policy andStrategy Committee on 30September 2008 BSI 2009ISBN 978 0 580 66870 8Amendments/corrigenda issued since publicationDate CommentsBS EN 15305:2008National forewordThis British Standard is the UK implementation of EN 15305:2008,The UK participation in its p

4、reparation was entrusted to TechnicalCommittee WEE/46, Non-destructive testing.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisionsof a contract. Users are responsible for its correc

5、t application.Compliance with a British Standard cannot confer immunityfrom legal obligations.incorporating corrigendum January 2009.30 June 2009 Implementation of CEN corrigendumJanuary 2009. Modification of the fourthparagraph of the CEN Foreword.EUROPEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN 1

6、5305August 2008ICS 19.100English VersionNon-destructive Testing - Test Method for Residual Stressanalysis by X-ray DiffractionEssais non-destructifs - Mthode dessai pour lanalyse descontraintes rsiduelles par diffraction des rayons XZerstrungsfreie Prfung - RntgendiffraktometrischesPrfverfahren zur

7、Ermittlung der EigenspannungenThis European Standard was approved by CEN on 4 July 2008.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists

8、 and bibliographical references concerning such nationalstandards may be obtained on application to the CEN Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsi

9、bility of a CEN member into its own language and notified to the CEN Management Centre has the same status as theofficial versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland,France, Germany, Greece, Hungary, Iceland,

10、 Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMIT EUROPEN DE NORMALISATIONEUROPISCHES KOMITEE FR NORMUNGManagement Centre: rue de Stassart

11、, 36 B-1050 Brussels 2008 CEN All rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 15305:2008: EIncorporating corrigendum January 2009BS EN 15305:2008EN 15305:2008 (E) 2 Contents Page Foreword5 Introduction .6 1 Scope 7 2 Normative references

12、 7 3 Terms, definitions and symbols.8 3.1 Terms and definitions .8 3.2 Symbols and abbreviations 8 4 Principles10 4.1 General principles of the measurement 10 4.2 Biaxial stress analysis 12 4.3 Triaxial stress analysis .13 5 Specimen 14 5.1 Material characteristics.14 5.1.1 General14 5.1.2 Shape, di

13、mensions and weight 15 5.1.3 Specimen composition/homogeneity15 5.1.4 Grain size and diffracting domains16 5.1.5 Specimen X-ray transparency 16 5.1.6 Coatings and thin layers .16 5.2 Preparation of specimen.17 5.2.1 Surface preparation.17 5.2.2 Stress depth profiling17 5.2.3 Large specimen or comple

14、x geometry17 6 Equipment 17 6.1 General17 6.2 Choice of equipment .18 6.2.1 General18 6.2.2 The -method.19 6.2.3 The -method .20 6.2.4 The modified -method .21 6.2.5 Other geometries .21 6.3 Choice of radiation 21 6.4 Choice of the detector.23 6.5 Performance of the equipment.24 6.5.1 Alignment .24

15、6.5.2 Performance of the goniometer .24 6.6 Qualification and verification of the equipment .24 6.6.1 General24 6.6.2 Qualification .24 6.6.3 Verification of the performance of the qualified equipment .26 7 Experimental Method 27 7.1 General27 7.2 Specimen positioning .27 7.3 Diffraction conditions2

16、8 7.4 Data collection .29 8 Treatment of the data 30 8.1 General30 8.2 Treatment of the diffraction data30 8.2.1 General30 BS EN 15305:2008EN 15305:2008 (E) 3 8.2.2 Intensity corrections .30 8.2.3 Determination of the diffraction line position.31 8.2.4 Correction on the diffraction line position32 8

17、.3 Stress calculation32 8.3.1 Calculation of strains and stresses.32 8.3.2 Errors and uncertainties 16, 17 .33 8.4 Critical assessment of the results .34 8.4.1 General .34 8.4.2 Visual inspection.34 8.4.3 Quantitative inspection.34 9 Report .35 10 Experimental determination of XECs 36 10.1 Introduct

18、ion36 10.2 Loading device 37 10.3 Specimen37 10.4 Loading device calibration and specimen accommodation .38 10.5 Diffractometer measurements .38 10.6 Calculation of XECs 38 11 Reference specimens39 11.1 Introduction39 11.2 Stress-free reference specimen.39 11.2.1 General .39 11.2.2 Preparation of th

19、e stress-free specimen.39 11.2.3 Method of measurement.40 11.3 Stress-reference specimen 40 11.3.1 Laboratory qualified (LQ) stress-reference specimen.40 11.3.2 Inter-laboratory qualified (ILQ) stress-reference specimen41 12 Limiting cases41 12.1 Introduction41 12.2 Presence of a subsurface stress g

20、radient42 12.3 Surface stress gradient.42 12.4 Surface roughness42 12.5 Non-flat surfaces .42 12.6 Effects of specimen microstructure 43 12.6.1 Textured materials.43 12.6.2 Multiphase materials.43 12.7 Broad diffraction lines 44 Annex A (informative) Schematic representation of the European XRPD Sta

21、ndardisation Project 46 Annex B (informative) Sources of Residual Stress .47 B.1 General .47 B.2 Mechanical processes 47 B.3 Thermal processes47 B.4 Chemical processes47 Annex C (normative) Determination of the stress state - General Procedure48 C.1 General .48 C.2 Using the exact definition of the

22、deformation49 C.2.1 General .49 C.2.2 Determination of the stress tensor components .49 C.2.3 Determination of and d0.50 C.3 Using an approximation of the definition of the deformation.50 C.3.1 General .50 C.3.2 Determination of the stress tensor components .51 C.3.3 Determination of 0 and d051 Anne

23、x D (informative) Recent developments.52 D.1 Stress measurement using two-dimensional diffraction data52 D.2 Depth resolved evaluation of near surface residual stress - The Scattering Vector Method54 BS EN 15305:2008EN 15305:2008 (E) 4 D.3 Accuracy improvement through the use of equilibrium conditio

24、ns for determination of stress profile 55 Annex E (informative) Details of treatment of the measured data .56 E.1 Intensity correction on the scan 56 E.1.1 General56 E.1.2 Divergence slit conversion.56 E.1.3 Absorption correction .57 E.1.4 Background correction .58 E.1.5 Lorentz-polarisation correct

25、ion58 E.1.6 K-Alpha2 stripping.59 E.2 Diffraction line position determination59 E.2.1 Centre of Gravity methods59 E.2.2 Parabola Fit 60 E.2.3 Profile Function Fit 60 E.2.4 Middle of width at x% height method 61 E.2.5 Cross-correlation method.61 E.3 Correction on the diffraction line position61 E.3.1

26、 General61 E.3.2 Remaining misalignments 61 E.3.3 Transparency correction.62 Annex F (informative) General description of acquisition methods 64 F.1 Introduction64 F.2 Definitions 64 F.3 Description of the various acquisition methods 67 F.3.1 General method67 F.3.2 Omega () method.68 F.3.3 Chi () me

27、thod69 F.3.4 Combined tilt method (also called scattering vector method)71 F.3.5 Modified chi method73 F.3.6 Low incidence method 76 F.3.7 Modified omega method .77 F.3.8 Use of a 2D (area) detector .78 F.4 Choice of and angles .79 F.5 The stereographic projection .80 Annex G (informative) Normal St

28、ress Measurement Procedure“ and “Dedicated Stress Measurement Procedure.82 G.1 Introduction82 G.2 General82 G.2.1 Introduction82 G.2.2 Normal stress measurement procedure for a single specimen82 G.2.3 Dedicated Stress Measurement Procedure for very similar specimens82 Bibliography 84 BS EN 15305:200

29、8EN 15305:2008 (E) 5 Foreword This document (EN 15305:2008) has been prepared by Technical Committee CEN/TC 138 “Non-destructive testing”, the secretariat of which is held by AFNOR. This European Standard shall be given the status of a national standard, either by publication of an identical text or

30、 by endorsement, at the latest by February 2009, and conflicting national standards shall be withdrawn at the latest by February 2009. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsibl

31、e for identifying any or all such patent rights. In order to explain the relationship between the topics described in the different standards, a diagram illustrating typical operation involved in XRPD is given in Annex A. According to the CEN/CENELEC Internal Regulations, the national standards orga

32、nizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, R

33、omania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. The topic “Non destructive testing X-ray diffraction from polycrystalline and amorphous material“ is considered in the present document and several other European Standards, namely: g177 EN 13925-1, General principles; g1

34、77 EN 13925-2, Procedures; g177 EN 13925-3, Instruments; g177 EN 1330-11, Non-destructive testing Terminology Terms used in X-ray diffraction from polycrystalline and amorphous materials BS EN 15305:2008EN 15305:2008 (E) 6 Introduction Residual strains in crystalline materials may be determined by X

35、-ray diffraction analysis. Assuming linear elastic distortions, the related residual stresses are calculated. In this document the principles of the measure procedure and the analysis technique are described. BS EN 15305:2008EN 15305:2008 (E) 7 1 Scope This European Standard describes the test metho

36、d for the determination of macroscopic residual or applied stresses non-destructively by X-ray diffraction analysis in the near-surface region of a polycrystalline specimen or component. All materials with a sufficient degree of crystallinity can be analysed, but limitations may arise in the followi

37、ng cases (brief indications are given in Clause 12): Stress gradients; Lattice constants gradient ; Surface roughness; Non-flat surfaces (see 5.1.2); Highly textured materials; Coarse grained material (see 5.1.4); Multiphase materials; Overlapping diffraction lines; Broad diffraction lines. The spec

38、ific procedures developed for the determination of residual stresses in the cases listed above are not included in this document. The method described is based on the angular dispersive technique with reflection geometry as defined by EN 13925-1. The recommendations in this document are meant for st

39、ress analysis where only the diffraction line shift is determined. This European Standard does not cover methods for residual stress analyses based on synchrotron X-ray radiation and it does not exhaustively consider all possible areas of application. Radiation Protection. Exposure of any part of th

40、e human body to X-rays can be injurious to health. It is therefore essential that whenever X-ray equipment is used, adequate precautions should be taken to protect the operator and any other person in the vicinity. Recommended practice for radiation protection as well as limits for the levels of X-r

41、adiation exposure are those established by national legislation in each country. If there are no official regulations or recommendations in a country, the latest recommendations of the International Commission on Radiological Protection should be applied. 2 Normative references The following referen

42、ced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. EN 13925-1:2003, Non-destructive testing X-ray diffraction from polycr

43、ystalline and amorphous material Part 1: General principles BS EN 15305:2008EN 15305:2008 (E) 8 EN 13925-2:2003, Non-destructive testing X-ray diffraction from polycrystalline and amorphous materials Part 2: Procedures. EN 13925-3:2005, Non-destructive testing X-ray diffraction from polycrystalline

44、and amorphous materials Part 3: Instruments ISO 5725-1, Accuracy (trueness and precision) of measurement methods and results Part 1: General principles and definitions ISO 5725-2, Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repea

45、tability and reproducibility of a standard measurement method 3 Terms, definitions and symbols For the purposes of this document, the following term, definition and symbols apply 3.1 Terms and definitions 3.1.1 Residual stress self-equilibrating internal stresses existing in a free body which has no

46、 external forces or constraints acting on its boundary 3.2 Symbols and abbreviations 2 The diffraction angle; this is the angle between the incident and diffracted X-ray beams. The Bragg angle; this is the angle between the diffracting lattice planes and the incident beam. The angle between the inci

47、dent X-ray beam and the specimen surface at = 0. The angle between a fixed direction in the plane of the specimen and the projection in that plane of the normal to the diffracting lattice planes. The angle between the normal of the specimen and the normal of the diffracting lattice planes. The angle

48、 rotates in the plane perpendicular to that containing and 2; the rotation axis of is orientated perpendicular to both the and the g1167 axis. hkl Family of crystal lattice planes defined by the indices h, k and l. Strain measured in the direction defined by the angles and . d0Interplanar distance (

49、d spacing) of a strain free specimen. d Interplanar distance (d spacing) of strained material in the direction of measurement defined by the angles and . (S1, S2, S3) Specimen coordinate system. (L1, L2, L3) Laboratory coordinate system. BS EN 15305:2008EN 15305:2008 (E) 9 21S2hkl, S1hkl Elasticity constants of the family of lattice planes hkl. ii Normal stress components (i = 1,2,3). ij Shear stress components (i j ; i,j = 1,2,3). Z Distance to