ANSI IEEE 1445-2016 Standard for Digital Test Interchange Format (DTIF).pdf

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1、IEEE Standard for Digital Test Interchange Format (DTIF)IEEE Std 1445-2016(Revision of IEEE Std 1445-1998)IEEE-SA Standards BoardSponsored by the Standards Coordinating Committee 20 (SCC20)IEEE3 Park AvenueNew York, NY 10016-5997USAIEEE Std 1445-2016(Revision of IEEE Std 1445-1998)IEEE Standard for

2、Digital Test Interchange Format (DTIF)Sponsor Standards Coordinating Committee 20 (SCC20) of the IEEE-SA Standards BoardApproved 7 December 2016IEEE-SA Standards BoardAbstract: The information content and the data formats for the interchange of digital test pro-gram data between digital automated te

3、st program generators (DATPGs) and automatic test equip-PHQW $7( IRUERDUGOHYHOSULQWHGFLUFXLWDVVHPEOLHVDUHGHQHG7KLVLQIRUPDWLRQFDQEHEURDGOJURXSHGLQWRGDWDWKDWGHQHVWKHIROORZLQJXVHUXQGHUWHVW 887 PRGHOVWLPXOXVDQGUHVSRQVHIDXOWGLFWLRQDUDQGSUREHKeywords:DXWRPDWLFWHVWHTXLSPHQW$7($73*GLJLWDODXWRPDWHGWHVWSURJUD

4、PJHQHUDWRUGLJLWDOWHVWLQWHUFKDQJHIRUPDW7,)IDXOWGLFWLRQDUGDWD,(7KH,QVWLWXWHRI(OHFWULFDODQG(OHFWURQLFV(QJLQHHUV,QF3DUN$YHQXH1HZ6 SA 1 (component: U5, SLQIDXOWWSH6WXFNDW go/nogo test: See: end-to-end test.LASAR 4: Simulation software, used for digital test program set (TPS) development. LASARpredicts th

5、e timing variability of signals and the behavior of the unit under test (UUT) when a physical or logic fault is present. LASAR builds an accurate diagnostic database for isolating faults on the UUT. LASAR also SUHGLFWVWKHHIIHFWRIWKHWHVWWXUHRQWKH887ZRUVWFDVHWLPLQJSUREOHPVDQGFRPSDWLELOLWZLWKWKHWDUJHWt

6、ester. The name LASAR is an acronym for “logic automated stimulus and response.”logic state: The representation a simulator uses to describe the state of a circuit during digital logic simulation. There are four types of logic states that exist in a typical simulator: 0, 1, Z, and X.main model7KHWRS

7、OHYHOXQLWXQGHUWHVW 887 PRGHOGHVFULSWLRQWKDWLQFOXGHVDOLVWRIFRPSRQHQWSDFNDJ-es and a -list: A point-to-point description of the interconnections between individual components in a circuit.packet$JURXSRISRLQWHUVLQDOH7KHJURXSVRISRLQWHUVDUHXVHGWRSURYLGHFKLSSLQLQIRUPDWLRQZLWKRWKHUSLQUHODWHGGDWDOHVpatterns

8、: A set of unit under test (UUT) stimulus and expected response states. A pattern contains one unit of logic state (0, 1, X, Z) data for each UUT input and each UUT output pin.phase: The time within a timing cycle when a primary input is in transition between logic states.4/$6$5LVDWUDGHPDUNRI7HUDGQH

9、,QFIEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQJH)RUPDW 7,) 13OHVZKLFKLQFOXGHVDKHDGHUOHDQGGDWDOHV57KHKHDGHUOHSURYLGHVVXPPDULQIRUPDWLRQDQGDOLVWLQJEQDPHRIWKH7,)OHVHWJHQHUDWHGEDVLPX-ODWRUIRUDJLYHQGLJLWDOFLUFXLW QRWDOO7,)OHVDUHUHTXLUHGWREHLQWKHGDWDVHW 7KHUHPDLQLQJ7,)GDWDOHVDUHRUJDQLHGLQWRWKHIRXUIX

10、QFWLRQDOJURXSV7KLVRUJDQLDWLRQSRUWUDVWKHrole of each functional group as it relates to UUT testing. They are: 8870RGHO*URXS GDWDOHV 6WLPXOXVDQG5HVSRQVH*URXS QLQHGDWDOHV )DXOWLFWLRQDU*URXS VLGDWDOHV 3UREH*URXS HLJKWGDWDOHV 7KH8870RGHO*URXSFRQWDLQVDOOWKHOHVUHTXLUHGWRGHQHWKHWRSRORJLFDOGDWDEDVHIRUGLDJQRV

11、LQJIDXOWVon the UUT. This includes component instantiations, component input/output (I/O) pins, primary inputs, pri-PDURXWSXWVDQGSDFNDJHLQWHUFRQQHFWLRQV7KH6WLPXOXVDQG5HVSRQVH*URXSFRQWDLQVDOOWKHOHVUHTXLUHGIRUIDXOWGHWHFWLRQWHVWLQJ HQGWRHQG 7KHintent of an end-to-end test of a UUT is to verify the over

12、all functionality of the item and to indicate a failure if one exists and can be detected by the test pattern set developed for it. There is no explicit attempt to diagnose the cause of the failure.5Information on references can be found in Clause 2.IEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQ

13、JH)RUPDW 7,) 15,/,$5B3,1B1$0(6 auxpins.tapNODE_NAMES nodenames.tap4.2 Stimulus and response group7KH6WLPXOXVDQG5HVSRQVH*URXSFRQVLVWVRIQLQHGDWDOHWSHVWKDWGHQHWKHORJLFYDOXHRIDSSOLHGVWLPX-OXVDQGREVHUYHGJRRGFLUFXLWUHVSRQVH7KHVHGDWDOHWSHVLGHQWLI The timing of stimulus edge transitions within a pattern The

14、 period of valid output responses within a pattern *URXSVRI887SLQVZLWKWKHVDPHVWLPXOXVDQGUHVSRQVHWLPLQJFKDUDFWHULVWLFV(DFKRIWKHQLQHGDWDOHWSHVKDVDQDVVRFLDWHGOHQDPHTable 2LGHQWLHVHDFKRIWKH7,)OHWSHVDQGLWVDVVRFLDWHG7,)OHQDPH7DEOH6WLPXOXVDQG5HVSRQVH*URXSOHWSHVDQGOHQDPHV7,)OHWSHQDPH 7,)OHQDPHSTIMULUS stimu

15、lus.tapPO_RESPONSE response.tap7,0,1*B6(76 timesets.tapTable continuesIEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQJH)RUPDW 7,) 17 61RWHVLQWHWWDEOHVDQGJXUHVRIDVWDQGDUGDUHJLYHQIRULQIRUPDWLRQRQODQGGRQRWFRQWDLQUHTXLUHPHQWVQHHGHGWRLPSOHPHQWWKLVstandard.IEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHU

16、FKDQJH)RUPDW 7,) 20 however, a pattern greater than 80 pins would continue on the next line.32B5(63216(OHWSHFile name: response.tapDescription:7KH32B5(63216(OHWSHFRQWDLQVDOORIWKHHSHFWHGRXWSXWSLQUHVSRQVHVWDWHVUHTXLUHGWRcompare to that of the UUT. Responses are limited to four logic states: 8QNQRZQ ;

17、High impedance (Z) Low (0)IEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQJH)RUPDW 7,) 21 however, a pattern greater than 80 pins would continue on the next line.3,B1$0(6OHWSHFile name: pinames.tapDescription:7KH3,B1$0(6OHWSHLGHQWLHVHDFKSULPDULQSXWSLQEQDPHDQGEXVHUQRGHQXPEHU7KH3,B1$0(6OHWSHGHQHVHDF

18、KSULPDULQSXW 3, SLQEQDPHDQGELQGVLWWRDXVHUQRGHQXPEHU7KHVHDUHXVHGIRU,2FRQQHFWLRQLGHQWLFDWLRQThe name of the primary input pin for each user node is typically the schematic or etched board name. Each primary input pin shall have a name. This name is used for I/O connection and in probe algorithms. Prim

19、ary EXV,2SLQVDUHFRQVLGHUHGLQERWKWKH3,B1$0(6OHWSHDQGWKH32B1$0(6OHWSH$OOSULPDULQSXWpins and output pins not connected to any other I/O pin are in connectivity group70. Bus pins or I/O pins are assigned a unique connectivity group number starting with 1. Identical connectivity group numbers are as-VLJQ

20、HGWR,2SLQVZKHQWKHDSSHDULQERWKWKH32B1$0(6OHWSHDQGWKH3,B1$0(6OHWSH7KHUHLVno requirement that the name of the PI and PO be the same.7For a description of “connectivity group,” refer to the LSRTAP Reference Manual B3 Paragraph 4.4 Note 2.IEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQJH)RUPDW 7,) 22,

21、/,$5B3,1B1$0(6DQG36(823,B1$0(6OHWSHVOLVWRWKHUVSHFLDOFDVHQRGHVXVHGLQPRGHOLQJDQGWHVWLQJRQWKH$7(DPSOHVRIWKLVDUH9FFDQGJURXQGFormat:Line 1: Columns 1:24 7,)OHWSHQDPH $ Columns 25:27 7,)OHQXPEHU , Columns 28:31 File version number (optional value).(I4)Columns 32:55 UUT name (A24)Columns 56:72 File creatio

22、n date and time (A17) (See Note 1)Columns 73:77 (LWKHUVSDFHVRU(5525WRLQGLFDWHDQHUURULQOHgeneration (A5)Line 2: Columns 1:10 1XPEHURIFLUFXLWSDFNDJHV , 6HH1RWH Line 3 to N: Columns 1:24 7KHSDFNDJHQDPH $ Columns 25:28 7KHSDFNDJHWSHQXPEHU , 6HH1RWH Columns 29:32 1XPEHURILQSXWVRQWKHSDFNDJH , Columns 33:3

23、6 1XPEHURIRXWSXWVRQWKHSDFNDJH , Columns 37:42 ,QGHIRUWKHUVWLQSXWSLQLQWKH86(512(OH , 6HH1RWH Columns 43:48 ,QGHIRUWKHUVWRXWSXWSLQLQWKH86(512(OH , 6HH1RWH Columns 49:58 8VHUFRPSRQHQWQXPEHURIWKLVSDFNDJH , NOTE 1See 1.3.4.NOTE 2This number includes wired nets, Z-components, and all probe-able components

24、 on the UUT.NOTE 37KLVQXPEHULVDQLQGHLQWRWKH,/,$53,11$0(6OH , 6HH1RWH Columns 51 Either a “W” for wired net compo-QHQWRUEODQNIRUDOORWKHUV $ 9For a description of “connectivity group,” refer to the LSRTAP Reference Manual B3 Paragraph 4.4 Note 2.IEEE Std 1445-2016,(6WDQGDUGIRULJLWDO7HVW,QWHUFKDQJH)RUP

25、DW 7,) 26,/,$5B3,1B1$0(6OHWSH86(5B12(OHWSHFile name: usernodes.tapDescription:7KH86(5B12(OHWSHVHTXHQWLDOOOLVWVWKHXVHUQRGHQXPEHUVDVVLJQHGWRHDFKSDFN-DJHIRXQGLQWKH0$,1B02(/OHWSH7KHRUGHULVWRUVWOLVWDOOLQSXWSLQVIRXQGLQWKH,1387B3,1B1$0(6OHWSHIROORZHGEDOORXWSXWSLQVIRXQGLQWKH287387B3,1B1$0(6OHWSHIRUHDFKSDFND

26、JHLQDVFHQGLQJRUGHU SDFNDJHSDFNDJHHWF )RUHDFKSDFNDJHLQSXWVDUHOLVWHGUVWIROORZHGERXWSXWSLQVLQWKHRUGHUWKDWWKHDUHIRXQGLQWKH,1387B3,1B1$0(6DQG287387B3,1B1$0(6OHWSHVUHVSHF-tively. Unused pins in the model are also allocated user node numbers. Therefore, there are at least as many HOHPHQWVLQWKHOLVWDVWKHUHDU

27、HSDFNDJHSLQVLQWKH0$,1B02(/OHWSH,IZLUHGQHWVDUHXVHGLQWKH887model, there shall be more user nodes than physical nodes.7KH0$,1B02(/OHWSHGLUHFWOSRLQWVWRWKH86(5B12(OHWSH7KLVOHLVWKHRQHWKDWFRPELQHVDOORIWKHSDFNDJHVWRJHWKHULQWRDPRGHO8VHUQRGHVDUHXVHGWRUHODWHWKHLQSXWDQGRXWSXWSLQVRQDSDFNDJHWRDFRPSRQHQWSLQQXPEHUE

28、UHIHUULQJWRWKHLQIRUPDWLRQIRXQGLQWKH12(B6285&(OHWSH7KLVOHWSHDOVRSURYLGHVDSDWKZDIURPDOORIWKHRWKHUQRGHQDPHOHWSHVWRWKHFRPSRQHQWOHWSHVIf wired nets are used in the UUT, there shall be more user nodes than physical nodes to accommodate the bi-GLUHFWLRQDOZRUNDURXQGDVVRFLDWHGZLWKZLUHGQHWV7KH86(5B12(OHWSHXVHGLQFRQMXQFWLRQZLWKWKH0$,1B02(/OHWSHUHSUHVHQWVDQHWOLVWIRUWKHFLUFXLWFormat:Line 1: Columns 1:24 7,)OHWSHQDPH $