IEEE 62 2-2004 en Guide for Diagnostic Field Testing of Electric Power Apparatus - Electrical Machinery《电力装置诊断现场试验指南 电机》.pdf
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1、IEEE Std 62.2-200462.2TMIEEE Guide for Diagnostic Field Testingof Electric Power ApparatusElectrical Machinery3 Park Avenue, New York, NY 10016-5997, USAIEEE Instrumentation and Measurement SocietySponsored by theElectric Machinery Committee8 June 2005Print: SH95305PDF: SS95305The Institute of Elect
2、rical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 8 June 2005. Printed in the United States of America.IEEE is a registered trademark in the U.S. Patent (978) 750
3、-8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may require use of subject mat-ter covered by patent rights. B
4、y publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal vali
5、dity orscope of those patents that are brought to its attention.Copyright 2004 IEEE. All rights reserved. iiiIntroductionThe condition of power apparatus is of prime importance for the successful operation of a power system.During transportation, installation and service operation, the apparatus may
6、 be exposed to conditions whichadversely affect its reliability and useful life. One of the principal aims of the maintenance engineer is todetect defects at an early stage and take appropriate corrective measures. The detection is usually achievedby means of diagnostic evaluation in the field which
7、 is performed at regular intervals (for example annuallyor more frequently as necessary). This guide describes most of the off-line diagnostic tests andmeasurements which are common practice and provides additional information in the case of morespecialized procedures. Each test has an interpretatio
8、n subclause which is provided not to establish astandard but merely to provide a guide to the user. There is not necessarily any direct relationship betweenthese field tests and factory tests. For tests performed within the warranty period, the measurements shouldagree with the manufacturers data wh
9、en performed under similar conditions. When measurements areperformed on service-aged equipment, there may be some deviation between field and factory data.Interpretation of measured results is usually based on a comparison with data obtained previously on thesame unit or by comparison with similar
10、units. Many of the levels specified in this document are notstandardized; however, the values quoted have been found to be practical and are widely used by theindustry. The frequency of the tests will vary depending upon the type, size, age and operating history of theunit. It is recommended that th
11、e user of the power apparatus establish a maintenance schedule based on theseconditions and on original equipment manufacturer (OEM) recommendations. The test results obtainedduring the periodic checks should be systematically filed in order to provide a diagnostic data base.This guide was first pub
12、lished in April 1958 as AIEE Std 62, Recommended Guide for Making DielectricMeasurements in the Field. It was revised and republished as IEEE Std 62 - 1978, Guide for Field TestingPower Apparatus Insulation. This present revision contains more detailed descriptions of test proceduresthan the previou
13、s editions and also includes guidance covering visual inspection. It will therefore bepublished in different parts with each part covering a specific type of power apparatus.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ie
14、ee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that impleme
15、ntation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applicat
16、ions for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.This introduction is not part of IEEE Std 62.2-2004, IEEE Guide for Diagnostic Field Testing of Electric PowerApparatu
17、sElectrical Machinery.iv Copyright 2004 IEEE. All rights reserved.ParticipantsAt the time this standard was completed, the working group had the following membership: Thomas R. Wait, Chair and SecretaryRichard H. Hulett, PCIC Standards LiaisonIt is fitting that we give special recognition to David T
18、rain, who had the foresight and determination toinitiate the development of this guide. He was chair of the development of P62.1, dealing with transformersand has made significant contributions to this guide on Electrical Machinery.Other individuals who have contributed review and comments during th
19、e development of this guide are thefollowing:The following individual members of the balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. William H. BartleyElton W. FloydBerry R. HugginsJoseph V. KiselaJames F. LauClyde V. MaughanWilliam McDer
20、midTimothy P. OlsonMaurice A. SecrestHoward G. SeddingEdward. T. ThomsonDavid TrainRobert T. WardJames S. EdmondsGeoffrey S. KlempnerNils E. NilssonJames A. OliverVicki WarrenJames R. MichalecVaino AarePaul A. AndersonRoy L. BalkeWilliam H. BartleyRay BartnikasKevin D. BeckerThomas H. BishopE.A. Bou
21、lterVern L. BuchholzSudhakar CherukupalliDouglas ConleyStephen P. ConradTommy P. CooperGuru Dutt DhingraJames DymondJames S. EdmondsFranklin T. EmeryRobert E. FentonJorge Fernandez-DaherElton W. FloydTrilok C. GargNirmal GhaiBrian E. B. GottVince GreenGlenn L. GriffinRandall C. GrovesBal K. GuptaTho
22、mas J. HammonsGary A. HeustonEdward A. HorganAlan M. IversenReinhard E. JohoInnocent KamwaJoseph V. KiselaGeoffrey S. KlempnerStephen B. KuznetsovThomas E. LairdPeter H. LandrieuWilliam E. LarzelereKevin LovingJohn E. MalinowskiAndrea MariscottiAntonio J. Marques-CardosoWalter J. MartinyC. V. Maugha
23、nWilliam R. McCownWilliam McDermidJeffery L. McElray, Sr.Donald G. McLarenJames R. MichalecGary L. MichelG. Harold MillerCharles MilletRihong MoDaleep MohlaLon W. MontgomeryGlenn MottersheadNils E. NilssonBeant S. NindraJames A. OliverPaul J. PillitteriMadan RanaRadhakrishnaV.RebbapragadaLaurence Ro
24、dlandJesus Martinez RodriguezCharles M. RoweJames A. RuggieriEwald SchweigerManoj R. ShahJohn SheaDaniel SlomovitzGreg C. StoneQi SuJames E. TimperleyDavid TrainGerald VaughnPaul Dieter WangnerThomas R. WaitRobert T. WardVicki WarrenCharles A. WilsonKarim YounsiHugh ZhuCopyright 2004 IEEE. All right
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