ITU-T L 1101-2014 Measurement methods to characterize rare metals in information and communication technology goods (Study Group 5)《信息和通信技术商品中稀有金属的表征方法》.pdf

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1、 I n t e r n a t i o n a l T e l e c o m m u n i c a t i o n U n i o n ITU-T L.1101 TELECOMMUNICATION STANDARDIZATION SECTOR OF ITU (03/2014) SERIES L: CONSTRUCTION, INSTALLATION AND PROTECTION OF CABLES AND OTHER ELEMENTS OF OUTSIDE PLANT Measurement methods to characterize rare metals in informati

2、on and communication technology goods Recommendation ITU-T L.1101 Rec. ITU-T L.1101 (03/2014) i Recommendation ITU-T L.1101 Measurement methods to characterize rare metals in information and communication technology goods Summary Information and communication technology (ICT) goods, which consist of

3、 many parts and modules, are comprised of relatively small quantities of rare metals and larger quantities of major materials (e.g., iron, nonferrous metals, plastics, glasses, and engineering ceramics). They are usually produced through complex production procedures. To achieve successful recycling

4、 systems, the rare metals information provided by manufacturers should be accurate. However, many measurement and characterization methods may be used to obtain information on rare metals for elements of ICT goods. Each method has its own intrinsic advantages and disadvantages in the analysis of the

5、 information of such elements. The element separation capabilities and quantitative resolutions differ according to the measurement methods used and there are no standardized measurement methods to define the quantities and qualities of rare metals. However, IEC 62321 provides some guidelines for X-

6、ray fluorescence (XRF) and inductively coupled plasma mass spectrometry (ICP-MS) measurement methods to perform qualitative and quantitative analysis of unknown samples and harmful materials. Based on the guidelines of IEC 62321, Recommendation ITU-T L.1101 provides reference characterization proced

7、ures for efficient recycling of rare metals by using XRF and ICP-MS measurement methods. History Edition Recommendation Approval Study Group Unique ID* 1.0 ITU-T L.1101 2014-03-22 5 11.1002/1000/12134 Keywords Climate change, element measurement, ICT goods, quantitative resolution, rare metals. _ *

8、To access the Recommendation, type the URL http:/handle.itu.int/ in the address field of your web browser, followed by the Recommendations unique ID. For example, http:/handle.itu.int/11.1002/1000/11830-en. ii Rec. ITU-T L.1101 (03/2014) FOREWORD The International Telecommunication Union (ITU) is th

9、e United Nations specialized agency in the field of telecommunications, information and communication technologies (ICTs). The ITU Telecommunication Standardization Sector (ITU-T) is a permanent organ of ITU. ITU-T is responsible for studying technical, operating and tariff questions and issuing Rec

10、ommendations on them with a view to standardizing telecommunications on a worldwide basis. The World Telecommunication Standardization Assembly (WTSA), which meets every four years, establishes the topics for study by the ITU-T study groups which, in turn, produce Recommendations on these topics. Th

11、e approval of ITU-T Recommendations is covered by the procedure laid down in WTSA Resolution 1. In some areas of information technology which fall within ITU-Ts purview, the necessary standards are prepared on a collaborative basis with ISO and IEC. NOTE In this Recommendation, the expression “Admin

12、istration“ is used for conciseness to indicate both a telecommunication administration and a recognized operating agency. Compliance with this Recommendation is voluntary. However, the Recommendation may contain certain mandatory provisions (to ensure, e.g., interoperability or applicability) and co

13、mpliance with the Recommendation is achieved when all of these mandatory provisions are met. The words “shall“ or some other obligatory language such as “must“ and the negative equivalents are used to express requirements. The use of such words does not suggest that compliance with the Recommendatio

14、n is required of any party. INTELLECTUAL PROPERTY RIGHTSITU draws attention to the possibility that the practice or implementation of this Recommendation may involve the use of a claimed Intellectual Property Right. ITU takes no position concerning the evidence, validity or applicability of claimed

15、Intellectual Property Rights, whether asserted by ITU members or others outside of the Recommendation development process. As of the date of approval of this Recommendation, ITU had not received notice of intellectual property, protected by patents, which may be required to implement this Recommenda

16、tion. However, implementers are cautioned that this may not represent the latest information and are therefore strongly urged to consult the TSB patent database at http:/www.itu.int/ITU-T/ipr/. ITU 2014 All rights reserved. No part of this publication may be reproduced, by any means whatsoever, with

17、out the prior written permission of ITU. Rec. ITU-T L.1101 (03/2014) iii Table of Contents Page 1 Scope . 1 2 References . 1 3 Definitions 1 3.1 Terms defined elsewhere 1 4 Abbreviations and acronyms 2 5 Introduction of rare metal measurement in ICT goods . 2 5.1 Overview of rare metals in ICT goods

18、 . 2 5.2 Rare metal element measurement methods 3 5.3 Rare metal quantity measurement methods 4 6 Measurement methods to characterize rare metals in ICT goods . 5 6.1 Recycling procedures Flow chart 5 6.2 Rare metal measurement methods for ICT goods 6 6.3 Preparation of measurement samples . 6 Appen

19、dix I Case study for measurement of rare metals . 8 I.1 XRF measurement method . 8 I.2 ICP-MS measurement method . 8 I.3 Examples result of measurement of rare metals in smartphone parts 9 I.4 Example result of measurements of rare metals in laptop parts . 12 Bibliography. 17 Rec. ITU-T L.1101 (03/2

20、014) 1 Recommendation ITU-T L.1101 Measurement methods to characterize rare metals in information and communication technology goods 1 Scope This Recommendation explains the measurement methods for rare metals contained in Information and Communication Technology (ICT) goods. The measurement method

21、may affect the interpretation of the results. This Recommendation specifies measurement methods to determine types and associated quantities of the rare metals of ICT goods. This Recommendation covers: an overview of rare metals measurements; the reference rare metals recycling procedure; and recomm

22、ended measurement methods of rare metals of ICT goods. 2 References The following ITU-T Recommendations and other references contain provisions which, through reference in this text, constitute provisions of this Recommendation. At the time of publication, the editions indicated were valid. All Reco

23、mmendations and other references are subject to revision; users of this Recommendation are therefore encouraged to investigate the possibility of applying the most recent edition of the Recommendations and other references listed below. A list of the currently valid ITU-T Recommendations is regularl

24、y published. The reference to a document within this Recommendation does not give it, as a stand-alone document, the status of a Recommendation. ITU-T L.1100 Recommendation ITU-T L.1100 (2012), Procedure for recycling rare metals in information and communication technology goods. IEC 62321 IEC 62321

25、 ed 1.0 (2008), Electrotechnical Products Determination of levels of six regulated substances (lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyls, polybrominated diphenyl ethers). 3 Definitions 3.1 Terms defined elsewhere This Recommendation uses the following term defined elsewhe

26、re: 3.1.1 information and communication technology (ICT) goods b-ITU-T L.1400: The tangible products deriving from, or making use, of technologies devoted to, or concerned with (a) the study and application of data and the processing thereof; i.e., the automatic acquisition, storage, manipulation (i

27、ncluding transformation), management, movement, control, display, switching, interchange, transmission or reception of a diversity of data; (b) the development and use of the hardware, software, and procedures associated with this delivery; and (c) the representation, transfer, interpretation, and p

28、rocessing of data among persons, places, and machines, noting that the meaning assigned to the data must be preserved during these operations. 2 Rec. ITU-T L.1101 (03/2014) 4 Abbreviations and acronyms This Recommendation uses the following abbreviations and acronyms: At% Atomic per-cent AED Atomic

29、Emission Detector AES Auger Electron Spectroscopy CD-ROM Compact Disk Read-Only Memory EDS Energy Dispersive X-ray Spectroscopy FTIR Fourier Transform Infrared spectroscopy HF Hydrofluoric ICP-MS Inductively Coupled Plasma Mass Spectrometry ICP-OES Inductively Coupled Plasma Optical Emission Spectro

30、meter ICT Information and Communication Technology LA Laser Ablation LA-ICPMS Laser Ablation Inductively Coupled Plasma Mass Spectrometry LCD Liquid Crystal Display LEXES Low Energy X-ray Emission Spectrometry PC Personal Computer PCB Printed Circuit Board ppm parts per million ptt parts per trillio

31、n RBS Rutherford Backscattering Spectrometry SEM Scanning Electron Microscopy SIMS Secondary Ion Mass Spectrometry STEM Scanning Transmission Electron Microscopy TOF-SIMS Time-of-flight Secondary Ion Mass Spectrometry TXRF Total reflection X-Ray Fluorescence Wt% weight per-cent XPS/ESCA X-ray Photoe

32、lectron Spectroscopy/Electron Spectroscopy for Chemical Analysis XRD X-Ray Diffraction XRF X-Ray Fluorescence XRR X-Ray Reflectivity 5 Introduction of rare metal measurement in ICT goods 5.1 Overview of rare metals in ICT goods Rare metals are essential to obtain high performance and high functional

33、ity in ICT goods. As global awareness on environmental problems is on the rise, the concern in the ICT industry on the recycling of electric and electronic goods is increasing. Nowadays, there is an increased emphasis on the Rec. ITU-T L.1101 (03/2014) 3 recycling of rare metals in mobile phones, pe

34、rsonal computers (PCs) and other ICT goods. In addition, much research on recycling methods of rare metals is being promoted. Each country has different industrial structures and security situations, and the definition of rare metals is not exactly the same in each country because geographic distrib

35、ution of rare metals is different. Nevertheless, there are some elements commonly agreed as rare metals, reported in the following: Alkaline earth metal: Li, Ca, Be, Sr, Ba Metalloid: Ge, Bi, Se, Te Iron group: Co Boron group: B, Ga, In, Tl, Cd High fusion point metal: Ti, Zr, Hf, V, Nb, Ta, Cr, Mo,

36、 W, Mn, Re Rare earth: La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Sc, Y Platinum group: Ru, Rh, Pd, Os, Ir, Pt For example, rare metals such as indium (In), yttrium (Y), gallium (Ga) and arsenic (As) are widely used in ICT goods such as smartphones, laptops, etc. For more informatio

37、n, see ITU-T L.1100. 5.2 Rare metal element measurement methods For successful recycling, producers are required to provide detailed information on rare metals to recyclers. The provided information should be accurate for effective recycling. However, many measurement and characterization methods ma

38、y be used to obtain this information on elements (rare metals). Moreover, each method has its intrinsic advantages and disadvantages for the analysis of these elements. Element separation abilities and quantitative resolutions are divergent in different measurement methods. Figure 1 depicts an analy

39、tical resolution diagram for various element measurement systems. Each measurement system has a different analytical spot size and detection quantity range. If a producer applies a non-standard measurement method and system to ICT goods, rare metal information based on ITU-T L.1100 may be incorrect.

40、 Moreover, it is hard to distinguish rare earth elements contained in rare metals because they have similar chemical properties. The development of standard measurement methods to characterize rare metals in ICT goods is urgently required. Hence, this Recommendation provides two recommended measurem

41、ent methods in clause 6.2 to characterize rare metals. 4 Rec. ITU-T L.1101 (03/2014) L . 1 1 0 1 (1 4 )_ F 0 11 0 0 at %A na l y ti ca l res o l uti o n v ers us det ecti o n l i m i t fo r v a ri o us m ea s ure m ent s y s tem s1 0 at %1 at %0 . 1 at %1 0 0 p p m1 0 p p m1 p p m1 0 0 p p b1 0 p p

42、b1 p p b1 0 0 p p t1 0 p p tDetectionrange0 . 1 n m 1 n m 1 0 n m 1 0 0 n m 1 m 1 0 m 1 0 0 m 1 mm 1 cmA na l y ti ca l s po t s i zeS T E M /E D SA E SS E M /E D SR a m a nX P S /E S C A X R DF T I R X R F RBSL EX ESI C P - M ST O F - S I M SX R RT X R FD y n a m i cS I M SXRRXRDSEM/EDSAEDSTEM/EDSR

43、amanXPS/ESCALEXESXRFRBSTXRFLA-ICPMSTOF-SIMSDYNAMICSIMSNOTE 1 Raman refers to Raman spectroscopy. NOTE 2 Refer to clause 4 for other acronyms. Figure 1 Analytical resolution diagram showing element measurement systems (Reproduced with the kind permission of EAG b-EAG) Usually measurement of rare meta

44、l elements is performed by a combination of different ways of measurement methods (e.g., TOF-SIMS, XRD and XRF). 1) TOF-SIMS (Time-of-flight secondary ion mass spectrometry) TOF-SIMS uses a pulsed primary ion beam to desorb and ionize species from a sample surface. The resulting secondary ions are a

45、ccelerated into a mass spectrometer, where they are mass analysed by measuring their time-of-flight from the sample surface to the detector. TOF-SIMS provides spectroscopy for characterization of chemical composition, designed to determine the distribution of chemical species, and depth profiling fo

46、r thin film characterization. 2) XRD (X-ray diffraction) XRD is based on the principle that different structural materials distinguish different diffraction angles and intensities. XRD is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide i

47、nformation on unit cell dimensions, as such XRD analysis methods are used for obtaining information on the structure of crystalline materials. 3) XRF (X-ray fluorescence) XRF analysis has an advantage of supporting the measurement of high-content major metals. XRF uses the emission of characteristic

48、 secondary X-rays from a material that has been excited by bombardment with high-energy X-rays or gamma rays. The XRF has been widely used for elemental and chemical analyses. This method can identify every metal element and measure its amount at percentage levels. The weights of metals in electric

49、wires, metal-plastic composites, magnets, and vibrators are recorded and these components are then subjected to XRF to obtain rare metal information. The advantages of XRF measurements are that they can measure elemental metal, plastic, solution or powder samples without pre-treatment and they can have multi-element measurement capability. They can also minimize the analytical error margin. 5.3 Rare metal quantity measurement methods Usually measurement of rare metal quantity is performed through a combinatio