4-2013 - IEEE Standard for High-Voltage Testing Techniques.pdf

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1、 I IEEE S Standard for High- -V Voltage Testing T Techniques Sponsored by the Power System Instrumentation and Measurements Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 10 May 2013 IEEE Power and Energy Society IEEE Std 4 4- -201 13 (Revision of IEEE Std 4-1995) IEEE Std 4-2013 (Revision

2、 of IEEE Std 4-1995) IEEE Standard for High-Voltage Testing Techniques Sponsor Power System Instrumentation and Measurements Committee of the IEEE Power and Energy Society Approved 6 March 2013 IEEE-SA Standards Board Recognized as an American National Standard Abstract: Standard methods and basic t

3、echniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse t

4、esting are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version. Keywords: atmospheric corrections, high-current testing, high-voltage measur

5、ements, high- voltage testing, IEEE 4 TM , impulse currents, impulse voltages, testing The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published

6、10 May 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Notice to users Laws and reg

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12、rough the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website a

13、t http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility tha

14、t implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a s

15、tatement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without com

16、pensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rights reserved. iv Copyright 2013 IEEE. All rights reserved. v Essential Patent Claims may exist

17、 for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provi

18、ded in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely thei

19、r own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was completed, the High Voltage Test Techniques Working Group had the following membership: William Larzelere, Chair Frank Blalock Jeffrey A. Britton Larry Coffe

20、en Ross Daharsh Frank DeCesaro Dana Dufield Jari Hallstrom Jeffrey G. Hildreth Harold Kirkham Jack Kise John Kuffel William Larzelere Yi Li Kevin P. Loving James McBride Terry McComb Nigel P. McQuin Arthur Molden Randy Newnam Johannes Rickmann Juris Rungis Daniel Schweickart Stephen A. Sebo Mel Smit

21、h Eddy So May Wang Yixin Zhang The following members of the Standards Association balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Michael Adams S. Aggarwal Roy Alexander Saleman Alibhay Stephen Antosz Anthony Baker Peter

22、 Balma Paul Barnhart Earle Bascom III Thomas Basso Martin Baur Barry Beaster W.J. (Bill) Bergman Steven Bezner Wallace Binder Thomas Bishop Thomas Blackburn Frank Blalock Anne Bosma Kenneth Bow Harvey Bowles Jeffrey A. Britton Chris Brooks Gustavo Brunello Ted Burse Carl Bush William Bush Mark Bushn

23、ell William Byrd Paul Cardinal Michael Champagne Arvind K. Chaudhary Weijen Chen Robert Christman Larry Coffeen Michael Comber John Crouse Matthew Davis Frank DeCesaro Larry Dix Dieter Dohnal Carlo Donati Gary Donner Randall Dotson Louis Doucet Dana Dufield Denis Dufournet James Dymond Douglas Edwar

24、ds Kenneth Edwards Fred Elliott Gary Engmann C. Erven Leslie Falkingham Jorge Fernandez Daher Keith Flowers Joseph Foldi Marcel Fortin Rostyslaw Fostiak Fredric Friend Paul Gaberson Robert Ganser George Gela Saurabh Ghosh David Giegel David Gilmer Douglas Giraud Mietek Glinkowski Waymon Goch Jalal G

25、ohari Edwin Goodwin James Graham William Griesacker J. Travis Griffith Randall Groves Bal Gupta Ajit Gwal Said Hachichi Charles Hand Richard Harp David Harris Jeffrey Hartenberger Wolfgan Haverkamp Jeffrey Helzer Steven Hensley Lee Herron Scott Hietpas Lauri Hiivala Raymond Hill Werner Hoelzl David

26、Horvath John Houdek A. Jones Andrew Jones Harry Josten Gael Kennedy Sheldon Kennedy Vladimir Khalin Yuri Khersonsky Gary King Harold Kirkham Jack Kise J. Koepfinger Boris Kogan Neil Kranich Jim Kulchisky Saumen Kundu John Lackey Donald Laird Chung-Yiu Lam William Larzelere Michael Lauxman Aleksandr

27、Levin Paul Lindemulder Gerald Liskom Hua Liu Copyright 2013 IEEE. All rights reserved. vi Albert Livshitz William Lockley Larry Lowdermilk Greg Luri Arturo Maldonado Richard Marek J. Dennis Marlow Lee Matthews Michael Maytum Omar Mazzoni James McBride William McBride Thomas McCarthy Terry McComb Wil

28、liam McCown William McDermid Nigel P. McQuin Joseph Melanson James Michalec Michael Miller Arthur Molden Georges Montillet Jerry Murphy R. Murphy Ryan Musgrove K.R.M. Nair Dennis Neitzel Arthur Neubauer Michael S. Newman Joe Nims T. Olsen Carl Orde Lorraine Padden Mirko Palazzo Donald Parker Bansi P

29、atel David Peelo Brian Penny Christopher Petrola Donald Platts Alvaro Portillo Bertrand Poulin Lewis Powell Ulf Radbrandt Reynaldo Ramos Johannes Rickmann Pierre Riffon Michael Roberts Stephen Rodick John Rossetti Marnie Roussell Thomas Rozek Dinesh Sankarakurup Daniel Sauer Bartien Sayogo Gil Shult

30、z Hyeong Sim Douglas Smith James Smith Jerry Smith Steve Snyder Eddy So John Spare Nagu Srinivas David Stankes Gary Stoedter David Stone James Swank David Tepen Malcolm Thaden Peter Tirinzoni John Toth Remi Tremblay Eric Udren John Vergis Jane Verner Martin Von Herrmann Mark Walton Barry Ward Daniel

31、 Ward Joe Watson Peter Werelius Steven Whalen Kenneth White Ernesto Jorge Wiedenbrug Matthew Wilkowski Larry Yonce Jian Yu Dawn Zhao Tiebin Zhao Hugh Zhu Xi Zhu J. Zimnoch When the IEEE-SA Standards Board approved this standard on 6 March 2013, it had the following membership: John Kulick, Chair Dav

32、id J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Lo

33、gvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE Standards Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program DevelopmentCopyright 2013 IEEE. All rights reserved. vii