IEEE C57.12.58-2017 Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil.pdf

《IEEE C57.12.58-2017 Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil.pdf》由会员分享，可在线阅读，更多相关《IEEE C57.12.58-2017 Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil.pdf（30页珍藏版）》请在麦多课文档分享上搜索。

1、IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil IEEE Std C57.12.58-2017 (Revision of IEEE Std C57.12.58-1991) IEEE Power and Energy Society Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std C57.12.58-2017 (Revision of

2、 IEEE Std C57.12.58-1991) IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 15 June 2017 IEEE-SA Standards BoardAbstract: General recommendations for measuring voltage transients in dry-t

3、ype distribution and power transformers are provided. Recurrent surge voltage generator circuitry, instrumentation, test sample, test point location, mounting the test coil, conducting the test, and reporting results are covered. Keywords: IEEE C57.12.58, impulse distribution, recurrent surge genera

4、tor, transient voltage analysis The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 November 2017. Printed in the United States of Ameri

5、ca. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards docum

6、ents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furt

7、hermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering profe

8、ssional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in

9、 any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PR

10、OCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON AN

11、Y STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE W AS FORESEEABLE.4 Copyright 2017 IEEE. All rights reserved. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is

12、 translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official pos

13、ition of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered th

14、e personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice

15、pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questi

16、ons also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the

17、same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes

18、 Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard ar

19、e responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved stand

20、ards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the pr

21、omotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents.5 Copyright 2017 IEEE. All rights reserved. Photocopies Subject to payment of the appropriate f

22、ee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Ro

23、sewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that the

24、se documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corri

25、genda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present s

26、tate of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Xplore at

27、 http:/ ieeexplore .ieee .or g/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Web

28、site at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By pu

29、blication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE

30、- SA Website at http:/ standards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demons

31、trably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting in

32、quiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advi

33、sed that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2017 IEEE. All rights reserved. Participants At the time this guide was

34、submitted to the IEEE-SA Standards Board for approval, the following attendees of the Dry-Type Transformers Subcommittee provided input on the revision of this document: Roger C. Wicks, Chair James Antweiler R. Casey Ballard J. Arturo Del Rio Derek Foster Mark Gromlovits Phil Hopkinson Mohammad Iman

35、 John John Charles Johnson Sheldon Kennedy Aleksandr Levin Tim-Felix Mai Richard Marek Martin Navarro Klaus Papp Dhiru Patel Klaus Pointner Paulette Payne Powell Thomas Prevost Michael Sharp Sanjib Som David Stankes Vijay Tendulkar David Walker The following members of the individual balloting commi

36、ttee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Roy Alexander R. Casey Ballard Peter Balma Barry Beaster W.J. (Bill) Bergman Paul Cardinal John Crouse Gary Donner Jorge Fernandez Daher Bruce Forsyth Derek Foster Jalal Gohari Randall Groves Werner Hoelzl M

37、ohammad Iman Richard Jackson John John Charles Johnson Laszlo Kadar Jim Kulchisky Chung-Yiu Lam William Larzelere Aleksandr Levin Tim-Felix Mai Omar Mazzoni Daleep Mohla Daniel Mulkey Jerry Murphy K. R. M. Nair Martin Navarro Michael Newman Raymond Nicholas T. W . Olsen Lorraine Padden Mirko Palazzo

38、 Klaus Papp Bansi Patel Shawn Patterson Paulette Payne Powell Alvaro Portillo Iulian Profir Johannes Rickmann Thomas Rozek Ryandi Ryandi Bartien Sayogo Jeremy Smith Jerry Smith David Stankes Ralph Stell David Tepen James V an De Ligt Roger V erdolin John V ergis David Walker John Wang Kenneth White

39、Roger C. Wicks Jian Y u When the IEEE-SA Standards Board approved this guide on 15 June 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug

40、 Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus7 Copyright 2017 IEEE. All rights r

41、eserved. Introduction This introduction is not part of IEEE Std C57.12.58-2017, IEEE Guide for Conducting a Transient V oltage Analysis of a Dry-Type Transformer Coil. This guide covers general recommendations for measuring voltage transients in dry-type distribution and power transformers. Insulati

42、on is recognized as one of the most important components of a transformer. Its major function is to prevent dielectric breakdown between parts with different voltage potentials. Insulation materials and components are also a part of the mechanical structure of the transformer. Any weakness of insula

43、tion may result in the failure of the transformer. Dielectric strength is a measure of the effectiveness with which insulation performs. It was once accepted that low-frequency tests alone were adequate to demonstrate the dielectric strength of transformers. As more became known about lightning phen

44、omena, and as impulse testing apparatus was developed, it became apparent that the distribution of impulse voltage stress through the transformer winding varies with the configuration of the windings. Impulse voltages are distributed initially on the basis of winding capacitances. If this initial di

45、stribution differs from the final low-frequency inductance distribution, the impulse energy will oscillate between the two distributions until the energy is dissipated and the inductance distribution is reached. In severe cases, these internal oscillations can produce voltages to ground that approac

46、h twice the applied voltage. Along with the variation in size of transformer windings and the physical configuration of the windings, the impulse voltage distribution when chopping the applied wave was considered by the task force that developed this guide. Since there was insufficient information o

47、n how to interpret the short-time oscillations on the insulation system, the inclusion of the chopped wave was deferred until a later date. This document was originally developed in 1991 to determine standard methods for examining the impulse voltage distribution within dry-type transformer windings

48、; to establish a means for defining the location and magnitude of maximum voltage stress in a dry-type transformer coil; and to support other IEEE standards such as the thermal evaluation document, IEEE Std C57.12.60 B6. 1 This updated version of IEEE Std C57.12.58 corrects some editorial and techni

49、cal issues from the original document. The task force involved in the revision of this document considered a more extensive revision of the document (incorporating use of commercial equipment and new software techniques), but due to a compressed time frame determined to defer this more extensive revision after the approval of this document. 1 The numbers in brackets correspond to those of the bibliography in Annex A.