EIA ECA-364-110-2006 TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets.pdf

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1、 EIA STANDARD TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets EIA/ECA-364-110 August 2006 EIA/ECA-364-110 ANSI/EIA-364-110-2006(R2013) Approved: August 25, 2006 Reaffirmed: January 15, 2013 NOTICE EIA Engineering Standards and Publications are designed to serve the public

2、 interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub

3、lications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the

4、standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation w

5、hatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC documen

6、t can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory

7、limitations before its use. (Created under Standards Proposal No. 5064 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards and reaffirmed under Project No. 5253.09). Published by Electronic Components Industry Association 2013 Engineering Department

8、 2214 Rock Hill Road, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For informatio

9、n, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i CONTENTS Clause Page1 Introduction . 11.1 Scope . 12 Test resources . 12.1 Test equipment 13 Test specimen 13.1 Description 13.2 Preparation 14 Test procedure . 25 D

10、etails to be specified . 46 Test documentation . 4Table 1 Test condition . 32 Test duration . 3ii(This page left blank) EIA/ECA-364-110 Page 1 TEST PROCEDURE No. 110 THERMAL CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 5064, formulated under the cogni

11、zance CE-2.0 EIA Committee on National Connector Standards.) 1 Introduction 1.1 Scope This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate. NOTE If the ramp time between temperature extremes is 2.0

12、 minutes, this test procedure shall not be used. The procedure as specified in EIA-364-32 (Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets) shall be performed as a substitute. 2 Test resources 2.1 Test equipment The chamber and accessories shall be constructe

13、d of material that will not be affected by the temperature extremes as specified. A suitable open screen tray, rack or other suitable holding feature shall be provided to ensure that the specimen shall be exposed to circulating air. Specimens shall not be subjected to radiant heat from chamber condi

14、tioning processes. The circulation of air within the chamber shall be sufficient to assure a no-load temperature uniformity of 5C. A temperature recorder and controller shall be provided, capable of controlling and recording the temperature within 2C at any setting throughout the temperature range.

15、3 Test specimen 3.1 Description A test specimen shall consist of a mated connector, unless otherwise specified in the referencing document. 3.2 Preparation 3.2.1 The test specimen shall be assembled with contacts and all accessories required for proper function of the specimen under test, unless oth

16、erwise specified in the referencing document. EIA/ECA-364-110 Page 2 3.2.2 The test specimen shall be tested in a terminated and mated state, unless otherwise specified in the referencing document. 3.2.3 When applicable the conductor lengths (directly terminated to the contacts or as attached to sup

17、port vehicles) shall be of sufficient length to interconnect the test specimen to applicable test equipment as may be specified for pre and post measurements or for monitoring during the test exposure. 3.2.4 If required, fixtures shall be lightweight with low thermal capacity in order to minimize “h

18、eat sink” effects. 4 Test procedure 4.1 Mounting The test specimens shall be placed in such a position with respect to the air stream so that there is substantially no obstruction to the flow of air across and around each specimen, unless otherwise specified in the referencing document. When special

19、 mounting is required it shall be specified in the referencing document. 4.2 Initial and final measurements The specified measurements shall be made prior to the first cycle at room ambient conditions, and after the last cycle after recovery to room ambient conditions, unless otherwise specified in

20、the referencing document. 4.3 Test cycle 4.3.1 The specimen shall be placed in the test chamber, as specified in 4.1, when the chamber is at room ambient (15 C to 35 C). 4.3.2 The specimen shall be cycled at the rates specified in the following manner: step a: ramp up to the high (hot) temperature l

21、evel, step b: dwell at the high (hot) temperature level, step c: ramp down to the low (cold) temperature level, step d: dwell at the low (cold) temperature level, step e: repeat steps a through d until the specified number of cycles has been completed, step f: return to room ambient as defined in 4.

22、3.1 at the same ramp rate used in step a. EIA/ECA-364-110 Page 3 4.4 Ramp rate 4.4.1 If necessary, based on the specified ramp rate (hot to cold) liquid nitrogen may be used. If used, liquid nitrogen shall be introduced in such a manner that it shall not be directed onto the test specimen. 4.4.2 Unl

23、ess otherwise specified in the referencing document, the ramp rate shall be an average of 5 C/minute. 4.4.3 A chamber temperature overshoot may be used to help achieve the desired test sample temperature. It shall not exceed 10 C on the cold side nor more than +10 C on the hot side. 4.4.4 Humidity s

24、hall be uncontrolled. 4.5 Dwell time 4.5.1 The temperature extremes shall be maintained within 3 C, with the exception of overshoot as noted in 4.4.3. 4.5.2 The minimum dwell time shall be 10 minutes after the specimen(s) has reached the chamber temperature specified, unless otherwise specified in t

25、he referencing document. This shall be determined by placing a thermocouple at the midpoint along the longitudinal length on the side of the test specimen. Only one specimen needs to be monitored located near the center of the group of specimens under test. 4.6 Unless otherwise specified in the refe

26、rencing document, the severity level and duration shall be in accordance with one of the conditions as indicated in table 1 and 2 respectively. Table 1 - Test conditions Test condition Low temperature High temperature A +15 C +85 C B -15 C +85 C C 0 C +100 C Table 2 - Test durations Test duration Nu

27、mber of cycles A 10 B 100 C 500 D 1000 E 2000 F 3500 EIA/ECA-364-110 Page 4 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Number of specimens to be tested 5.2 Test specimen description, if other than specified in 3.1 5.3 Special mounting if requi

28、red 5.4 Test temperatures if other than indicated in table 1. 5.5 Dwell time if other than specified in 4.5.2 5.6 Ramp rates, if other than specified in 4.4 5.7 Number of cycles, if other than indicated in table 2 5.8 Measurements to be made before, during or after the exposure 6 Test documentation

29、Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Report number and test procedure number 6.2 Test equipment used, and date of last and next calibration 6.3 Actual temperature extremes (charts or a data log) 6.4 Dwell times (charts or a data l

30、og) 6.5 Ramp up and ramp down times (charts or a data log) 6.6 Values and observations 6.7 Name of operator and start/finish dates of test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please f

31、ill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Ur

32、gency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions SP-5064 Initial release Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org